Wyniki wyszukiwania dla: SECONDARY EMISSION
Filtry
wszystkich: 14
wybranych: 1
Filtry wybranego katalogu
Wyniki wyszukiwania dla: SECONDARY EMISSION
-
SEM micrographs of boron-doped nanocrystalline diamond-carbon nanospikes
Dane BadawczeThis dataset contains the Scanning Electron Microscopy (SEM) micrographs taken for rich boron-doped carbon crystalline nanospikes/nanograss structures, at different magnifications, encoded in the labels of the images. The micrographs were made using Hitachi S-3400N SEM microscope in secondary electron mode under 20 kV accelerating voltage. No additional...