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Wyniki wyszukiwania dla: semiconductor
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Integrated circuit structure surface images obtained with contact capacitive imaging technique
Dane BadawczeThe measurements were done using NTEGRA Prima (NT-MDT) device. CSG 10Pt probe.
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Validation of result of STM probe fabrication
Dane BadawczeThe scanning tunneling microscope [1] is a powerful research tool that allows, among other things, to obtain images with atomic resolution. A serious limitation of the described microscope is its limited applicability relating to conductive and semiconductor materials and the reproducibility of measurements depending on the preparation of the measuring...