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Wyniki wyszukiwania dla: TITANIUM DIOXIDE THIN FILM
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Photocatalytic degradation of acetaldehyde in high temperature reaction chamber
Dane BadawczeThis dataset contains chromatograms recorded during the decomposition of acetaldehyde in a high-temperature reaction chamber under UV irradiation using TiO2 (titanium dioxide) as photocatalysts. It includes data on the influence of flow rate, TiO2 (titanium dioxide) filling the entire reactor, a thin layer of TiO2 (titanium dioxide) supported on KBr...
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SEM analysis of the TiO2 layers deposited on a FTO substrates
Dane BadawczeTitanium dioxide layers were deposited on a FTO conducting glass by sol-gel method. For sol gel synthesis butoxy titanium and ethanol were used as a reagents. Samples were sintered in a furnace at temperature of 600 deg. SEM measurements were performed by FEI Quanta FEG250 microscope. SEM images of a cross-section of samples exhibit a porous structures...
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SEM-EDS images of expanded polystyrene spheres coated with silicon dioxide (SiO2) and/or titanium dioxide (TiO2)
Dane BadawczeData contain SEM and SEM-EDS images of expanded polystyrene spheres coated with silicon dioxide (SiO2) and/or titanium dioxide (TiO2). The detailed equipment and measurement data was described in measurement info.txt file.
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UV/VIS Spectroscopy of titanium dioxide coated nickel foams
Dane BadawczeThe data includes UV-Vis spectra of titanium dioxide coated nickel foams heated at 400, 500 and 600 C in Ar. Jasco V-650 Spectrophotometer was used and Spectra Measurement software.
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XRD (X-ray Diffraction) of titanium dioxide coated nickel foams
Dane BadawczeThese data include XRD patterns of titanium dioxide coated nickel foams heated at 400, 500 and 600C in argon atmosphere.
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XRD analysis of the tellurium dioxide thin films
Dane BadawczeTellurium dioxide thin films were deposited by magnetron sputtering method. The XRD analysis of the films annealed at 200, 500, 650 and 700 celsius degree showed appearing of crystalline phase in a higher temeratures.
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FTIR (Fourier-transform infrared spectroscopy) spectra of titanium dioxide coated nickel foams.
Dane BadawczeThis dataset contains FTIR spectra recorded on a JASCO 4200 spectrometer of nickel foams coated with titanium dioxide after heating at 400, 500 and 600 C and after photocatalytic process with NOx.
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Ultra-thin film of aluminum oxide influence on the plasmon resonance in gold nanostructures
Dane BadawczeUltra-thin film of aluminum oxide influence on the plasmon resonance in gold nanostructures was measured by UV-VIS spectroscopy. Ultra thin film of Al2O3 was deposited on a gold nanostructures. Thickness of film was 2nm - 8nm. Shift of plasmon resonance was observed, as a result of various dielectric constant of layer.
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XRD patterns of V2O5 thin film morphology dependent on substrate types
Dane BadawczeThe DataSet contains the XRD patterns of the V2O5 thin film structure dependent on substrate types. The as-prepared thin films were deposited on alumina, zirconium, zirconium oxide and metallic vanadium substrate, then was annealing under an oxidizing atmosphere at 600C for 10h.
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XPS (X-ray photoelectron spectroscopy) of titanium dioxide coated nickel foams and heated 400,500, 600C
Dane BadawczeThis data set contains XPS spectra recorded for nickel foams coated with titanium dioxide and heated at 400, 500 and 600 degrees celcius.
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BET (Brunauer-Emmett-Teller) surface area analysis of titanium dioxide coated nickel foams
Dane BadawczeThe data are presented for the BET surface results of nickel foams coated with titanium dioxide and heated 400, 500 and 600 degrees Celsius in an argon atmosphere. N2 sorption was performed at 77 K pore size distribution was determined by BJH and DFT methods.
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SEM micrographs of V2O5 thin film morphology dependent on substrate types
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of V2O5 thin film morphology dependent on substrate types. The as-prepared thin films were deposited on alumina, zirconium, zirconium oxide and metallic vanadium substrate, then was annealing under an oxidizing atmosphere at 600C for 10h. The results show that the morphology of...
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Optical properties of tellurium dioxide thin films
Dane BadawczeTeO2 and TeO2 doped by Eu thin films manufactured by magnetron sputtering method were measured by optical spectroscopy. Metallic Te target and Te-Eu mosaic target with diameter of 50.8 mm were sputtered for about 45 min in argon-oxygen atmosphere what resulted in 300 nm film thickness deposition. The pressure in the chamber was below 0.2 Pa and substrate...
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Photocatalytic decomposition of acetaldehyde over TiO2 (titanium dioxide) supported on nickel foam and Ni-doped (nickel-doped) TiO2
Dane BadawczeThis dataset contains chromatograms recorded during the decomposition of acetaldehyde in a high-temperature reaction chamber under UV irradiation using as photocatalytic systems TiO2 (titanium dioxide) supported on nickel foam, TiO2 supported on oxidized nickel foam and TiO2 doped by metallic nickel (Ni) powder. The detailed equipment and measurement...
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Phototcatalytic oxidation of NO on titanium dioxide coated nickel foams
Dane BadawczeThe results of photocatalytic NO oxidation were compiled in an Excel file. The measurement was carried out using a chemiluminescence NO analyzer.
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Structural analysis of the tellurium dioxide thin films
Dane BadawczeTeO2 thin films were deposited by magnetron sputtering method. After deposition, amorphous samples were annealed at various temperatures. Influence of annealing temperature on a presence of crystalline phase was investigated.
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Depth profile of the composition of 8 nm Al2O3 thin film
Dane Badawcze8 nm layer of aluminum oxide (Al2O3) was deposited by ALD method on a s. Atomic layer deposition provides precise thickness control down to a single atomic layer. The precursors used were trimethylaluminum (Sigma-Aldrich) and purified water. The deposition of the atomic layer was carried out at 200 °C. To investigate the profile of concenration of...
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The AFM micrographs of vanadium oxides thin films deposited on quartz glass - the influence of the thickness of the thin film on its morphology
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (1, 2 or 3 AsP layers) were deposited on a quartz glass substrate and were...
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Brunauer-Emmett-Teller (BET) surface analysis of titanium dioxide (TiO2) and silicon dioxide (SiO2) used for coating of expanded polystyrene spheres (EPS)
Dane BadawczeData refer to the results of BET surface area of TiO2 and SiO2 powders used for coating of expanded polystyrene spheres. The detailed measurement and equipment data was described in readme BET.txt file.TiO2 was treated firstly in autoclave at 150 C degrees for 1h, then was further heat treated in Ar at 400 C degrees. As a raw material TiO2 was used,...
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The AFM micrographs of vanadium oxides thin films deposited on silicon - the influence of the thickness of the film on morphology
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (1, 2 or 3 AsP layers) were deposited on a silicon substrate and were annealing...