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Open Research Data
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The XRD diffraction pattern of interdiffusion test in the CLO-NiO-YSZ system (10wt.%YSZ)
Open Research DataThe dataset includes the XRD pure diffraction pattern of the interdiffusion system consisting of CLO (Ce0.8La0.2O2), NiO and 8YSZ (8mol.% Y2O3 stabilized ZrO2). The mixture contains equal amounts of CLO and NiO as well as 10wt.% 8YSZ. Samples were sintered at 1400 oC. The reaction between CLO and YSZ is visible.
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Thermal behaviour of vanadium xerogel powder under different inert atmosphere
Open Research DataThe DataSet contains the results of the thermal behavior of the vanadium xerogel powder. The information about xerogel powder synthesis is described in the Journal of Nanomaterials.
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FTIR spectra of VO2 and V2O3 nanostructures
Open Research DataThe DataSet contains the FTIR spectra of VO2 and V2O3 nanostructures obtained by the sol-gel with different reaction conditions. The information about xerogel powder synthesis is described in the Journal of Nanomaterials. The xerogel powder was annealing under argon atmosphere in the temperature range 400-1000C. The results show that the morphology...
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XRD patterns of VO2 and V2O3 nanostructures
Open Research DataThe DataSet contains the XRD patterns of VO2 and V2O3 nanostructures obtained by the sol-gel with different reaction conditions. The information about xerogel powder synthesis is described in the Journal of Nanomaterials. The xerogel powder was annealing under argon atmosphere in the temperature range 400-1000C. The results show that the morphology...
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SEM micrographs of morphology evolution of VO2 and V2O3 nanostructures
Open Research DataThe DataSet contains the scanning electron microscopy (SEM) micrographs of VO2 and V2O3 nanostructures obtained by the sol-gel with different reaction conditions. The information about xerogel powder synthesis is described in the Journal of Nanomaterials. The xerogel powder was annealing under argon atmosphere in the temperature range 400-800C. The...
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Thermal behaviour of vanadium xerogel powder under argon atmosphere
Open Research DataThe DataSet contains the results of the thermal behavior of the vanadium xerogel powder. The information about xerogel powder synthesis is described in the Journal of Nanomaterials.
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Thermal behaviour of vanadium xerogel powder and V2O5 nanorods under helium atmosphere
Open Research DataThe DataSet contains the results of the thermal behavior of the vanadium xerogel powder and V2O5 nanorods obtained at 650C. The information about xerogel powder and V2O5 nanorods synthesis is described in the Journal of Nanomaterials.
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Changes in heat of vanadium xerogel powder under different atmosphere
Open Research DataThe DataSet contains the DSC curves of the vanadium xerogel powder. The information about xerogel powder synthesis is described in the Journal of Nanomaterials.
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Thermal stability of vanadium xerogel powder under different atmpshere
Open Research DataThe DataSet contains the results of the thermal behavior of the vanadium xerogel powder. The information about xerogel powder synthesis is described in the Journal of Nanomaterials.
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Thermal behaviour of vanadium xerogel powder under oxidizing atmosphere
Open Research DataThe DataSet contains the results of the thermal behavior of the vanadium xerogel powder. The information about xerogel powder synthesis is described in the Journal of Nanomaterials.
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Thermal stability of V2O5 nanorods under oxidizing atmosphere
Open Research DataThe DataSet contains the TGA curves of V2O5 nanorods obtained at 650°C. The information about nanorods synthesis is described in the Journal of Nanomaterials.
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Changes in heat flow of V2O5 nanorods under oxidizing atmosphere
Open Research DataThe DataSet contains the DSC curves of V2O5 nanorods obtained at 650°C. The information about nanorods synthesis is described in the Journal of Nanomaterials.
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Changes in heat flow of V2O5 nanorods under inert atmosphere
Open Research DataThe DataSet contains the DSC curves of V2O5 nanorods obtained at 650°C. The information about nanorods synthesis is described in the Journal of Nanomaterials.
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Thermal stability of V2O5 nanorods under inert atmosphere
Open Research DataThe DataSet contains the TGA curves of V2O5 nanorods obtained at 650°C. The information about nanorods synthesis is described in the Journal of Nanomaterials.
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Decomposition kinetics of vanadium xerogel powder
Open Research DataThe DataSet contains the TGA curves of vanadium As-prepared xerogel powder with different heating rates. The information about sol synthesis is described in the Journal of Nanomaterials.
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Crystallization kinetics of V2O5 nanorods
Open Research DataThe DataSet contains the DSC curves of As-prepared xerogel powder with different heating rates. The information about sol synthesis is described in the Journal of Nanomaterials.
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Chemical composition of V2O5 nanorods
Open Research DataThe DataSet contains the chemical compositions of the V2O5 nanorods on a silicon substrate. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The As-prepared thin films were annealed at 600C under a synthetic air atmosphere.
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XRD patterns of vanadium oxide nanostructures on silicon substrate obtained by V2O5 recrystallization
Open Research DataThe DataSet contains the XRD patterns of vanadium oxide nanostructures on silicon substrates obtained by recrystallization of V2O5 thin films between 800-1200°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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XRD patterns of vanadium oxide nanostructures on quartz glass substrate obtained by V2O5 recrystallization
Open Research DataThe DataSet contains the XRD patterns of vanadium oxide nanostructures on quartz glass substrates obtained by recrystallization of V2O5 thin films between 800-1200°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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SEM micrographs of vanadium oxide nanostructures obtained by V2O5 recrystallization at 1200°C
Open Research DataThe DataSet contains the scanning electron microscopy (SEM) micrographs of vanadium oxide nanostructures on quartz glass and silicon substrates obtained by recrystallization of V2O5 thin films at 1200°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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SEM micrographs of vanadium oxide nanostructures obtained by V2O5 recrystallization at 1000°C
Open Research DataThe DataSet contains the scanning electron microscopy (SEM) micrographs of vanadium oxide nanostructures on quartz glass and silicon substrates obtained by recrystallization of V2O5 thin films at 1000°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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SEM micrographs of vanadium oxide nanostructures obtained by V2O5 recrystallization at 800°C
Open Research DataThe DataSet contains the scanning electron microscopy (SEM) micrographs of vanadium oxide nanostructures on quartz glass and silicon substrates obtained by recrystallization of V2O5 thin films at 800°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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Structure evolution of V2O5 thin films deposited on quartz glass substrate - High-Temperature X-ray Diffraction
Open Research DataThe DataSet contains the XRD patterns of V2O5 thin films deposited on guartz glass. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on the quartz glass substrate. The structure was measured in-situ during heating between 50-800°C under synthetic...
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Structure evolution of V2O5 thin films deposited on silicon substrate - High-Temperature X-ray Diffraction
Open Research DataThe DataSet contains the XRD patterns of V2O5 thin films deposited on silicon substrates (111). The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on the silicon substrate. The structure was measured in-situ during heating between 50-800°C under...
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SEM micrographs of V2O5 thin films deposited on isotropic etching silicon substrates (111)
Open Research DataThe DataSet contains the scanning electron microscopy (SEM) micrographs of V2O5 thin films deposited on isotropic etching silicon substrates (111). The silicon wafers were etched in a mixture of nitric acid, hydrofluoric acid, and acetic acid in the ratio of 40:1:15. The soaking time for the substrates was from 30 to 90 seconds. The thin films were...
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XRD patterns of V2O5 thin films deposited on isotropic etching silicon substrates (111)
Open Research DataThe DataSet contains the XRD patterns of V2O5 thin films deposited on isotropic etching silicon substrates (111). The silicon wafers were etched in a mixture of nitric acid, hydrofluoric acid, and acetic acid in the ratio of 40:1:15. The soaking time for the substrates was from 30 to 90 seconds. The thin films were obtained by the sol-gel method. ...
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The AFM micrographs of V2O5 single crystals
Open Research DataThe DataSet contains the atomic force microscope images of the surface of V2O5 single crystals. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The As-prepared films were deposited on a quartz glass substrate and were annealing at 600°C under synthetic air.
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The AFM micrographs of vanadium oxides thin films deposited on silicon - the influence of the thickness of the film on morphology
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (1, 2 or 3 AsP layers) were deposited on a silicon substrate and were annealing...
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The AFM micrographs of vanadium oxides thin films deposited on quartz glass - the influence of the thickness of the thin film on its morphology
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (1, 2 or 3 AsP layers) were deposited on a quartz glass substrate and were...
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The AFM micrographs of vanadium oxides thin films obtained at 450°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films obtained at 400°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films obtained at 1200°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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Sb measurements in a Bi-Sb-Te ceramics materials
Open Research DataThe influence of the temperature of the annealing of ceramic materials with the composition Bi0.5Sb1.5Te3O9 was investigated. The materials were annealed at the temperature of 440 degrees Celsius and 450 degrees Celsius. There were no significant differences in the valence of antimony and other elements.
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XPS measurements of the Fe-Bi based glass
Open Research DataFe-Si-O and Fe-Si-Pb-O glass was measured by XPS method. The influence of Pb dopand on the glass structure, including the valence of iron, was investigated. The influence of the annealing temperature on the behavior of iron in glass was also investigated. Studies have confirmed the mixed valence of iron in glasses and a high proportion of metallic Fe.
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The AFM micrographs of vanadium oxides thin films obtained at 800°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on a silicon substrate and vanadium thin films were obtained by annealing as-prepared films at...
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The AFM micrographs of vanadium oxides thin films obtained at 600°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of of vanadium oxides thin films obtained at 300°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films obtained at 200°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films obtained at 150°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxide thin films obtained at 100°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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Nonlinear impedance of 50Bi2VO5.5-50SrB4O7 glass measured with impedance spectroscopy method at high temperature region
Open Research DataThe nonlinear electrcial properties of 50(Bi2VO5.5)-50SrB4O7 glass was measured by impedance spectroscopy method.
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Nonlinear impedance of 50Bi2VO5.5-50SrB4O7 partially crystallized glass at 613 K measured with impedance spectroscopy method at high temperature region
Open Research DataThe nonlinear electrcial properties of 50Bi2VO5.5-50SrB4O7 partially crystallized glass was measured by impedance spectroscopy method.
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Linear impedance of 50Bi2VO5.5-50SrB4O7 glass measured with impedance spectroscopy method at low temperature region
Open Research DataThe linear electrcial properties of 50Bi2VO5.5-50SrB4O7 glass was measured by impedance spectroscopy method.
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Nonlinear impedance of 50Bi2VO5.5-50SrB4O7 glass measured with impedance spectroscopy method at low temperature region
Open Research DataThe nonlinear electrcial properties of 50(Bi2VO5.5)-50SrB4O7 glass was measured by impedance spectroscopy method.
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Nonlinear impedance of 50Bi2VO5.5-50SrB4O7 fully crystallized glass at 813 K measured with impedance spectroscopy method at high temperature region
Open Research DataThe nonlinear electrcial properties of 50Bi2VO5.5-50SrB4O7 fully crystallized glass was measured by impedance spectroscopy method.
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Nonlinear impedance of 50Bi2VO5.5-50SrB4O7 annealed glass at 593 K measured with impedance spectroscopy method at high temperature region
Open Research DataThe nonlinear electrcial properties of 50Bi2VO5.5-50SrB4O7 annealed glass was measured by impedance spectroscopy method.
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Nonlinear impedance of annealed and next fully crystallized 50Bi2VO5.5-50SrB4O7 glass measured with impedance spectroscopy method at high temperature region
Open Research DataThe nonlinear electrcial properties of annealed and next fully crystallized 50Bi2VO5.5-50SrB4O7 glass was measured by impedance spectroscopy method.
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Nonlinear impedance as a function of A.C. voltage for annealed and next fully crystallized 50Bi2VO5.5-50SrB4O7 glass measured with impedance spectroscopy method at high temperature region
Open Research DataThe nonlinear electrcial properties as a function of A.C. voltage for annealed and next fully crystallized 50Bi2VO5.5-50SrB4O7 glass was measured by impedance spectroscopy method.
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Nonlinear impedance of 45Bi2VO5.5-55SrB4O7 glass measured with impedance spectroscopy method at high temperature region
Open Research DataThe nonlinear electrcial properties of 45Bi2VO5.5-55SrB4O7 glass was measured by impedance spectroscopy method.
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Nonlinear impedance of 45Bi2VO5.5-55SrB4O7 fully crystallized glass measured with impedance spectroscopy method at high temperature region
Open Research DataThe nonlinear electrcial properties of 45Bi2VO5.5-55SrB4O7 fully crystallized glass was measured by impedance spectroscopy method.