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Search results for: ELECTRONIC SENSORS
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Dual role of oxygen-related defects in the luminescence kinetics of AlNMn2+
Open Research DataThis dataset presents the impact of temperature and pressure on AlN:Mn2+ luminescence kinetics. Unusual behavior of Mn2+ optical properties during UV excitation is observed, where a strong afterglow luminescence of Mn2+ occurs even at low temperatures. When the temperature increases, the contribution of the afterglow luminescence is further enhanced,...
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Selection of material for infiltration of non-stoichiometric Sr0.95Ti0.3Fe0.7O3-δ
Open Research DataThe porous electrodes used for the infiltration were prepared from A-site non-stoichiometric Sr0.95Ti0.3Fe0.7O3-δ synthesized by the conventional solid state reaction method. Screen printed electrodes (0.5 cm2) on CGO-20 substrate, were fired at 800 °C for 2 hours in an air atmosphere. Infiltration of the scaffolds was performed by a water-based precursor...
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Autocorrelation function for the chosen effective potential of the diatomic silver anion
Open Research DataThe process of a two-channel decay of the diatomic silver anion (Ag2-), namely the spontaneous electron ejection giving Ag2 + e- and the dissociation leading to Ag- + Ag is theoretically studied. The ground state potential energy curves (PECs) of the neutral silver dimer and anionic silver diatomic molecule are calculated using the single reference...
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The conducted immunity test of a power supply unit in accordance with EMC standards
Open Research DataThe dataset presents a result of measurements that are a part of immunity tests to conducted disturbances, induced by radio-frequency fields. The immunity tests were carried out on the mains cable of the DF1723003TC NDN power supply. Tests of immunity of electronic systems to conducted disturbances in the frequency range from 150 kHz to 230 MHz are...
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The conducted immunity test of an AC adaptor in accordance with EMC standards
Open Research DataThe dataset presents a result of measurements that are a part of immunity tests to conducted disturbances, induced by radio-frequency fields. The immunity tests were carried out on the mains cable of the ac adaptor PHILIPS DC power supply SBC 6654. Tests of immunity of electronic systems to conducted disturbances in the frequency range from 150 kHz...
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Continuum orbitals in low energy scattering of electrons from Ar, Kr, Xe, Rn and Og atoms
Open Research DataThe dataset includes relativistic continuum electron wave functions (continuum orbitals, continuum spinors) for elastic scattering of electrons from Argon (Ar), Krypton (Kr), Xenon (Xe), Radon (Rn) and Oganesson (Og) atoms, calculated using the Multiconfiguration Dirac-Hartree-Fock method (MCDHF), at very low electron energies (0.0001 - 0.001 eV). Only...
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The conducted immunity test of a power supply unit in the frequency range from 19 MHz to 26 MHz for the RF voltage level of 3 V
Open Research DataThe dataset presents a result of measurements that are a part of immunity tests to conducted disturbances, induced by radio-frequency fields. The immunity tests were carried out on the mains cable of the DF1723003TC NDN power supply unit. Tests of immunity of electronic systems to conducted disturbances in the frequency range from 19 MHz to 26 MHz were...
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The conducted immunity test of a power supply unit in the frequency range from 19 MHz to 26 MHz for the RF voltage level of 1 V
Open Research DataThe dataset presents a result of measurements that are a part of immunity tests to conducted disturbances, induced by radio-frequency fields. The immunity tests were carried out on the mains cable of the DF1723003TC NDN power supply unit. Tests of immunity of electronic systems to conducted disturbances in the frequency range from 19 MHz to 26 MHz were...
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The conducted immunity test of a power supply unit in the frequency range from 19 MHz to 26 MHz for the RF voltage level of 10 V
Open Research DataThe dataset presents a result of measurements that are a part of immunity tests to conducted disturbances, induced by radio-frequency fields. The immunity tests were carried out on the mains cable of the DF1723003TC NDN power supply unit. Tests of immunity of electronic systems to conducted disturbances in the frequency range from 19 MHz to 26 MHz were...