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Open Research Data
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SEM micrographs of vanadium oxide nanostructures obtained by V2O5 recrystallization at 1200°C
Open Research DataThe DataSet contains the scanning electron microscopy (SEM) micrographs of vanadium oxide nanostructures on quartz glass and silicon substrates obtained by recrystallization of V2O5 thin films at 1200°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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SEM micrographs of vanadium oxide nanostructures obtained by V2O5 recrystallization at 1000°C
Open Research DataThe DataSet contains the scanning electron microscopy (SEM) micrographs of vanadium oxide nanostructures on quartz glass and silicon substrates obtained by recrystallization of V2O5 thin films at 1000°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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SEM micrographs of vanadium oxide nanostructures obtained by V2O5 recrystallization at 800°C
Open Research DataThe DataSet contains the scanning electron microscopy (SEM) micrographs of vanadium oxide nanostructures on quartz glass and silicon substrates obtained by recrystallization of V2O5 thin films at 800°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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Structure evolution of V2O5 thin films deposited on quartz glass substrate - High-Temperature X-ray Diffraction
Open Research DataThe DataSet contains the XRD patterns of V2O5 thin films deposited on guartz glass. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on the quartz glass substrate. The structure was measured in-situ during heating between 50-800°C under synthetic...
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Structure evolution of V2O5 thin films deposited on silicon substrate - High-Temperature X-ray Diffraction
Open Research DataThe DataSet contains the XRD patterns of V2O5 thin films deposited on silicon substrates (111). The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on the silicon substrate. The structure was measured in-situ during heating between 50-800°C under...
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SEM micrographs of V2O5 thin films deposited on isotropic etching silicon substrates (111)
Open Research DataThe DataSet contains the scanning electron microscopy (SEM) micrographs of V2O5 thin films deposited on isotropic etching silicon substrates (111). The silicon wafers were etched in a mixture of nitric acid, hydrofluoric acid, and acetic acid in the ratio of 40:1:15. The soaking time for the substrates was from 30 to 90 seconds. The thin films were...
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XRD patterns of V2O5 thin films deposited on isotropic etching silicon substrates (111)
Open Research DataThe DataSet contains the XRD patterns of V2O5 thin films deposited on isotropic etching silicon substrates (111). The silicon wafers were etched in a mixture of nitric acid, hydrofluoric acid, and acetic acid in the ratio of 40:1:15. The soaking time for the substrates was from 30 to 90 seconds. The thin films were obtained by the sol-gel method. ...
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The AFM micrographs of V2O5 single crystals
Open Research DataThe DataSet contains the atomic force microscope images of the surface of V2O5 single crystals. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The As-prepared films were deposited on a quartz glass substrate and were annealing at 600°C under synthetic air.
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The AFM micrographs of vanadium oxides thin films deposited on silicon - the influence of the thickness of the film on morphology
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (1, 2 or 3 AsP layers) were deposited on a silicon substrate and were annealing...
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The AFM micrographs of vanadium oxides thin films deposited on quartz glass - the influence of the thickness of the thin film on its morphology
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (1, 2 or 3 AsP layers) were deposited on a quartz glass substrate and were...
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The AFM micrographs of vanadium oxides thin films obtained at 450°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films obtained at 400°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films obtained at 1200°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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Sb measurements in a Bi-Sb-Te ceramics materials
Open Research DataThe influence of the temperature of the annealing of ceramic materials with the composition Bi0.5Sb1.5Te3O9 was investigated. The materials were annealed at the temperature of 440 degrees Celsius and 450 degrees Celsius. There were no significant differences in the valence of antimony and other elements.
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XPS measurements of the Fe-Bi based glass
Open Research DataFe-Si-O and Fe-Si-Pb-O glass was measured by XPS method. The influence of Pb dopand on the glass structure, including the valence of iron, was investigated. The influence of the annealing temperature on the behavior of iron in glass was also investigated. Studies have confirmed the mixed valence of iron in glasses and a high proportion of metallic Fe.
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The AFM micrographs of vanadium oxides thin films obtained at 800°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on a silicon substrate and vanadium thin films were obtained by annealing as-prepared films at...
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The AFM micrographs of vanadium oxides thin films obtained at 600°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of of vanadium oxides thin films obtained at 300°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films obtained at 200°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films obtained at 150°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxide thin films obtained at 100°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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Nonlinear impedance of 50Bi2VO5.5-50SrB4O7 glass measured with impedance spectroscopy method at high temperature region
Open Research DataThe nonlinear electrcial properties of 50(Bi2VO5.5)-50SrB4O7 glass was measured by impedance spectroscopy method.
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Nonlinear impedance of 50Bi2VO5.5-50SrB4O7 partially crystallized glass at 613 K measured with impedance spectroscopy method at high temperature region
Open Research DataThe nonlinear electrcial properties of 50Bi2VO5.5-50SrB4O7 partially crystallized glass was measured by impedance spectroscopy method.
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Linear impedance of 50Bi2VO5.5-50SrB4O7 glass measured with impedance spectroscopy method at low temperature region
Open Research DataThe linear electrcial properties of 50Bi2VO5.5-50SrB4O7 glass was measured by impedance spectroscopy method.
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Nonlinear impedance of 50Bi2VO5.5-50SrB4O7 glass measured with impedance spectroscopy method at low temperature region
Open Research DataThe nonlinear electrcial properties of 50(Bi2VO5.5)-50SrB4O7 glass was measured by impedance spectroscopy method.
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Nonlinear impedance of 50Bi2VO5.5-50SrB4O7 fully crystallized glass at 813 K measured with impedance spectroscopy method at high temperature region
Open Research DataThe nonlinear electrcial properties of 50Bi2VO5.5-50SrB4O7 fully crystallized glass was measured by impedance spectroscopy method.
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Nonlinear impedance of 50Bi2VO5.5-50SrB4O7 annealed glass at 593 K measured with impedance spectroscopy method at high temperature region
Open Research DataThe nonlinear electrcial properties of 50Bi2VO5.5-50SrB4O7 annealed glass was measured by impedance spectroscopy method.
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Nonlinear impedance of annealed and next fully crystallized 50Bi2VO5.5-50SrB4O7 glass measured with impedance spectroscopy method at high temperature region
Open Research DataThe nonlinear electrcial properties of annealed and next fully crystallized 50Bi2VO5.5-50SrB4O7 glass was measured by impedance spectroscopy method.
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Nonlinear impedance as a function of A.C. voltage for annealed and next fully crystallized 50Bi2VO5.5-50SrB4O7 glass measured with impedance spectroscopy method at high temperature region
Open Research DataThe nonlinear electrcial properties as a function of A.C. voltage for annealed and next fully crystallized 50Bi2VO5.5-50SrB4O7 glass was measured by impedance spectroscopy method.
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Nonlinear impedance of 45Bi2VO5.5-55SrB4O7 glass measured with impedance spectroscopy method at high temperature region
Open Research DataThe nonlinear electrcial properties of 45Bi2VO5.5-55SrB4O7 glass was measured by impedance spectroscopy method.
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Nonlinear impedance of 45Bi2VO5.5-55SrB4O7 fully crystallized glass measured with impedance spectroscopy method at high temperature region
Open Research DataThe nonlinear electrcial properties of 45Bi2VO5.5-55SrB4O7 fully crystallized glass was measured by impedance spectroscopy method.
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Nonlinear impedance as a function of A.C. voltage for fully crystallized 45Bi2VO5.5-55SrB4O7 glass measured with impedance spectroscopy method at high temperature region
Open Research DataThe nonlinear electrcial properties as a function of A.C. voltage for fully crystallized 45Bi2VO5.5-55SrB4O7 glass was measured by impedance spectroscopy method.
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Nonlinear impedance of 30Bi2VO5.5-70SrB4O7 glass measured with impedance spectroscopy method at high temperature region
Open Research DataThe nonlinear electrcial properties of 30Bi2VO5.5-70SrB4O7 glass was measured by impedance spectroscopy method.
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Mechanical properties of single V2O5 nanocrystal - nanoindentation measurement in control of the max-load
Open Research DataThe DataSet contains the nanoindentation curves (indentation force Fn vs penetrationPd) for a single V2O5 nanocrystal supported on a substrate. The measurements were performed in control of the maximum load of Berkovich indenter force from 2 to 50 mN.
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Mechanical properties of single V2O5 nanocrystal - nanoindentation measurement in control of the max-depth
Open Research DataThe DataSet contains the nanoindentation curves (indentation force Fn vs penetrationPd) for a single V2O5 nanocrystal supported on a substrate. The measurements were performed in control of the maximum depth of Berkovich indenter penetration: 60, 70, and 100 nm.
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Linear impedance of 50(2Bi2O3-V2O5)-50SrB4O7 glass-ceramic heat-treated at 613 K measured with impedance spectroscopy method at high temperature region
Open Research DataThe linear electrcial properties of 50(2Bi2O3-V2O5)-50SrB4O7 glass-ceramic heat-treated at 613 K was measured by impedance spectroscopy method.
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Nonlinear impedance of 50(2Bi2O3-V2O5)-50SrB4O7 glass-ceramic heat-treated at 613 K measured with impedance spectroscopy method at high temperature region
Open Research DataNonlinear electrcial properties of 50(2Bi2O3-V2O5)-50SrB4O7 glass-ceramic heat treated at 613 K was measured by impedance spectroscopy method.
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Nonlinear impedance of 58(2Bi2O3-V2O5)-42SrB4O7 glass heat-treated for 3 hours at 693 K, measured with impedance spectroscopy method at low temperature region
Open Research DataThe nonlinear electrcial properties of partially crystallized 58(2Bi2O3-V2O5)-42SrB4O7 glass was measured by impedance spectroscopy method.
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Linear impedance of 58(2Bi2O3-V2O5)-42SrB4O7 glass heat-treated for 10 hours at 693 K, measured with impedance spectroscopy method at low temperature region
Open Research DataThe linear electrcial properties of partially crystallized 58(2Bi2O3-V2O5)-42SrB4O7 glass was measured by impedance spectroscopy method.
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Linear impedance as a function of A.C. voltage for 50(2Bi2O3-V2O5)-50SrB4O7 glass heat treated at 693 K measured with impedance spectroscopy method at 273 K
Open Research DataThe linear electrcial properties as a function of A.C. voltage for 50(2Bi2O3-V2O5)-50SrB4O7 glass heat treated at 693 K was measured by impedance spectroscopy method.
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Linear impedance of 50(2Bi2O3-V2O5)-50SrB4O7 glass heat treated at 693 K measured with impedance spectroscopy method at low temperature region
Open Research DataThe linear electrcial properties of 50(2Bi2O3-V2O5)-50SrB4O7 glass heat treated at 693 K was measured by impedance spectroscopy method.
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Linear impedance as a function of A.C. voltage for 50(2Bi2O3-V2O5)-50SrB4O7 glass-ceramic heat-treated at 813 K measured with impedance spectroscopy method at high temperature region
Open Research DataThe linear electrcial properties as a function of A.C. voltage of 50(2Bi2O3-V2O5)-50SrB4O7 glass-ceramic heat treated at 813 K was measured by impedance spectroscopy method.
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Nonlinear impedance of 50(2Bi2O3-V2O5)-50SrB4O7 glass-ceramic heat-treated at 813 K measured with impedance spectroscopy method at high temperature region
Open Research DataNonlinear electrcial properties of 50(2Bi2O3-V2O5)-50SrB4O7 glass-ceramic heat treated at 813 K was measured by impedance spectroscopy method.
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Nonlinear impedance of 58(2Bi2O3-V2O5)-42SrB4O7 glass heat-treated for 10 hours at 693 K, measured with impedance spectroscopy method at low temperature region
Open Research DataThe nonlinear electrcial properties of partially crystallized 58(2Bi2O3-V2O5)-42SrB4O7 glass was measured by impedance spectroscopy method.
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Linear impedance of 50(2Bi2O3-V2O5)-50SrB4O7 glass measured with impedance spectroscopy method at low temperature region
Open Research DataThe linear electrcial properties of 50(2Bi2O3-V2O5)-50SrB4O7 glass was measured by impedance spectroscopy method.
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The AFM micrographs of isotropic etching silicon substrates (111)
Open Research DataThe DataSet contains the atomic force microscope images of isotropic etching silicon substrates (111). The silicon wafers were etched in a mixture of nitric acid, hydrofluoric acid, and acetic acid in the ratio of 40:1:15. The soaking time for the substrates was from 20 to 90 seconds
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Linear impedance of 50(2Bi2O3-V2O5)-50SrB4O7 glass measured with impedance spectroscopy method at high temperature region
Open Research DataThe linear electrcial properties of 50(2Bi2O3-V2O5)-50SrB4O7 glass was measured by impedance spectroscopy method.
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Linear impedance as a function of A.C. voltage for 50(2Bi2O3-V2O5)-50SrB4O7 glass measured with impedance spectroscopy method
Open Research DataThe linear electrcial properties as a function of A.C. voltage for 50(2Bi2O3-V2O5)-50SrB4O7 glass was measured by impedance spectroscopy method.
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Nonlinear impedance of 50(2Bi2O3-V2O5)-50SrB4O7 glass heat treated two times measured with impedance spectroscopy method at high temperature region
Open Research DataThe nonlinear electrcial properties of 50(2Bi2O3-V2O5)-50SrB4O7 glass heat treated two times was measured by impedance spectroscopy method.
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Nonlinear impedance of 50(2Bi2O3-V2O5)-50SrB4O7 glass heat treated at 693 K measured with impedance spectroscopy method at high temperature region
Open Research DataThe nonlinear electrcial properties of 50(2Bi2O3-V2O5)-50SrB4O7 glass heat treated at 693 K was measured by impedance spectroscopy method.