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Search results for: surface profile
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Depth profile of the gold-silver bimetallic structures
Open Research DataSilver and gold bimetallic layers were deposited on a silicon substrate by magnetron sputtering method. Both, Au and Ag layers had 3 nm of thickness. That prepared nanostructures were measured by XPS method. To obtain a depth profile of chemical composition, an Argon ion (Ar+) gun was used for etching surface of sample. Each cycle of etching takes 30...
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Depth profile of the chemical composition of the Au-Ag multilayers
Open Research DataSilver and gold multilayers were deposited on a silicon substrate by magnetron sputtering method. Both type, Au and Ag thin films had 2 nm of thickness. Totally structure had thickness of 6 nm (Au-Ag-Au). That prepared multilayers were measured by XPS method. To obtain a depth profile of chemical composition, an Argon ion (Ar+) gun was used for etching...
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Integrated circuit structure surface images obtained with contact capacitive imaging technique
Open Research DataThe measurements were done using NTEGRA Prima (NT-MDT) device. CSG 10Pt probe.
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Microbiological analysis of sea water and bottom sediments in Kosakowo – Gdańsk profile
Open Research DataThis dataset contains the results of microbiological analysis of sea water and bottom sediments in Kosakowo – Gdańsk profile in 2013 - 2014 . The tested material consisted of water samples (surface water and bottom water) and bottom sediment samples. Water and sediment samples were analysed for the following: number of Enterobacteriaceae genus bacteria,...
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Results of calibration of the piezoelectric scanner using the probe TGQ1
Open Research DataTeaching file. Results of calibration of the piezoelectric scanner using the probe TGQ1. Scanning in contact mode. NTEGRA Prima (NT-MDT) device. CSG probe 10.
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CTD Gdańsk Deep_2001_2005
Open Research DataDataset includes measurements of conductivity (mS cm-1), temperature (°C), sound speed (m s-1) and salinity (PSU) made with the probe Falmouth Scientific Inc. The research was carried out in 2001 (at the turn of May and June), 2003 (beginning of May), 2005 (end of April) and in 2002 and 2004 (at the turn of September and October). In 2002, only temperature...
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Statistics of AFM current-voltage curves
Open Research DataMapping surface electrical conductivity offers enormous cognitive possibilities regarding the structure and properties of modern materials. The technique invented for this purpose (Conductive AFM) by Murrel's team and colleagues allows independent monitoring of the local conductivity of materials in correlation with the topographic profile. The mentioned...
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Depth chemical profile in a CeIr3 sample
Open Research DataThe polycrystalline sample of CeIr3 used in the present studies was synthesized by arc-melting cerium (4N) and iridium (3N5) in an arc furnace on a water-cooled copper hearth using a tungsten electrode under a high purity argon atmosphere. A piece of zirconium was used as an oxygen getter. First, a button of Ir was prepared by arc-melting the iridium...
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Finite element models used in diagnostics of transverse cracks in bridge approach pavement
Open Research DataTransverse cracks in the asphalt pavement were observed on bridge structures next to single-module expansion joints with a 5 meter approach slab set at the depth of 1 m. The finite element (FE) models of the approach pavement were created to investigate the reasons of premature cracking and crack initiation mechanism over the back edge of the abutment...
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Jumping Wave 2D Profiles
Open Research DataThe file contains 2D profiles obtained from a jumping wave study in front of the tool during burnishing of 1.0562 steel by the toroidal-cone tool. Burnishing speed 30.5 m/min, feed of burnishing 0.2mm/rev Force 550 and 800 N.