Wyniki wyszukiwania dla: EMBEDDED DETERMINISTIC TEST

• High-Speed Serial Embedded Deterministic Test for System-on-Chip Designs

  Publikacja

  • G. Mrugalski
  • N. Mukherejee
  • A. Pogiel
  • J. Rajski
  • M. Trawka
  • J. Tyszer

  - Rok 2014

  The paper presents a high-speed serial interface between external tester and Embedded Deterministic Test (EDT) compression logic hosted by SoC designs. With only a single bidirectional link, the system is capable of feeding distributed heterogeneous cores with hundreds of test channels. Moreover, it synergistically supports EDT bandwidth management to improve the overall test performance. A detailed study indicates a high potential...

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• Test Design Patterns for Embedded Systems,

  Publikacja

  • J. Zander
  • A. M. Perez
  • I. Schieferdecker
  • Z. R. Dai

  - Rok 2007

  Test suites for embedded systems are typically created from scratch using dif- ferent, often inadequate methods. In consequence, industry branches dealing with software-intensive embedded systems have to cope with quality problems, even though test processes are particularly time-consuming and costly. Based on an evolving model-based testing methodology we introduce test design patterns for simplifying and accelerating...

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• Systematic Test Data Generation for Embedded Software

  Publikacja

  • J. Zander
  • X. Xiong
  • I. Schieferdecker

  - Rok 2008

  Systematic Test Data Generation for Embedded Software

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• Using an IEEE1149.1 Test Bus for Fault Diagnosis of Analog Parts of Electronic Embedded Systems

  Publikacja

  • Z. Czaja
  • B. Bartosiński

  - Rok 2013

  The new solution of a BIST called the JTAG BIST for self-testing of analog parts of electronic embedded systems is presented in the paper. The JTAG BIST consists of the BCT8244A and SCANSTA476 integrated circuits of Texas Instruments controlled via the IEEE 1149.1 bus. The BCT8244A is a scan test device with octal buffers, and the SCANSTA476 is a 12-bit ADC with 8 analog input channels. Self-testing approach is based on the fault...

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• From Functional Requirements through Test Evaluation Design to Automatic Test Data Retrieval – a Concept for Testing of Software Dedicated for Hybrid Embedded Systems

  Publikacja

  • J. Zander

  - Rok 2007

  From Functional Requirements through Test Evaluation Design to Automatic Test Data Retrieval – a Concept for Testing of Software Dedicated for Hybrid Embedded Systems

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• Derivation of Executable Test Models From Embedded System Models using Model Driven Architecture Artefacts - Automotive Domain

  Publikacja

  • J. Zander
  • I. Schieferdecker
  • T. Farkas

  - Rok 2006

  The approach towards system engineering compliant to Model-Driven Architecture (MDA) implies an increased need for research on the automation of the model-based test generation. This applies especially to embedded real-time system development where safety critical requirements must be met by a system. The following paper presents a methodology to derive basic Simulink test models from Simulink system models so as to execute them...

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• Five-phase induction motor drive with sine-wave filter

  Publikacja

  • P. Stec
  • J. Guziński
  • P. Strankowski
  • A. Iqbal
  • A. A. Abduallah
  • H. Abu-Rub

  - Rok 2014

  The paper presents closed loop ac drive with 5 phase induction motor operating with voltage source inverter and sine wave filter. The motor supply voltages and currents have sinusoidal shape. For well known adjustable electric drives the field oriented control method with flux and speed co ntrol can be applied. In the presence of output filter both control and estimation algorithms should be modified due to sine wave filter installation....

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• TEST

  Czasopisma

  ISSN: 1133-0686 , eISSN: 1863-8260

• EXPERIENCE-ORIENTED SMART EMBEDDED SYSTEM

  Publikacja

  • E. Szczerbicki
  • C. Sanin

  - Rok 2013

  The Experience-Oriented Smart Embedded System (EOSES) is proposed as a new technological platform providing a common knowledge management approach that allows mass embedded systems for experiential knowledge capturing, storage, involving, and sharing. Knowledge in the EOSES is represented as SOEKS, and organized as Decisional DNA. The platform is mainly based on conceptual principles from Embedded Systems and Knowledge Management....

• Quality of Test Specification by Application of Patterns

  Publikacja

  • J. Zander

  - Rok 2008

  Embedded system and software testing requires sophisticated methods, which are nowadays frequently supported by application of test patterns. This eases the test development process and contributes to the reusability and maintainability of the test specification. However, it does not guarantee the proper level of quality and test coverage in d ifferent dimensions of the test specification. In this paper the quality of the test...

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