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X-ray diffractometry results of the Sr0.90Ti0.30Fe0.70O3-d material before and after H2-TPR measurement
Dane BadawczeThis dataset contains results of X-ray diffractometry mesurement (XRD) of the Sr0.90Ti0.30Fe0.70O3-d material. The phase composition of the investigated powders was analyzed by XRD at room temperature. The X-ray diffractometry (XRD) technique was used to determine the phase composition of the fabricated powder and powder after H2-TPR (temperature programmed...
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X-ray diffractometry results of the Sr1.00Ti0.30Fe0.70O3-d material before and after H2-TPR measurement
Dane BadawczeThis dataset contains results of X-ray diffractometry mesurement (XRD) of the Sr1.00Ti0.30Fe0.70O3-d material. The phase composition of the investigated powders was analyzed by XRD at room temperature. The X-ray diffractometry (XRD) technique was used to determine the phase composition of the fabricated powder and powder after H2-TPR (temperature programmed...
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X-ray diffractometry results of the Sr0.95Ti0.30Fe0.70O3-d material before and after H2-TPR measurement
Dane BadawczeThis dataset contains results of X-ray diffractometry mesurement (XRD) of the Sr0.95Ti0.30Fe0.70O3-d material. The phase composition of the investigated powders was analyzed by XRD at room temperature. The X-ray diffractometry (XRD) technique was used to determine the phase composition of the fabricated powder and powder after H2-TPR (temperature programmed...
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SPTNO ceramics measured by XPS method
Dane BadawczeSPTNO (Sr-Pr-Ti-Ni-O) ceramic were manufactured by solid state reaction, from oxides compounds. Synthesis conducted in air atmosphere at temperature in a range of 800-900 deg. Chemical composition of prepared materials were measured by XPS (X-Ray photoemision spectroscopy) method. UHV OmicronNanotechnology system with 128 channel Argus hemispherical...
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The AFM micrographs of vanadium oxides thin films obtained at 800°C
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on a silicon substrate and vanadium thin films were obtained by annealing as-prepared films at...
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SEM micrographs of morphology evolution of V2O5 nanostructures
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of morphology evolution of vanadium pentaoxide nanostructures obtained by the sol-gel, depending on annealing temperature under synthetic air. The results show that the morphology dependent on the annealing temperature.
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Nonlinear impedance of Bi2VO5.5 ceramic of thickness 2.52 mm (after second heat-treatment at 913 K) was measured at high temperature range with impedance spectroscopy method
Dane BadawczeThe nonlinear electrical properties of Bi2VO5.5 ceramic of thickness 2.52 mm (after second heat-treatment at 913 K) was measured by impedance spectroscopy method.
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Effects of CO2 and utilization of spent trickling liquid towards plant growth
Dane BadawczeDataset presents the results of biomass yield for Phaseolus vulgaris pot cultures watered with diluted trickling liquid from biotrickling filtration experiments with or without additional CO2 in air by means of introducting post-biofilter air to the plant culture.
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The AFM micrographs of vanadium oxides thin films obtained at 1200°C
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films obtained at 400°C
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films obtained at 600°C
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of of vanadium oxides thin films obtained at 300°C
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxide thin films obtained at 100°C
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films obtained at 150°C
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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XRD patterns of V2O5 nanostructures
Dane BadawczeThe DataSet contains the XRD patterns of vanadium pentaoxide nanostructures obtained by the sol-gel with different annealing temperatures under synthetic air. The results show that crystallinity dependent on the annealing temperature.
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The AFM micrographs of vanadium oxides thin films obtained at 200°C
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films deposited on quartz glass - the influence of the thickness of the thin film on its morphology
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (1, 2 or 3 AsP layers) were deposited on a quartz glass substrate and were...
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The AFM micrographs of vanadium oxides thin films obtained at 450°C
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films deposited on silicon - the influence of the thickness of the film on morphology
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (1, 2 or 3 AsP layers) were deposited on a silicon substrate and were annealing...
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XRD patterns of vanadium oxide nanostructures on silicon substrate obtained by V2O5 recrystallization
Dane BadawczeThe DataSet contains the XRD patterns of vanadium oxide nanostructures on silicon substrates obtained by recrystallization of V2O5 thin films between 800-1200°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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XRD patterns of vanadium oxide nanostructures on quartz glass substrate obtained by V2O5 recrystallization
Dane BadawczeThe DataSet contains the XRD patterns of vanadium oxide nanostructures on quartz glass substrates obtained by recrystallization of V2O5 thin films between 800-1200°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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Chemical composition of V2O5 nanorods
Dane BadawczeThe DataSet contains the chemical compositions of the V2O5 nanorods on a silicon substrate. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The As-prepared thin films were annealed at 600C under a synthetic air atmosphere.
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FTIR in situ - ethylene decomposition on TiO2
Dane BadawczeThese data contain FTIR spectra recorded in FTIR spectrometer Nicolet iS50 coupled with High Temperature Chamber "The Praying Mantis". These spectra were measured for TiO2 irradiated by UV and under flowing of ethylene gas diluted in air. FTIR spectra were measured in situ during the photocatalytic process of ethylene decomposition. In order to identify...
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Refractive index measurement in the range of 1.3 – 1.5 for 1550 nm wavelength (2nd serie)
Dane BadawczeThe low-coherence refractive index measurements of certified liquid samples provided by Cargille Labs were performed. The measurement system consisted of a broadband light source (central wavelength of 1550 nm), an optical spectrum analyzer, a 2x1 fiber-optic coupler (50:50 power split), and single-mode telecommunication optical fibers. A micromechanical...
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Refractive index measurement in the range of 1.3 – 1.5 for 1550 nm wavelength (1st serie)
Dane BadawczeThe low-coherence refractive index measurements of certified liquid samples provided by Cargille Labs were performed. The measurement system consisted of a broadband light source (central wavelength of 1550 nm), an optical spectrum analyzer, a 2x1 fiber-optic coupler (50:50 power split), and single-mode telecommunication optical fibers. A micromechanical...
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Comparisson of area specific resistance of the SrTi1-xFexO3-d porous oxygen electrodes and state-of-the-art LSCF sintered at optimal conditions
Dane BadawczeIn this dataset are presented results of the polarization resistance of optimaly sintered SrTi1-xFexO3-d porous oxygen electrodes in symetrical cell (1000 °C; 800 °C and 800°C respectively x = 0.35; 0.50 and 0.70). For commparison were selected commercially avilable state-of-the-art LSCF (Europa) sintered at 1050 °C. The measurement temperature range...
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Structure evolution of V2O5 thin films deposited on quartz glass substrate - High-Temperature X-ray Diffraction
Dane BadawczeThe DataSet contains the XRD patterns of V2O5 thin films deposited on guartz glass. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on the quartz glass substrate. The structure was measured in-situ during heating between 50-800°C under synthetic...
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Structure evolution of V2O5 thin films deposited on silicon substrate - High-Temperature X-ray Diffraction
Dane BadawczeThe DataSet contains the XRD patterns of V2O5 thin films deposited on silicon substrates (111). The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on the silicon substrate. The structure was measured in-situ during heating between 50-800°C under...
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Thermal properties of VO2 and V2O3 nanostructures
Dane BadawczeThe DataSet contains the DSC and TG curves of VO2 and V2O3 nanostructures obtained by the sol-gel with different reaction conditions. The information about xerogel powder synthesis is described in the Journal of Nanomaterials. The xerogel powder was annealing under argon atmosphere at the selected temperature: 500C, 600C, and 1000C.
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SEM micrographs of vanadium oxide nanostructures obtained by V2O5 recrystallization at 1000°C
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of vanadium oxide nanostructures on quartz glass and silicon substrates obtained by recrystallization of V2O5 thin films at 1000°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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SEM micrographs of vanadium oxide nanostructures obtained by V2O5 recrystallization at 800°C
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of vanadium oxide nanostructures on quartz glass and silicon substrates obtained by recrystallization of V2O5 thin films at 800°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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SEM micrographs of vanadium oxide nanostructures obtained by V2O5 recrystallization at 1200°C
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of vanadium oxide nanostructures on quartz glass and silicon substrates obtained by recrystallization of V2O5 thin films at 1200°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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Raman spectra of PCMCA-X (potassium citrate derived porous carbon materials obtained at various temperatures of carbonization)
Dane BadawczeThese data contain Raman spectra of PCMCA-700 (potassium citrate derived porous carbon materials obtained at 700°C ), PCMCA-800 (potassium citrate derived porous carbon materials obtained at 800°C ), PCMCA-900 (potassium citrate derived porous carbon materials obtained at 900°C ). The D peak at 1340 cm−1 and the G peak at 1592 cm−1 can be seen in all...
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Share of enterprises' expenditure in total R&D expenditure (2009-2011)
Dane BadawczeThe countries with the highest share of enterprises in R&D expenditure are: Finåandia (67%), Germany (65.6%) and Slovenia (61.2%). On the opposite pole are Cyprus (11%), Bulgaria (16.9%) and Latvia (24.8%). The average result for the Member States in 2011 was 54.9%. It is worth noting that the countries that significantly increased the ratio of...
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Nonlinear impedance of 50Bi2VO5.5-50SrB4O7 glass measured with impedance spectroscopy method at low temperature region
Dane BadawczeThe nonlinear electrcial properties of 50(Bi2VO5.5)-50SrB4O7 glass was measured by impedance spectroscopy method.
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Nonlinear impedance of Bi2VO5.5 ceramic prepared by traditional melt quenching technique was measured with impedance spectroscopy method at low temperature region
Dane BadawczeThe nonlinear electrical properties of Bi2VO5.5 ceramic prepared by traditional melt quenching technique was measured by impedance spectroscopy method.
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Nonlinear impedance of 50Bi2VO5.5-50SrB4O7 annealed glass at 593 K measured with impedance spectroscopy method at high temperature region
Dane BadawczeThe nonlinear electrcial properties of 50Bi2VO5.5-50SrB4O7 annealed glass was measured by impedance spectroscopy method.
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Nonlinear impedance of 35Bi2VO5.5-65SrB4O7 glass measured with impedance spectroscopy method at high temperature region
Dane BadawczeThe nonlinear electrcial properties of 35Bi2VO5.5-65SrB4O7 glass was measured by impedance spectroscopy method.
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Nonlinear impedance of as-quenched 40Bi2VO5.5-60SrB4O7 glass measured with impedance spectroscopy method at high temperature region
Dane BadawczeThe nonlinear electrical properties of as-quenched 40Bi2VO5.5-60SrB4O7 glass was measured by impedance spectroscopy method.
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Nonlinear impedance of 30Bi2VO5.5-70SrB4O7 glass measured with impedance spectroscopy method at high temperature region
Dane BadawczeThe nonlinear electrcial properties of 30Bi2VO5.5-70SrB4O7 glass was measured by impedance spectroscopy method.
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Nonlinear impedance of 50Bi2VO5.5-50SrB4O7 glass measured with impedance spectroscopy method at high temperature region
Dane BadawczeThe nonlinear electrcial properties of 50(Bi2VO5.5)-50SrB4O7 glass was measured by impedance spectroscopy method.
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Nonlinear impedance of 45Bi2VO5.5-55SrB4O7 glass measured with impedance spectroscopy method at high temperature region
Dane BadawczeThe nonlinear electrcial properties of 45Bi2VO5.5-55SrB4O7 glass was measured by impedance spectroscopy method.
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Reaction quotients of reforming reactions for SOFC and SOFC with LSCNT layer fueled by biogas mixture at 750 C - longterm
Dane BadawczeThe dataset contains the calculated reaction quotients of reforming reactions for the SOFC and SOFC with LSCNT layer (La0.27Sr0.54Ce0.09Ni0.1Ti0.9O3-s) fueled by synthetic biogas mixture (60:40 CH4:CO2). The outlet concentration of the gases from SOFC were measured using novel FTIR-based unit.
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The morphology of V2O5 nanostructures deposited on quartz glass
Dane BadawczeThe DataSet contains the confocal microscope images of morphology evolution of vanadium pentaoxide nanostructures on quartz glass obtained by annealing as-prepared films at 500C and 600C under synthetic air.
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The share of BEV and PHEV in total number of registered vehicles (%) 2011-2016
Dane BadawczeIn 2016, the highest percentage of electric vehicles among all passenger automobiles was recorded in Norway - about 28% (it should be noted that in 5 years the number of electric cars in this country increased from 5 thousand to 133 thousand). However, the remaining countries in the ranking note a much smaller share of sales of electric vehicles in...
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Electrical measurements of the dewetting of metal thin films
Dane BadawczeIn situ observations of dewetting of thin films is very complicated. One of the method, that helps to observe it, could be electrical measurements. For experiments, thin gold, silver and gold-silver nanoalloy films were deposited by magnetron sputtering method. Films were deposited on a Corning glass substrates. Samples were measured by four point method...
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Nonlinear impedance as a function of A.C. voltage for glass 40Bi2VO5.5-60SrB4O7 annealed at 473 K for 3h and next fully crystallized measured with impedance spectroscopy method at high temperature region
Dane BadawczeThe nonlinear electrcial properties as a function of A.C. voltage for annealed at 473 K for 3h and next fully crystallized 40Bi2VO5.5-60SrB4O7 glass was measured by impedance spectroscopy method.
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Nonlinear impedance as a function of A.C. voltage for fully crystallized 35Bi2VO5.5-65SrB4O7 glass measured with impedance spectroscopy method at high temperature region
Dane BadawczeThe nonlinear electrcial properties as a function of A.C. voltage for fully crystallized 35Bi2VO5.5-65SrB4O7 glass was measured by impedance spectroscopy method.
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Nonlinear impedance of 45Bi2VO5.5-55SrB4O7 fully crystallized glass measured with impedance spectroscopy method at high temperature region
Dane BadawczeThe nonlinear electrcial properties of 45Bi2VO5.5-55SrB4O7 fully crystallized glass was measured by impedance spectroscopy method.
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Nonlinear impedance as a function of A.C. voltage for annealed and next fully crystallized 50Bi2VO5.5-50SrB4O7 glass measured with impedance spectroscopy method at high temperature region
Dane BadawczeThe nonlinear electrcial properties as a function of A.C. voltage for annealed and next fully crystallized 50Bi2VO5.5-50SrB4O7 glass was measured by impedance spectroscopy method.