Wśród 1000 najlepszych uczelni świata
Politechnika Gdańska znajduje się w gronie 8 polskich uczelni sklasyfikowanych w prestiżowym Academic Ranking of World Universities (ARWU) zwanym również Rankingiem Szanghajskim. Każdego roku ARWU klasyfikuje ponad 2000 uczelni i publikuje ponad 1000 najlepszych spośród nich. Politechnika Gdańska w roku 2021 sklasyfikowana została w przedziale 801-900.
Najwyższe standardy w Europie do prowadzenia badań naukowych
W 2017 roku Komisja Europejska przyznała PG prawo do posługiwania się prestiżowym logo HR Excellence in Research. Politechnika Gdańska została w ten sposób uznana za instytucję stwarzającą jedne z najlepszych warunków pracy i rozwoju dla badaczy w Europie.
Jedna z najlepszych uczelni w Polsce
Politechnika Gdańska to druga najlepsza w Polsce uczelnia badawcza w konkursie Ministerstwa Nauki i Szkolnictwa Wyższego „Inicjatywa doskonałości - uczelnia badawcza”. To tu powstają wynalazki wykorzystywane w Polsce i na świecie – komunikacja za pomocą oczu, ekologiczny lek na osteoporozę, biodegradowalne tworzywo i wiele innych.
Dane badawcze
Filtry
wszystkich: 3538
wyświetlamy 1000 najlepszych wyników Pomoc
Katalog Danych Badawczych
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Złocieniec 2021- video data - pedestrian, bicycles, vehicles
Dane BadawczeZłocieniec 2021- video data - pedestrian, bicycles, vehicles
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XRD results of melamine sponges impregnated by DES
Dane BadawczeThe set includes raw data from XRD analysis of pure melamine sponge and melamine sponges impregnated by:- Eucalyptol:Menthol (1:1)- Eucalyptol:Menthol (1:2)- Eucalyptol:Menthol (1:3)- Eucalyptol:Menthol (1:4)- Eucalyptol:Menthol (1:5)- Thymol:Menthol (1:1)
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XRD patterns of VO2 and V6O13 nanostructures
Dane BadawczeThe DataSet contains the XRD patterns of VO2 and V6O13 thin films deposited on a silicon substrate. The as-prepared thin films were annealing under a reducing atmosphere (94% Ar, 6% H2) at 500, 600 and 700C for 10h.
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XRD patterns of VO2 and V2O3 thin films obtained at 700°C
Dane BadawczeThe DataSet contains the XRD patterns of VO2 and V2O3 thin films obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (5-9 AsP layers) were deposited on a silicon substrate and were annealing at 700°C under an argon atmosphere.
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XRD patterns of VO2 and V2O3 thin films obtained at 500°C
Dane BadawczeThe DataSet contains the XRD patterns of VO2 and V2O3 thin films obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (3-9 AsP layers) were deposited on a silicon substrate and were annealing at 500°C under an argon atmosphere.
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XRD patterns of VO2 and V2O3 nanostructures
Dane BadawczeThe DataSet contains the XRD patterns of VO2 and V2O3 nanostructures obtained by the sol-gel with different reaction conditions. The information about xerogel powder synthesis is described in the Journal of Nanomaterials. The xerogel powder was annealing under argon atmosphere in the temperature range 400-1000C. The results show that the morphology...
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XRD patterns of vanadium oxide nanostructures on silicon substrate obtained by V2O5 recrystallization
Dane BadawczeThe DataSet contains the XRD patterns of vanadium oxide nanostructures on silicon substrates obtained by recrystallization of V2O5 thin films between 800-1200°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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XRD patterns of vanadium oxide nanostructures on quartz glass substrate obtained by V2O5 recrystallization
Dane BadawczeThe DataSet contains the XRD patterns of vanadium oxide nanostructures on quartz glass substrates obtained by recrystallization of V2O5 thin films between 800-1200°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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XRD patterns of V2O5 thin films deposited on silicon substrate
Dane BadawczeThe DataSet contains the XRD patterns of V2O5 thin films deposited on a silicon substrate. The as-prepared thin films were annealing under an oxidizing atmosphere in the temperature range of 300-600C. The results show that the structure of the films dependent on the annealing temperature.
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XRD patterns of V2O5 thin films deposited on quartz glass
Dane BadawczeThe DataSet contains the XRD patterns of V2O5 thin films deposited on a quartz glass substrate. The as-prepared thin films were annealing under an oxidizing atmosphere in the temperature range 200-600C. The results show that the structure of the films dependent on the annealing temperature.
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XRD patterns of V2O5 thin films deposited on isotropic etching silicon substrates (111)
Dane BadawczeThe DataSet contains the XRD patterns of V2O5 thin films deposited on isotropic etching silicon substrates (111). The silicon wafers were etched in a mixture of nitric acid, hydrofluoric acid, and acetic acid in the ratio of 40:1:15. The soaking time for the substrates was from 30 to 90 seconds. The thin films were obtained by the sol-gel method. ...
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XRD patterns of V2O5 thin film morphology dependent on substrate types
Dane BadawczeThe DataSet contains the XRD patterns of the V2O5 thin film structure dependent on substrate types. The as-prepared thin films were deposited on alumina, zirconium, zirconium oxide and metallic vanadium substrate, then was annealing under an oxidizing atmosphere at 600C for 10h.
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XRD patterns of V2O5 nanostructures
Dane BadawczeThe DataSet contains the XRD patterns of vanadium pentaoxide nanostructures obtained by the sol-gel with different annealing temperatures under synthetic air. The results show that crystallinity dependent on the annealing temperature.
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XRD patterns of V2O3 nanostructures
Dane BadawczeThe DataSet contains the XRD patterns of V2O3 nanostructures obtained by the sol-gel with different reaction conditions. The xerogel powder was annealing under a reducing atmosphere (94% Ar, 6% H2) in the temperature range 350-700C. The results show that crystallinity dependent on the annealing temperature.
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XRD patterns of the V2O5 nanorods after thermal treatment under reducing atmosphere
Dane BadawczeThe DataSet contains the XRD patterns of V2O5 nanorods after thermal treatment under a reducing atmosphere. Samples were annealed at 450C for 2, 20, and 40h under a reducing atmosphere (94% Ar, 6% H2).
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XRD patterns of the V2O5 coatings after thermal treatment under reducing atmosphere
Dane BadawczeThe DataSet contains the XRD patterns of V2O5 coatings on the silicon substrate after thermal treatment under a reducing atmosphere. Thin films were annealed at 500C, 600C, and 700C for 10 under a reducing atmosphere (94% Ar, 6% H2).
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XRD patterns of TeOx powder
Dane BadawczeThe DataSet contains the XRD patterns of the TeOx powder. The material was obtained by the sol-gel method. The starting solution was prepared by mixing telluric acid (precursor) with thetraetylene glycol, water, and ethanol. The sol was obtained by vigorously stirring precursor solution at 50°C for 2h, then the temperature was raised to 75°C for the...
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XRD patterns of TeOx-BaO-BiO powder
Dane BadawczeThe DataSet contains the XRD patterns of the TeOx-BaO-BiO powder. The material was obtained by the sol-gel method. The starting solution was prepared by mixing telluric acid (precursor), barium carbonate, and bismuth carbonate with thetraetylene glycol, water, ethanol, and acetic acid. (Samples molar concentration: 73TeO2-4BaO-3Bi2O3 and 73TeO2-3BaO-4Bi2O3)....
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XRD patterns of nickel-modified V2CTx
Dane BadawczeThe set includes data for XRD pattern preparation of nickel-modified V2CTx samples.
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XRD patterns of ammonium vanadate nanocrystals
Dane BadawczeThe DataSet contains the XRD patterns of ammonium vanadate nanobelts obtained by the hydrothermal method with different conditions. The results show that the structure and phase compositions of samples dependent on reaction conditions.
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XRD pattern of Mo2Ga2C, Mo2CTx/Mo2GaC and Ni-Mo2CTx/Mo2Ga2C materials
Dane BadawczeIn the dataset are included raw data for the preparation of XRD pattern of Mo2Ga2C, Mo2CTx/Mo2GaC and Ni-Mo2CTx/Mo2Ga2C materials.
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XRD investigations of the lithium titanate thin films
Dane BadawczeNanocrystalline thin films with 800 nm thickness were prepared by sol–gel method. To examine the influence of the annealing temperature on as-prepared films crystallization, the coatings were heated at temperature from 500 °C up to 600 °C for 20h. Structure of manufactured thin films was investigated using X-ray diffraction (XRD). The most visible...
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XRD for molybdenum sulfide modified with nickel or platinum nanoparticles
Dane BadawczeThe presented data showcases the results of XRD analysis conducted on molybdenum sulfide modified with nickel or platinum nanoparticles . The MoS2 was prepared on the TiO2 nanotube substrates via a facile hydrothermal method, followed by the deposition by magnetron sputtering of Ni or Pt nanoparticles on the MoS2 surface. Structural characterization...
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XRD, DTA and luminescence measurements of B2O3-Bi2O3-AlF3 glasses doped with Eu3+, Tb3+ and Tm3+ ions
Dane BadawczeThe DataSet contains the XRD,DTA and luminescence measurements for the B2O3-Bi2O3-AlF3 glass system. Samples were prepared by the conventional melt quenching technique. Starting materials were melted in porcelain crucibles at 950 oC for 20 min. XRD and DTA data were collected for 50B2O3-50Bi2O3,45B2O3-45Bi2O3+10AlF3 and 40B2O3-40Bi2O3+20AlF3 glasses....
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XRD diffraction patterns for strontium ferrite molybdate-based compounds: as-prepared, reduced and reoxidized
Dane BadawczeThe dataset contains the XRD diffractograms collected at room temperature for SFM, LSFM and SFMNb in 3 different oxidation states, namely: as-prepared, reduced and reoxidized.
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XRD data of V2AlC, Mo3AlC2, Mo3CTx and V2AlCTx
Dane BadawczeRaw data for XRD diffractograms of MAX phases: V2AlC and Mo3AlC2 and corresponding MXenes after selective etching of Al.
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XRD data of (Cr,Fe,Mn,Co,Ni)3O4 High-entropy spinel oxide thin films deposited on amorphous SiO2 substrate by spray pyrolysis techniqe, annealed in a range from 400 to 900oC
Dane BadawczeDataset include collected XRD data of (Cr,Fe,Mn,Co,Ni)3O4 high-entropy spinel oxide thin films deposited by spray pyrolysis technique on amorphous SiO2 substrates and annealed from 400 to 900oC. Samples were prepared in the form of a ~ 500 nm thin film utilising a facile spray pyrolysis technique. The structural and electrical properties of the layers...
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XRD and electrochemical results for MoO3 films deposited using pulsed laser deposition system
Dane BadawczeThe attached data contains XRD and electrochemical results for MoO3 films deposited on fluorine-doped tin oxide glasses. Films were deposited using a pulsed laser deposition system at different conditions. Part of the samples was deposited at room temperature and then annealed at 575°C for given times (samples labeled PLD_RT_575C_xmin, where x stands...
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XRD analysis of the tellurium dioxide thin films
Dane BadawczeTellurium dioxide thin films were deposited by magnetron sputtering method. The XRD analysis of the films annealed at 200, 500, 650 and 700 celsius degree showed appearing of crystalline phase in a higher temeratures.
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X-Ray photoemission spectroscopy measurements of the Nb-V-Sr-O ceramics
Dane BadawczeNiobium doped strontium vanadate based perovskite SrV1-xNbxO3-δ materials were prepared via conventional solid state reaction (SSR) method. For comparison, different samples with a various amount of niobium dopant in the structure were synthesized; x = 0; 0,2; 0,5; 0,8 and 1. Samples were sintered by two-steps: first under a pure hydrogen (purity >99.999%)...
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X-ray Photoelectron Spectroscopy studies of various carboxylic acids adsorption on aluminium alloys in alkaline media
Dane BadawczeThis dataset contains the results of high-resolution XPS studies obtained during evaluation of high corrosion inhibition efficiency of various carboxylic acids towards aluminium alloy 5754 in bicarbonate buffer pH=11.
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X-ray Photoelectron Spectroscopy studies of salivary gland stones
Dane BadawczeThis dataset contains the high-resolution XPS studies for 23 cross-sections of salivary gland stones. The sialoliths were cut to determine the differences in composition between various regions: core (labeled as R), interlayer (labeled as P) and sialolith surface (labeled as Z).
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X-ray Photoelectron Spectroscopy studies of laser-induced titania nanotubes
Dane BadawczeThis dataset contains the results of high-resolution XPS studies obtained during the formation of the hollow nanopillar arrays through the laser-induced transformation of titania nanotubes.
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X-ray Photoelectron Spectroscopy studies of citric acid adsorption on aluminium alloy 5754 in alkaline media
Dane BadawczeThis dataset contains the results of high-resolution XPS obtained during evaluation of high corrosion inhibition efficiency of citric acid towards aluminium alloy 5754 in bicarbonate buffer pH=11. The exposition duration of samples to electrolytic environment was 100 min. Each sample was exposed at different citric acid concentration ranging from 0...
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X-ray Photoelectron Spectroscopy studies of ammonium vanadate
Dane BadawczeThe DataSet contains the high-resolution XPS studies of the ammonium vanadate nanostructures obtained by the hydrothermal method. XPS analyses were carried out with an X-ray photoelectron spectrometer (Omicron NanoTechnology) with a 128-channel collector. The measurements were performed at room temperature in an ultra-high vacuum condition (below 1.1x10-8...
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X-ray diffractometry results of the SrTi0.50Fe0.50O3-d powder
Dane BadawczeThis dataset contains results of X-ray diffractometry mesurement (XRD) of the SrTi0.50Fe0.50O3-d (STF50) powder after ball milling. The phase composition of the investigated STF50 powder was analyzed by XRD at room temperature. The X-ray diffractometry (XRD) technique was used to determine the phase composition of the fabricated powder. Measurements...
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X-ray diffractometry results of the SrTi0.35Fe0.65O3-d powder
Dane BadawczeThis dataset contains results of X-ray diffractometry mesurement (XRD) of the SrTi0.35Fe0.65O3-d (STF35) powder after ball milling. The phase composition of the investigated STF35 powder was analyzed by XRD at room temperature. The X-ray diffractometry (XRD) technique was used to determine the phase composition of the fabricated powder. Measurements...
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X-ray diffractometry results of the SrTi0.30Fe0.70O3-d powder
Dane BadawczeThis dataset contains results of X-ray diffractometry mesurement (XRD) of the SrTi0.30Fe0.70O3-d (STF70) powder after ball milling. The phase composition of the investigated STF70 powder was analyzed by XRD at room temperature. The X-ray diffractometry (XRD) technique was used to determine the phase composition of the fabricated powder. Measurements...
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X-ray diffractometry results of the Sr0.86Ti0.65Fe0.35O3 powder
Dane BadawczeThis dataset contains results of X-ray diffractometry mesurement (XRD) of the Sr0.86Ti0.65Fe0.35O3-d (STF35) powder. The phase composition of the investigated STF35 powder was analyzed by XRD at room temperature. It confirms the formation of the cubic perovskite oxide phase. Calculated average lattice constant is a 3.90882(1) Å, with Goodness of Fit...
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X-ray diffraction spectra of the NiCo2O4 modified by carbon
Dane BadawczeThis dataset comprises XRD results for NiCo2O4 modified with carbon, varying according to the amount of carbon. In this context, the XRD data provide insights into the crystalline structure and phase composition of the NiCo2O4 material as it is modified with varying quantities of carbon. This investigation is valuable for understanding how the presence...
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X-ray diffraction spectra of nitrogen-doped carbon in hybrid materials containing praseodymium oxide
Dane BadawczeX-ray powder diffraction patterns of samples were carried out by Philips X’Pert diffractometer, which was radiated by graphite monochromatized Cu Kα (l equal 1.540598). The operating voltage was maintained at 40 kV, the current was maintained at 30 mA and analyzed in the range from 20° to 90°. The data presented confirmed the presence of the PrBSCF...
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X-ray diffraction spectra of modification of TiO2 nanotubes by graphene - strontium and cobalt molybdate perovskite
Dane BadawczeData show XRD results for strontium and cobalt molybdate-modified nanotubes that were also decorated with graphene oxide. The crystalline phases were characterized by X-ray diffractometer (Philips X”Pert with detector X’Celerator Scientific).
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X-ray diffraction patterns of BaCe0.6Zr0.2Y0.1M0.1O3-δ (M = Fe, Pr, Tb)
Dane BadawczeThe dataset consists of three raw X-ray diffraction (XRD) files collected using a Phillips X’Pert Pro diffractometer (CuKα radiation (𝜆 = 1.541 Å), under 40 kV and 30 mA). The diffraction patterns of BaCe0.6Zr0.2Y0.1Fe0.1O3-δ (BCZYFe), BaCe0.6Zr0.2Y0.1Pr0.1O3-δ (BCZYPr), and BaCe0.6Zr0.2Y0.1Tb0.1O3-δ (BCZYTb) were collected at room temperature. Collected...
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X-ray diffraction of ZnIn2S4 layers on TiO2NT and FTO annealed at different temperatures
Dane BadawczeData show XRD results for ZnIn2S4 layers deposited using hydrothermal method on FTO glass and TiO2 nanotubes. The layers were annealed in air atmosphere at 300, 400 and 500 oC.
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X-Ray diffraction of the metallic nanostructures
Dane BadawczeMetallic nanostructures (gold and silver) were manufactured as a thermal annealing of gold or silver thin film. Gold films with thickness of 2.8 nm were deposited on a silicon substrates using a table-top dc magnetron sputtering coater (EM SCD 500, Leica), equipped with quartz microbalance for in-situ thickness measurements. Films were deposited from...
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XPS study of the YST ceramics
Dane BadawczeYttrium-doped strontium titanate was prepared via conventional solid-state reaction method from Y2O3 (Sigma Aldrich, 99,9%), TiO2 (Sigma Aldrich, 99%) and SrCO3 (Sigma Aldrich,98%). For comparision, two other techniques were used for synthesis: Pechini and wet methods. Both kind of samples were measured, after and before reduction process (in a hydrogen)....
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XPS study of the TiO2-WO2 composites
Dane BadawczeValence state of W and Ti was measured in a TiO2-WO3 composites with a various composition.Powder samples of pure titanium dioxide, tungsten oxide and mix of 50% titanium oxide and 50% od tungsten oxide were measured. Oxides were annealed at the temperature in the range of 300 Celsius degree up to 900 deg. Measurements were performed by XPS UHV Omicron...
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XPS study of the NH4-VOx powders
Dane BadawczeVanadium pentoxide samples were prepared by sol-gel method. The starting solution was prepared by mixing vanadium (V) oxytripropoxide (Aldrich) in an anhydrous ethanol as solvent and acetylacetone. By drying the sol at 323 K for 48 h, it transforms via gel into a xerogel powder. Next, the precursor powder was pressed into the disk-shaped pellets. Samples...
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XPS study of the lithium titanate doped by copper
Dane BadawczeLithium titanate doped by copper was measured by X-ray photoemission spectroscopy. For sol-gel synthesis lithium acetate dehydrate from Alfa Aesar GmbH &Co and titanium (IV) butoxide 97% from Aldrich were used as reagents. Copper (II) nitrate from Alfa Aesar was used as a source of Cu dopant. It was added in the proper weight to get an x index equal...
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XPS studies of PDA-modified TiO2 nanotubes
Dane BadawczeThis dataset contains the XPS results (survey and high-resolution spectra) of the samples from TiO2 nanotubes modified with polydopamine. The studies were presented as a part of the research on "Band Gap Engineering toward Semimetallic Character of Quinone-Rich Polydopamine" (DOI: 10.1021/acs.jpcc.2c08804).