Wyniki wyszukiwania dla: MULTILAYERS
Znaleźliśmy mało wyników, wypróbuj alternatywnej metody wyszukiwania.
Filtry
wszystkich: 9
wybranych: 1
-
Katalog
Filtry wybranego katalogu
Wyniki wyszukiwania dla: MULTILAYERS
-
Depth profile of the chemical composition of the Au-Ag multilayers
Dane BadawczeSilver and gold multilayers were deposited on a silicon substrate by magnetron sputtering method. Both type, Au and Ag thin films had 2 nm of thickness. Totally structure had thickness of 6 nm (Au-Ag-Au). That prepared multilayers were measured by XPS method. To obtain a depth profile of chemical composition, an Argon ion (Ar+) gun was used for etching...