Artur Zieliński - Publications - Bridge of Knowledge

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  • Assessment of organic coating degradation via local impedance imaging

    The paper presents a new approach to organic coating condition evaluation at micrometer scale using localized impedance measurements. It is based on atomic force microscopy (AFM) in contact mode. Impedance is measured between conductive AFM tip and metal substrate covered with organic coating. A single-frequency voltage perturbation signal is applied between the electrodes and current response signal is registered. As the tip is...

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  • Mesoscopic impedance analysis of solid materials surface
    Publication

    Several techniques have been developed in order to characterize electrical properties of surfaces in micrometer/nanometer scale. Obtaining of the spatial distribution of sample resistance, capacitance or potential requires separate measurements performed in different scanning modes. On the other hand, analysis of the frequency response of investigated system enables determination of several physical quantities in single measurement...

Year 2009
  • Odszumianie obrazów z mikroskopu sił atomowych
    Publication

    Znanych jest wiele metod odszumiania obrazów. Oprogramowanie przygotowane do tego celu wykorzystuje zwykle transformację falkową i jest często dostępne w sieci Internet lub np. jako tool-box w programie Matlab. Brak jest jednak nadal ogólnych metod, które pozwoliłyby dobierać w sposób optymalny, ze względu na skuteczność usuwania szumów, parametry stosowanej transformacji. Ta uwaga dotyczy także odszumiania obrazów uzyskiwanych...

Year 2008
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