Katalog Danych Badawczych - Scanning Probe Microscopies data
Dane badawcze rozpoczynające się od: M wyczyść
Filtry
wszystkich: 49
wybranych: 3
Katalog Danych Badawczych
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Microscopic examination of the texture of paper products
Dane BadawczeAtomic force microscopy (AFM) can be used to study the state of the paper fibers with the aim of providing qualitative and semi-quantitative information on degradation and aging. The work [1] reports the results of tests of various paper products subjected to deliberate aging processes under the influence of various factors. Chemical and biological...
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Morphology and conductivity investigations of nickel-molybdenium alloy by means of Scanning Spreading Resistance Microscopy
Dane BadawczeElectrolytically deposited nickel-molybdenum alloys are interesting materials because of their high corrosion resistance and low over-potential for hydrogen evolution. Despite many studies devoted to the deposition of these alloys, the mechanism of co-deposition is not fully understood [1]. The aim of the research was to preserve the electrochemically...
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Mechanical lithography in a polymer substrate using AFM in contact mode
Dane BadawczeMechanical lithography in a polymer substrate. Contact mode. NTEGRA Prima (NT-MDT) device. NSG 01 probe.