Optical profilometer

Aleksandra Wieloszyńska; Marcin Strąkowski

doi:10.1117/12.2248123

Optical profilometer

Abstrakt

The profilometry plays a huge role in the most fields of science and technology. It allows to measure the profile of the surface with high-resolution. This technique is used in the fields like optic, electronic, medicine, automotive, and much more. The aim of the current work was to design and build optical profilometer based on the interference phenomena. The developed device has been working with He-Ne laser (632.8 nm). The optical parts have been chosen in order to reach the sized 2.0 mm x 1.6 mm of scanning area. The setup of the profilometer is based on Twyman-Green interferometer. Therefore, the phase distribution of the backreflected light from measured surface is recorded. The measurements are carried out with the aid of multiframe algorithms. In this approach we have used the Hariharan algorithm to obtain the exact value of the recorded phase. During tests, which have been carried out in order to check the functionality of the device, the interference patterns have been recoded and processed in order to obtain the 3D profile of measured surface. In this contribution the setup of the optical system, as well as signal processing methods are going to be presented. The brief discussion about the advantages and disadvantages, and usefulness of this approach will be carried out. © (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.

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Kategoria:: Aktywność konferencyjna
Typ:: publikacja w wydawnictwie zbiorowym recenzowanym (także w materiałach konferencyjnych)
Tytuł wydania:: Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2016 strony 1 - 6
Język:: angielski
Rok wydania:: 2016
Opis bibliograficzny:: Wieloszyńska A., Strąkowski M.: Optical profilometer// Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2016/ ed. Ryszard S. Romaniuk : SPIE, 2016, s.1-6
DOI:: Cyfrowy identyfikator dokumentu elektronicznego (otwiera się w nowej karcie) 10.1117/12.2248123
Weryfikacja:: Politechnika Gdańska