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Wyniki wyszukiwania dla: ANTENNA RADIATION PATTERNS
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Measurements of electrically small antenna radiation patterns in non-anechoic environments using TGM
Dane BadawczeThe dataset contains raw and processed measurements of radiation pattern characteristics performed in non-anechoic regime for four antenna structures: a spline-parameterized Vivaldi structure, a compact spline-based monopole, super-ultrawideband antenna, and a quasi-Yagi component. The responses have been obtained at the selected frequencies of interest...
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Radiation pattern measurements of geometrically small antennas performed in non-anechoic environments
Dane BadawczeThe dataset contains unprocessed measurements of radiation pattern characteristics performed in non-anechoic regime for three geometrically small antenna structures: a spline-parameterized Vivaldi structure, a compact spline-based monopole, and a quasi-Yagi geometry with enhanced bandwidth. The responses have been obtained over broad frequency ranges...
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XRD patterns of V2O5 nanostructures
Dane BadawczeThe DataSet contains the XRD patterns of vanadium pentaoxide nanostructures obtained by the sol-gel with different annealing temperatures under synthetic air. The results show that crystallinity dependent on the annealing temperature.
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XRD patterns of ammonium vanadate nanocrystals
Dane BadawczeThe DataSet contains the XRD patterns of ammonium vanadate nanobelts obtained by the hydrothermal method with different conditions. The results show that the structure and phase compositions of samples dependent on reaction conditions.
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XRD patterns of VO2 and V6O13 nanostructures
Dane BadawczeThe DataSet contains the XRD patterns of VO2 and V6O13 thin films deposited on a silicon substrate. The as-prepared thin films were annealing under a reducing atmosphere (94% Ar, 6% H2) at 500, 600 and 700C for 10h.
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XRD patterns of VO2 and V2O3 nanostructures
Dane BadawczeThe DataSet contains the XRD patterns of VO2 and V2O3 nanostructures obtained by the sol-gel with different reaction conditions. The information about xerogel powder synthesis is described in the Journal of Nanomaterials. The xerogel powder was annealing under argon atmosphere in the temperature range 400-1000C. The results show that the morphology...
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XRD patterns of V2O3 nanostructures
Dane BadawczeThe DataSet contains the XRD patterns of V2O3 nanostructures obtained by the sol-gel with different reaction conditions. The xerogel powder was annealing under a reducing atmosphere (94% Ar, 6% H2) in the temperature range 350-700C. The results show that crystallinity dependent on the annealing temperature.
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Correction of far-field measurements obtained in non-anechoic test site
Dane BadawczeThe dataset contains raw and processed measurements of radiation pattern characteristics performed in non-anechoic regime for two geometrically small antenna structures: a spline-parameterized Vivaldi structure and a compact spline-based monopole. The responses have been obtained at the selected frequencies of interest as a function of mentioned structures...
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XRD patterns of the V2O5 nanorods after thermal treatment under reducing atmosphere
Dane BadawczeThe DataSet contains the XRD patterns of V2O5 nanorods after thermal treatment under a reducing atmosphere. Samples were annealed at 450C for 2, 20, and 40h under a reducing atmosphere (94% Ar, 6% H2).
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XRD patterns of V2O5 thin film morphology dependent on substrate types
Dane BadawczeThe DataSet contains the XRD patterns of the V2O5 thin film structure dependent on substrate types. The as-prepared thin films were deposited on alumina, zirconium, zirconium oxide and metallic vanadium substrate, then was annealing under an oxidizing atmosphere at 600C for 10h.
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XRD patterns of VO2 and V2O3 thin films obtained at 500°C
Dane BadawczeThe DataSet contains the XRD patterns of VO2 and V2O3 thin films obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (3-9 AsP layers) were deposited on a silicon substrate and were annealing at 500°C under an argon atmosphere.
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XRD patterns of VO2 and V2O3 thin films obtained at 700°C
Dane BadawczeThe DataSet contains the XRD patterns of VO2 and V2O3 thin films obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (5-9 AsP layers) were deposited on a silicon substrate and were annealing at 700°C under an argon atmosphere.
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XRD patterns of vanadium oxide nanostructures on silicon substrate obtained by V2O5 recrystallization
Dane BadawczeThe DataSet contains the XRD patterns of vanadium oxide nanostructures on silicon substrates obtained by recrystallization of V2O5 thin films between 800-1200°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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XRD patterns of V2O5 thin films deposited on silicon substrate
Dane BadawczeThe DataSet contains the XRD patterns of V2O5 thin films deposited on a silicon substrate. The as-prepared thin films were annealing under an oxidizing atmosphere in the temperature range of 300-600C. The results show that the structure of the films dependent on the annealing temperature.
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XRD patterns of vanadium oxide nanostructures on quartz glass substrate obtained by V2O5 recrystallization
Dane BadawczeThe DataSet contains the XRD patterns of vanadium oxide nanostructures on quartz glass substrates obtained by recrystallization of V2O5 thin films between 800-1200°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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XRD (X-ray Diffraction) patterns of PMH, PMD and simulated MIL-53(Al)
Dane BadawczeThese data contain XRD (X-ray Diffraction) patterns of PMH, PMD and simulated MIL-53(Al). The results were recorded by a Philipsdiffractometer using Cu Ka radiation. Sample abbreviations (PMH, PMD, MIL-53(Al)) are in agreement with the markings used in the linked publication.
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XRD patterns of V2O5 thin films deposited on quartz glass
Dane BadawczeThe DataSet contains the XRD patterns of V2O5 thin films deposited on a quartz glass substrate. The as-prepared thin films were annealing under an oxidizing atmosphere in the temperature range 200-600C. The results show that the structure of the films dependent on the annealing temperature.
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XRD patterns of TeOx powder
Dane BadawczeThe DataSet contains the XRD patterns of the TeOx powder. The material was obtained by the sol-gel method. The starting solution was prepared by mixing telluric acid (precursor) with thetraetylene glycol, water, and ethanol. The sol was obtained by vigorously stirring precursor solution at 50°C for 2h, then the temperature was raised to 75°C for the...
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XRD patterns of V2O5 thin films deposited on isotropic etching silicon substrates (111)
Dane BadawczeThe DataSet contains the XRD patterns of V2O5 thin films deposited on isotropic etching silicon substrates (111). The silicon wafers were etched in a mixture of nitric acid, hydrofluoric acid, and acetic acid in the ratio of 40:1:15. The soaking time for the substrates was from 30 to 90 seconds. The thin films were obtained by the sol-gel method. ...
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X-ray diffraction patterns of BaCe0.6Zr0.2Y0.1M0.1O3-δ (M = Fe, Pr, Tb)
Dane BadawczeThe dataset consists of three raw X-ray diffraction (XRD) files collected using a Phillips X’Pert Pro diffractometer (CuKα radiation (𝜆 = 1.541 Å), under 40 kV and 30 mA). The diffraction patterns of BaCe0.6Zr0.2Y0.1Fe0.1O3-δ (BCZYFe), BaCe0.6Zr0.2Y0.1Pr0.1O3-δ (BCZYPr), and BaCe0.6Zr0.2Y0.1Tb0.1O3-δ (BCZYTb) were collected at room temperature. Collected...