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Wyniki wyszukiwania dla: X-ray diffraction
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X-ray diffraction patterns of BaCe0.6Zr0.2Y0.1M0.1O3-δ (M = Fe, Pr, Tb)
Dane BadawczeThe dataset consists of three raw X-ray diffraction (XRD) files collected using a Phillips X’Pert Pro diffractometer (CuKα radiation (𝜆 = 1.541 Å), under 40 kV and 30 mA). The diffraction patterns of BaCe0.6Zr0.2Y0.1Fe0.1O3-δ (BCZYFe), BaCe0.6Zr0.2Y0.1Pr0.1O3-δ (BCZYPr), and BaCe0.6Zr0.2Y0.1Tb0.1O3-δ (BCZYTb) were collected at room temperature. Collected...
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Powder x-ray diffraction pattern of polycrystalline Cu(IO3)2*xH2O
Dane BadawczeHydrated copper(II) iodate sample was prepared in water solution by reacting copper(II) sulfate and potassium iodate, following the method described by Peterson (J. Chem. Educ. 1957, 34, 12, 612). The sample was subsequently dried at various temperatures in order to produce an anhydrous Cu(IO3)2:
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X-ray diffraction of ZnIn2S4 layers on TiO2NT and FTO annealed at different temperatures
Dane BadawczeData show XRD results for ZnIn2S4 layers deposited using hydrothermal method on FTO glass and TiO2 nanotubes. The layers were annealed in air atmosphere at 300, 400 and 500 oC.
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X-ray Diffraction (XRD) patterns of PC-X (porous carbon materials obtained at various temperatures)
Dane BadawczeThese data contain X-ray diffraction patterns (XRD) of PC-700 (porous carbon materials obtained at 700°C), PC-800 (porous carbon materials obtained at 800°C) and PC-900 (porous carbon materials obtained at 900°C).
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High resolution X-ray diffractometry and reflectometry of semiconductor nano- and micro- structures based on X-ray refractive optics
PublikacjaIn this thesis proposed, discussed and studied novel synchrotron X-ray diffractometry and reflectometry methods based on a refractive optics. The experimental results obtained from the ID06 beamline at ESRF, Grenoble, France are presented and analyzed in this work to demonstrate a high angular and space resolution in addition to the opportunity to manage in situ and on operando experiments with the help of proposed X-ray optical...
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XRD (X-ray Diffraction) patterns of PMH, PMD and simulated MIL-53(Al)
Dane BadawczeThese data contain XRD (X-ray Diffraction) patterns of PMH, PMD and simulated MIL-53(Al). The results were recorded by a Philipsdiffractometer using Cu Ka radiation. Sample abbreviations (PMH, PMD, MIL-53(Al)) are in agreement with the markings used in the linked publication.
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The structure of vanadate glass-ceramics containing BaTiO3 measured with X-ray diffraction method
Dane BadawczeThe structure of vanadate glass-ceramics doped with BaTiO3 was measured by XRD. Samples of the composition of x[BaO,TiO2]–(80 − x)V2O5–20Bi2O3 where x = 5, 10 and 15 in mol% were prepared by a conventional melt quenching technique. The melting was performed in alumina crucibles at the temperature of 1273 K–1373 K. The melts were poured on a preheated...
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The structure of Bi2VO5.5 ceramic prepared by 3 different ways measured with X-ray diffraction
Dane BadawczeThe structure of Bi2VO5.5 ceramics was measured by XRD.
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The structure of 70(2Bi2O3-V2O5) - 30SrBO7 measured with X-ray diffraction and SEM methods
Dane BadawczeThe structure changes of 70(2Bi2O3-V2O5)-30SrB4O7 glass occurred during increase in temperature was measured by XRD and SEM.
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X-Ray Structure Analysis Online
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