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Search results for: ELECTRONIC EMBEDDED SYSTEMS
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A self-testing method of large analog circuits in electronic embedded systems
PublicationPrzedstawiono metodę samotestowania filtrów wyższych rzędów składających się z łańcucha pierwszego lub drugiego rzędu filtrów (bloków) zaimplementowanych w mieszanych sygnałowo elektronicznych systemach wbudowanych sterowanych mikrokontrolerami lub procesorami sygnałowymi.Idea metody bazuje na fakcie, iż odpowiedź danego bloku jest traktowana jako sygnał pobudzenia kolejnego bloku. Dzięki temu rozwiązaniu rekonfigurowalny układ...
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A method of fault diagnosis of analog parts of electronic embedded systems with tolerances
PublicationPrzedstawiono nową metodę detekcji i lokalizacji uszkodzeń w częściach analogowych z tolerancjami elementów nieuszkodzonych mieszanych sygnałowo elektronicznych systemów wbudowanych sterowanych mikrokontrolerami. Metoda składa się z trzech etapów. W pierwszym etapie tworzony jest słownik uszkodzeń przez aproksymację rodziny pasów lokalizacyjnych. W etapie pomiarowym wewnętrzny licznik mikrokontrolera mierzy czasy trwania impulsów...
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Two‐functional μBIST for Testing and Self‐Diagnosis of Analog Circuits in Electronic Embedded Systems
PublicationThe paper concerns the testing of analog circuits and blocks in mixed‐signal Electronic Embedded Systems (EESs), using the Built‐in Self‐Test (BIST) technique. An integrated, two‐functional, embedded microtester (μBIST) based on reuse of signal blocks already present in an EES, such as microprocessors, memories, ADCs, DACs, is presented. The novelty of the μBIST solution is its extended functionality. It can perform 2 testing functions:...
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A solution of the integrated µBIST for functional and diagnostic testing in mixed-signal electronic embedded systems
PublicationMain problem of the paper is testing of analog circuits and blocks in mixed-signal electronic embedded systems (EESs), using the built-in self-test (BIST) technique. The integrated mBIST based on reusing signal blocks already present in an EES, such as processors, memories, ADCs, is presented. The novelty of the solution is the extended functionality of the mBIST. It can perform 2 testing functions: functional testing and fault...
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Using an IEEE1149.1 Test Bus for Fault Diagnosis of Analog Parts of Electronic Embedded Systems
PublicationThe new solution of a BIST called the JTAG BIST for self-testing of analog parts of electronic embedded systems is presented in the paper. The JTAG BIST consists of the BCT8244A and SCANSTA476 integrated circuits of Texas Instruments controlled via the IEEE 1149.1 bus. The BCT8244A is a scan test device with octal buffers, and the SCANSTA476 is a 12-bit ADC with 8 analog input channels. Self-testing approach is based on the fault...
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A method of self-testing of an analog circuit terminated by an ADC in electronic embedded systems controlled by microcontrollers
PublicationA new self-testing method of analog parts terminated by an ADC in electronic embedded systems controlled by microcontrollers is presented. It is based on a new fault diagnosis method based on on-line (i.e. during measurement), transformations of voltage samples of the time response of a tested part to a square pulse - onto localization curves placed in the measurement space. The method can be used for fault detection and single...
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Using a square-wave signal for fault diagnosis of analog parts of mixed-signal electronic embedded systems
PublicationArtykuł przedstawia nowe podejście do detekcji i lokalizacji pojedynczych katastroficznych i parametrycznych uszkodzeń części analogowych w mieszanych sygnałowo elektronicznych systemach wbudowanych. Podejście składa się z trzech etapów: tworzenia słownika uszkodzeń na podstawie krzywych identyfikacyjnych, etapu pomiarowego w którym układ badany pobudzany jest falą prostokątną generowaną przez mikrokontroler a odpowiedź jest próbkowana...
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Implementation of an input-output method of diagnosis of analog electronic circuits in embedded systems
PublicationPrzedstawiono implementację zmodyfikowanej metody 2D detekcji i lokalizacji uszkodzeń sieci analogowych z uwzględnieniem tolerancji elementów nieuszkodzonych w systemach wbudowanych bazujących na mikrokontrolerach. Metoda składa się z dwóch etapów: przedtestowego - tworzenie słownika uszkodzeń i testowego, w którym dokonywany jest pomiar przez mikrokontroler amplitudy i przesunięcia fazowego odpowiedzi na pobudzenie przebiegiem...
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Application of Complementary Signals in Built-In Self Testers for Mixed-Signal Embedded Electronic Systems
PublicationThis paper concerns the implementation of shape-designed complementary signals (CSs), matched to the frequency characteristic of the circuit under test, in built-in self testers (BISTs), dedicated to mixed-signal embedded electronic systems for testing their analog sections. The essence of the proposed method and solution of CS BIST is low-cost realization on the base of hardware and software resources of microcontrollers used...
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Test Design Patterns for Embedded Systems,
PublicationTest suites for embedded systems are typically created from scratch using dif- ferent, often inadequate methods. In consequence, industry branches dealing with software-intensive embedded systems have to cope with quality problems, even though test processes are particularly time-consuming and costly. Based on an evolving model-based testing methodology we introduce test design patterns for simplifying and accelerating...
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IPNES - Interpreted Petri Net for Embedded Systems
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DESIGN AUTOMATION FOR EMBEDDED SYSTEMS
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International Journal of Embedded Systems
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EURASIP Journal on Embedded Systems
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IEEE Embedded Systems Letters
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Smart Embedded Systems with Decisional DNA Knowledge Representation
PublicationEmbedded systems have been in use since the 1970s. For most of their history embedded systems were seen simply as small computers designed to accomplish one or a few dedicated functions; and they were usually working under limited resources i.e. limited computing power, limited memories, and limited energy sources. As such, embedded systems have not drawn much attention from researchers, especially from those in the artificial...
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Decisional DNA based embedded systems: a new perspective
PublicationOmówiono nowe kierunki i perspektywy badań w zakresie systemów podporządkowanych opartych na decyzyjnym DNA.
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Performance Analysis of Convolutional Neural Networks on Embedded Systems
PublicationMachine learning is no longer confined to cloud and high-end server systems and has been successfully deployed on devices that are part of Internet of Things. This paper presents the analysis of performance of convolutional neural networks deployed on an ARM microcontroller. Inference time is measured for different core frequencies, with and without DSP instructions and disabled access to cache. Networks use both real-valued and...
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Model-Based Testing of Embedded Systems in the Automotive Domain
PublicationPhD
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Electronic and Photonic Systems Wilga 2014
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Electronic and Photonic Systems Wilga 2014
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Advanced Photonic and Electronic Systems WILGA 2017
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Advanced photonic and electronic systems WILGA 2016
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Advanced Photonic and Electronic Systems WILGA 2010
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International Journal of Advances in Embedded Systems
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International Journal of Reconfigurable and Embedded Systems
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ACM Transactions on Embedded Computing Systems
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PSoC embedded systems and its potential applications in wireless sensors network
PublicationW artykule zostanie przedstawiona koncepcja bezprzewodowej sieci sensorowej z wykorzystaniem mikrokontrolerów PSoC firmy Cypress. Mikrokontrolery PSoC (ang. Programmable System on a Chip) to 8-bitowe uniwersalne układy programowalne znajdujące zastosowanie między innymi w przemyśle, elektronice medycznej, telekomunikacji i samochodowych systemach sterowania. Mikrokontrolery PSoC pozwalają użytkownikom wybierać rodzaj i liczbę peryferiów...
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Selected Methods For Increases Reliability The Of Electronic Systems Security
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A Taxonomy of Model-Based Testing for Embedded Systems from Multiple Industry Domains
PublicationThis chapter provides a taxonomy of Model-Based Testing (MBT) based on the approaches that are presented throughout this book as well as in the related literature. The techniques for testing are categorized using a number of dimensions to familiarize the reader with the terminology used throughout the chapters that follow. In this chapter, after a brief introduction, a general definition of MBT and related work on available MBT...
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Space and High Energy Experiments Advanced Electronic Systems 2012
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IACR Transactions on Cryptographic Hardware and Embedded Systems
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International Conference on Embedded Wireless Systems and Networks
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Practical Approach to Large-Scale Electronic Structure Calculations in Electrolyte Solutions via Continuum-Embedded Linear-Scaling Density Functional Theory
PublicationWe present the implementation of a hybrid continuum-atomistic model for including the effects of a surrounding electrolyte in large-scale density functional theory (DFT) calculations within the Order-N Electronic Total Energy Package (ONETEP) linear-scaling DFT code, which allows the simulation of large complex systems such as electrochemical interfaces. The model represents the electrolyte ions as a scalar field and the solvent...
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Power electronic systems as a crucial part of Smart Grid infrastructure - a survey
PublicationThis article gives a tutorial overview of the most important issues related to the use of power electronic systems in power engineering, with respect to the urgent need for modernization of existing grids in the direction of intelligent networks. The main problems and conditions bound up with the construction of Smart Grids and the location, as well as functioning in them of the most important power electronic systems are presented...
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Documentation generator for VHDL and MatLab source codes for photonic and electronic systems
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Documentation generator for VHDL and MatLab source codes for photonic and electronic systems
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Preferred Benchmarking Criteria for Systematic Taxonomy of Embedded Platforms (STEP) in Human System Interaction Systems
PublicationThe rate of progress in the field of Artificial Intelligence (AI) and Machine Learning (ML) has significantly increased over the past ten years and continues to accelerate. Since then, AI has made the leap from research case studies to real production ready applications. The significance of this growth cannot be undermined as it catalyzed the very nature of computing. Conventional platforms struggle to achieve greater performance...
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Efficient algorithm for blinking LED detection dedicated to embedded systems equipped with high performance cameras
PublicationThis paper presents the concept and implementation of an efficient algorithm for detection of blinking LED or similar signal sources. Algorithm is designed for embedded devices equipped with high performance cameras being a part of an indoor positioning embedded system. An algorithm to be implemented in such a system should be efficient in terms of computational power what is hard to be achieved when large amount of data from camera...
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Advanced photonic, electronic, and web engineering systems: WILGA Symposium, January 2013
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Reliability analysis of aerodrome’s electronic security systems taking into account electromagnetic interferences
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International Journal of Embedded and Real-Time Communication Systems
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Model-Driven Testing of Real-Time Embedded Systems - From Object Oriented towards Function Oriented Development
PublicationMBD
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IEEE AEROSPACE AND ELECTRONIC SYSTEMS MAGAZINE
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IEEE TRANSACTIONS ON AEROSPACE AND ELECTRONIC SYSTEMS
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PROGRAM-ELECTRONIC LIBRARY AND INFORMATION SYSTEMS
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Electronic Journal of Information Systems in Developing Countries
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A testing method of analog parts of mixed-signal electronic systems equipped with the IEEE1149.1 test bus
PublicationA new solution of the JTAG BIST for testing analog circuits in mixed-signal electronic microsystems controlled by microcontrollers and equipped with the IEEE1149.1 bus is presented. It is based on a new fault diagnosis method in which an analog circuit is stimulated by a buffered signal from the TMS line, and the time response of the circuit to this signal is sampled by the ADC equipped with the JTAG. The method can be used for...
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Institute of electronic systems in CARE and EuCARD projects accelerator and FEL research, development and applications in Europe
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Institute of electronic systems in CARE and EuCARD projects accelerator and FEL research, development and applications in Europe
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