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Search results for: ROZKŁADY GESTOŚCI ELEKTRONOWEJ W ATOMACH
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Distance measurement with the low coherent interferometer with silver mirror (the source wavelegth 1310 nm) - 0 um.
Open Research DataThe obtained data was acquired by the interferometric fiber-optic sensor of distance. The setup was constructed of a broadband light source working at the central wavelength of 1310 nm, an optical spectrum analyzer, and a fiber-optic 2x1 coupler (with the power split 50:50). All elements were connected by standard single-mode optical fibers. The measurement...
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Distance measurement with the low coherent interferometer with silver mirror (the source wavelegth 1310 nm) - 110 um (serie 1)
Open Research DataThe obtained data was acquired by the interferometric fiber-optic sensor of distance. The setup was constructed of a broadband light source working at the central wavelength of 1310 nm, an optical spectrum analyzer, and a fiber-optic 2x1 coupler (with the power split 50:50). All elements were connected by standard single-mode optical fibers. The measurement...
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Distance measurement with the low coherent interferometer with silver mirror (the source wavelegth 1310 nm) - 80 um (serie 2)
Open Research DataThe obtained data was acquired by the interferometric fiber-optic sensor of distance. The setup was constructed of a broadband light source working at the central wavelength of 1310 nm, an optical spectrum analyzer, and a fiber-optic 2x1 coupler (with the power split 50:50). All elements were connected by standard single-mode optical fibers. The measurement...
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Distance measurement with the low coherent interferometer with silver mirror (the source wavelegth 1310 nm) - 10 um (serie 2)
Open Research DataThe obtained data was acquired by the interferometric fiber-optic sensor of distance. The setup was constructed of a broadband light source working at the central wavelength of 1310 nm, an optical spectrum analyzer, and a fiber-optic 2x1 coupler (with the power split 50:50). All elements were connected by standard single-mode optical fibers. The measurement...
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Distance measurement with the low coherent interferometer with silver mirror (the source wavelegth 1310 nm) - 190 um (serie 1)
Open Research DataThe obtained data was acquired by the interferometric fiber-optic sensor of distance. The setup was constructed of a broadband light source working at the central wavelength of 1310 nm, an optical spectrum analyzer, and a fiber-optic 2x1 coupler (with the power split 50:50). All elements were connected by standard single-mode optical fibers. The measurement...
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Distance measurement with the low coherent interferometer with silver mirror (the source wavelegth 1310 nm) - 10 um (serie 1)
Open Research DataThe obtained data was acquired by the interferometric fiber-optic sensor of distance. The setup was constructed of a broadband light source working at the central wavelength of 1310 nm, an optical spectrum analyzer, and a fiber-optic 2x1 coupler (with the power split 50:50). All elements were connected by standard single-mode optical fibers. The measurement...
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Distance measurement with the low coherent interferometer with silver mirror (the source wavelegth 1310 nm) - 70 um (serie 1)
Open Research DataThe obtained data was acquired by the interferometric fiber-optic sensor of distance. The setup was constructed of a broadband light source working at the central wavelength of 1310 nm, an optical spectrum analyzer, and a fiber-optic 2x1 coupler (with the power split 50:50). All elements were connected by standard single-mode optical fibers. The measurement...
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Distance measurement with the low coherent interferometer with silver mirror (the source wavelegth 1310 nm) - 100 um (serie 2)
Open Research DataThe obtained data was acquired by the interferometric fiber-optic sensor of distance. The setup was constructed of a broadband light source working at the central wavelength of 1310 nm, an optical spectrum analyzer, and a fiber-optic 2x1 coupler (with the power split 50:50). All elements were connected by standard single-mode optical fibers. The measurement...
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Distance measurement with the low coherent interferometer with silver mirror (the source wavelegth 1310 nm) - 30 um (serie 1)
Open Research DataThe obtained data was acquired by the interferometric fiber-optic sensor of distance. The setup was constructed of a broadband light source working at the central wavelength of 1310 nm, an optical spectrum analyzer, and a fiber-optic 2x1 coupler (with the power split 50:50). All elements were connected by standard single-mode optical fibers. The measurement...
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Distance measurement with the low coherent interferometer with silver mirror (the source wavelegth 1310 nm) - 150 um (serie 2)
Open Research DataThe obtained data was acquired by the interferometric fiber-optic sensor of distance. The setup was constructed of a broadband light source working at the central wavelength of 1310 nm, an optical spectrum analyzer, and a fiber-optic 2x1 coupler (with the power split 50:50). All elements were connected by standard single-mode optical fibers. The measurement...
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Distance measurement with the low coherent interferometer with silver mirror (the source wavelegth 1310 nm) - 160 um (serie 2)
Open Research DataThe obtained data was acquired by the interferometric fiber-optic sensor of distance. The setup was constructed of a broadband light source working at the central wavelength of 1310 nm, an optical spectrum analyzer, and a fiber-optic 2x1 coupler (with the power split 50:50). All elements were connected by standard single-mode optical fibers. The measurement...
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Distance measurement with the low coherent interferometer with silver mirror (the source wavelegth 1310 nm) - 150 um (serie 1)
Open Research DataThe obtained data was acquired by the interferometric fiber-optic sensor of distance. The setup was constructed of a broadband light source working at the central wavelength of 1310 nm, an optical spectrum analyzer, and a fiber-optic 2x1 coupler (with the power split 50:50). All elements were connected by standard single-mode optical fibers. The measurement...
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Distance measurement with the low coherent interferometer with silver mirror (the source wavelegth 1310 nm) - 160 um (serie 1)
Open Research DataThe obtained data was acquired by the interferometric fiber-optic sensor of distance. The setup was constructed of a broadband light source working at the central wavelength of 1310 nm, an optical spectrum analyzer, and a fiber-optic 2x1 coupler (with the power split 50:50). All elements were connected by standard single-mode optical fibers. The measurement...
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Distance measurement with the low coherent interferometer with silver mirror (the source wavelegth 1310 nm) - 100 um (serie 1)
Open Research DataThe obtained data was acquired by the interferometric fiber-optic sensor of distance. The setup was constructed of a broadband light source working at the central wavelength of 1310 nm, an optical spectrum analyzer, and a fiber-optic 2x1 coupler (with the power split 50:50). All elements were connected by standard single-mode optical fibers. The measurement...
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Distance measurement with the low coherent interferometer with silver mirror (the source wavelegth 1310 nm) - 50 um (serie 2)
Open Research DataThe obtained data was acquired by the interferometric fiber-optic sensor of distance. The setup was constructed of a broadband light source working at the central wavelength of 1310 nm, an optical spectrum analyzer, and a fiber-optic 2x1 coupler (with the power split 50:50). All elements were connected by standard single-mode optical fibers. The measurement...
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The AFM micrographs of V2O5 single crystals
Open Research DataThe DataSet contains the atomic force microscope images of the surface of V2O5 single crystals. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The As-prepared films were deposited on a quartz glass substrate and were annealing at 600°C under synthetic air.
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Chemical investigation of the Al2O3 ultra-thin films
Open Research DataUltra-thin layers of oluminum oxide (Al2O3) were deposited by ALD method. Atomic layer deposition provides precise thickness control down to a single atomic layer. The precursors used were trimethylaluminum (Sigma-Aldrich) and purified water. The deposition of the atomic layer was carried out at 200 °C. Samples with a thickness of 2 and 8 nm of alumina...
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The AFM micrographs of vanadium oxides thin films obtained at 800°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on a silicon substrate and vanadium thin films were obtained by annealing as-prepared films at...
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Formation of gold anostructures detected by SEM microscope
Open Research DataGold nanostructures were prepared on silicon - Si(111) as a substrate. The substrates (1 × 1 cm2 of area) were cleaned with acetylacetone and then rinsed in ethanol. Thin Au films (with thicknesses in a range of 1.7–5.0 nm) were deposited using a table-top dc magnetron sputtering coater (EM SCD 500, Leica) under pure Ar plasma conditions (Argon, Air...
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Simulation of perovskite-based CuI/CH3NH3PbI3/TiO2 solar cell performance
Open Research DataThe presented data set is part of the theoretical research on novel thin-layer lead-halide perovskite solar cells with different inorganic transparent conductive oxides used as charge transport layers. In this study CuI/CH3NH3PbI3/TiO2 model structure (Model 1) was investigated by the use of the SCAPS-1D simulation method (https://scaps.elis.ugent.be/).
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Simulation of perovskite-based CuI/CH3NH3PbI3/SnO2 solar cell performance
Open Research DataThe presented data set is part of the theoretical research on novel thin-layer lead-halide perovskite solar cells with different inorganic transparent conductive oxides used as charge transport layers. In this study CuI/CH3NH3PbI3/SnO2 model structure (Model 2) was investigated by the use of the SCAPS-1D simulation method (https://scaps.elis.ugent.be/).
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Simulation of perovskite-based CuI/CH3NH3PbI3/ZnO solar cell performance
Open Research DataThe presented data set is part of the theoretical research on novel thin-layer lead-halide perovskite solar cells with different inorganic transparent conductive oxides used as charge transport layers. In this study CuI/CH3NH3PbI3/ZnO model structure (Model 3) was investigated by the use of the SCAPS-1D simulation method (https://scaps.elis.ugent.be/).
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Wind speed, wind direction and solar radiation datasets; wind and solar energy resources analysis
Open Research DataDataset contain the results of wind speed, wind direction and solar radiation for wind and solar energy resources analysis performed in years 2008 and 2009. Application for efficiency and profitability of solar and wind power plants anaylsis and for energy generation forecasting algorithms design and anaysis. Datasets used in doctoral dissertations,...
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The AFM micrographs of vanadium oxides thin films obtained at 1200°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films obtained at 400°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films obtained at 600°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of of vanadium oxides thin films obtained at 300°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxide thin films obtained at 100°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films obtained at 150°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films obtained at 200°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films deposited on quartz glass - the influence of the thickness of the thin film on its morphology
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (1, 2 or 3 AsP layers) were deposited on a quartz glass substrate and were...
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The AFM micrographs of vanadium oxides thin films obtained at 450°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films deposited on silicon - the influence of the thickness of the film on morphology
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (1, 2 or 3 AsP layers) were deposited on a silicon substrate and were annealing...
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Depth profile of the composition of 8 nm Al2O3 thin film
Open Research Data8 nm layer of aluminum oxide (Al2O3) was deposited by ALD method on a s. Atomic layer deposition provides precise thickness control down to a single atomic layer. The precursors used were trimethylaluminum (Sigma-Aldrich) and purified water. The deposition of the atomic layer was carried out at 200 °C. To investigate the profile of concenration of...
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TEM and EDX study of the Al2O3 ultra thin films
Open Research DataThe ultra-thin layers of Al2O3 were deposited on a silicon substrates. The method of atomic layer deposition (Beneq TFS 200 ALD system) was chosen as the proper method of dielectric layer deposition. This method provides precise thickness control down to a single atomic layer. The precursors used were trimethylaluminum (Sigma-Aldrich) and purified water....
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The orthogonalization of objects simplified with the Simplify Building tool representing groups of buildings in Kartuzy district - scale 1:10000
Open Research DataThe process of automatic generalization is one of the elements of spatial data preparation for the purpose of creating digital cartographic studies. The presented data include a part of the process of generalization of building groups obtained from the national geodesy and cartography resource from BDOT10k (10k topographic database) [1].
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The orthogonalization of objects simplified using the Sester’s method representing groups of buildings in Kartuzy district - scale 1:10000
Open Research DataThe process of automatic generalization is one of the elements of spatial data preparation for the purpose of creating digital cartographic studies. The presented data include a part of the process of generalization of building groups obtained from the national geodesy and cartography resource from BDOT10k (10k topographic database) [1].
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Objects resulting from the sequential generalization of the buildings group in Kartuzy district - scale 1:10000
Open Research DataThe process of automatic generalization is one of the elements of spatial data preparation for the purpose of creating digital cartographic studies. The presented data include a part of the process of generalization of building groups obtained from the national geodesy and cartography resource from BDOT10k (10k topographic database) [1].
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The orthogonisation of objects simplified using the Chrobak’s method representing groups of buildings in Gdańsk district - scale 1:10000
Open Research DataThe process of automatic generalization is one of the elements of spatial data preparation for the purpose of creating digital cartographic studies. The presented data include a part of the process of generalization of building groups obtained from the national geodesy and cartography resource from BDOT10k (10k topographic database) [1].
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The orthogonalization of simplified objects representing groups of buildings in Gdańsk district using the Simplify Building tool - scale 1:10000
Open Research DataThe process of automatic generalization is one of the elements of spatial data preparation for the purpose of creating digital cartographic studies. The presented data include a part of the process of generalization of building groups obtained from the national geodesy and cartography resource from BDOT10k (10k topographic database) [1].
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Objects resulting from the sequential generalization of the buildings group in Gdańsk district - scale 1:10000
Open Research DataThe process of automatic generalization is one of the elements of spatial data preparation for the purpose of creating digital cartographic studies. The presented data include a part of the process of generalization of building groups obtained from the national geodesy and cartography resource from BDOT10k (10k topographic database) [1].
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IKE1-IKE3 (C-1305 derivatives) inhibitory effect of the Yeast Topoisomerase II relaxation activity
Open Research DataInhibition of Yeast Topoisomerase II were analyzed according to relaxation assay kit from Inspiralis. Briefly, 250 ng of supercoiled pBR322 DNA, 1 mM ATP, 1-200 μM of analyzed compound were mixed with reaction buffer (1 mM Tris-HCl (pH 7.9), 10 mM KCl, 0.5 mM MgCl 2, 0.2 % (v/v) glycerol). The reaction was initiated by the addition of an enzyme, allowed...
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The orthogonisation of objects simplified using the Sester’s method representing groups of buildings in Gdańsk district - scale 1:10000
Open Research DataThe process of automatic generalization is one of the elements of spatial data preparation for the purpose of creating digital cartographic studies. The presented data include a part of the process of generalization of building groups obtained from the national geodesy and cartography resource from BDOT10k (10k topographic database) [1].
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The orthogonalization of objects simplified using the Chrobak’s method representing groups of buildings in Kartuzy district - scale 1:10000
Open Research DataThe process of automatic generalization is one of the elements of spatial data preparation for the purpose of creating digital cartographic studies. The presented data include a part of the process of generalization of building groups obtained from the national geodesy and cartography resource from BDOT10k (10k topographic database) [1].
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The electrical properties mesurements of DIR-SOFC with Ce0.8Fe0.2O2-s functional layer
Open Research DataThe dataset includes the electrical properties mesurements of SOFC with Ce0.8Fe0.1O2-s layer. Samples were produced using aqueous soft chemistry methods (microemulsion method) and applied in form of a layer onto the anode of the commercial SOFC. The SOFC was working under biogas feeding at 750oC. The layers were sintered at 1100oC.
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The electrical properties mesurements of DIR-SOFC with Ce0.8Co0.2O2-s functional layer
Open Research DataThe dataset includes the electrical properties mesurements of SOFC with Ce0.8Co0.1O2-s layer. Samples were produced using aqueous soft chemistry methods (microemulsion method) and applied in form of a layer onto the anode of the commercial SOFC. The SOFC was working under biogas feeding at 750oC. The layers were sintered at 1100oC.
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The electrical properties mesurements of DIR-SOFC with Ce0.8Mn0.2O2-s functional layer
Open Research DataThe dataset includes the electrical properties mesurements of SOFC with Ce0.8Mn0.1O2-s layer. Samples were produced using aqueous soft chemistry methods (microemulsion method) and applied in form of a layer onto the anode of the commercial SOFC. The SOFC was working under biogas feeding at 750oC. The layers were sintered at 1100oC.
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The electrical properties mesurements of DIR-SOFC with Ce0.8Ni0.2O2-s functional layer
Open Research DataThe dataset includes the electrical properties mesurements of SOFC with Ce0.8Ni0.1O2-s layer. Samples were produced using aqueous soft chemistry methods (microemulsion method) and applied in form of a layer onto the anode of the commercial SOFC. The SOFC was working under biogas feeding at 750oC. The layers were sintered at 1100oC.
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The electrical properties mesurements of DIR-SOFC with CeO2-s functional layer
Open Research DataThe dataset includes the electrical properties mesurements of SOFC with CeO2-s layer. Samples were produced using aqueous soft chemistry methods (microemulsion method) and applied in form of a layer onto the anode of the commercial SOFC. The SOFC was working under biogas feeding at 750oC. The layers were sintered at 1100oC.
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The electrical properties mesurements of DIR-SOFC with Ce0.8Cu0.2O2-s functional layer
Open Research DataThe dataset includes the electrical properties mesurements of SOFC with Ce0.8Cu0.1O2-s layer. Samples were produced using aqueous soft chemistry methods (microemulsion method) and applied in form of a layer onto the anode of the commercial SOFC. The SOFC was working under biogas feeding at 750oC. The layers were sintered at 1100oC.