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Katalog Danych Badawczych
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Katalog Danych Badawczych
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XPS-Ni foam as received, after photocatalysis and after oxidation at 500_C.
Dane BadawczeThis dataset contains XPS spectra recorded for nickel foam as received from supplier, after photocatalytic process and after oxidation at 500C. Each set contains: survery spectrum, O1, C1s, Ni2p. The detailed equipment and measurement data was described in "readme XPS.txt" file
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XPS data of as-grown BDD, as-implanted Mn-BDD, and annealed Mn-BDD thin films
Dane BadawczeXPS survey spectra and detailed spectra O1, C1s and Mn2p of as-grown BDD, as-implanted Mn-BDD, and annealed Mn-BDD thin films. X-ray photoelectron spectroscopy (XPS) studies were conducted on an Escalab 250 Xi from Thermo Fisher Scientific with an Al Kα radiation. Results were published in the paper ( https://doi.org/10.1002/adfm.202308617)
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XPS data of deuterium and hydrogen grown boron-doped diamond
Dane BadawczeThe high-resolution C1s X-ray absorption spectra of BDD@H and BDD@D samples were measured using the facilities of the HE-SGM beamline (HE-SGM) at the BESSY II synchrotron radiation source of Helmholtz–Zentrum Berlin (HZB).[90] The measurements were carried out under ultra-high vacuum conditions: P ≈ 2×10−9 Torr at T = 300 K. The NEXAFS spectra were...
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X-ray diffraction spectra of the NiCo2O4 modified by carbon
Dane BadawczeThis dataset comprises XRD results for NiCo2O4 modified with carbon, varying according to the amount of carbon. In this context, the XRD data provide insights into the crystalline structure and phase composition of the NiCo2O4 material as it is modified with varying quantities of carbon. This investigation is valuable for understanding how the presence...
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X-ray diffraction (XRD) of silica-coated bismuth oxide/gadolinium oxide (Bi2O3+Gd2O3) structures
Dane BadawczeData contain results from X-ray diffraction (XRD) measurements of pristine Bi2O3 and Gd2O3 structures using Aeris diffractometer (Malvern Panalytical, Malvern, UK) with Cu-Kα radiation (λ = 1.544 Å)
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XPS studies of PDA-modified TiO2 nanotubes
Dane BadawczeThis dataset contains the XPS results (survey and high-resolution spectra) of the samples from TiO2 nanotubes modified with polydopamine. The studies were presented as a part of the research on "Band Gap Engineering toward Semimetallic Character of Quinone-Rich Polydopamine" (DOI: 10.1021/acs.jpcc.2c08804).
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XRD-Ni foam as received and oxidised at 500_C
Dane BadawczeThese data contain XRD patterns of porous nickel foam commercial and oxidised in air at 500 C degrees for 8 hours.
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XRD diffraction patterns for strontium ferrite molybdate-based compounds: as-prepared, reduced and reoxidized
Dane BadawczeThe dataset contains the XRD diffractograms collected at room temperature for SFM, LSFM and SFMNb in 3 different oxidation states, namely: as-prepared, reduced and reoxidized.
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XPS data of MXene catalyst
Dane BadawczeData contain results from XPS measurement of the Ti3C2Tx MXenes produced via acidic etching aluminum from MAX Phase (Ti3C2-Al-Ti3C2-Al-Ti3C2) using 48% HF etching agent (MXene HF). The X-ray spectroscopy (XPS) measurements were conducted using Mg Ka (hn = 1253.6 eV) radiation in a Prevac (Poland) system equipped with a Scienta SES 2002 (Sweden) electron...
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XRD patterns of MXenes ashes obtained after TGA measurement
Dane BadawczeData contain results from XRD measurements of the product (ashes) produced after TGA of MAX Phase, MXene HF, MXene HF/HCl 1:3 and MXene HF/H2SO4 1:3 . The measurements were performed in AERIS PANalytical X-ray diffractometer with Cu-Ka radiation.
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XRD patterns of MXenes catalysts
Dane BadawczeData contain results from XRD measurements of the Ti3C2Tx MXenes produced via acidic etching aluminum from MAX Phase (Ti3C2-Al-Ti3C2-Al-Ti3C2) using different etching agents, HF/HCl and HF/H2SO4 with different weight ratios (1:3, 1:4, and 1:5). The samples were labeled as MXene HF/HCl X:Y and MXene HF/H2SO4 X:Y, where X:Y means the acids weight ratios....
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XRD (X-ray Diffraction) patterns of PMH, PMD and simulated MIL-53(Al)
Dane BadawczeThese data contain XRD (X-ray Diffraction) patterns of PMH, PMD and simulated MIL-53(Al). The results were recorded by a Philipsdiffractometer using Cu Ka radiation. Sample abbreviations (PMH, PMD, MIL-53(Al)) are in agreement with the markings used in the linked publication.
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XPS (X-ray photoelectron spectroscopy) survey spectra of CPMD and CPMH
Dane BadawczeXPS (X-ray photoelectron spectroscopy) survey spectra of CPMD and CPMH. XPS spectra were obtained using Al Kɑ (hv=1486.6 eV) radiation with a Prevac system equipped with a Scienta SES 2002 electron energy analyzer operating at constant transmission energy (Ep=50 eV). Sample abbreviations (CPMD, CPMH) are in agreement with the markings used in the linked...
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X-ray diffraction (XRD) of pristine bismuth oxide (Bi2O3) and gadolinium oxide (Gd2O3) structures
Dane BadawczeData contain results from X-ray diffraction (XRD) measurements of pristine Bi2O3 and Gd2O3 structures using Aeris diffractometer (Malvern Panalytical, Malvern, UK) with Cu-Kα radiation (λ = 1.544 Å)
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X-ray diffraction (XRD) of silica-coated bismuth oxide (Bi2O3) and gadolinium oxide (Gd2O3) structures
Dane BadawczeData contain results from X-ray diffraction (XRD) measurements of pristine Bi2O3 and Gd2O3 structures using Aeris diffractometer (Malvern Panalytical, Malvern, UK) with Cu-Kα radiation (λ = 1.544 Å)
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XRD-TiO2 and SiO2
Dane BadawczeData contain results from XRD measurements of amorphous silica and TiO2 of antase and rutile phases. The commercial TiO2 named as P25 produced by Evonik was also analyzed.
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XRD-TiO2 heat-treated at 400-600oC in Ar or H2
Dane BadawczeThese data contain XRD patterns of TiO2 heat-treated at 400-600oC in Ar or H2. Two pases of TiO2 were identified: anatase and rutile.
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XPS-TiO2 heated in H2
Dane BadawczeThese XPS spectra were recorded for TiO2 heat-treated at 450-600oC in H2. Surface oxygen groups were determined. Deconvolution of Ti 2p peak allowed to determine Ti3+ on the titania surface.
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X-ray diffraction spectra of nitrogen-doped carbon in hybrid materials containing praseodymium oxide
Dane BadawczeX-ray powder diffraction patterns of samples were carried out by Philips X’Pert diffractometer, which was radiated by graphite monochromatized Cu Kα (l equal 1.540598). The operating voltage was maintained at 40 kV, the current was maintained at 30 mA and analyzed in the range from 20° to 90°. The data presented confirmed the presence of the PrBSCF...
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XRD data of (Cr,Fe,Mn,Co,Ni)3O4 High-entropy spinel oxide thin films deposited on amorphous SiO2 substrate by spray pyrolysis techniqe, annealed in a range from 400 to 900oC
Dane BadawczeDataset include collected XRD data of (Cr,Fe,Mn,Co,Ni)3O4 high-entropy spinel oxide thin films deposited by spray pyrolysis technique on amorphous SiO2 substrates and annealed from 400 to 900oC. Samples were prepared in the form of a ~ 500 nm thin film utilising a facile spray pyrolysis technique. The structural and electrical properties of the layers...