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Wyniki wyszukiwania dla: WAVE PERTURBATIONS IN PLASMA
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Nonlinear impedance of 50Bi2VO5.5-50SrB4O7 fully crystallized glass at 813 K measured with impedance spectroscopy method at high temperature region
Dane BadawczeThe nonlinear electrcial properties of 50Bi2VO5.5-50SrB4O7 fully crystallized glass was measured by impedance spectroscopy method.
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Nonlinear impedance of 40Bi2VO5.5-60SrB4O7 annealed glass at 593 K measured with impedance spectroscopy method at high temperature region
Dane BadawczeThe nonlinear electrical properties of 40Bi2VO5.5-60SrB4O7 glass annealed at 593 K was measured by impedance spectroscopy method.
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Nonlinear impedance of 50Bi2VO5.5-50SrB4O7 partially crystallized glass at 613 K measured with impedance spectroscopy method at high temperature region
Dane BadawczeThe nonlinear electrcial properties of 50Bi2VO5.5-50SrB4O7 partially crystallized glass was measured by impedance spectroscopy method.
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Nonlinear impedance as a function of A.C. voltage for fully crystallized 45Bi2VO5.5-55SrB4O7 glass measured with impedance spectroscopy method at high temperature region
Dane BadawczeThe nonlinear electrcial properties as a function of A.C. voltage for fully crystallized 45Bi2VO5.5-55SrB4O7 glass was measured by impedance spectroscopy method.
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Nonlinear impedance of 30Bi2VO5.5-70SrB4O7 fully crystallized glass measured with impedance spectroscopy method at high temperature region
Dane BadawczeThe nonlinear electrcial properties of 30Bi2VO5.5-70SrB4O7 fully crystallized glass was measured by impedance spectroscopy method.
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Nonlinear impedance of glass 40Bi2VO5.5-60SrB4O7 annealed at 593 K and next fully crystallized was measured with impedance spectroscopy method at high temperature region
Dane BadawczeThe nonlinear electrcial properties of glass 40Bi2VO5.5-60SrB4O7 annealed at 593 K and next fully crystallized was measured by impedance spectroscopy method.
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Rheological and compressive strength (ultrasonic pulse method) properties of cement pastes containing iron oxide (Fe3O4) nanoparticles
Dane BadawczeRheological data of cement pastes containing different replacement levels of cement with iron oxide nanoparticles deterimined using MCR 301 (Anton Paar) stress-imposed rheometer, equipped with calibrated helicoidal geometry
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SEM inwestigation of the silver nanostructures
Dane BadawczeSilver thin films with a thickness of 1nm, 3nm, 5nm, 7nm and 9nm were deposited by a table-top magnetron sputtering unit in a pure argon plasma from a high-purity silver target. Silicon wafers was used as a substrates. As-deposired films were annealed in Ar atmosphere at 550 Celsius degree for 15 minutes.As a result of annealing, Ag nanostructures formed...
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Data obtained by numerical simulation for X-ray focusing using a finite difference method
Dane BadawczeThe propagation of X-ray waves through an optical system consisting of many X-ray refractive lenses is considered. For solving the problem for an electromagnetic wave, a finite-difference method is applied.
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Oxidation of silver nanostructures
Dane BadawczeSilver nanostructures were prepared on Si substrate. Thin Ag films (2 and 6 nm thickness) were deposited using a tabletop dc magnetron sputtering coater (EM SCD 500, Leica) in pure Ar plasma. The Ag target was of 99.99% purity, the rate of layer deposition was about 0.4 nm·s−1 , and the incident power was in the range of 30–40 W. The layer thickness...
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SEM micrographs of diamond-phase (sp3-C) rich boron-doped carbon nanowalls (sp2-C)
Dane BadawczeThis dataset contains the Scanning Electron Microscopy (SEM) micrographs taken for rich boron-doped carbon nanowalls structures, with different boron addition during the synthesis process and different CVD synthesis duration. The [B]/[C] ratios in the plasma were set to 0k, 1.2k, 2k and 5k ppm. The time of growth was ranging between 4 and 9 hours. This...
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SEM images of dewetted gold films
Dane BadawczeGold nanostructures were prepared on silicon - Si(111) as a substrate. as a result of dewetting process. Thin golds films were deposited using a table-top dc magnetron sputtering coater under pure Ar plasma conditions . The Au target had 99.99% purity, the rate of Au layer deposition was about 0.4 nm·s−1 and the incident power was 32 W. The thickness...
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X-Ray diffraction of the metallic nanostructures
Dane BadawczeMetallic nanostructures (gold and silver) were manufactured as a thermal annealing of gold or silver thin film. Gold films with thickness of 2.8 nm were deposited on a silicon substrates using a table-top dc magnetron sputtering coater (EM SCD 500, Leica), equipped with quartz microbalance for in-situ thickness measurements. Films were deposited from...
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Comparison of XPS spectra of Ag3d for silver nanostructures and bulk material
Dane BadawczeAg nanostructures were prepared on borosilicate glass (Corning 1737F) and Si substrates. In both cases, the substrateswere cleaned with acetylacetone and then rinsed in ethanol. Thin Ag films (2 and 6 nm thickness) were deposited using a tabletop dc magnetron sputtering coater (EM SCD 500, Leica) in pure Ar plasma (argon, Air Products 99.999%). The...
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Investigation of plasmon resonance in a silver nanoparticles
Dane BadawczeSilver nanostructures were prepared on borosilicate glass (Corning 1737F) substrates. Thin Ag films (1–9 nm thickness) were deposited using a table-top dc magnetron sputtering coater (EM SCD 500, Leica) in pure Ar plasma (argon, Air Products 99.999%). The Ag target was of 99.99% purity, the rate of layer deposition was about 0.4 nm·s−1, and the incident...
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SEM images of tge gold nanostructures on silicon
Dane BadawczeAu nanostructures were prepared on Si(111) as a substrate. The substrates (1 × 1 cm2 of area) were cleaned with acetylacetone and then rinsed in ethanol. Thin Au films (with thicknesses in a range of 1.7–5.0 nm) were deposited using a table-top dc magnetron sputtering coater (EM SCD 500, Leica) under pure Ar plasma conditions (Argon, Air Products 99.999%)....
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Distance measurement by the low coherent interferometer
Dane BadawczeThe obtained data was acquired by the interferometric fiber-optic sensor of distance. The setup was constructed of a broadband light source working at the central wavelength of 1560 nm, an optical spectrum analyzer and a fiber-optic 2x1 coupler (with the power split 50:50). All elements were connected by standard single-mode optical fibers. The measurement...
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Formation of gold anostructures detected by SEM microscope
Dane BadawczeGold nanostructures were prepared on silicon - Si(111) as a substrate. The substrates (1 × 1 cm2 of area) were cleaned with acetylacetone and then rinsed in ethanol. Thin Au films (with thicknesses in a range of 1.7–5.0 nm) were deposited using a table-top dc magnetron sputtering coater (EM SCD 500, Leica) under pure Ar plasma conditions (Argon, Air...
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Compression test results of fused filamend fabricated polylactyde and polylactyde with carbon fiber filler
Dane BadawczeThe DataSet contains the results of the mechanical behaviour of cube specimens with dimensions 30 x 30 x 30 cm3. The specimens were additively manufactured with the fused filament fabrication (FFF) method. They used two different materials polylactide (PURE PLA) and polylactide with carbon fibre filler (PLA+CF). The specimens were segregated into three...
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Distance measurement by the low coherent interferometer with NND layer (the source wavelegth 1310 nm)
Dane BadawczeThe obtained data was acquired by the interferometric fiber-optic sensor of distance. The setup was constructed of a broadband light source working at the central wavelength of 1310 nm, an optical spectrum analyzer, and a fiber-optic 2x1 coupler (with the power split 50:50). All elements were connected by standard single-mode optical fibers. The measurement...