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Wyniki wyszukiwania dla: NSGT
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The AFM topographic measurements of the surface heterogeneity of iron hexacyanoferrate on a steel surface
Dane BadawczeMeasurements in semi-contact mode. NTEGRA Prima (NT-MDT) device. NSG 01 probe.
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The surface of a fragment of the structure of an integrated circuit in the semi-contact mode.
Dane BadawczeThe surface of a fragment of the structure of an integrated circuit. Topographic measurements in the semi-contact mode. NTEGRA Prima (NT-MDT) device. NSG 01 probe.
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Atomic force microscopy images of copper electrical contacts wear under the influence of friction
Dane BadawczeMeasurement of wear of copper electrical contacts under the influence of friction. Imaging in contact mode in the variant of scanning spreading resistance microscopy. Additionally, there are spectroscopic current-voltage curves showing local changes in electrical conductivity. NTEGRA Prima (NT-MDT) device. Probe NSG 01Pt.
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Mechanical lithography in a polymer substrate using AFM in contact mode
Dane BadawczeMechanical lithography in a polymer substrate. Contact mode. NTEGRA Prima (NT-MDT) device. NSG 01 probe.
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Topographic AFM imaging of the leaf surface with magnification of details of its morphological structure
Dane BadawczeTopographic imaging of the leaf surface with magnification of details of its morphological structure. Measurements in semi-contact mode. NTEGRA Prima (NT-MDT) device. NSG 01 probe.
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Microscopic examination of the texture of paper products
Dane BadawczeAtomic force microscopy (AFM) can be used to study the state of the paper fibers with the aim of providing qualitative and semi-quantitative information on degradation and aging. The work [1] reports the results of tests of various paper products subjected to deliberate aging processes under the influence of various factors. Chemical and biological...
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The conducted immunity test of a power supply unit in accordance with EMC standards
Dane BadawczeThe dataset presents a result of measurements that are a part of immunity tests to conducted disturbances, induced by radio-frequency fields. The immunity tests were carried out on the mains cable of the DF1723003TC NDN power supply. Tests of immunity of electronic systems to conducted disturbances in the frequency range from 150 kHz to 230 MHz are...
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The conducted immunity test of an AC adaptor in accordance with EMC standards
Dane BadawczeThe dataset presents a result of measurements that are a part of immunity tests to conducted disturbances, induced by radio-frequency fields. The immunity tests were carried out on the mains cable of the ac adaptor PHILIPS DC power supply SBC 6654. Tests of immunity of electronic systems to conducted disturbances in the frequency range from 150 kHz...
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The conducted immunity test of a power supply unit in the frequency range from 19 MHz to 26 MHz for the RF voltage level of 3 V
Dane BadawczeThe dataset presents a result of measurements that are a part of immunity tests to conducted disturbances, induced by radio-frequency fields. The immunity tests were carried out on the mains cable of the DF1723003TC NDN power supply unit. Tests of immunity of electronic systems to conducted disturbances in the frequency range from 19 MHz to 26 MHz were...
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The conducted immunity test of a power supply unit in the frequency range from 19 MHz to 26 MHz for the RF voltage level of 1 V
Dane BadawczeThe dataset presents a result of measurements that are a part of immunity tests to conducted disturbances, induced by radio-frequency fields. The immunity tests were carried out on the mains cable of the DF1723003TC NDN power supply unit. Tests of immunity of electronic systems to conducted disturbances in the frequency range from 19 MHz to 26 MHz were...
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The conducted immunity test of a power supply unit in the frequency range from 19 MHz to 26 MHz for the RF voltage level of 10 V
Dane BadawczeThe dataset presents a result of measurements that are a part of immunity tests to conducted disturbances, induced by radio-frequency fields. The immunity tests were carried out on the mains cable of the DF1723003TC NDN power supply unit. Tests of immunity of electronic systems to conducted disturbances in the frequency range from 19 MHz to 26 MHz were...