Wyniki wyszukiwania dla: IMAGER CHARACTERIZATION

• A High-Efficient Measurement System With Optimization Feature for Prototype CMOS Image Sensors

  Publikacja

  • M. Kłosowski
  • J. Jakusz
  • W. Jendernalik
  • G. Blakiewicz
  • S. Szczepański
  • S. Kozieł

  - IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT - Rok 2018

  In this paper, a gray-scale CMOS image sensor (CIS) characterization system with an optimization feature has been proposed. By using a very fast and precise control of light intensity, based on the pulsewidth-modulation method, it is avoided to measure the illuminance every time. These features accelerate the multicriteria CIS optimization requiring many thousands of measurements. The system throughput is 2.5 Gb/s, which allows...

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