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Search results for: Nanotechnology
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3D point cloud as a representation of buildings: the Nanotechnology Center and the Auditorium Novum
Open Research DataThe product presents the point cloud in the collection of a three-dimensional database in spatial order as the representations of the Nanotechnology Center and the Auditorium Novum buildings (located on the campus of the Gdańsk University of Technology) acquired in the laser scanning technology. According to its high accuracy and precision of data acquisition...
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The 3d Ce XPS spectra of Ce0.9M0.1O2
Open Research DataThe dataset consists of 3d Ce XPS of Ce0.9M0.1O2 where (M=Mn, Fe, Co, Ni, Cu). X-ray Photoelectron Spectroscopy analysis (XPS) was performed using X-ray photoelectron spectrometer Omnicron NanoTechnology with 128-channel collector. XPS measurements were undertaken in ultra-high vacuum conditions, below 1.1x10-8 mbar. Photoelectrons were excited by an...
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XPS study of the TiO2-WO2 composites
Open Research DataValence state of W and Ti was measured in a TiO2-WO3 composites with a various composition.Powder samples of pure titanium dioxide, tungsten oxide and mix of 50% titanium oxide and 50% od tungsten oxide were measured. Oxides were annealed at the temperature in the range of 300 Celsius degree up to 900 deg. Measurements were performed by XPS UHV Omicron...
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The 2p XPS spectra of transition metals in Ce0.9M0.1O2
Open Research DataThe dataset consists of 2p XPS spectra of transition metals in Ce0.9M0.1O2 where (M=Mn, Fe, Co, Ni, Cu). X-ray Photoelectron Spectroscopy analysis (XPS) was performed using X-ray photoelectron spectrometer Omnicron NanoTechnology with 128-channel collector. XPS measurements were undertaken in ultra-high vacuum conditions, below 1.1x10-8 mbar. Photoelectrons...
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Depth profile of the gold-silver bimetallic structures
Open Research DataSilver and gold bimetallic layers were deposited on a silicon substrate by magnetron sputtering method. Both, Au and Ag layers had 3 nm of thickness. That prepared nanostructures were measured by XPS method. To obtain a depth profile of chemical composition, an Argon ion (Ar+) gun was used for etching surface of sample. Each cycle of etching takes 30...
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The XPS spectra of Ce0.8Ni0.2O2 prepared using microemulsion method
Open Research DataThe dataset includes XPS spectra of Ce0.8Ni0.2O2-s sintered under air atmosphere. Samples were produced using aqueous soft chemistry methods (microemulsion). The XPS spectra were collected for all species.
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The XPS spectra of Ce0.8Cu0.2O2 prepared using microemulsion method
Open Research DataThe dataset includes XPS spectra of Ce0.8Cu0.2O2-s sintered under air atmosphere. Samples were produced using aqueous soft chemistry methods (microemulsion). The XPS spectra were collected for all species.
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Depth profile of the chemical composition of the Au-Ag multilayers
Open Research DataSilver and gold multilayers were deposited on a silicon substrate by magnetron sputtering method. Both type, Au and Ag thin films had 2 nm of thickness. Totally structure had thickness of 6 nm (Au-Ag-Au). That prepared multilayers were measured by XPS method. To obtain a depth profile of chemical composition, an Argon ion (Ar+) gun was used for etching...
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The XPS spectra of LSCNT sintered at 1200C
Open Research DataThe dataset includes XPS spectra of La0.27Sr0.54Ce0.09Ni0.1Ti0.9O3-s sintered at various temperatures under air atmosphere for 12 h. Samples were produced using aqueous soft chemistry methods (Pechini). The XPS spectra were collected for all species.
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The XPS spectra of Al2O3/5%Cu prepared using wet impregnation method
Open Research DataThe dataset includes XPS spectra of Al2O3/5%Cu catalyst sintered under air atmosphere. Samples were produced using aqueous soft chemistry methods and incipient wettness impregnation using nitrate solution. The XPS spectra were collected for all species.
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The XPS spectra of AlOOH/1%Cu prepared using wet impregnation method
Open Research DataThe dataset includes XPS spectra of AlOOH/1%Cu catalyst sintered under air atmosphere. Samples were produced using aqueous soft chemistry methods and incipient wettness impregnation using nitrate solution. The XPS spectra were collected for all species.
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The XPS spectra of ZrO2/5%Cu prepared using wet impregnation method
Open Research DataThe dataset includes XPS spectra of ZrO2/5%Cu catalyst sintered under air atmosphere. Samples were produced using aqueous soft chemistry methods and incipient wettness impregnation using nitrate solution. The XPS spectra were collected for all species.
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The XPS spectra of CeO2/5%Cu prepared using wet impregnation method
Open Research DataThe dataset includes XPS spectra of CeO2/5%Cu catalyst sintered under air atmosphere. Samples were produced using aqueous soft chemistry methods and incipient wettness impregnation using nitrate solution. The XPS spectra were collected for all species.
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The XPS spectra of SrTiO3/5%Cu prepared using wet impregnation method
Open Research DataThe dataset includes XPS spectra of SrTiO3/5%Cu catalyst sintered under air atmosphere. Samples were produced using aqueous soft chemistry methods and incipient wettness impregnation using nitrate solution. The XPS spectra were collected for all species.
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The XPS spectra of AlOOH/5%Cu prepared using wet impregnation method
Open Research DataThe dataset includes XPS spectra of AlOOH/5%Cu catalyst sintered under air atmosphere. Samples were produced using aqueous soft chemistry methods and incipient wettness impregnation using nitrate solution. The XPS spectra were collected for all species.
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X-ray Photoelectron Spectroscopy studies of ammonium vanadate
Open Research DataThe DataSet contains the high-resolution XPS studies of the ammonium vanadate nanostructures obtained by the hydrothermal method. XPS analyses were carried out with an X-ray photoelectron spectrometer (Omicron NanoTechnology) with a 128-channel collector. The measurements were performed at room temperature in an ultra-high vacuum condition (below 1.1x10-8...
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XPS analysis of the GO based materials
Open Research DataGraphene oxides samples were measured by XPS method. The X-ray photoemission spectroscopy measurements were carried out with Omicron NanoTechnology UHV equipment. The hemispherical spectrophotometer was equipped with a 128-channel collector. The XPS measurements were performed at room temperature at a pressure below 1.1 × 10−8 mBar. The photoelectrons...
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AFM and SSRM investiagtion of carbon nanowalls properties
Open Research DataStructures with limited dimensionality are of great interest in modern nanotechnology. The properties of these objects are used, among others, for the construction of modern displays or as a base for quantum computers. Carbon nanowalls, which are the subject of the imaging results contained in this collection, are also considered interesting building...
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Graphene oxide thin films deposited on a PCB board - chemical analysis
Open Research DataGraphene oxides based films were measured by X-ray photoemission spectroscopy (XPS) method. TheXPS measurements were carried out with the Omicron NanoTechnology UHV equipment. The hemispherical spectrophotometer was equipped with a 128-channel collector. The XPS measurements were performed at room temperature at a pressure below 1.1 × 10−8 mBar. The...
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Mechanical lithography in a polymer substrate using AFM in contact mode
Open Research DataMechanical lithography in a polymer substrate. Contact mode. NTEGRA Prima (NT-MDT) device. NSG 01 probe.