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Search results for: ellipsometric modeling
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JOURNAL OF MOLECULAR MODELING
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Ellipsometric data analysis used in on-line metal passivation monitoring
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A review of applications of ellipsometry in corrosion research
PublicationElipsometria jest to nieinwazyjna i bardzo dokładna technika pomiarowa znajdująca coraz więcej zastosowań w badaniach korozyjnych. Poglądowo przedstawiono aktualne zastosowania pomiarów elipsometrycznych. Przeglądu dokonano pod kątem przydatności elipsometrii do wyznaczania grubości oraz charakterystyki optycznej cienkich warstewek pasywnych pokrywających powierzchnię różnych metali. Opisano zastosowanie pomiarów elipsometrycznych...
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Ellipsometric study of carbon nitride films deposited by DC-magnetron sputtering
PublicationWe report the optical properties of a carbon nitride (CNx) film as a function of nitrogen concentration (N/C) of the deposited film. As nitrogen concentration is increased (N/C ratio) in a CNx film, the refractive index and band gap also increase. The real and imaginary parts, n and k (refractive index and extinction coefficient) of the complex refraction index of carbon nitride films were determined by spectroscopic ellipsometry...
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Ellipsometric study of oxide formation on Cu electrode in 0.1 M NaOH
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Ellipsometric study of carbon nitride films deposited by DC-magnetron sputtering
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Journal of Chemical Information and Modeling
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APPLIED MATHEMATICAL MODELLING
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Elipsometric data analysis used in on-line metal passivation monitoring
PublicationWykorzystano technikę elipsometrii monochromatycznej do opisu on-line warstw tlenkowych, elektroosadzanych na miedzi. Elipsometria jest w stanie dostarczyć informacji odnośnie grubości i współczynników załamania światła układów warstwowych, jednakże wymagane w tym celu jest zbudowanie matematycznego modelu odwzorowującego stałe optyczne układu badanego. W powyższej pracy przedyskutowane zostały różne metody dopasowywania modelu...
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Dependence Modeling
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Multidiscipline Modeling in Materials and Structures
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Ellipsometry study of oxide formation on Cu electrode in 0.1 M NaOH
PublicationPrzedstawiono przykład zastosowania techniki elipsometrii monochromatycznej w celu określenia dynamiki wzrostu warstw tlenkowych i wodorotlenkowych na miedzi w środowisku 0.1M NaOH. Badania te stanowią część projektu skupiającego się na oznaczeniu fizycznych i elektrycznych własności tlenku miedzi (I) oraz tlenku miedzi (II) podczas procesu formowania się warstwy. Jednoczesne pomiary elipsometryczne i impedancyjne są nowatorskie...
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Synthesis, ellipsometry and non-linear optical features of substituted 1,3,5-triphenylpyrazolines
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Variable Temperature Spectroscopic Ellipsometry as a Tool for Insight into the Optical Order in the P3HT:PC70BM and PC70BM Layers
PublicationTwo combined ellipsometric techniques—variable angle spectroscopic ellipsometry (VASE) and variable temperature spectroscopic ellipsometry (VTSE)—were used as tools to study the surface order and dielectric properties of thin films of a poly(3-hexylthiophene-2,5-diyl) (P3HT) mixture with a fullerene derivative (6,6-phenyl-C71-butyric acid methyl ester) (PC70BM). Under the influence of annealing, a layer of the ordered PC70BM...
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P3HT:PCBM blend films phase diagram on the base of variable-temperature spectroscopic ellipsometry
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Phase diagram of P3HT:PC70BM thin films based on variable-temperature spectroscopic ellipsometry
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Optical properties of boron-doped nanocrystalline diamond films studied by spectroscopic ellipsometry
PublicationThe optical properties of boron-doped nanocrystalline diamond films, coated using Microwave Plasma Enhanced Chemical Vapour Deposition (μPE CVD) system, were analyzed by spectroscopic ellipsometry. Diamond films were deposited on silicon substrates. The ellipsometry data (refractive index (n(λ)), extinction coefficient (k(λ)) were modeled using dedicated software. Evolution of the optical structure with boron doping was observed...
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Modeling pragmatics for visual modeling language evaluation
PublicationPodczas oceny użyteczności języków modelowania wizualnego istnieje potrzeba uwzględnienia ich pragmatyki. Języki modelowania wizualnego mogą być stosowane w różnym kontekście, co powoduje różnice w wymaganiach, które są im stawiane. Jawny opis kontekstu użycia ułatwia precyzyjną ocenę. Pragmatyka składa się ze zbioru profili, które opisują konkretne konteksty użycia. W referacie podjęto próbę zastosowania modeli zadań do opisu...
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JOURNAL OF MOLECULAR GRAPHICS & MODELLING
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Journal of Multiscale Modeling
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ENVIRONMENTAL MODELING & ASSESSMENT
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Journal of Mathematical Modeling
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Statistics & Risk Modeling
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Computer Research and Modeling
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Computational Mathematics and Modeling
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Mathematical Modeling and Computing
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NATURAL RESOURCE MODELING
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Journal for Modeling in Ophthalmology
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MODELING IDENTIFICATION AND CONTROL
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Software and Systems Modeling
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Scientific Modeling and Simulations
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ECONOMIC MODELLING
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STATISTICAL MODELLING
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Ellipsometric investigation of nitrogen doped diamond thin films grown in microwave CH4/H2/N2 plasma enhanced chemical vapor deposition
PublicationThe influence of N2 concentration (1%–8%) in CH4/H2/N2 plasma on structure and optical properties of nitrogen doped diamond (NDD) films was investigated. Thickness, roughness, and optical properties of the NDD films in the VIS–NIR range were investigated on the silicon substrates using spectroscopic ellipsometry. The samples exhibited relatively high refractive index (2.6 6 0.25 at 550 nm) and extinction coefficient (0.05 6 0.02...
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Systems Analysis Modelling Simulation
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Sparse autoregressive modeling
PublicationIn the paper the comparison of the popular pitch determination (PD) algorithms for thepurpose of elimination of clicks from archive audio signals using sparse autoregressive (SAR)modeling is presented. The SAR signal representation has been widely used in code-excitedlinear prediction (CELP) systems. The appropriate construction of the SAR model is requiredto guarantee model stability. For this reason the signal representation...
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Ellipsometric monitoring during the polarization studies of Mg corrosion in alkaline environment
Open Research DataThe dataset contains the ellipsometric results from the Mg polarization studies aiming at understanding the Mg(OH)2 passive layer formation mechanism and conditions. The single-wavelength ellipsometer ELX-02C from Dr Riss GmbH was utilized, operating He-Ne laser at 632.8 nm. The polarization conditions for the experiment are depicted in the related...
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MULTISCALE MODELING & SIMULATION
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Chemical Product and Process Modeling
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Journal of Computational Simulation and Modeling
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Journal of Water Management Modeling
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Complex Adaptive Systems Modeling
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Advances in Modeling and Analysis C
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Journal of Peridynamics and Nonlocal Modeling
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Journal of Nonlinear Modeling and Analysis
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The Influence of PEDOT to PSS Ratio on the Optical Properties of PEDOT:PSS Thin Solid Films - Insight from Spectroscopic Ellipsometry
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Cezary Orłowski prof. dr hab. inż.
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COMBUSTION THEORY AND MODELLING
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Journal of Modelling in Management
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Journal of Choice Modelling
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