Dane badawcze rozpoczynające się od: X wyczyść
Filtry
wszystkich: 24238
wybranych: 87
Katalog Danych Badawczych
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XRD patterns of VO2 and V2O3 nanostructures
Dane BadawczeThe DataSet contains the XRD patterns of VO2 and V2O3 nanostructures obtained by the sol-gel with different reaction conditions. The information about xerogel powder synthesis is described in the Journal of Nanomaterials. The xerogel powder was annealing under argon atmosphere in the temperature range 400-1000C. The results show that the morphology...
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XRD patterns of vanadium oxide nanostructures on silicon substrate obtained by V2O5 recrystallization
Dane BadawczeThe DataSet contains the XRD patterns of vanadium oxide nanostructures on silicon substrates obtained by recrystallization of V2O5 thin films between 800-1200°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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XRD patterns of vanadium oxide nanostructures on quartz glass substrate obtained by V2O5 recrystallization
Dane BadawczeThe DataSet contains the XRD patterns of vanadium oxide nanostructures on quartz glass substrates obtained by recrystallization of V2O5 thin films between 800-1200°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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XRD patterns of V2O5 thin films deposited on isotropic etching silicon substrates (111)
Dane BadawczeThe DataSet contains the XRD patterns of V2O5 thin films deposited on isotropic etching silicon substrates (111). The silicon wafers were etched in a mixture of nitric acid, hydrofluoric acid, and acetic acid in the ratio of 40:1:15. The soaking time for the substrates was from 30 to 90 seconds. The thin films were obtained by the sol-gel method. ...
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XPS measurements of the Fe-Bi based glass
Dane BadawczeFe-Si-O and Fe-Si-Pb-O glass was measured by XPS method. The influence of Pb dopand on the glass structure, including the valence of iron, was investigated. The influence of the annealing temperature on the behavior of iron in glass was also investigated. Studies have confirmed the mixed valence of iron in glasses and a high proportion of metallic Fe.
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XPS analysis of strontium titanate ceramics
Dane BadawczeThe chemical composition of the strontium titanite doped with yttrium and iron ceramic samples was investigated. Samples of Y0.07Sr0.93Ti0.8Fe0.2 were prepared by solid phase reaction and sintered for 24 and 48 hours. Chemical composition was measured by UHV OmicronNanotechnology XPS system. The analysis confirmed the chemical composition of the ceramics...
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XRD data of V2AlC, Mo3AlC2, Mo3CTx and V2AlCTx
Dane BadawczeRaw data for XRD diffractograms of MAX phases: V2AlC and Mo3AlC2 and corresponding MXenes after selective etching of Al.
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X-ray diffractometry results of the SrTi0.50Fe0.50O3-d powder
Dane BadawczeThis dataset contains results of X-ray diffractometry mesurement (XRD) of the SrTi0.50Fe0.50O3-d (STF50) powder after ball milling. The phase composition of the investigated STF50 powder was analyzed by XRD at room temperature. The X-ray diffractometry (XRD) technique was used to determine the phase composition of the fabricated powder. Measurements...
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X-ray diffractometry results of the SrTi0.35Fe0.65O3-d powder
Dane BadawczeThis dataset contains results of X-ray diffractometry mesurement (XRD) of the SrTi0.35Fe0.65O3-d (STF35) powder after ball milling. The phase composition of the investigated STF35 powder was analyzed by XRD at room temperature. The X-ray diffractometry (XRD) technique was used to determine the phase composition of the fabricated powder. Measurements...
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X-ray diffractometry results of the SrTi0.30Fe0.70O3-d powder
Dane BadawczeThis dataset contains results of X-ray diffractometry mesurement (XRD) of the SrTi0.30Fe0.70O3-d (STF70) powder after ball milling. The phase composition of the investigated STF70 powder was analyzed by XRD at room temperature. The X-ray diffractometry (XRD) technique was used to determine the phase composition of the fabricated powder. Measurements...
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XRD patterns of V2O5 nanostructures
Dane BadawczeThe DataSet contains the XRD patterns of vanadium pentaoxide nanostructures obtained by the sol-gel with different annealing temperatures under synthetic air. The results show that crystallinity dependent on the annealing temperature.
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XRD patterns of V2O3 nanostructures
Dane BadawczeThe DataSet contains the XRD patterns of V2O3 nanostructures obtained by the sol-gel with different reaction conditions. The xerogel powder was annealing under a reducing atmosphere (94% Ar, 6% H2) in the temperature range 350-700C. The results show that crystallinity dependent on the annealing temperature.
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XRD patterns of the V2O5 coatings after thermal treatment under reducing atmosphere
Dane BadawczeThe DataSet contains the XRD patterns of V2O5 coatings on the silicon substrate after thermal treatment under a reducing atmosphere. Thin films were annealed at 500C, 600C, and 700C for 10 under a reducing atmosphere (94% Ar, 6% H2).
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XRD patterns of the V2O5 nanorods after thermal treatment under reducing atmosphere
Dane BadawczeThe DataSet contains the XRD patterns of V2O5 nanorods after thermal treatment under a reducing atmosphere. Samples were annealed at 450C for 2, 20, and 40h under a reducing atmosphere (94% Ar, 6% H2).
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XRD patterns of VO2 and V6O13 nanostructures
Dane BadawczeThe DataSet contains the XRD patterns of VO2 and V6O13 thin films deposited on a silicon substrate. The as-prepared thin films were annealing under a reducing atmosphere (94% Ar, 6% H2) at 500, 600 and 700C for 10h.
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X-ray Photoelectron Spectroscopy studies of ammonium vanadate
Dane BadawczeThe DataSet contains the high-resolution XPS studies of the ammonium vanadate nanostructures obtained by the hydrothermal method. XPS analyses were carried out with an X-ray photoelectron spectrometer (Omicron NanoTechnology) with a 128-channel collector. The measurements were performed at room temperature in an ultra-high vacuum condition (below 1.1x10-8...
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XRD patterns of V2O5 thin film morphology dependent on substrate types
Dane BadawczeThe DataSet contains the XRD patterns of the V2O5 thin film structure dependent on substrate types. The as-prepared thin films were deposited on alumina, zirconium, zirconium oxide and metallic vanadium substrate, then was annealing under an oxidizing atmosphere at 600C for 10h.
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XRD patterns of V2O5 thin films deposited on silicon substrate
Dane BadawczeThe DataSet contains the XRD patterns of V2O5 thin films deposited on a silicon substrate. The as-prepared thin films were annealing under an oxidizing atmosphere in the temperature range of 300-600C. The results show that the structure of the films dependent on the annealing temperature.
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XRD patterns of V2O5 thin films deposited on quartz glass
Dane BadawczeThe DataSet contains the XRD patterns of V2O5 thin films deposited on a quartz glass substrate. The as-prepared thin films were annealing under an oxidizing atmosphere in the temperature range 200-600C. The results show that the structure of the films dependent on the annealing temperature.
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XRD patterns of ammonium vanadate nanocrystals
Dane BadawczeThe DataSet contains the XRD patterns of ammonium vanadate nanobelts obtained by the hydrothermal method with different conditions. The results show that the structure and phase compositions of samples dependent on reaction conditions.