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Search results for: AIR HEAT EXCHANGER
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X-ray diffractometry results of the SrTi0.50Fe0.50O3-d powder
Open Research DataThis dataset contains results of X-ray diffractometry mesurement (XRD) of the SrTi0.50Fe0.50O3-d (STF50) powder after ball milling. The phase composition of the investigated STF50 powder was analyzed by XRD at room temperature. The X-ray diffractometry (XRD) technique was used to determine the phase composition of the fabricated powder. Measurements...
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X-ray diffractometry results of the SrTi0.35Fe0.65O3-d powder
Open Research DataThis dataset contains results of X-ray diffractometry mesurement (XRD) of the SrTi0.35Fe0.65O3-d (STF35) powder after ball milling. The phase composition of the investigated STF35 powder was analyzed by XRD at room temperature. The X-ray diffractometry (XRD) technique was used to determine the phase composition of the fabricated powder. Measurements...
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Low temperature electrical conductivity of the SrTi0.65Fe0.35O3-d pellet
Open Research DataThis dataset contains results of low temperature electrical conductivity measurements of dense SrTi0.65Fe0.35O3-d (STF35) pellet. DC electrical conductivity measurements of STF35 were performed by the Van der Pauw method between 400 °C and room temperature with 20 °C step. Studies were performed at Synthetic Air flow under humidified (~4 vol%) gas...
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Low temperature electrical conductivity of the SrTi0.30Fe0.70O3-d pellet
Open Research DataThis dataset contains results of low temperature electrical conductivity measurements of dense SrTi0.30Fe0.70O3-d (STF70) pellet. DC electrical conductivity measurements of STF70 were performed by the Van der Pauw method between 400 °C and room temperature with 20 °C step. Studies were performed at Synthetic Air flow under humidified (~4 vol%) gas...
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Low temperature electrical conductivity of the SrTi0.50Fe0.50O3-d pellet
Open Research DataThis dataset contains results of low temperature electrical conductivity measurements of dense SrTi0.50Fe0.50O3-d (STF50) pellet. DC electrical conductivity measurements of STF50 were performed by the Van der Pauw method between 400 °C and room temperature with 20 °C step. Studies were performed at Synthetic Air flow under humidified (~4 vol%) gas...
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X-ray diffractometry results of the SrTi0.30Fe0.70O3-d powder
Open Research DataThis dataset contains results of X-ray diffractometry mesurement (XRD) of the SrTi0.30Fe0.70O3-d (STF70) powder after ball milling. The phase composition of the investigated STF70 powder was analyzed by XRD at room temperature. The X-ray diffractometry (XRD) technique was used to determine the phase composition of the fabricated powder. Measurements...
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Low temperature electrical conductivity of the SrTi0.10Fe0.90O3-d pellet
Open Research DataThis dataset contains results of low temperature electrical conductivity measurements of dense SrTi0.10Fe0.90O3-d (STF90) pellet. DC electrical conductivity measurements of STF90 were performed by the Van der Pauw method between 400 °C and room temperature with 20 °C step. Studies were performed at Synthetic Air flow under humidified (~4 vol%) gas...
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Nonlinear impedance as a function of A.C. voltage for glass 40Bi2VO5.5-60SrB4O7 annealed at 473 K for 3h and next fully crystallized measured with impedance spectroscopy method at high temperature region
Open Research DataThe nonlinear electrcial properties as a function of A.C. voltage for annealed at 473 K for 3h and next fully crystallized 40Bi2VO5.5-60SrB4O7 glass was measured by impedance spectroscopy method.
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Nonlinear impedance as a function of A.C. voltage for fully crystallized 35Bi2VO5.5-65SrB4O7 glass measured with impedance spectroscopy method at high temperature region
Open Research DataThe nonlinear electrcial properties as a function of A.C. voltage for fully crystallized 35Bi2VO5.5-65SrB4O7 glass was measured by impedance spectroscopy method.
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Nonlinear impedance of 45Bi2VO5.5-55SrB4O7 fully crystallized glass measured with impedance spectroscopy method at high temperature region
Open Research DataThe nonlinear electrcial properties of 45Bi2VO5.5-55SrB4O7 fully crystallized glass was measured by impedance spectroscopy method.
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Nonlinear impedance as a function of A.C. voltage for annealed and next fully crystallized 50Bi2VO5.5-50SrB4O7 glass measured with impedance spectroscopy method at high temperature region
Open Research DataThe nonlinear electrcial properties as a function of A.C. voltage for annealed and next fully crystallized 50Bi2VO5.5-50SrB4O7 glass was measured by impedance spectroscopy method.
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Nonlinear impedance of as-quenched glass 40Bi2VO5.5-60SrB4O7 after full crystallization was measured with impedance spectroscopy method at high temperature region
Open Research DataThe nonlinear electrcial properties of as-quenched glass 40Bi2VO5.5-60SrB4O7 afetr full crystallization was measured by impedance spectroscopy method.
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Nonlinear impedance as a function of A.C. voltage for glass 40Bi2VO5.5-60SrB4O7 annealed at 593 K and next fully crystallized measured with impedance spectroscopy method at high temperature region
Open Research DataThe nonlinear electrcial properties as a function of A.C. voltage for annealed at 593 K and next fully crystallized 40Bi2VO5.5-60SrB4O7 glass was measured by impedance spectroscopy method.
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Nonlinear impedance of glass 40Bi2VO5.5-60SrB4O7 annealed at 473 K for 3h and next fully crystallized was measured with impedance spectroscopy method at high temperature region
Open Research DataThe nonlinear electrcial properties of glass 40Bi2VO5.5-60SrB4O7 annealed at 593 K and next fully crystallized was measured by impedance spectroscopy method.
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Nonlinear impedance of 35Bi2VO5.5-65SrB4O7 fully crystallized glass measured with impedance spectroscopy method at high temperature region
Open Research DataThe nonlinear electrcial properties of 35Bi2VO5.5-65SrB4O7 fully crystallized glass was measured by impedance spectroscopy method.
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Nonlinear impedance of annealed and next fully crystallized 50Bi2VO5.5-50SrB4O7 glass measured with impedance spectroscopy method at high temperature region
Open Research DataThe nonlinear electrcial properties of annealed and next fully crystallized 50Bi2VO5.5-50SrB4O7 glass was measured by impedance spectroscopy method.
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Nonlinear impedance of 50Bi2VO5.5-50SrB4O7 fully crystallized glass at 813 K measured with impedance spectroscopy method at high temperature region
Open Research DataThe nonlinear electrcial properties of 50Bi2VO5.5-50SrB4O7 fully crystallized glass was measured by impedance spectroscopy method.
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Nonlinear impedance of 50Bi2VO5.5-50SrB4O7 partially crystallized glass at 613 K measured with impedance spectroscopy method at high temperature region
Open Research DataThe nonlinear electrcial properties of 50Bi2VO5.5-50SrB4O7 partially crystallized glass was measured by impedance spectroscopy method.
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Nonlinear impedance as a function of A.C. voltage for fully crystallized 45Bi2VO5.5-55SrB4O7 glass measured with impedance spectroscopy method at high temperature region
Open Research DataThe nonlinear electrcial properties as a function of A.C. voltage for fully crystallized 45Bi2VO5.5-55SrB4O7 glass was measured by impedance spectroscopy method.
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Nonlinear impedance of 30Bi2VO5.5-70SrB4O7 fully crystallized glass measured with impedance spectroscopy method at high temperature region
Open Research DataThe nonlinear electrcial properties of 30Bi2VO5.5-70SrB4O7 fully crystallized glass was measured by impedance spectroscopy method.
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Nonlinear impedance of glass 40Bi2VO5.5-60SrB4O7 annealed at 593 K and next fully crystallized was measured with impedance spectroscopy method at high temperature region
Open Research DataThe nonlinear electrcial properties of glass 40Bi2VO5.5-60SrB4O7 annealed at 593 K and next fully crystallized was measured by impedance spectroscopy method.
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High temperature XRD diffraction patterns collected during the reoxidation process of SFM-based compounds
Open Research DataThis dataset contains three file folders for SFM, LSFM (La-doped) and SFMNb (Nb-doped) respectively. Samples were reduced prior to the XRD measurements. The measurements were performed on Philipps X’Pert Pro diffractometer using a high-temperature Anthon Paar HT-1200 oven adapter. Scans were performed each 50 deg. in air. The data in dataset were already...
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Isothermal calorimetry data for cement pastes containing pristine Bi2O3/Gd2O3 and silica-coated Bi2O3/Gd2O3 structures
Open Research DataCsv file containing raw calorimetric data determined up to 168 h (Tam Air 3 8-channel isothermal calorimeter) of cement pastes containing Bi2O3+Gd2O3 amd silica-coated Bi2O3-Gd2O3 structures. Sample designation in the .csv file is in line with sample designation in the manuscript associated with dataset.
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The AFM micrographs of V2O5 single crystals
Open Research DataThe DataSet contains the atomic force microscope images of the surface of V2O5 single crystals. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The As-prepared films were deposited on a quartz glass substrate and were annealing at 600°C under synthetic air.
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X-ray diffractometry results of the Sr0.90Ti0.30Fe0.70O3-d material before and after H2-TPR measurement
Open Research DataThis dataset contains results of X-ray diffractometry mesurement (XRD) of the Sr0.90Ti0.30Fe0.70O3-d material. The phase composition of the investigated powders was analyzed by XRD at room temperature. The X-ray diffractometry (XRD) technique was used to determine the phase composition of the fabricated powder and powder after H2-TPR (temperature programmed...
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X-ray diffractometry results of the Sr0.95Ti0.30Fe0.70O3-d material before and after H2-TPR measurement
Open Research DataThis dataset contains results of X-ray diffractometry mesurement (XRD) of the Sr0.95Ti0.30Fe0.70O3-d material. The phase composition of the investigated powders was analyzed by XRD at room temperature. The X-ray diffractometry (XRD) technique was used to determine the phase composition of the fabricated powder and powder after H2-TPR (temperature programmed...
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SPTNO ceramics measured by XPS method
Open Research DataSPTNO (Sr-Pr-Ti-Ni-O) ceramic were manufactured by solid state reaction, from oxides compounds. Synthesis conducted in air atmosphere at temperature in a range of 800-900 deg. Chemical composition of prepared materials were measured by XPS (X-Ray photoemision spectroscopy) method. UHV OmicronNanotechnology system with 128 channel Argus hemispherical...
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The AFM micrographs of vanadium oxides thin films obtained at 800°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on a silicon substrate and vanadium thin films were obtained by annealing as-prepared films at...
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SEM micrographs of morphology evolution of V2O5 nanostructures
Open Research DataThe DataSet contains the scanning electron microscopy (SEM) micrographs of morphology evolution of vanadium pentaoxide nanostructures obtained by the sol-gel, depending on annealing temperature under synthetic air. The results show that the morphology dependent on the annealing temperature.
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Effects of CO2 and utilization of spent trickling liquid towards plant growth
Open Research DataDataset presents the results of biomass yield for Phaseolus vulgaris pot cultures watered with diluted trickling liquid from biotrickling filtration experiments with or without additional CO2 in air by means of introducting post-biofilter air to the plant culture.
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The AFM micrographs of vanadium oxides thin films obtained at 1200°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films obtained at 400°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films obtained at 600°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of of vanadium oxides thin films obtained at 300°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxide thin films obtained at 100°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films obtained at 150°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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XRD patterns of V2O5 nanostructures
Open Research DataThe DataSet contains the XRD patterns of vanadium pentaoxide nanostructures obtained by the sol-gel with different annealing temperatures under synthetic air. The results show that crystallinity dependent on the annealing temperature.
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The AFM micrographs of vanadium oxides thin films obtained at 200°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films deposited on quartz glass - the influence of the thickness of the thin film on its morphology
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (1, 2 or 3 AsP layers) were deposited on a quartz glass substrate and were...
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The AFM micrographs of vanadium oxides thin films obtained at 450°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films deposited on silicon - the influence of the thickness of the film on morphology
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (1, 2 or 3 AsP layers) were deposited on a silicon substrate and were annealing...
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XRD patterns of vanadium oxide nanostructures on silicon substrate obtained by V2O5 recrystallization
Open Research DataThe DataSet contains the XRD patterns of vanadium oxide nanostructures on silicon substrates obtained by recrystallization of V2O5 thin films between 800-1200°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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XRD patterns of vanadium oxide nanostructures on quartz glass substrate obtained by V2O5 recrystallization
Open Research DataThe DataSet contains the XRD patterns of vanadium oxide nanostructures on quartz glass substrates obtained by recrystallization of V2O5 thin films between 800-1200°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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Chemical composition of V2O5 nanorods
Open Research DataThe DataSet contains the chemical compositions of the V2O5 nanorods on a silicon substrate. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The As-prepared thin films were annealed at 600C under a synthetic air atmosphere.
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FTIR in situ - ethylene decomposition on TiO2
Open Research DataThese data contain FTIR spectra recorded in FTIR spectrometer Nicolet iS50 coupled with High Temperature Chamber "The Praying Mantis". These spectra were measured for TiO2 irradiated by UV and under flowing of ethylene gas diluted in air. FTIR spectra were measured in situ during the photocatalytic process of ethylene decomposition. In order to identify...
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Tellurite based glass doped by Eu3+ ions - XPS measurements
Open Research DataEu3+ doped tellurite glass ceramics containing SrF2 nanocrystals were prepared using melt quenching technique and subsequent heat treatment of glass in 370 °C for different time periods. Thermal properties of glass matrix have been determined based on DSC measurements. XRD and XPS results confirmed formation of SrF2 nanocrystals in glass matrices after...
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Refractive index measurement in the range of 1.3 – 1.5 for 1550 nm wavelength (2nd serie)
Open Research DataThe low-coherence refractive index measurements of certified liquid samples provided by Cargille Labs were performed. The measurement system consisted of a broadband light source (central wavelength of 1550 nm), an optical spectrum analyzer, a 2x1 fiber-optic coupler (50:50 power split), and single-mode telecommunication optical fibers. A micromechanical...
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Refractive index measurement in the range of 1.3 – 1.5 for 1550 nm wavelength (1st serie)
Open Research DataThe low-coherence refractive index measurements of certified liquid samples provided by Cargille Labs were performed. The measurement system consisted of a broadband light source (central wavelength of 1550 nm), an optical spectrum analyzer, a 2x1 fiber-optic coupler (50:50 power split), and single-mode telecommunication optical fibers. A micromechanical...
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Comparisson of area specific resistance of the SrTi1-xFexO3-d porous oxygen electrodes and state-of-the-art LSCF sintered at optimal conditions
Open Research DataIn this dataset are presented results of the polarization resistance of optimaly sintered SrTi1-xFexO3-d porous oxygen electrodes in symetrical cell (1000 °C; 800 °C and 800°C respectively x = 0.35; 0.50 and 0.70). For commparison were selected commercially avilable state-of-the-art LSCF (Europa) sintered at 1050 °C. The measurement temperature range...
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Structure evolution of V2O5 thin films deposited on quartz glass substrate - High-Temperature X-ray Diffraction
Open Research DataThe DataSet contains the XRD patterns of V2O5 thin films deposited on guartz glass. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on the quartz glass substrate. The structure was measured in-situ during heating between 50-800°C under synthetic...