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Using an IEEE1149.1 Test Bus for Fault Diagnosis of Analog Parts of Electronic Embedded Systems
PublicationThe new solution of a BIST called the JTAG BIST for self-testing of analog parts of electronic embedded systems is presented in the paper. The JTAG BIST consists of the BCT8244A and SCANSTA476 integrated circuits of Texas Instruments controlled via the IEEE 1149.1 bus. The BCT8244A is a scan test device with octal buffers, and the SCANSTA476 is a 12-bit ADC with 8 analog input channels. Self-testing approach is based on the fault...
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A testing method of analog parts of mixed-signal electronic systems equipped with the IEEE1149.1 test bus
PublicationA new solution of the JTAG BIST for testing analog circuits in mixed-signal electronic microsystems controlled by microcontrollers and equipped with the IEEE1149.1 bus is presented. It is based on a new fault diagnosis method in which an analog circuit is stimulated by a buffered signal from the TMS line, and the time response of the circuit to this signal is sampled by the ADC equipped with the JTAG. The method can be used for...
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Measurements of passive components using of an IEEE 1149.4 mixed-signal test bus
PublicationW pracy przedstawiono wyniki badań nad wykorzystaniem magistrali testującej mieszanej sygnałowo IEEE 1149.4 do pomiarów elementów pasywnych zamontowanych na pakietach elektronicznych. Do badań użyto wyposażonych w magistralę układów scalonych typu STA400. Zaprezentowano metody pomiaru rezystancji pojedynczych elementów z wykorzystaniem źródła prądowego oraz źródła VH znajdującego się w analogowych modułach ABM układu STA400. Pokazano...
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Some methods of diagnosis of analog circuit using mixed signal test bus IEEE 1149.4
PublicationW artykule przedstawiono wybrane metody testowania i diagnostyki analogowych układów elektronicznych zamontowanych na pakiecie pomiędzy układami scalonymi wyposażonymi w magistralę IEEE 1149.4. Prezentowane metody dobrano pod kątem stopnia skomplikowania układów testowanych oraz specyficznych właściwości metrologicznych magistrali, które ograniczają możliwości pomiarowe i aplikacyjność metod. Rozważono trzy typy układów testowanych:...
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Diagnostyka analogowych filtrów wielosekcyjnych oparta na magistrali testującej IEEE1149.1
PublicationPrzedstawiono nową koncepcję testera JTAG BIST do samo-testowania torów analogowych opartych na wielosekcyjnych filtrach wyższego rzędu w mieszanych sygnałowo mikrosystemach elektronicznych sterowanych mikrokontrolerami i wyposażonych w magistralę testującą IEEE1149.1 (JTAG). Bazuje ona na metodzie diagnostycznej opartej na przekształce-niu transformującym próbki odpowiedzi czasowych kolejnych sekcji filtra pobudzonego impulsem...
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Comparative field test for measurement of PM10 dust in atmospheric air using gravimetric (reference) method and b-absorption method (Eberline FH 62-1)
PublicationThe paper presents the results of a field test carried out in Gdansk region between 01-01-2010 and 31-12-2010 in order to demonstrate equivalence of the Eberline FH 62-1 sampler to the reference gravimetric method of suspended PM10 dust measurement. The differences in PM10 dust concentration provided by both methods have been discussed for different seasons of the year. A method of estimation of the correction factors/correction...
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INTERLABORATORY COMPARISON OF THE ELECTROMAGNETIC EMISSION MEASUREMENTS USING FAR AND GTEM TEST SITES UP TO 1 GHz
PublicationElectromagnetic emission limiting is one of the basic requirements in the European Directive 2014/30/EU (EMC Directive). Manufacturers often use alternative methods of measurements to make preliminary verification of emission. This paper presents and analyzes problem with comparison between measurements in different test sites: FAR (Fully Anechoic Room) and GTEM (Gigahertz Transverse Electromagnetic cell). FAR is assumed as the...
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The conducted immunity test of a power supply unit in the frequency range from 19 MHz to 26 MHz for the RF voltage level of 1 V
Open Research DataThe dataset presents a result of measurements that are a part of immunity tests to conducted disturbances, induced by radio-frequency fields. The immunity tests were carried out on the mains cable of the DF1723003TC NDN power supply unit. Tests of immunity of electronic systems to conducted disturbances in the frequency range from 19 MHz to 26 MHz were...
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Fault detection in electronic circuits using test buses
PublicationA survey of test buses designed for diagnostics of digital and analog electronic circuits is presented: the IEEE 1149.1 bus for digital circuits, the IEEE 1149.4 bus for mixed-signal and the IEEE 1149.6 bus for AC coupled complex digital circuits. Each bus is presented with its structure, solution of key elements, particularly boundary registers and a set of test instructions. Diagnosis with the use of the described buses is...