dr hab. inż. Artur Zieliński
Employment
- Associate professor at Department of Electrochemistry, Corrosion and Materials Engineering
Publications
Filters
total: 71
Catalog Publications
Year 2015
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Application of multisine nanoscale impedance microscopy to heterogeneous alloy surface investigations
PublicationIn the recent years atomic force microscopy is recognized as valuable tool for investigation of surficial features of construction materials. It concerns, among other things, studies of changes caused by such phenomena as galvanic corrosion, passivation associated with the growth of oxide layers, or sensitization of austenitic steels with the formation of carbide phases. In addition, atomic forcemicroscopy allows easy coupling...
Year 2014
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Dynamic Nanoimpedance Characterization of the Atomic Force Microscope Tip-Surface Contact
PublicationNanoimpedance measurements, using the dynamic impedance spectroscopy technique, were carried out during loading and unloading force of a probe on three kinds of materials of different resistivity. These materials were: gold, boron-doped diamond, and AISI 304 stainless steel. Changes of impedance spectra versus applied force were registered and differences in the tip-to-sample contact character on each material were revealed. To...
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Effect of native air-formed oxidation on the corrosion behavior of AA7075 aluminum alloys
PublicationThe microstructure of aluminum alloys plays a key role in their corrosion resistance. In particular, the presence of intermetallic precipitates differing in the potential from the alloy matrix induces local corrosion. The study presents the effect of native air-formed oxidation on the corrosion behavior of AA 7075 aluminum alloy. Various microscopic and spectroscopic techniques were used to examine the changes occurring in the...
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Implementation and Validation of Multisinusoidal, Fast Impedance Measurements in Atomic Force Microscope Contact Mode.
PublicationThis study presents a novel approach to impedance measurements. The methodology discussed is limited to contact in the sample-probe system under ambient conditions without the presence of electrolyte. Comparison with results of direct and alternating current measurements for well-defined metallic surfaces are made. In spite of idealization related to the type of contact examined, the proposed technique provides an improvement of...
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Local impedance imaging of boron-doped polycrystalline diamond thin films
PublicationLocal impedance imaging (LII) was used to visualise surficial deviations of AC impedances in polycrystalline boron-doped diamond (BDD). The BDD thin film electrodes were deposited onto the highly doped silicon substrates via microwave plasma-enhanced CVD. The studied boron dopant concentrations, controlled by the [B]/[C] ratio in plasma, ranged from 1 × 1016 to 2 × 1021 atoms cm−3. The BDD films displayed microcrystalline structure,...
Year 2013
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A measurement system for nonlinear surface spectroscopy with an atomic force microscope during corrosion process monitoring
PublicationIn addition to traditional imaging the surface, atomic force microscopy (AFM) enables wide variety of additional measurements. One of them is higher harmonic imaging. In tapping mode the nonlinear contact between tip and specimen results in higher frequency vibrations. More information available from the higher harmonics analysis proves to be helpful for more detailed imaging. Such visualization is espe-cially useful for heterogeneous...
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Electrochemical oxidation of sulphamerazine at boron-doped diamond electrodes: Influence of boron concentration
PublicationThe boron-doped diamond (BDD) electrodes with different boron concentrations have been tested as electrode material for sulphamerazine (SRM) oxidation in water solution. An investigation of the electrode morphology and molecular structure was carried out using high resolution scanning electron microscopy (SEM) and Raman spectroscopy. Electrochemical results showed clearly that the kinetics and efficiency of SRM oxidation were dependent...
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Enhancing capabilities of Atomic Force Microscopy by tip motion harmonics analysis
PublicationMotion of a tip used in an atomic force microscope can be described by the Lennard-Jones potential, approximated by the van der Waals force in a long-range interaction. Here we present a general framework of approximation of the tip motion by adding three terms of Taylor series what results in non-zero harmonics in an output signal. We have worked out a measurement system which allows recording of an excitation tip signal and its...
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Impedance of cation-coupled electron transfer reaction: Theoretical description of one pathway process
PublicationIt has been assumed that cation electron coupled charge transfer can be conducted in accordance with two mutually coupled reactions. Using a differential method an expression was introduced which describes the impedance of a cation electron coupled transfer reaction. Also, an electrical equivalent circuit has been defined. The total faradaic impedance is the sum of electron transfer impedance and cation transfer impedance. Issues...
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Localized impedance measurements of AA2024 and AA2024-T3 performed by means of AFM in contact mode
PublicationPurpose: The purpose of this paper is to present the results of an atomic force microscopy (AFM) based approach to local impedance spectroscopy (LIS) measurement performed on AA2024 and AA2024-T3 aluminium alloys. Design/methodology/approach: AFM-LIS measurements were performed ex-situ without the electrolyte environment, so in fact the electrical not electrochemical impedance was obtained. Findings: Relative local impedance values...
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Measurement system for nonlinear surface spectroscopy by atomic force microscopy for corrosion processes monitoring
PublicationIn addition to traditional imaging the surface, atomic force microscopy (AFM) enables wide variety of additional measurements. One of them is higher harmonic imaging. In tapping mode the nonlinear contact between tip and specimen results in higher frequency vibrations. More information available from the higher harmonics analysis proves to be helpful for more detailed imaging. Such visualization is especially useful for heterogeneous...
Year 2012
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Impedance of cation-coupled electron transfer reaction: teoretical description of one pathway process
PublicationPrzyjęto możliwość występowanie dwóch wzajemnie sprzężonych reakcji. Opisana została impedancja sprzężonej reakcji przeniesienia elektronu z kationem. Wyznaczony został również model elektrycznego schematu zastępczego. Całkowita impedancja Faradayowska jest sumą impedancji przeniesienia elektronu i impedancji przeniesienia kationu. Przykłady pomiaru impedancyjnego w warunkach potencjostatycznych i potencjodynamicznych zostały omówione....
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Improving AFM images with harmonic interference by spectral analysis
PublicationPrzedstawiono sposób usunięcia zakłóceń pojawiających się na obrazach uzyskiwanych z mikroskopu sił atomowych (AFM). Przybliżono kilka metod stosowanych do redukcji zakłóceń w obrazach. Następnie opisano zidentyfikowane zakłócenia harmoniczne oraz zaproponowany sposób ich znaczącej redukcji. W pracy zamieszczono szereg obrazów uzyskanych z mikroskopu AFM ilustrujących efekty powodowane zakłóceniami oraz skuteczność zaproponowanej...
Year 2011
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Atomic force microscopy based approach to local impedance measurements of grain interiors and grain boundaries of sensitized AISI 304 stanless steel
PublicationPraca prezentuje wyniki badań uzyskane z pomiarów techniką lokalnej spektroskopii impedancyjnej (LIS) wykonanych w trybie kontaktowym mikroskopii sił atomowych (AFM), które zostały przeprowadzone w lokalnych obszarach powierzchni ziarna austenitu i na granicy ziarna austenitu wysokostopowej stali austenitycznej AISI 304 poddanej procesowi uczulania oraz na próbkach odniesienia nie poddanych obróbce cieplnej.Badania LIS-AFM były...
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Simulation and measurements for the substance identification by AFM
Publication
Year 2010
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Assessment of organic coating degradation via local impedance imaging
PublicationThe paper presents a new approach to organic coating condition evaluation at micrometer scale using localized impedance measurements. It is based on atomic force microscopy (AFM) in contact mode. Impedance is measured between conductive AFM tip and metal substrate covered with organic coating. A single-frequency voltage perturbation signal is applied between the electrodes and current response signal is registered. As the tip is...
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Mesoscopic impedance analysis of solid materials surface
PublicationSeveral techniques have been developed in order to characterize electrical properties of surfaces in micrometer/nanometer scale. Obtaining of the spatial distribution of sample resistance, capacitance or potential requires separate measurements performed in different scanning modes. On the other hand, analysis of the frequency response of investigated system enables determination of several physical quantities in single measurement...
Year 2009
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Odszumianie obrazów z mikroskopu sił atomowych
PublicationZnanych jest wiele metod odszumiania obrazów. Oprogramowanie przygotowane do tego celu wykorzystuje zwykle transformację falkową i jest często dostępne w sieci Internet lub np. jako tool-box w programie Matlab. Brak jest jednak nadal ogólnych metod, które pozwoliłyby dobierać w sposób optymalny, ze względu na skuteczność usuwania szumów, parametry stosowanej transformacji. Ta uwaga dotyczy także odszumiania obrazów uzyskiwanych...
Year 2008
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Application of dynamic impedance spectroscopy to atomic force microscopy
PublicationMikroskopia sił atomowych jest uniwersalną techniką obrazowania powierzchni podczas gdy spektroskopia impedancyjna jest fundamentalną metodą charakteryzowania właściwości elektrycznych materiałów. Z powyższego względu użyteczne jest połączenie powyższych technik dla uzyskania przestrzennego rozkładu wektora impedancji. W pracy autorzy proponują nowe podejście polegające na połączeniu multiczęstotliwościowego pomiaru impedancyjnego...
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Frequency bands selection of the Portevin-LeChatelier
PublicationEfekt Portevina-LeChateliera ujawnia się w postaci skokowych zmian naprężenia w trakcie procesu odkształcenia próbek pewnych stopów. Zjawisko PLC występuje w kilku odmianach charakteryzujących się istotnymi różnicami zarówno w przestrzennym rozkładzie pasm odkształcenia jak też przebiegu krzywej naprężeniowej. Przebiegi odpowiadające różnym odmianom serration charakteryzują się odmiennymi właściwościami rozkładu energetycznego...
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