Wyniki wyszukiwania dla: optocouplers

• Identification of inherent noise components of semiconductor devices on an example of optocouplers

  Publikacja

  • B. Stawarz-Graczyk
  • A. Szewczyk
  • A. Konczakowska

  - OPTO-ELECTRONICS REVIEW - Rok 2009

  In the paper, a method of estimation of parameters of Gaussian and non-Gaussian components in the noise signal of semiconductor devices in a frequency domain is proposed. The method is based on composing estimators of two spectra, corresponding to noise (Gaussian component) and two-level RTS noise (non-Gaussian component). The proposed method can be applied for precise evaluation of the corner RTS frequency fRTS in the noise...

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• Identification of Optocoupler Devices with RTS Noise

  Publikacja

  • A. Konczakowska
  • J. A. Cichosz
  • A. Szewczyk
  • B. Stawarz-Graczyk

  - FLUCTUATION AND NOISE LETTERS - Rok 2006

  The results of noise measurements in low frequency range for CNY 17 type optocouplers are presented. The research were carried out on devices with different values of Current Transfer Ratio (CTR). The methods for identification of Random Telegraph Signal (RTS) in noise signal of optocouplers were proposed. It was found that the Noise Scattering Pattern method (NSP method) enables to identify RTS noise as non-Gaussian component...

• Analysis of noise properties of the optocoupler device

  Publikacja

  • A. Konczakowska
  • J. A. Cichosz
  • A. Szewczyk
  • B. Stawarz-Graczyk

  - OPTO-ELECTRONICS REVIEW - Rok 2007

  In the paper the localization of a source of Random Telegraph Signal noise (RTS noise) in optocoupler devices type CNY 17 were defined. The equivalent noise circuit in low frequency noise for these type optocouplers was proposed.

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• A method of RTS noise identification in noise signals of semiconductor devices in the time domain

  Publikacja

  • B. Stawarz-Graczyk
  • D. Dokupil
  • P. Flisikowski

  - Metrology and Measurement Systems - Rok 2010

  In the paper a new method of Random Telegraph Signal (RTS) noise identification is presented. The method is based on a standardized histogram of instantaneous noise values and processing by Gram-Charlier series. To find a device generating RTS noise by the presented method one should count the number of significant coefficients of the Gram-Charlier series. This would allow to recognize the type of noise. There is always one (first)...

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• The Methods for RTS Noise Identification

  Publikacja

  • A. Konczakowska
  • B. Stawarz-Graczyk

  - Rok 2009

  In the paper authors present two methods, which allows to identify the RTS noise in noise signal of semiconductor devices. The first one was elaborated to identify the RTS noise and also to estimate the number of its levels. The second one can be used to estimate all of the parameters of Gaussian and non-Gaussian components in the noise signal in a frequency domain.