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Wyniki wyszukiwania dla: ADCS
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Simple Measurement Method for Resistive Sensors Based on ADCs of Microcontrollers
PublikacjaA new, complete measurement method for resistance measurement of resistive sensors for systems based on microcontrollers equipped with analog-to-digital converters (ADCs) is proposed. The interface circuit consists of only four resistors, including a resistive sensor and a reference resistor, connected directly to the microcontroller pins. It is activated only during measurements, which significantly reduces power consumption....
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A Power-Efficient Digital Technique for Gain and Offset Correction in Slope ADCs
PublikacjaIn this brief, a power-efficient digital technique for gain and offset correction in slope analog-to-digital converters (ADCs) has been proposed. The technique is especially useful for imaging arrays with massively parallel image acquisition where simultaneous compensation of dark signal non-uniformity (DSNU) as well as photo-response non-uniformity (PRNU) is critical. The presented approach is based on stopping the ADC clock by...
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Self-Testing of Analog Parts Terminated by ADCs Based on Multiple Sampling of Time Responses
PublikacjaA new approach for self-testing of analog parts terminated by analog-to-digital converters in mixed-signal electronic microsystems controlled by microcontrollers is presented. It is based upon a new fault diagnosis method using a transformation of the set of voltage samples of the time response of a tested analog part to a square impulse into localization curves placed in a multidimensional measurement space. The method can be used...
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In-ADC, Rank-Order Filter for Digital Pixel Sensors
PublikacjaThis paper presents a new implementation of the rank-order filter, which is established on a parallel-operated array of single-slope (SS) analog-to-digital converters (ADCs). The SS ADCs use an “on-the-ramp processing” technique, i.e., filtration is performed along with analog-to-digital conversion, so the final states of the converters represent a filtered image. A proof-of-concept 64 × 64 array of SS ADCs, integrated with MOS...
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An Ultra-Low-Energy Analog Comparator for A/D Converters in CMOS Image Sensors
PublikacjaThis paper proposes a new solution of an ultra-low-energy analog comparator, dedicated to slope analog-to-digital converters (ADC), particularly suited for CMOS image sensors (CISs) featuring a large number of ADCs. For massively parallel imaging arrays, this number may be as high as tens-hundreds of thousands ADCs. As each ADC includes an analog comparator, the number of these comparators in CIS is always high. Detailed analysis...
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A solution of the integrated µBIST for functional and diagnostic testing in mixed-signal electronic embedded systems
PublikacjaMain problem of the paper is testing of analog circuits and blocks in mixed-signal electronic embedded systems (EESs), using the built-in self-test (BIST) technique. The integrated mBIST based on reusing signal blocks already present in an EES, such as processors, memories, ADCs, is presented. The novelty of the solution is the extended functionality of the mBIST. It can perform 2 testing functions: functional testing and fault...
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Fixed Pattern Noise Reduction and Linearity Improvement in Time-Mode CMOS Image Sensors
PublikacjaIn the paper, a digital clock stopping technique for gain and offset correction in time-mode analog-to-digital converters (ADCs) has been proposed. The technique is dedicated to imagers with massively parallel image acquisition working in the time mode where compensation of dark signal non-uniformity (DSNU) as well as photo-response non-uniformity (PRNU) is critical. Fixed pattern noise (FPN) reduction has been experimentally validated...
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Two‐functional μBIST for Testing and Self‐Diagnosis of Analog Circuits in Electronic Embedded Systems
PublikacjaThe paper concerns the testing of analog circuits and blocks in mixed‐signal Electronic Embedded Systems (EESs), using the Built‐in Self‐Test (BIST) technique. An integrated, two‐functional, embedded microtester (μBIST) based on reuse of signal blocks already present in an EES, such as microprocessors, memories, ADCs, DACs, is presented. The novelty of the μBIST solution is its extended functionality. It can perform 2 testing functions:...
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An Implementation of a Compact Smart Resistive Sensor Based on a Microcontroller with an Internal ADC
PublikacjaIn the paper a new implementation of a compact smart resistive sensor based on a microcontroller with internal ADCs is proposed and analysed. The solution is based only on a (already existing in the system) microcontroller and a simple sensor interface circuit working as a voltage divider consisting of a reference resistor and the resistive sensor connected in parallel with an interference suppression capacitor. The measurement...
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A random signal generation method for microcontrollers with DACs
PublikacjaA new method of noise generation based on software implementation of a 7-bit LFSR based on a common polynomial PRBS7 using microcontrollers equipped with internal ADCs and DACs and a microcontroller noise generator structure are proposed in the paper. Two software applications implementing the method: written in ANSI C and based on the LUT technique and written in AVR Assembler are also proposed. In the method the ADC results are...
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Time-domain measurement methods for R, L and C sensors based on aversatile direct sensor-to-microcontroller interface circuit
PublikacjatIn the paper new time-domain measurement methods for determining values of resistive (R), inductive(L) and capacitive (C) sensors based on a versatile direct sensor-to-microcontroller interface for microcon-trollers with internal analog-to-digital converters (ADCs) and analog comparators (ACs) are presented.The interface circuit consists of a reference resistor Rrworking as a voltage divider, a given R, L or C sensorand a microcontroller...
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Hybrid‐mode single‐slope ADC with improved linearity and reduced conversion time for CMOS image sensors
PublikacjaIn the paper, a single‐slope analog‐to‐digital converter (ADC) for integrated CMOS image sensor applications with an improved technique of conversion has been proposed. The proposed hybrid‐mode ADC automatically uses one of the following conversion techniques: time based (i.e. PWM) or voltage based (i.e. single‐slope). During the ADC operation, the clock frequency and reference voltage are modified in order to reduce the conversion...
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Experimental Study of the Influence of Noise Level on the Uncertainty Value in a Measurement System Containing an Analog-to-Digital Converter
Dane BadawczeFor newly developed measuring systems it is easy to estimate type B uncertainties based on the technical data of the measuring modules applied. However, it is difficult to estimate A type un-certainties due to the unknown type and level of interferences infiltrating into the measuring sys-tem. This is a particularly important problem for measurements...
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A measurement method for capacitive sensors based on a versatile direct sensor-to-microcontroller interface circuit
PublikacjaIn the paper, there is presented a new time-domain measurement method for determining the capacitance values of capacitive sensors, dedicated, among others, to capacitive relative humidity sensors. The method is based on a versatile direct sensor-to-microcontroller interface for microcontrollers with internal analog comparators (ACs) and with precision voltage reference sources, e.g. digital-to-analog converters (DACs). The reference...