Self-Testing of Analog Parts Terminated by ADCs Based on Multiple Sampling of Time Responses - Publikacja - MOST Wiedzy

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Self-Testing of Analog Parts Terminated by ADCs Based on Multiple Sampling of Time Responses

Abstrakt

A new approach for self-testing of analog parts terminated by analog-to-digital converters in mixed-signal electronic microsystems controlled by microcontrollers is presented. It is based upon a new fault diagnosis method using a transformation of the set of voltage samples of the time response of a tested analog part to a square impulse into localization curves placed in a multidimensional measurement space. The method can be used for fault detection and single soft fault localization. Modified digital Fourier transform formulas are used for conversion of the measurement results to the form used by the fault detection and localization algorithm during the self-testing of the system and also for creation of the fault dictionary. In this paper, the results of experimental verification of the approach are included.

Informacje szczegółowe

Kategoria:
Publikacja w czasopiśmie
Typ:
artykuł w czasopiśmie wyróżnionym w JCR
Opublikowano w:
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT nr 62, wydanie 12, strony 3160 - 3167,
ISSN: 0018-9456
Język:
angielski
Rok wydania:
2013
Opis bibliograficzny:
Czaja Z.: Self-Testing of Analog Parts Terminated by ADCs Based on Multiple Sampling of Time Responses// IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. -Vol. 62, iss. 12 (2013), s.3160-3167
Weryfikacja:
Politechnika Gdańska

wyświetlono 3 razy

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