Search results for: AFM
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The study of harmonic imaging by AFM = Badania harmonicznych w obrazowaniu AFM
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Simulation and measurements for the substance identification by AFM
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Morphology of polyurethanes revisited by complementary AFM and TEM
PublicationPrzedmiotem badań mikroskopowych TEM i AFM były lane segmentowe poliuretany o zawartości 30 i 50% segmentu sztywnego. Stwierdzono obecność sferolitów (poziom mikrometrów), fibryl i globul. Ponadto zastosowanie AFM pozwoliło na zbadanie nanomorfologii badanych poliuretanów. Zaobserwowano krótkie, cylindropodobne domeny segmentów sztywnych rozproszone w matrycy segmentów giętkich.
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AFM-assisted investigation of conformal coatings in electronics
PublicationPurpose – This paper aims to presents a new method of investigation of local properties of conformal coatings utilized in microelectronics. Design/methodology/approach – It is based on atomic force microscopy (AFM) technique supplemented with the ability of local electrical measurements, which apart from topography acquisition allows recording of local impedance spectra, impedance imaging and dc current mapping. Potentialities...
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Evaluation of organic coatings condition with AFM-based method
PublicationThe paper presents an atomic force microscopy (AFM)-based approach to evaluation of local protective properties of organic coatings. Apart from topography, it provides local ac and dc characteristics of examined coating. The method consists in application of ac voltage perturbation signal between conductive AFM tip and coated metal substrate. The resulting current is used to determine local impedance characteristics. Both impedance...
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Improving AFM images with harmonic interference by spectral analysis
PublicationPrzedstawiono sposób usunięcia zakłóceń pojawiających się na obrazach uzyskiwanych z mikroskopu sił atomowych (AFM). Przybliżono kilka metod stosowanych do redukcji zakłóceń w obrazach. Następnie opisano zidentyfikowane zakłócenia harmoniczne oraz zaproponowany sposób ich znaczącej redukcji. W pracy zamieszczono szereg obrazów uzyskanych z mikroskopu AFM ilustrujących efekty powodowane zakłóceniami oraz skuteczność zaproponowanej...
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Corrosion process monitoring by AFM higher harmonic imaging
PublicationThe atomic force microscope (AFM) was invented in 1986 as an alternative to the scanning tunnelling microscope, which cannot be used in studies of non-conductive materials. Today the AFM is a powerful, versatile and fundamental tool for visualizing and studying the morphology of material surfaces. Moreover, additional information for some materials can be recovered by analysing the AFM's higher cantilever modes when the cantilever...
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AFM, XRD and HRTEM studies of annealed FePd thin films
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TEM and AFM studies of segmented polyester polyurethanes obtained by quasi-prepolymer method.
PublicationPrzedmiotem badań były poliestrouretany o zawartości 50% segmentów sztywnych i zmiennym stosunku NCO/OH. Wykazano, że poliestrouretany otrzymane metodą quasi-prepolimerową wykazują inną morfologię niż otrzymane za pomocą metody prepolimerowej. W poliuretanach quasi- prepolimerowych obserwowano za pomocą mikroskopu AFM agregację segmentów sztywnych o wymiarze poprzecznym rzędu200nm. Segmenty te tworzyły fazę ciągłą. Kruche...
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Hyperelastic Microcantilever AFM: Efficient Detection Mechanism Based on Principal Parametric Resonance
PublicationThe impetus of writing this paper is to propose an efficient detection mechanism to scan the surface profile of a micro-sample using cantilever-based atomic force microscopy (AFM), operating in non-contact mode. In order to implement this scheme, the principal parametric resonance characteristics of the resonator are employed, benefiting from the bifurcation-based sensing mechanism. It is assumed that the microcantilever is made...
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Performance of zinc-rich coatings evaluated using AFM-based electrical properties imaging
PublicationThe paper presents the results of investigation of polyvinyl zinc-rich coating exposed to 97% relativehumidity atmosphere for 40 days. Condition of the coating and evolution of its protective properties weredetermined with the novel AFM-based approach capable of providing surface profiles, local dc currentmaps as well as local impedance spectra. The proposed technique allowed insight into the local changesof coating topography...
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Localized impedance measurements of AA2024 and AA2024-T3 performed by means of AFM in contact mode
PublicationPurpose: The purpose of this paper is to present the results of an atomic force microscopy (AFM) based approach to local impedance spectroscopy (LIS) measurement performed on AA2024 and AA2024-T3 aluminium alloys. Design/methodology/approach: AFM-LIS measurements were performed ex-situ without the electrolyte environment, so in fact the electrical not electrochemical impedance was obtained. Findings: Relative local impedance values...
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Localized impedance measurements of AA2024 and AA2024‐T3 performed by means of AFM in contact mode
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Assessment of copper surface coverage with corrosion inhibitor using AFM-based local electrical measurements
PublicationThe paper presents a new method of assessment of metal surface coverage with corrosion inhibitor and thus of inhibitor protective performance. It is based on the atomic force microscopy measurement performed in a contact mode. Apart from topography images the proposed approach allows acquisition of local DC maps and local electrical impedance spectra via application of DC bias voltage or AC perturbation signal between the conductive...
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Temporal sequence of the human RBCs' vesiculation observed in nano-scale with application of AFM and complementary techniques
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Investigation of morphological and electrical properties of the PMMA coating upon exposure to UV irradiation based on AFM studies
PublicationCelem badania było określenie wpływu promieniowania ultrafioletowego na morfologię powierzchni powłoki i na jej właściwości elektryczne. Cienka powłoka z polimetakrylanu metylu została nałożona na podłoże stalowe metodą zanurzeniową. Oceny stanu przed ekspozycją UV i w jej trakcie dokonywano przy użyciu mikroskopu sił atomowych. Na obrazach AFM zaobserwowano pojawienie się mikropęknięć. Celem zweryfikowania czy wykryte nieciągłości...
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Evaluation of adhesive forces and the specific surface energy of zirconia stabilized by yttria with alumina additions ceramic by AFM method
PublicationThe adhesive forces and the specific surface energy of ceramic material surfaces are very important for further tribological and biomedical applications of ceramics. Partially stabilized zirconia (zirconium oxide) is popular for manufacturing various medical products. ZrO2 stabilized by Y2O3 with additions of 5 wt% alumina was produced by slip casting method with a subsequent sintering. Structure and chemical composition of ceramic...
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Integration of Fluorescent, NV-Rich Nanodiamond Particles with AFM Cantilevers by Focused Ion Beam for Hybrid Optical and Micromechanical Devices
PublicationIn this paper, a novel fabrication technology of atomic force microscopy (AFM) probes integrating cantilever tips with an NV-rich diamond particle is presented. Nanomanipulation techniques combined with the focused electron beam-induced deposition (FEBID) procedure were applied to position the NV-rich diamond particle on an AFM cantilever tip. Ultrasonic treatment of nanodiamond suspension was applied to reduce the size of diamond...
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Electrical mapping of AISI 304 stainless steel subjected to intergranular corrosion performed by means of AFM-LIS in the contact mode
PublicationThe paper presents results of the AFM-based approach to local impedance spectroscopy (LIS) measurements performed in a 20 20 lm grid within an austenite grain–grain boundary region for sensitized AISI 304 stainless steel (SS). Maps of electrical parameters obtained on the basis of localized impedance spectra were demonstrated, presenting their changes and correlation with the sample topography. Performed research revealed significant...
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Surface characteristics of glass fibres covered with an aluminum layer after a chemical modification process using secondary ion mass spectrometry (SIMS) and atomic force microscopy (AFM)
PublicationPrzedstawiono wyniki z badań powierzchni modyfikowanych włókien szklanych (przed i po procesie chemicznej modyfikacji ich powierzchni), które są kandydatem na przyszły oryginalny bezmatrycowy materiał odniesienia lotnych analitów etenu (C2H4) metodami spektrometrii mas jonów wtórnych oraz mikroskopii sił atomowych. Badania miały na celu obserwację zmian oraz procesów, jakie zaszły na powierzchni włókien szklanych pokrytych...