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Search results for: roughness
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Sound signals generated during lapping of technical ceramics using electroplated tools with diamond grains
Open Research DataData contains the recordings of sound generated during single-sided lapping with the use of electroplated diamond tools. This relationship was examined with the use of spectral analysis of the sound signal in the frequency domain with a focus on the Ra parameter of the surface roughness. The estimated sound coefficient increased as the surface roughness...
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Laser microscope profilometry of SrTi0.3Fe0.7O3-d electrode surface after quickly drying
Open Research DataThe dataset consists of a surface image, topography and profilometry obtained using a Keyence VK-X1000 confocal laser microscope for SrTi0.3Fe0.7O3-d electrode (STF70). Imaging was performed to determine surface roughness. The Keyence VK-X1000 uses a 404 nm laser to map and measure the surface of samples via confocal scanning or a wide-field variable...
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Laser microscope profilometry of (Ce0.80Gd0.20)O1.90 surface before polishing
Open Research DataThe dataset consists of a surface image and topography obtained using a Keyence VK-X1000 confocal laser microscope for (Ce0.80Gd0.20)O1.90 substrate (CGO-20). Imaging was performed to determine surface roughness. The Keyence VK-X1000 uses a 404 nm laser to map and measure the surface of samples via confocal scanning or a wide-field variable focus. The...
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Laser microscope profilometry of SrTi0.3Fe0.7O3-d electrode surface after slowly drying
Open Research DataThe dataset consists of a surface image, topography and profilometry obtained using a Keyence VK-X1000 confocal laser microscope for SrTi0.3Fe0.7O3-d electrode (STF70). Imaging was performed to determine surface roughness. The Keyence VK-X1000 uses a 404 nm laser to map and measure the surface of samples via confocal scanning or a wide-field variable...
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Laser microscope profilometry of (Ce0.80Gd0.20)O1.90 after ∼3 μm surface finish
Open Research DataThe dataset consists of a surface image and topography obtained using a Keyence VK-X1000 confocal laser microscope for (Ce0.80Gd0.20)O1.90 substrate (CGO-20). Imaging was performed to determine surface roughness. The Keyence VK-X1000 uses a 404 nm laser to map and measure the surface of samples via confocal scanning or a wide-field variable focus. The...
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The AFM topographic measurements of the surface heterogeneity of iron hexacyanoferrate on a steel surface
Open Research DataMeasurements in semi-contact mode. NTEGRA Prima (NT-MDT) device. NSG 01 probe.
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AFM images of the platinum (111) single crystal surface as delivered, without the polishing treatment
Open Research DataPlatinum (111) single crystal surface images as delivered, without polishing treatment. Topographic measurements in contact mode. NTEGRA Prima (NT-MDT) device. CSG probe 10.
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The influence of external interference on AFM imaging, the use of a protective helmet
Open Research DataThis collection is of purely practical importance, showing how the presence of external disturbances can adversely affect the quality of imaging with an atomic force microscope. For this reason, it is also advisable to provide a link to a workshop-like study [1] as well as a huge number of commercial solutions available after entering the keyword "AFM...
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AeroSense Measurements: Wind Tunnel ETH Zurich
Open Research DataData from wind tunnel tests of Aerosesne measurement system installed on NACA 0012 at ETH Zurich wind tunnel.
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A study of the alignment of information sounds in public spaces - dataset
Open Research DataDataset used during work on master's thesis. Contains R scripts, used recordins (.wav) and csv files with results of objective and subjective analysis.
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The AFM micrographs of isotropic etching silicon substrates (111)
Open Research DataThe DataSet contains the atomic force microscope images of isotropic etching silicon substrates (111). The silicon wafers were etched in a mixture of nitric acid, hydrofluoric acid, and acetic acid in the ratio of 40:1:15. The soaking time for the substrates was from 20 to 90 seconds