Katalog Danych Badawczych - Vanadium oxides
Filtry
wszystkich: 92
Katalog Danych Badawczych
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The AFM micrographs of vanadium oxides thin films obtained at 800°C
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on a silicon substrate and vanadium thin films were obtained by annealing as-prepared films at...
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The AFM micrographs of vanadium oxides thin films obtained at 600°C
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of of vanadium oxides thin films obtained at 300°C
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films obtained at 200°C
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films obtained at 150°C
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxide thin films obtained at 100°C
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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Mechanical properties of single V2O5 nanocrystal - nanoindentation measurement in control of the max-load
Dane BadawczeThe DataSet contains the nanoindentation curves (indentation force Fn vs penetrationPd) for a single V2O5 nanocrystal supported on a substrate. The measurements were performed in control of the maximum load of Berkovich indenter force from 2 to 50 mN.
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Mechanical properties of single V2O5 nanocrystal - nanoindentation measurement in control of the max-depth
Dane BadawczeThe DataSet contains the nanoindentation curves (indentation force Fn vs penetrationPd) for a single V2O5 nanocrystal supported on a substrate. The measurements were performed in control of the maximum depth of Berkovich indenter penetration: 60, 70, and 100 nm.
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The AFM micrographs of isotropic etching silicon substrates (111)
Dane BadawczeThe DataSet contains the atomic force microscope images of isotropic etching silicon substrates (111). The silicon wafers were etched in a mixture of nitric acid, hydrofluoric acid, and acetic acid in the ratio of 40:1:15. The soaking time for the substrates was from 20 to 90 seconds
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The morphology of V2O5 nanostructures deposited on quartz glass
Dane BadawczeThe DataSet contains the confocal microscope images of morphology evolution of vanadium pentaoxide nanostructures on quartz glass obtained by annealing as-prepared films at 500C and 600C under synthetic air.
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SEM micrographs of V2O5 nanocrystals as cathode material in Li-ion batteries
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of V2O5 nanocrystals as cathode materials before and after the galvanostatic charge/discharge curves.
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XRD patterns of V2O5 nanostructures
Dane BadawczeThe DataSet contains the XRD patterns of vanadium pentaoxide nanostructures obtained by the sol-gel with different annealing temperatures under synthetic air. The results show that crystallinity dependent on the annealing temperature.
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SEM micrographs of V2O5 nanorods as cathode material in Li-ion batteries
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of V2O5 nanorods as cathode materials before and after the galvanostatic charge/discharge curves.
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SEM micrographs of morphology evolution of V2O5 nanostructures
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of morphology evolution of vanadium pentaoxide nanostructures obtained by the sol-gel, depending on annealing temperature under synthetic air. The results show that the morphology dependent on the annealing temperature.
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FTIR spectra of V2O5 nanostructures
Dane BadawczeThe DataSet contains FTIR spectra of vanadium pentaoxide nanostructures obtained by the sol-gel with different annealing temperatures under synthetic air.
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XRD patterns of V2O3 nanostructures
Dane BadawczeThe DataSet contains the XRD patterns of V2O3 nanostructures obtained by the sol-gel with different reaction conditions. The xerogel powder was annealing under a reducing atmosphere (94% Ar, 6% H2) in the temperature range 350-700C. The results show that crystallinity dependent on the annealing temperature.
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SEM micrographs of morphology evolution of V2O3 nanostructures
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of V2O3 nanostructures obtained by the sol-gel with different reaction conditions. The xerogel powder was annealing under a reducing atmosphere (94% Ar, 6% H2) in the temperature range 350-700C. The results show that the morphology dependent on the annealing temperature.
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SEM micrographs of the V2O5 coatings after thermal treatment under reducing atmosphere
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of V2O5 coatings on the silicon substrate after thermal treatment under a reducing atmosphere. Thin films were annealed at 600C and 700C for 10 under a reducing atmosphere (94% Ar, 6% H2).
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XRD patterns of the V2O5 coatings after thermal treatment under reducing atmosphere
Dane BadawczeThe DataSet contains the XRD patterns of V2O5 coatings on the silicon substrate after thermal treatment under a reducing atmosphere. Thin films were annealed at 500C, 600C, and 700C for 10 under a reducing atmosphere (94% Ar, 6% H2).
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Morphology and structure of V2O5 nanorods deposited on the silicon substrate after reduction
Dane BadawczeThe DataSet contains the XRD patterns and SEM micrographs of V2O5 nanorods on the silicon substrate after thermal treatment under a reducing atmosphere. Thin films were annealed at 500C for 40 under a reducing atmosphere (94% Ar, 6% H2).
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XRD patterns of the V2O5 nanorods after thermal treatment under reducing atmosphere
Dane BadawczeThe DataSet contains the XRD patterns of V2O5 nanorods after thermal treatment under a reducing atmosphere. Samples were annealed at 450C for 2, 20, and 40h under a reducing atmosphere (94% Ar, 6% H2).
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SEM micrographs of the V2O5 nanorods after thermal treatment under reducing atmosphere
Dane BadawczeThe DataSet contains the SEM micrographs of V2O5 nanorods after thermal treatment under a reducing atmosphere. Samples were annealed at 450C for 2, 20, and 40h under a reducing atmosphere (94% Ar, 6% H2).
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SEM micrographs of VO2 and V6O13 nanostructures
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of VO2 and V6O13 thin films deposited on a silicon substrate. The as-prepared thin films were annealing under a reducing atmosphere (94% Ar, 6% H2) at 600 and 700C for 10h.
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XRD patterns of VO2 and V6O13 nanostructures
Dane BadawczeThe DataSet contains the XRD patterns of VO2 and V6O13 thin films deposited on a silicon substrate. The as-prepared thin films were annealing under a reducing atmosphere (94% Ar, 6% H2) at 500, 600 and 700C for 10h.
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SEM micrographs of morphology evolution of V2O5 thin films on silicon substrate
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of V2O5 thin films deposited on a silicon substrate. The as-prepared thin films were annealing under an oxidizing atmosphere in the temperature range 250-600C. The results show that the morphology of the films dependent on the annealing temperature.
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TEM micrographs of V2O5 nanostructures
Dane BadawczeThe DataSet contains the TEM images of V2O5 nanostructures obtained by the sol-gel method.
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Electrochemical impedance spectra and CV curves of V2O5 nanorods
Dane BadawczeThe DataSet contains the EIS spectra for coin-cells and CV curves with the V2O5 nanorods obtained by the sol-gel method. Cyclic voltammetry and electrochemical impedance spectroscopy (EIS) were measured using the AUTOLAB 302N potentiostat-galvanostat under Nova software. The EIS measurements were recorded in the frequency range 100 kHz to 10 mHz for...
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Electrochemical impedance spectra and CV curves of V2O5 nanocrystals
Dane BadawczeThe DataSet contains the EIS spectra for coin-cells and CV curves with the V2O5 nanocrystals obtained by the sol-gel method. Cyclic voltammetry and electrochemical impedance spectroscopy (EIS) were measured using the AUTOLAB 302N potentiostat-galvanostat under Nova software. The EIS measurements were recorded in the frequency range 100 kHz to 10 mHz...
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Cycling performances of the V2O5 nanostructures as cathode material in Na-ion batteries
Dane BadawczeThe DataSet contains the next one hundred galvanostatic charge/discharge curves of the V2O5 nanostructures with different morphology obtained by the sol-gel method. The battery tests of the samples were performed using the Atlas-Sollich 0961 (Atlas-Sollich, Poland) with C/5 current densities in the voltage range between 2.0 V and 4.0 V vs. Li/Li+. Here...
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Cycling performances of the V2O5 nanorods as cathode material in Li-ion batteries
Dane BadawczeThe DataSet contains the next one hundred galvanostatic charge/discharge curves of the V2O5 nanorods obtained by the sol-gel method. The battery tests of the samples were performed using the Atlas-Sollich 0961 (Atlas-Sollich, Poland) with C/5 and 2C current densities in the voltage range between 2.0 V and 4.0 V vs. Li/Li+. Here 1C is 294 mAh g-1. The...
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Cycling performances of the V2O5 nanocrystals as cathode material in Li-ion batteries
Dane BadawczeThe DataSet contains the next one hundred galvanostatic charge/discharge curves of the V2O5 nanocrystals obtained by the sol-gel method. The battery tests of the samples were performed using the Atlas-Sollich 0961 (Atlas-Sollich, Poland) with C/5 and 2C current densities in the voltage range between 2.0 V and 4.0 V vs. Li/Li+. Here 1C is 294 mAh g-1. ...
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Cyclic voltammetry curves of the V2O5 nanorods (Na-ion batteries)
Dane BadawczeThe DataSet contains the next thirty cycles voltammetry curves for the V2O5 nanorods obtained by the sol-gel method. The cyclic voltammetry was measured using the AUTOLAB 302N potentiostat-galvanostat. The measurements were carried out in a voltage range of 2 V to 4 V vs. Na/Na+ at a scan rate of 1 mV/s. As an electrolyte 1M NaPF6 was applied.
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Cyclic voltammetry curves of the V2O5 nanocrystals (Na-ion batteries)
Dane BadawczeThe DataSet contains the next thirty cycles voltammetry curves for the V2O5 nanocrystals obtained by the sol-gel method. The cyclic voltammetry was measured using the AUTOLAB 302N potentiostat-galvanostat. The measurements were carried out in a voltage range of 2 V to 4 V vs. Na/Na+ at a scan rate of 1 mV/s. As an electrolyte 1M NaPF6 was applied.
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Cyclic voltammetry curves of the V2O5 nanorods (Li-ion batteries)
Dane BadawczeThe DataSet contains the next thirty cycles voltammetry curves for the V2O5 nanocrystals obtained by the sol-gel method. The cyclic voltammetry was measured using the AUTOLAB 302N potentiostat-galvanostat. The measurements were carried out in a voltage range of 2 V to 4 V vs. Li/Li+ at a scan rate of 1 mV/s. The results show that in the subsequent cycles,...
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Cyclic voltammetry curves of the V2O5 nanocrystals (Li-ion batteries)
Dane BadawczeThe DataSet contains the next thirty cycles voltammetry curves for the V2O5 nanocrystals obtained by the sol-gel method. The cyclic voltammetry was measured using the AUTOLAB 302N potentiostat-galvanostat. The measurements were carried out in a voltage range of 2 V to 4 V vs. Li/Li+ at a scan rate of 1 mV/s. The results show that in the subsequent cycles,...
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Rate performance of the V2O5 nanorods as cathode material in Li-ion batteries
Dane BadawczeThe DataSet contains the galvanostatic charge/discharge curves of the V2O5 nanorods obtained by the sol-gel method. The battery tests of the samples were performed using the Atlas-Sollich 0961 (Atlas-Sollich, Poland) with different current densities in the voltage range between 2.0 V and 4.0 V vs. Li/Li+. Here 1C is 294 mAh g-1.
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Rate performance of the V2O5 nanocrystals as cathode material in Li-ion batteries
Dane BadawczeThe DataSet contains the galvanostatic charge/discharge curves of the V2O5 nanocrystals obtained by the sol-gel method. The battery tests of the samples were performed using the Atlas-Sollich 0961 (Atlas-Sollich, Poland) with different current densities in the voltage range between 2.0 V and 4.0 V vs. Li/Li+. Here 1C is 294 mAh g-1.
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SEM micrographs of V2O5 thin film morphology dependent on substrate types
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of V2O5 thin film morphology dependent on substrate types. The as-prepared thin films were deposited on alumina, zirconium, zirconium oxide and metallic vanadium substrate, then was annealing under an oxidizing atmosphere at 600C for 10h. The results show that the morphology of...
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SEM micrographs of morphology evolution of V2O5 thin films on quartz glass
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of V2O5 thin films deposited on a quartz glass substrate. The as-prepared thin films were annealing under an oxidizing atmosphere in the temperature range 200-600C. The results show that the morphology of the films dependent on the annealing temperature.
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XRD patterns of V2O5 thin film morphology dependent on substrate types
Dane BadawczeThe DataSet contains the XRD patterns of the V2O5 thin film structure dependent on substrate types. The as-prepared thin films were deposited on alumina, zirconium, zirconium oxide and metallic vanadium substrate, then was annealing under an oxidizing atmosphere at 600C for 10h.
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XRD patterns of V2O5 thin films deposited on silicon substrate
Dane BadawczeThe DataSet contains the XRD patterns of V2O5 thin films deposited on a silicon substrate. The as-prepared thin films were annealing under an oxidizing atmosphere in the temperature range of 300-600C. The results show that the structure of the films dependent on the annealing temperature.
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XRD patterns of V2O5 thin films deposited on quartz glass
Dane BadawczeThe DataSet contains the XRD patterns of V2O5 thin films deposited on a quartz glass substrate. The as-prepared thin films were annealing under an oxidizing atmosphere in the temperature range 200-600C. The results show that the structure of the films dependent on the annealing temperature.