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Wyniki wyszukiwania dla: MECHANO-CHEMICAL RECLAIMING

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Wyniki wyszukiwania dla: MECHANO-CHEMICAL RECLAIMING

  • XPS data of deuterium and hydrogen grown boron-doped diamond

    Dane Badawcze
    open access

    The high-resolution C1s X-ray absorption spectra of BDD@H and BDD@D samples were measured using the facilities of the HE-SGM beamline (HE-SGM) at the BESSY II synchrotron radiation source of Helmholtz–Zentrum Berlin (HZB).[90] The measurements were carried out under ultra-high vacuum conditions: P ≈ 2×10−9 Torr at T = 300 K. The NEXAFS spectra were...

  • Mn-Co nanofilms on nickel foam measured by XPS mehod

    Dane Badawcze
    open access

    Manganium-Cobaltium based thin films were electrochemically deposited on a Ni based subsrates in a one-step process at −1.1 V vs. Ag/AgCl in an aqueous solution of differently concentrated Mn(NO3)2·4H2O and Co(NO3)2·6H2O with the deposition time limited by charges of 60, 120, and 200 mC at 25 °C. The concentration ratios of Mn(NO3)2·4H2O to Co(NO3)2·6H2O...

  • Amplitude-distance spectroscopy in semi-contact mode

    Dane Badawcze
    open access - seria: Scanning Probe Microscopies data

    Since it was invented by Binnig et al. in 1986, atomic force microscopy (AFM) plays a key role in science and technology at the nanoscale. AFM is a microscopic technique that visualizes the surface topography using the attractive and repulsive forces of interaction between several atoms (in theory) of a blade attached to the end of the probe lever and...

  • Surface modifcation of PMMA polymer detected by XPS

    Dane Badawcze
    open access

    In order to obtain the experimental specimens, four PMMA/PC61BM samples with the following  mass proportions were prepared: 10%, 20%, 30%, and 40%. In addition, as a reference, a PMMA sample without  PC61BM was prepared as well. For the fabrication process, PC61BM 99.5% (Solenne BV), chloroform HPLC  (Sigma Aldrich), and PMMA (commercially available...