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Wyniki wyszukiwania dla: atomic force microscopy
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AFM (atomic force microscopy) images of borophene after sonication of boron
Dane BadawczeThese data include AFM (atomic force microscopy) images of borophene obtained after sonication in aceton of boron, collected in order to estimate lateral size of the nanoflakes.
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AFM (Atomic Force Microscopy) analysis of surface topography loaded with nickel nanoparticles.
Dane BadawczeThis dataset presents AFM (Atomic Force Microscopy) images depicting the surface topography loaded with nickel powdered nanoparticles. The detailed equipment and measurement data was described in "AFM readme.txt" file
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Atomic force microscopy images of copper electrical contacts wear under the influence of friction
Dane BadawczeMeasurement of wear of copper electrical contacts under the influence of friction. Imaging in contact mode in the variant of scanning spreading resistance microscopy. Additionally, there are spectroscopic current-voltage curves showing local changes in electrical conductivity. NTEGRA Prima (NT-MDT) device. Probe NSG 01Pt.
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AFM (atomic force microscopy) images of borophene flakes obtained during ball milling at different operating parameters
Dane BadawczeThis dataset contains atomic force microscopy (AFM) images of representative borophene flakes obtained during ball milling. The operational parameters of the ball-milling process included rotation speed (250, 450, and 650 rpm), time of ball-milling (1, 3, 6, and 12 h), and the mass loading of starting bulk boron (1, 2, 3 g).
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Ferromagnetic nanoparticles imaging by means of Magnetic Force Microscopy
Dane BadawczeFerromagnetic nanoparticles can be used as building blocks for advanced thin film magnets, and can also be used in data storage and biomedical technologies. Nano-crystalline ferrites with the chemical formula NixZn (1 - x) Fe2O4, where x = 0, 0.2, 0.4, 0.6, 0.8, 1.0 show anti-corrosion properties and suppress electromagnetic interference, in the case...
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Imaging of ferroelectric properties of sinter by means of Piezoresponse Force Microscopy
Dane BadawczeFerroelectricity is a property of certain materials [1], characterized by a spontaneous electrical polarization that can be reversed by applying an external electric field. Ferroelectric properties can be used to make capacitors with adjustable capacity. The permeability of ferroelectrics is not only regulated, but usually also very high, especially...
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Fingerprint structure studies with semi-contact AFM
Dane BadawczeThe work [1] presents many, sometimes even surprising examples of the use of atomic force microscopy in modern forensics. Some of them are projectile tests using the characteristic scratch patterns created by the firing pin on the primer. There are more and more suggestions in the literature for the use of atomic force microscopy in dactyloscopy [2]....
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Force-deformation spectroscopy in contact mode
Dane BadawczeThe deformation-distance spectroscopic curve is obtained by registering the value of the probe cantilever deflection as a function of the elongation of the piezoelectric scanner. It assumes a simple relationship in the form of Hooke’s law, linking the deformation of the lever with the amount of its deflection caused by the proximity of the probe and...
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The AFM micrographs of isotropic etching silicon substrates (111)
Dane BadawczeThe DataSet contains the atomic force microscope images of isotropic etching silicon substrates (111). The silicon wafers were etched in a mixture of nitric acid, hydrofluoric acid, and acetic acid in the ratio of 40:1:15. The soaking time for the substrates was from 20 to 90 seconds
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Amplitude-distance spectroscopy in semi-contact mode
Dane BadawczeSince it was invented by Binnig et al. in 1986, atomic force microscopy (AFM) plays a key role in science and technology at the nanoscale. AFM is a microscopic technique that visualizes the surface topography using the attractive and repulsive forces of interaction between several atoms (in theory) of a blade attached to the end of the probe lever and...
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The AFM micrographs of V2O5 single crystals
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of V2O5 single crystals. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The As-prepared films were deposited on a quartz glass substrate and were annealing at 600°C under synthetic air.
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The AFM micrographs of vanadium oxides thin films obtained at 800°C
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on a silicon substrate and vanadium thin films were obtained by annealing as-prepared films at...
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The AFM micrographs of vanadium oxides thin films obtained at 1200°C
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films obtained at 400°C
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films obtained at 600°C
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of of vanadium oxides thin films obtained at 300°C
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxide thin films obtained at 100°C
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films obtained at 150°C
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films obtained at 200°C
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films deposited on quartz glass - the influence of the thickness of the thin film on its morphology
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (1, 2 or 3 AsP layers) were deposited on a quartz glass substrate and were...