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prof. dr hab. inż. Barbara Kościelska
Employment
- Professor at Instytut Nanotechnologii i Inżynierii Materiałowej
- Vice-Dean for Organization at Faculty of Applied Physics and Mathematics
- Head of Section at Zakład fizyki nanomateriałów
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XRD patterns of TeOx powder
Open Research DataThe DataSet contains the XRD patterns of the TeOx powder. The material was obtained by the sol-gel method. The starting solution was prepared by mixing telluric acid (precursor) with thetraetylene glycol, water, and ethanol. The sol was obtained by vigorously stirring precursor solution at 50°C for 2h, then the temperature was raised to 75°C for the...
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XRD patterns of TeOx-BaO-BiO powder
Open Research DataThe DataSet contains the XRD patterns of the TeOx-BaO-BiO powder. The material was obtained by the sol-gel method. The starting solution was prepared by mixing telluric acid (precursor), barium carbonate, and bismuth carbonate with thetraetylene glycol, water, ethanol, and acetic acid. (Samples molar concentration: 73TeO2-4BaO-3Bi2O3 and 73TeO2-3BaO-4Bi2O3)....
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XRD patterns of VO2 and V2O3 thin films obtained at 500°C
Open Research DataThe DataSet contains the XRD patterns of VO2 and V2O3 thin films obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (3-9 AsP layers) were deposited on a silicon substrate and were annealing at 500°C under an argon atmosphere.
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XRD patterns of VO2 and V2O3 thin films obtained at 700°C
Open Research DataThe DataSet contains the XRD patterns of VO2 and V2O3 thin films obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (5-9 AsP layers) were deposited on a silicon substrate and were annealing at 700°C under an argon atmosphere.
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XRD patterns of VO2 and V2O3 nanostructures
Open Research DataThe DataSet contains the XRD patterns of VO2 and V2O3 nanostructures obtained by the sol-gel with different reaction conditions. The information about xerogel powder synthesis is described in the Journal of Nanomaterials. The xerogel powder was annealing under argon atmosphere in the temperature range 400-1000C. The results show that the morphology...
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XRD patterns of vanadium oxide nanostructures on silicon substrate obtained by V2O5 recrystallization
Open Research DataThe DataSet contains the XRD patterns of vanadium oxide nanostructures on silicon substrates obtained by recrystallization of V2O5 thin films between 800-1200°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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XRD patterns of vanadium oxide nanostructures on quartz glass substrate obtained by V2O5 recrystallization
Open Research DataThe DataSet contains the XRD patterns of vanadium oxide nanostructures on quartz glass substrates obtained by recrystallization of V2O5 thin films between 800-1200°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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XRD patterns of V2O5 thin films deposited on isotropic etching silicon substrates (111)
Open Research DataThe DataSet contains the XRD patterns of V2O5 thin films deposited on isotropic etching silicon substrates (111). The silicon wafers were etched in a mixture of nitric acid, hydrofluoric acid, and acetic acid in the ratio of 40:1:15. The soaking time for the substrates was from 30 to 90 seconds. The thin films were obtained by the sol-gel method. ...
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XRD patterns of V2O5 nanostructures
Open Research DataThe DataSet contains the XRD patterns of vanadium pentaoxide nanostructures obtained by the sol-gel with different annealing temperatures under synthetic air. The results show that crystallinity dependent on the annealing temperature.
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XRD patterns of V2O3 nanostructures
Open Research DataThe DataSet contains the XRD patterns of V2O3 nanostructures obtained by the sol-gel with different reaction conditions. The xerogel powder was annealing under a reducing atmosphere (94% Ar, 6% H2) in the temperature range 350-700C. The results show that crystallinity dependent on the annealing temperature.
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XRD patterns of the V2O5 coatings after thermal treatment under reducing atmosphere
Open Research DataThe DataSet contains the XRD patterns of V2O5 coatings on the silicon substrate after thermal treatment under a reducing atmosphere. Thin films were annealed at 500C, 600C, and 700C for 10 under a reducing atmosphere (94% Ar, 6% H2).
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Morphology and structure of V2O5 nanorods deposited on the silicon substrate after reduction
Open Research DataThe DataSet contains the XRD patterns and SEM micrographs of V2O5 nanorods on the silicon substrate after thermal treatment under a reducing atmosphere. Thin films were annealed at 500C for 40 under a reducing atmosphere (94% Ar, 6% H2).
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XRD patterns of the V2O5 nanorods after thermal treatment under reducing atmosphere
Open Research DataThe DataSet contains the XRD patterns of V2O5 nanorods after thermal treatment under a reducing atmosphere. Samples were annealed at 450C for 2, 20, and 40h under a reducing atmosphere (94% Ar, 6% H2).
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XRD patterns of VO2 and V6O13 nanostructures
Open Research DataThe DataSet contains the XRD patterns of VO2 and V6O13 thin films deposited on a silicon substrate. The as-prepared thin films were annealing under a reducing atmosphere (94% Ar, 6% H2) at 500, 600 and 700C for 10h.
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XRD patterns of V2O5 thin film morphology dependent on substrate types
Open Research DataThe DataSet contains the XRD patterns of the V2O5 thin film structure dependent on substrate types. The as-prepared thin films were deposited on alumina, zirconium, zirconium oxide and metallic vanadium substrate, then was annealing under an oxidizing atmosphere at 600C for 10h.
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XRD patterns of V2O5 thin films deposited on silicon substrate
Open Research DataThe DataSet contains the XRD patterns of V2O5 thin films deposited on a silicon substrate. The as-prepared thin films were annealing under an oxidizing atmosphere in the temperature range of 300-600C. The results show that the structure of the films dependent on the annealing temperature.
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XRD patterns of V2O5 thin films deposited on quartz glass
Open Research DataThe DataSet contains the XRD patterns of V2O5 thin films deposited on a quartz glass substrate. The as-prepared thin films were annealing under an oxidizing atmosphere in the temperature range 200-600C. The results show that the structure of the films dependent on the annealing temperature.
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Structure of ammonium vanadate synthesis by LPE-IonEx method
Open Research DataThe DataSet contains the XRD patterns, FTIR spectra of NH4VO3 crystals with different morphology obtained by the LPE-IonEx method.
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Structural and luminescence properties of B2O3-Bi2O3+10AlF3 glasses doped with Eu3+/Dy3+ ions
Open Research DataThe attached data contains the results of measurements of B2O3-Bi2O3 and B2O3-Bi2O3+10AlF3 glasses doped with Eu3+ and Dy3+ ions in different molar ratios. Glasses were synthesized by the melt quenching technique. On their basis, the structural, optical, and luminescence properties of synthesized samples were characterized. The dataset includes XRD,...
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Increasing the conductivity of v2o5-teo2 glass by crystallization: structure and charge transfer studies
Open Research DataThis is the dataset concerning the publication titled: Increasing the conductivity of V2O5-TeO2 glass by crystallization: structure and charge transfer studies. In this dataset raw data and origin project concerning this article can be found.
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TG and DTG profiles for plastics: LDPE, HDPE, PP, PD and PET
Open Research DataThe dataset includes:
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Influence of controlled crystallization and SrF2 content on the structure and properties of Eu3+ doped phosphate glasses
Open Research DataThe attached data contains the results of measurements of phosphate glasses and glass-ceramics doped with Eu. On their basis, the new material was characterized and the influence of the SrF2 addition on the glass structure was determined. In addition, the influence of the SrF2 content and controlled crystallization on the luminescent properties of Eu3+...
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Au nanostructures coated with a ultrathin film of Al2O3 - measurements and FDTD simulations
Open Research DataGold plasmonic platforms have been coated with an ultra-thin films of aluminium oxide. Optical measurements, showing the influence of the thickness of Al2O3 on plasmon resonance position. The observed red-shift of the resonance location with the increase of the thickness of the Al2O3 film, can be explained by the change in the dielectric function of...
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XRD, DTA and luminescence measurements of B2O3-Bi2O3-AlF3 glasses doped with Eu3+, Tb3+ and Tm3+ ions
Open Research DataThe DataSet contains the XRD,DTA and luminescence measurements for the B2O3-Bi2O3-AlF3 glass system. Samples were prepared by the conventional melt quenching technique. Starting materials were melted in porcelain crucibles at 950 oC for 20 min. XRD and DTA data were collected for 50B2O3-50Bi2O3,45B2O3-45Bi2O3+10AlF3 and 40B2O3-40Bi2O3+20AlF3 glasses....
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Luminescence and FTIR measurements of B2O3-Bi2O3-SrF2 glass and glass-ceramics doped with Eu3+ ions
Open Research DataLuminescence and FTIR measurements of B2O3-Bi2O3-xSrF2+2Eu (x=10,20) glass and glass-ceramics. The emission and excitation spectra of the samples depend on the composition and annealing time.
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Raw data of AuAg nanoalloy plasmon resonances used for machine learning method
Open Research DataRaw data used for machine learning process. UV-vis measurements of AuAg alloyed nanostructures created from thin films. Plasmonic band position dependence on fabrication parameters. Small presentation reviewing achieved structures and their properties.
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Temperature of formation of Au nanostructures
Open Research DataNanostructures were obtained via annealing of thin Au films. In order to determine possible nanoislands formation mechanisms, dependence on initial film thickness was examined. For the surface morphology studies, nanograin structure and chemical composition analysis, SEM, HR TEM and EDS measurements were performed, respectively. Morphology studies shown...
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Structure and optical measurements of Eu doped tellurium oxide thin films
Open Research DataThin films were deposited by magnetron sputtering method and simultaneously heated at 200 oC. Presence of Eu ions and their valence states was confirmed by X-ray photoemission spectroscopy measurements. The structure of the films as well as the influence of europium dopant on crystalline structure of the films was examined by X-ray diffraction method. ...
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UV-Vis measurements and SEM images of Ag nanostructures
Open Research DataUv-vis and SEM of Ag nanostructures. Structures were obtained by dewetting thin films. Various fabrication conditions i.e. temperature, time of the annealing and thickness of the initial layer were subsequently changed.
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Measurements of AuAg nanostructures
Open Research DataExtensive UV-vis measurements of AuAg alloyed nanostructures created from thin films. Plasmonic band position dependence on fabrication parameters.
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Processed measurements of AuAg nanostructures
Open Research DataExtensive processed UV-vis measurements of AuAg alloyed nanostructures created from thin films. Plasmonic band position dependence on fabrication parameters.
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