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Institute Of Nanotechnology And Materials Engineering
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Open Research Data
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Thermogravimetric analysis data of hydration in air for BaCe0.6Zr0.2Y0.2-xFexO3-δ (x = 0, 0.02, 0.05, 0.1)
Open Research DataThe dataset consists of 6 files of thermogravimetric analysis (TGA) data. The TGA experiments of hydration for BaCe0.6Zr0.2Y0.2O3-δ (BCZY622), BaCe0.6Zr0.2Y0.18Fe0.02O3-δ (BCZYFe2), BaCe0.6Zr0.2Y0.15Fe0.05O3-δ (BCZYFe5), and BaCe0.6Zr0.2Y0.1Fe0.1O3-δ (BCZYFe10) were conducted on Netzsch STA 449.
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Iodometric titration analysis for BaCe0.6Zr0.2Y0.2-xFexO3-δ (x = 0.02, 0.05, 0.1)
Open Research DataThe determination of oxygen nonstoichiometry in the series of BaCe0.6Zr0.2Y0.2-xFexO3-δ (x = 0.02, 0.05, 0.1) compounds was carried out using the iodometric titration method.
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Electrochemical impedance spectroscopy measurements - conductivity vs. temperature and conductivity vs. oxygen partial pressure for BaCe0.6Zr0.2Y0.2-xFexO3-δ (x = 0.02, 0.05, 0.1)
Open Research DataThe dataset consists of two main catalogs consisting of measurement data: of the electrical conductivity of the BaCe0.6Zr0.2Y0.18Fe0.02O3-δ (BCZYFe2), BaCe0.6Zr0.2Y0.15Fe0.05O3-δ (BCZYFe5), and BaCe0.6Zr0.2Y0.1Fe0.1O3-δ (BCZYFe10) samples as a function of temperature and of the electrical conductivity as a function of oxygen partial pressure (pO2)....
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Electrical conductivity relaxation measurements - water uptake and oxidation of BaCe0.6Zr0.2Y0.2-xFexO3-δ (x = 0.02, 0.05, 0.1)
Open Research DataThe dataset consists of 2 main catalogs: measurements performed for oxidation/reduction (Oxidation) and hydration/dehydration (Hydration). Each of them consists individual catalogs for the measurements performed on the samples indicated by the name of the catalog. In the case of oxidation/reduction, inside each them, there are catalogs indicating if...
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X-Ray difractogramms of multicomponent perovskites
Open Research DataThe dataset contains raw XRD patterns of four exemplary barium perovskites having 5 different B-cations, that is Zr, Hf, Sn, Ti and Ce, Zr, Hf, Sn, Ti and Y, Zr, Hf, Sn, Ti and Yb and Zr, Hf, Sn, Ti and Sm. The perovskites were synthesised and studied in the NCN project "High entropy oxides for energy conversion"
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High temperature X-Ray difractogramms of 8_B cation multicomponent perovskites
Open Research DataThe dataset contains high-temperature XRD patterns of the Ba(ZrHfSnTiInYYbSm)O3 perovskite which was hydrated at 300 C before the analyses. The set contains the data from four subsequent heating treatments. It also includes the XRD of a dry sample. The technical symbol of the sample is H038.
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High temperature X-Ray difractogramms of 10_B cation multicomponent perovskites
Open Research DataThe dataset contains high-temperature XRD patterns of the Ba(ZrHfSnTiCeInYYbSmZn)O3 perovskite which was hydrated at 300 C before the analyses. The set contains the data from four subsequent heating treatments. It also includes the XRD of a dry sample. The technical symbol of the sample is H038. The perovskites were synthesised and studied in the NCN...
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High temperature X-Ray difractogramms of multicomponent orthoniobate
Open Research DataHigh-temperature XRD of calcium-doped (La0.2Nd0.2Sm0.2Gd0.2Eu0.2)1-xCaxNbO4-δ (x = 0.05) ortho-niobate. The oxide undergoes the transition between monoclinic and tetragonal structures.
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Enhancing electrical properties through in-situ controlled nanocrystallization of V2O5–TeO2 glass
Open Research DataThe dataset contains raw data and projects concerning the manuscript called "Enhancing electrical properties through in-situ controlled nanocrystallization of V2O5–TeO2 glass"
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The electrical conductivity of pristine, La-, and Nb-doped SFM measured in air and hydrogen atmospheres
Open Research DataThis dataset consists of an Excel sheet with the result of DC4W method of electrical measurements. The measurements were conducted on pristine strontium ferrite molubdate as well as ones doped with La and Nb. Additionally two samples co-doped with La and Ni/Co were analyzed. Pellets were prepared by high temperature sintering at 1400 deg. C, then cut...
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High temperature XRD diffraction patterns collected during the reoxidation process of SFM-based compounds
Open Research DataThis dataset contains three file folders for SFM, LSFM (La-doped) and SFMNb (Nb-doped) respectively. Samples were reduced prior to the XRD measurements. The measurements were performed on Philipps X’Pert Pro diffractometer using a high-temperature Anthon Paar HT-1200 oven adapter. Scans were performed each 50 deg. in air. The data in dataset were already...
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FTIR spectra of Ce0.9M0.1O2 synthesised by reverse microemulsion method
Open Research DataThe dataset consist of the FTIR spectra of Ce0.9M0.1O2 synthesised by reverse microemulsion method, after calcination at 500 degrees.
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The 3d Ce XPS spectra of Ce0.9M0.1O2
Open Research DataThe dataset consists of 3d Ce XPS of Ce0.9M0.1O2 where (M=Mn, Fe, Co, Ni, Cu). X-ray Photoelectron Spectroscopy analysis (XPS) was performed using X-ray photoelectron spectrometer Omnicron NanoTechnology with 128-channel collector. XPS measurements were undertaken in ultra-high vacuum conditions, below 1.1x10-8 mbar. Photoelectrons were excited by an...
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The 2p XPS spectra of transition metals in Ce0.9M0.1O2
Open Research DataThe dataset consists of 2p XPS spectra of transition metals in Ce0.9M0.1O2 where (M=Mn, Fe, Co, Ni, Cu). X-ray Photoelectron Spectroscopy analysis (XPS) was performed using X-ray photoelectron spectrometer Omnicron NanoTechnology with 128-channel collector. XPS measurements were undertaken in ultra-high vacuum conditions, below 1.1x10-8 mbar. Photoelectrons...
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Impact of strontium non-stoichiometry of SrxTi0.3Fe0.7O3-δ
Open Research DataThis dataset contains results of the research on the basis of which the Figures presented in the manuscript entitled "Impact of strontium non-stoichiometry of SrxTi0.3Fe0.7O3-δ on structural, electrical, and electrochemical properties for potential oxygen electrode of intermediate temperature Solid Oxide Cells" were prepared. A detailed description...
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Au nanostructures coated with a ultrathin film of Al2O3 - measurements and FDTD simulations
Open Research DataGold plasmonic platforms have been coated with an ultra-thin films of aluminium oxide. Optical measurements, showing the influence of the thickness of Al2O3 on plasmon resonance position. The observed red-shift of the resonance location with the increase of the thickness of the Al2O3 film, can be explained by the change in the dielectric function of...
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Investigation of the uniformity of TeO2:Eu layer
Open Research DataTeO2 doped by Eu thin films manufactured by magnetron sputtering method were measured by XPS method. Te-Eu mosaic target with diameter of 50.8 mm was sputtered for about 45 min in argon-oxygen atmosphere what resulted in 300 nm film thickness deposition. The pressure in the deposition chamber was below 0.2 Pa and substrate was heated at 200 oC during...
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Depth profile of the composition of 8 nm Al2O3 thin film
Open Research Data8 nm layer of aluminum oxide (Al2O3) was deposited by ALD method on a s. Atomic layer deposition provides precise thickness control down to a single atomic layer. The precursors used were trimethylaluminum (Sigma-Aldrich) and purified water. The deposition of the atomic layer was carried out at 200 °C. To investigate the profile of concenration of...
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Chemical investigation of the Al2O3 ultra-thin films
Open Research DataUltra-thin layers of oluminum oxide (Al2O3) were deposited by ALD method. Atomic layer deposition provides precise thickness control down to a single atomic layer. The precursors used were trimethylaluminum (Sigma-Aldrich) and purified water. The deposition of the atomic layer was carried out at 200 °C. Samples with a thickness of 2 and 8 nm of alumina...
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Graphene oxide thin films deposited on a PCB board - chemical analysis
Open Research DataGraphene oxides based films were measured by X-ray photoemission spectroscopy (XPS) method. TheXPS measurements were carried out with the Omicron NanoTechnology UHV equipment. The hemispherical spectrophotometer was equipped with a 128-channel collector. The XPS measurements were performed at room temperature at a pressure below 1.1 × 10−8 mBar. The...
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Mn-Co nanofilms on nickel foam measured by XPS mehod
Open Research DataManganium-Cobaltium based thin films were electrochemically deposited on a Ni based subsrates in a one-step process at −1.1 V vs. Ag/AgCl in an aqueous solution of differently concentrated Mn(NO3)2·4H2O and Co(NO3)2·6H2O with the deposition time limited by charges of 60, 120, and 200 mC at 25 °C. The concentration ratios of Mn(NO3)2·4H2O to Co(NO3)2·6H2O...
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XPS analysis of the GO based materials
Open Research DataGraphene oxides samples were measured by XPS method. The X-ray photoemission spectroscopy measurements were carried out with Omicron NanoTechnology UHV equipment. The hemispherical spectrophotometer was equipped with a 128-channel collector. The XPS measurements were performed at room temperature at a pressure below 1.1 × 10−8 mBar. The photoelectrons...
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Substrate characterization in a electrochemically derived Manganium-Cobaltium thin films
Open Research DataManganium-Cobaltium thin films were electrochemically deposited on a Ni foams subsrates in a one-step process at −1.1 V vs. Ag/AgCl in an aqueous solution of differently concentrated Mn(NO3)2·4H2O and Co(NO3)2·6H2O with the deposition time limited by charges of 60, 120, and 200 mC at 25 °C. The concentration ratios of Mn(NO3)2·4H2O to Co(NO3)2·6H2O...
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XRD patterns of V2O5 nanostructures
Open Research DataThe DataSet contains the XRD patterns of vanadium pentaoxide nanostructures obtained by the sol-gel with different annealing temperatures under synthetic air. The results show that crystallinity dependent on the annealing temperature.
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XRD patterns of V2O3 nanostructures
Open Research DataThe DataSet contains the XRD patterns of V2O3 nanostructures obtained by the sol-gel with different reaction conditions. The xerogel powder was annealing under a reducing atmosphere (94% Ar, 6% H2) in the temperature range 350-700C. The results show that crystallinity dependent on the annealing temperature.
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XRD patterns of the V2O5 coatings after thermal treatment under reducing atmosphere
Open Research DataThe DataSet contains the XRD patterns of V2O5 coatings on the silicon substrate after thermal treatment under a reducing atmosphere. Thin films were annealed at 500C, 600C, and 700C for 10 under a reducing atmosphere (94% Ar, 6% H2).
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Morphology and structure of V2O5 nanorods deposited on the silicon substrate after reduction
Open Research DataThe DataSet contains the XRD patterns and SEM micrographs of V2O5 nanorods on the silicon substrate after thermal treatment under a reducing atmosphere. Thin films were annealed at 500C for 40 under a reducing atmosphere (94% Ar, 6% H2).
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XRD patterns of the V2O5 nanorods after thermal treatment under reducing atmosphere
Open Research DataThe DataSet contains the XRD patterns of V2O5 nanorods after thermal treatment under a reducing atmosphere. Samples were annealed at 450C for 2, 20, and 40h under a reducing atmosphere (94% Ar, 6% H2).
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XRD patterns of VO2 and V6O13 nanostructures
Open Research DataThe DataSet contains the XRD patterns of VO2 and V6O13 thin films deposited on a silicon substrate. The as-prepared thin films were annealing under a reducing atmosphere (94% Ar, 6% H2) at 500, 600 and 700C for 10h.
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XRD patterns of V2O5 thin film morphology dependent on substrate types
Open Research DataThe DataSet contains the XRD patterns of the V2O5 thin film structure dependent on substrate types. The as-prepared thin films were deposited on alumina, zirconium, zirconium oxide and metallic vanadium substrate, then was annealing under an oxidizing atmosphere at 600C for 10h.
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XRD patterns of V2O5 thin films deposited on silicon substrate
Open Research DataThe DataSet contains the XRD patterns of V2O5 thin films deposited on a silicon substrate. The as-prepared thin films were annealing under an oxidizing atmosphere in the temperature range of 300-600C. The results show that the structure of the films dependent on the annealing temperature.
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XRD patterns of V2O5 thin films deposited on quartz glass
Open Research DataThe DataSet contains the XRD patterns of V2O5 thin films deposited on a quartz glass substrate. The as-prepared thin films were annealing under an oxidizing atmosphere in the temperature range 200-600C. The results show that the structure of the films dependent on the annealing temperature.
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Temperature of formation of Au nanostructures
Open Research DataNanostructures were obtained via annealing of thin Au films. In order to determine possible nanoislands formation mechanisms, dependence on initial film thickness was examined. For the surface morphology studies, nanograin structure and chemical composition analysis, SEM, HR TEM and EDS measurements were performed, respectively. Morphology studies shown...
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Structure and optical measurements of Eu doped tellurium oxide thin films
Open Research DataThin films were deposited by magnetron sputtering method and simultaneously heated at 200 oC. Presence of Eu ions and their valence states was confirmed by X-ray photoemission spectroscopy measurements. The structure of the films as well as the influence of europium dopant on crystalline structure of the films was examined by X-ray diffraction method. ...
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Structure of ammonium vanadate synthesis by LPE-IonEx method
Open Research DataThe DataSet contains the XRD patterns, FTIR spectra of NH4VO3 crystals with different morphology obtained by the LPE-IonEx method.
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UV-Vis measurements and SEM images of Ag nanostructures
Open Research DataUv-vis and SEM of Ag nanostructures. Structures were obtained by dewetting thin films. Various fabrication conditions i.e. temperature, time of the annealing and thickness of the initial layer were subsequently changed.