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Search results for: VANADIUM OXIDES
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The AFM micrographs of vanadium oxides thin films obtained at 800°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on a silicon substrate and vanadium thin films were obtained by annealing as-prepared films at...
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The AFM micrographs of vanadium oxides thin films obtained at 1200°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films obtained at 400°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films obtained at 600°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of of vanadium oxides thin films obtained at 300°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films obtained at 150°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films obtained at 200°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films obtained at 450°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxide thin films obtained at 100°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films deposited on silicon - the influence of the thickness of the film on morphology
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (1, 2 or 3 AsP layers) were deposited on a silicon substrate and were annealing...
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XRD patterns of vanadium oxide nanostructures on silicon substrate obtained by V2O5 recrystallization
Open Research DataThe DataSet contains the XRD patterns of vanadium oxide nanostructures on silicon substrates obtained by recrystallization of V2O5 thin films between 800-1200°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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SEM micrographs of vanadium oxide nanostructures obtained by V2O5 recrystallization at 1000°C
Open Research DataThe DataSet contains the scanning electron microscopy (SEM) micrographs of vanadium oxide nanostructures on quartz glass and silicon substrates obtained by recrystallization of V2O5 thin films at 1000°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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SEM micrographs of vanadium oxide nanostructures obtained by V2O5 recrystallization at 800°C
Open Research DataThe DataSet contains the scanning electron microscopy (SEM) micrographs of vanadium oxide nanostructures on quartz glass and silicon substrates obtained by recrystallization of V2O5 thin films at 800°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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SEM micrographs of vanadium oxide nanostructures obtained by V2O5 recrystallization at 1200°C
Open Research DataThe DataSet contains the scanning electron microscopy (SEM) micrographs of vanadium oxide nanostructures on quartz glass and silicon substrates obtained by recrystallization of V2O5 thin films at 1200°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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The topography of strontium–borate glasses and glass-ceramics containing bismuth and vanadium oxides measured with SEM method
Open Research DataThe topography of strontium–borate glasses and glass-ceramics containing bismuth and vanadium oxides was measured by SEM.
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XRD patterns of vanadium oxide nanostructures on quartz glass substrate obtained by V2O5 recrystallization
Open Research DataThe DataSet contains the XRD patterns of vanadium oxide nanostructures on quartz glass substrates obtained by recrystallization of V2O5 thin films between 800-1200°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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Thermal properties of strontium–borate glasses and glass-ceramics containing bismuth and vanadium oxides measured with DSC method
Open Research DataThermal properties of strontium–borate glasses and glass-ceramics containing bismuth and vanadium oxides was measured by DSC.
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The structure of strontium–borate glasses and glass-ceramics containing bismuth and vanadium oxides measured with X-ray diffraction method
Open Research DataThe structure of strontium–borate glasses and glass-ceramics containing bismuth and vanadium oxides was measured by XRD.
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The AFM micrographs of vanadium oxides thin films deposited on quartz glass - the influence of the thickness of the thin film on its morphology
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (1, 2 or 3 AsP layers) were deposited on a quartz glass substrate and were...
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Decomposition kinetics of vanadium xerogel powder
Open Research DataThe DataSet contains the TGA curves of vanadium As-prepared xerogel powder with different heating rates. The information about sol synthesis is described in the Journal of Nanomaterials.
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Depth XPS profile of vanadium pentoxide
Open Research DataVanadium pentoxide sample was manufactured by sol-gel method and deposited on a substrate by spin coating technique. To determine depth profile of chemical composition of thin film, etching by Argon ion gun was used. Thin film was etched three times. Chemical composition was measured by XPS method.
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Thermal stability of vanadium xerogel powder under different atmpshere
Open Research DataThe DataSet contains the results of the thermal behavior of the vanadium xerogel powder. The information about xerogel powder synthesis is described in the Journal of Nanomaterials.
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Thermal behaviour of vanadium xerogel powder under oxidizing atmosphere
Open Research DataThe DataSet contains the results of the thermal behavior of the vanadium xerogel powder. The information about xerogel powder synthesis is described in the Journal of Nanomaterials.
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Changes in heat of vanadium xerogel powder under different atmosphere
Open Research DataThe DataSet contains the DSC curves of the vanadium xerogel powder. The information about xerogel powder synthesis is described in the Journal of Nanomaterials.
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Thermal behaviour of vanadium xerogel powder under argon atmosphere
Open Research DataThe DataSet contains the results of the thermal behavior of the vanadium xerogel powder. The information about xerogel powder synthesis is described in the Journal of Nanomaterials.
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Thermal behaviour of vanadium xerogel powder under different inert atmosphere
Open Research DataThe DataSet contains the results of the thermal behavior of the vanadium xerogel powder. The information about xerogel powder synthesis is described in the Journal of Nanomaterials.
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Thermal behaviour of vanadium xerogel powder and V2O5 nanorods under helium atmosphere
Open Research DataThe DataSet contains the results of the thermal behavior of the vanadium xerogel powder and V2O5 nanorods obtained at 650C. The information about xerogel powder and V2O5 nanorods synthesis is described in the Journal of Nanomaterials.
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XPS study of the TiO2-WO2 composites
Open Research DataValence state of W and Ti was measured in a TiO2-WO3 composites with a various composition.Powder samples of pure titanium dioxide, tungsten oxide and mix of 50% titanium oxide and 50% od tungsten oxide were measured. Oxides were annealed at the temperature in the range of 300 Celsius degree up to 900 deg. Measurements were performed by XPS UHV Omicron...
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The structure of lead-silicate glasses containing nanocrystallites of iron oxides
Open Research DataThe structure of iron-doped glasses and glass-ceramics were studied. Samples has the composition of (50 − 0.5x)SiO2–(50 − 0.5x)PbO–xFe2O3, where x = 2, 5, 10, 15, 20 and 25 (in mol%). All samples were prepared by the conventional melt quenching technique; the melting was conducted in air at 1623 K in alumina crucibles. The melts were poured on a brass...
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The structure of lead-borate glasses containing nanocrystallites of iron oxides
Open Research DataThe structure of iron-doped glasses and glass-ceramics were studied. Glass samples of composition of xFe2O3–(100 − x)(B2O3–2PbO) (2.5 b x b 37, in mol%) were prepared by the conventional melt quenching technique. The melting was conducted in alumina crucibles at the temperature of 1523 K. The melts were poured on a preheated (573 K) brass plate and...
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The morphology of lead-silicate glasses containing nanocrystallites of iron oxides
Open Research DataThe topography of iron-doped glasses and glass-ceramics were studied. Samples has the composition of (50 − 0.5x)SiO2–(50 − 0.5x)PbO–xFe2O3, where x = 2, 5, 10, 15, 20 and 25 (in mol%). All sampleswere prepared by the conventional melt quenching technique; the melting was conducted in air at 1623 K in alumina crucibles. The melts were poured on a brass...
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XPS investigations of tge tin/tin oxides - CNT composites
Open Research DataThe composite of tin/tin oxide nanoparticles with graphene oxide and CMC based on laser ablation technique as an electrode material for energy storage devices were manufactured. The material exhibited a three-dimensional conducting graphene oxide network decorated with tin or tin oxide nanoparticles. The presence of tin/tin oxide in composites was...
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XRD patterns of V2O5 thin film morphology dependent on substrate types
Open Research DataThe DataSet contains the XRD patterns of the V2O5 thin film structure dependent on substrate types. The as-prepared thin films were deposited on alumina, zirconium, zirconium oxide and metallic vanadium substrate, then was annealing under an oxidizing atmosphere at 600C for 10h.
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XPS measurement of the Fe-Ti based materials
Open Research DataThe mono‐ and bimetal‐modified (Pd, Cu) titanium(IV) oxide and iron oxide (III) photocatalysts were prepared by chemical reduction method and characterized using XPS method. The composition of elements incorporated in the surface layer of mono- and bimetallic photocatalysts was determined by XPS analysis, as well as the valence state of elements. Measurements...
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X-ray diffraction (XRD) of pristine bismuth oxide (Bi2O3) and gadolinium oxide (Gd2O3) structures
Open Research DataData contain results from X-ray diffraction (XRD) measurements of pristine Bi2O3 and Gd2O3 structures using Aeris diffractometer (Malvern Panalytical, Malvern, UK) with Cu-Kα radiation (λ = 1.544 Å)
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BET specific surface area measurements of bismuth oxide (Bi2O3) and gadolinium oxide (Gd2O3) structures
Open Research DataThe BET specific surface area was measured using an N2 adsorption/desorption isotherm (Micromeritics ASAP 2460, Norcross, GA, USA).
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Electrical properties of silicate-lead glasses containing nanostructures of iron oxides.
Open Research DataElectrical properties of silicate-lead glasses doped with different content of iron oxide was studied. The set of glass samples were prepared with the composition of (50 − 0.5x)SiO2–(50 − 0.5x)PbO–xFe2O3, where x = 2, 5, 10, 15, 20 and 25 (in mol%). All sampleswere prepared by the conventional melt quenching technique; the melting was conducted in...
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XPS analysis of the GO based materials
Open Research DataGraphene oxides samples were measured by XPS method. The X-ray photoemission spectroscopy measurements were carried out with Omicron NanoTechnology UHV equipment. The hemispherical spectrophotometer was equipped with a 128-channel collector. The XPS measurements were performed at room temperature at a pressure below 1.1 × 10−8 mBar. The photoelectrons...
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X-ray diffraction (XRD) of silica-coated bismuth oxide (Bi2O3) and gadolinium oxide (Gd2O3) structures
Open Research DataData contain results from X-ray diffraction (XRD) measurements of pristine Bi2O3 and Gd2O3 structures using Aeris diffractometer (Malvern Panalytical, Malvern, UK) with Cu-Kα radiation (λ = 1.544 Å)
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Particle size distribution (laser granulometry) of pristine bismuth oxide (Bi2O3) and gadolinium oxide (Gd2O3) structures
Open Research DataData contain raw results of particle size distribution (by volume) of Bi2O3 and Gd2O3 particles determined using a laser diffraction method (Malvern Mastersizer 2000, Worcestershire, UK).
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X-ray diffraction (XRD) of silica-coated bismuth oxide/gadolinium oxide (Bi2O3+Gd2O3) structures
Open Research DataData contain results from X-ray diffraction (XRD) measurements of pristine Bi2O3 and Gd2O3 structures using Aeris diffractometer (Malvern Panalytical, Malvern, UK) with Cu-Kα radiation (λ = 1.544 Å)
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Graphene oxide thin films deposited on a PCB board - chemical analysis
Open Research DataGraphene oxides based films were measured by X-ray photoemission spectroscopy (XPS) method. TheXPS measurements were carried out with the Omicron NanoTechnology UHV equipment. The hemispherical spectrophotometer was equipped with a 128-channel collector. The XPS measurements were performed at room temperature at a pressure below 1.1 × 10−8 mBar. The...
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SEM micrographs of V2O5 thin film morphology dependent on substrate types
Open Research DataThe DataSet contains the scanning electron microscopy (SEM) micrographs of V2O5 thin film morphology dependent on substrate types. The as-prepared thin films were deposited on alumina, zirconium, zirconium oxide and metallic vanadium substrate, then was annealing under an oxidizing atmosphere at 600C for 10h. The results show that the morphology of...
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Chemical composition of tellurium oxides thin films deposited by magnetron sputtering method
Open Research DataThin films were prepared by radio frequency reactive magnetron sputtering technique. Metallic Te target was sputtered for about 45 min in argon-oxygen atmosphere what resulted in 300 nm film thickness deposition. The pressure in the chamber was below 0.2 Pa and substrate was heated at 200 °C. The distance between sputtered target and the Corning 1737...
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BET specific surface area measurements of silica-coated bismuth oxide(Bi2O3) and gadolinium oxide (Gd2O3) structures
Open Research DataThe BET specific surface area was measured using an N2 adsorption/desorption isotherm (Micromeritics ASAP 2460, Norcross, GA, USA).
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TEM, EDS and optical microscope images of pristine and silica-coated bismuth oxide (Bi2O3) and gadolinium oxide (Gd2O3) structures.
Open Research DataData consists of raw TEM/EDS and optical microscope images of pristine and silica-coated bismuth oxide (Bi2O3) and gadolinium oxide (Gd2O3) structures. Additional TEM images and optical microscope images of silica shells were included.
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Mechanical properties of cement pastes containing pristine and silica-coated bismuth oxide (Bi2O3) and gadolinium oxide (Gd2O3) structures
Open Research DataExcel file containing raw mechanical (compressive strength) data of cement pastes containing variable amount of Bi2O3, Gd2O3, Bi2O3-SiO2 and Gd2O3-SiO2 structures. Sample designation in the Excel file is in line with sample designation in the manuscript associated with dataset.
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Thermgravimetric analysis (TGA) data of cement pastes containing pristine and silica-coated bismuth oxide and gadolinium oxide particles
Open Research DataThermogravimetric (TGA) data of cement pastes after 2, 7 and 28 days. Samples designations: Control, BG, BG-A and BG-B are associated with the specimen names in the associated publication.
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Transmission electron microscope (TEM) and optical microscope images of pristine and silica-coated bismuth oxide and gadolinium oxide particles
Open Research DataCollection of raw transmission electron microscope (TEM) micrographs and optical microscope images used in the associated manuscript. All data in accessible *.tif format. Zip package contains:
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Thermal behavior of VO2/V2O3 nanostructures obtained at 500°C under argon atmosphere
Open Research DataThe DataSet contains the results of the thermal behavior of the VO2/V2O3 nanostructures. The vanadium oxides nanostructures were synthesized by the sol-gel method, where obtained xerogel powder was annealing at 500°C under an argon atmosphere. The information about xerogel powder synthesis is described in the Journal of Nanomaterials.