Dane badawcze rozpoczynające się od: S wyczyść
Filtry
wszystkich: 24619
wybranych: 434
Katalog Danych Badawczych
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SEM micrographs of the V2O5 nanorods after thermal treatment under reducing atmosphere
Dane BadawczeThe DataSet contains the SEM micrographs of V2O5 nanorods after thermal treatment under a reducing atmosphere. Samples were annealed at 450C for 2, 20, and 40h under a reducing atmosphere (94% Ar, 6% H2).
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SEM micrographs of VO2 and V6O13 nanostructures
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of VO2 and V6O13 thin films deposited on a silicon substrate. The as-prepared thin films were annealing under a reducing atmosphere (94% Ar, 6% H2) at 600 and 700C for 10h.
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SEM micrographs of morphology evolution of V2O5 thin films on silicon substrate
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of V2O5 thin films deposited on a silicon substrate. The as-prepared thin films were annealing under an oxidizing atmosphere in the temperature range 250-600C. The results show that the morphology of the films dependent on the annealing temperature.
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SEM micrographs of ammonium vanadate nanocrystals
Dane BadawczeThe DataSet contains the electron microscopy (SEM) micrographs of ammonium vanadate nanobelts obtained by the hydrothermal method with different conditions. The results show that the morphology of samples dependent on reaction conditions.
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SEM micrographs of NH4VO3 crystals - molar concetration factor after annealing
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of NH4VO3 nano_crystals obtained by the LPE-IonEx method with different morphology after annealing at 400C under argon atmosphere (with a heating rate of 10 C/min).
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SEM micrographs of V2O5 thin film morphology dependent on substrate types
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of V2O5 thin film morphology dependent on substrate types. The as-prepared thin films were deposited on alumina, zirconium, zirconium oxide and metallic vanadium substrate, then was annealing under an oxidizing atmosphere at 600C for 10h. The results show that the morphology of...
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SEM micrographs of morphology evolution of V2O5 thin films on quartz glass
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of V2O5 thin films deposited on a quartz glass substrate. The as-prepared thin films were annealing under an oxidizing atmosphere in the temperature range 200-600C. The results show that the morphology of the films dependent on the annealing temperature.
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SEM images of symmetrical cell interface with SrTi0.65Fe0.35O3-d electrode and CGO-20 substrate in function of sintering temperature
Dane BadawczeThis dataset contains images of polished cross section of symmetrical cell interface with SrTi0.65Fe0.35O3-d electrode and CGO-20 substrate in function of sintering temperature (800 °C, 900°C and 1000 °C) . Images were obtained using a PhenomXL (Thermo Fisher Scientific, the Netherlands) scanning electron microscope (SEM) with an accelerating voltage...
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SEM images of symmetrical cell interface with SrTi0.50Fe0.50O3-d electrode and CGO-20 substrate in function of sintering temperature
Dane BadawczeThis dataset contains images of polished cross section of symmetrical cell interface with SrTi0.50Fe0.50O3-d electrode and CGO-20 substrate in function of sintering temperature (800 °C, 900°C and 1000 °C) . Images were obtained using a PhenomXL (Thermo Fisher Scientific, the Netherlands) scanning electron microscope (SEM) with an accelerating voltage...
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SEM images of symmetrical cell interface with SrTi0.30Fe0.70O3-d electrode and CGO-20 substrate in function of sintering temperature
Dane BadawczeThis dataset contains images of polished cross section of symmetrical cell interface with SrTi0.30Fe0.70O3-d electrode and CGO-20 substrate in function of sintering temperature (800 °C, 900°C and 1000 °C) . Images were obtained using a PhenomXL (Thermo Fisher Scientific, the Netherlands) scanning electron microscope (SEM) with an accelerating voltage...
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Sounding rocket temperature and heat transfer data
Dane BadawczeThis dataset contains temperature and heat transfer data measured during REXUS 25 sounding rocket HEDGEHOG Experiment launched from Esrange Space Centre, Kiruna, Sweden. For experiment details, please see:
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SEM image and EDS map of SrTi0.30Fe0.70O3-d powder aglomerate
Dane BadawczeThis dataset contains image of the SrTi0.30Fe0.70O3-d powder aglomerate with EDS map analysis results. Images were obtained using a PhenomXL (Thermo Fisher Scientific, the Netherlands) scanning electron microscope (SEM) with an accelerating voltage of 10 kV in a high vacuum mode. The chemical compositions of the investigated powder were determined...
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SEM image and EDS map of SrTi0.50Fe0.50O3-d powder aglomerate
Dane BadawczeThis dataset contains image of the SrTi0.50Fe0.50O3-d powder aglomerate with EDS map analysis results. Images were obtained using a PhenomXL (Thermo Fisher Scientific, the Netherlands) scanning electron microscope (SEM) with an accelerating voltage of 10 kV in a high vacuum mode. The chemical compositions of the investigated powder were determined...
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SEM image and EDS map of SrTi0.65Fe0.35O3-d powder aglomerate
Dane BadawczeThis dataset contains image of the SrTi0.65Fe0.35O3-d powder aglomerate with EDS map analysis results. Images were obtained using a PhenomXL (Thermo Fisher Scientific, the Netherlands) scanning electron microscope (SEM) with an accelerating voltage of 10 kV in a high vacuum mode. The chemical compositions of the investigated powder were determined...
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SEM examination of surface layer of C45 steel after grinding on defferent depth
Dane BadawczeFerrite examination for the medium carbon structural steel with low content of Mn, Si, Cu, Cr and Ni after its grinding to a depth of 2 µm, 8 µm, 14 µm and 20 µm, at constant wheel circumferential speed of vs = 25 m/s and constant feed rate vft = 1 m/min. It was shown that the grinding of C45 steel causes strong work hardening of ferrite in surface...
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Structure and optical measurements of Eu doped tellurium oxide thin films
Dane BadawczeThin films were deposited by magnetron sputtering method and simultaneously heated at 200 oC. Presence of Eu ions and their valence states was confirmed by X-ray photoemission spectroscopy measurements. The structure of the films as well as the influence of europium dopant on crystalline structure of the films was examined by X-ray diffraction method. ...
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Split-beam echosounder data from Puck Bay autumn 2018 Part II
Dane BadawczeThe acoustic data was collected in 2018, in the Bay of Puck, in the seasons: autumn. Data was collected during the day and night. Three split-beam echosounders with frequencies of 38 kHz, 120 kHz and 333 kHz were used to collect the data. The data was collected at a designated study area not far from the city of Hel and on the route Hel - Gdynia while...
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Stages of development of payment cards in Poland
Dane BadawczeAn important stage in the development of the Polish card market was the commencement of the card and check center of Bank Pekao SA in 1992, which became a professional technical background for the widespread issuance of bank cards. At the same year PolCard SA, became the first agent in the country, launched its own terminals for payment intermediation...
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Structure of foreigners registered for retirement and disability pension insurance by citizenship (%) - at the end of the year
Dane BadawczeThe structure of foreigners registered for insurance, divided by citizenship, changed dynamically. The share of foreigners from the EU regularly decreases (from 25.1% in December 2008 to 6.3% in December 2018), while the share of foreigners from outside the EU is steadily growing (from 74.9% in December 2008 to 93.7% in December 2018). The largest changes...
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Simulation of perovskite-based CuI/CH3NH3PbI3/ZnO solar cell performance
Dane BadawczeThe presented data set is part of the theoretical research on novel thin-layer lead-halide perovskite solar cells with different inorganic transparent conductive oxides used as charge transport layers. In this study CuI/CH3NH3PbI3/ZnO model structure (Model 3) was investigated by the use of the SCAPS-1D simulation method (https://scaps.elis.ugent.be/).