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Wyniki wyszukiwania dla: imperfection
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Destruction of AFM probes during normal operation
Dane BadawczeThe quality of the images obtained with the use of an atomic force microscope is determined by the state of the blade interacting with the tested material. Image artifacts can be generated by various reasons, such as oxidation, contamination or an error in blade fabrication, but also appear as a result of the repeated scanning process and inevitable...