Search
Filters
total: 108
filtered: 62
Chosen catalog filters
Search results for: INTERFEROMETR FABRY-PEROTA
-
Spectroscopic Optical Coherence Tomography for Thin Layer and Foil Measurements
PublicationThe main goal of this research was to assess if it is possible to evaluate the thickness of thin layers (both thin films on the surface and thin layers below the surface of the tested object) and foils using optical coherence tomography (OCT) for thickness assessment under the resolution of the standard commercially available OCT measurement system. In the proposed solution, light backscattered from the evaluated thin layer has...
-
FIBRE-OPTIC SENSOR FOR SIMULTANEOUS MEASUREMENT OF THICKNESSAND REFRACTIVE INDEX OF LIQUID LAYERS
PublicationIn this paper, we present a fibre-optic sensor for simultaneous measurement of refractive index and thickness of liquid layers. We designed an experimental low-coherence setup with two broadband light sources and an extrinsic fibre-optic Fabry–Pérot interferometer acting as the sensing head. We examined how the refractive index of a liquid film and its thickness affect spectrum at the output of a fibre-optic interferometer. We...
-
Temperature Sensors Based on Polymer Fiber Optic Interferometer
PublicationTemperature measurements are of great importance in many fields of human activities, including industry, technology, and science. For example, obtaining a certain temperature value or a sudden change in it can be the primary control marker of a chemical process. Fiber optic sensors have remarkable properties giving a broad range of applications. They enable continuous real-time temperature control in difficult-to-reach areas, in...
-
Implementation of SiN thin film in fiber-optic sensor working in telecommunication range of wavelengths
PublicationMirrors are used in optical sensors and measurement setups. This creates a demand for mirrors made of new materials and having various properties tailored to specific applications. In this work, we propose silicon covered with a thin silicon nitride layer as a mirror for near-infrared measurements. SiN layer was deposited on a standard silicon wafer with a Low-Pressure Chemical Vapor Deposition furnace. Then, the created layer...
-
Stability of thin film diamond mirror for applications in interferometers under the short-time exposure on selected aggressive chemicals
PublicationIn presented study a thin boron-doped diamond film was proposed for application in the interferometry as a highly durable optical mirror. The unique properties of the diamond films, like high chemical stability and hardness, allow them to be used even in the chemically aggressive environment, where the commonly used silver mirrors can be susceptible to damage. The investigated nanodiamond layer was fabricated by uPE CVD method...
-
Incorporation of nitrogen in diamond films – A new way of tuning parameters for optical passive elements
PublicationThis paper investigates the impact of nitrogen incorporation in diamond films for the construction of an interferometric sensor to measure displacement. Diamond films with different nitrogen levels (0–5%) were deposited on silicon substrates by microwave plasma enhanced chemical vapor deposition. The structural characteristics of these samples are characterized using scanning electron microscopy (SEM), atomic force microscopy (AFM), confocal...
-
Global Complex Roots and Poles Finding Algorithm in C × R Domain
PublicationAn algorithm to find the roots and poles of a complex function depending on two arguments (one complex and one real) is proposed. Such problems are common in many fields of science for instance in electromagnetism, acoustics, stability analyses, spectroscopy, optics, and elementary particle physics. The proposed technique belongs to the class of global algorithms, gives a full picture of solutions in a fixed region ⊂ C × R and...
-
Incorporation of nitrogen in diamond films - A new way of tuning parameters for optical passive elements
PublicationThis paper investigates the impact of nitrogen incorporation in diamond films for the construction of an interferometric sensor to measure displacement. Diamond films with different nitrogen levels (0–5%) were deposited on silicon substrates by microwave plasma enhanced chemical vapor deposition. The structural characteristics of these samples are characterized using scanning electron microscopy (SEM), atomic force microscopy...
-
Nanocrystalline diamond sheets as protective coatings for fiber-optic measurement head
PublicationFiber-optic sensors find numerous applications in science and industry, but their full potential is limited because of the risk of damaging the measurement head, in particular, due to the vulnerability of unprotected tips of the fiber to mechanical damage and aggressive chemical agents. In this paper, we report the first use of a new nanocrystalline diamond structure in a fiber-optic measurement head as a protective coating of...
-
Preparation and Characterization of Microsphere ZnO ALD Coating Dedicated for the Fiber-Optic Refractive Index Sensor
PublicationWe report the fabrication of a novel fiber-optic sensor device, based on the use of a microsphere conformally coated with a thin layer of zinc oxide (ZnO) by atomic layer deposition (ALD), and its use as a refractive index sensor. The microsphere was prepared on the tip of a single-mode optical fiber, on which a conformal ZnO thin film of 200 nm was deposited using an ALD process based on diethyl zinc (DEZ) and water at 100 °C....
-
Computer support of analysis optical spectra measurements
PublicationVerification of measurement errors has a big impact on assessment of accuracy of conducted measurements and obtained results. In many cases computer simulation results are compared with measurement results in order to evaluate measurement errors. The purpose of our research was to check the accuracy of measurements made with Fabry-Perot interferometer working in the transmission mode. In measurement setup, a 1310 nm superluminescent...
-
Computer Support of Analysis of Optical Spectra Measurements
PublicationThe verification of measurement errors has a big impact on the assessment of the accuracy of conducted measurements and obtained results. In many cases, computer simulation results are compared with measurement results in order to evaluate measurement errors. The purpose of our research was to check the accuracy of measurements made with a Fabry–Perot interferometer working in the transmission mode. In the measurement setup, a...