Artur Zieliński - Publications - Bridge of Knowledge

Search

Filters

total: 71

  • Category
  • Year
  • Options

clear Chosen catalog filters disabled

Catalog Publications

Year 2023
Year 2022
Year 2021
Year 2020
Year 2019
Year 2018
Year 2017
Year 2016
Year 2015
  • Application of different modes of nanoscale impedance microscopy in materials research
    Publication

    In recent years, there is noticeable interest in application of various types of scanning probe microscopy in material science research. One of them is contact atomic force microscopy combined with local impedance measurements, known as nanoscale impedance microscopy. Literature references present its application in investigations of new materials, microelectronics diagnostics, or research of protective coatings performance. In...

    Full text to download in external service

seen 1588 times