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Wyniki wyszukiwania dla: OMA
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Thermographic imaging of electrochemical double layer capacitors during cycling charging - discharging 0 - 3,6 V at 420 mA. Sample 103, run #2. Image period: 0,5 sec.
Dane BadawczeDataset contains thermal images of prototype electrochemical double layer capacitor taken during cyclic charging - discharging. The sample was charged to 3,6 V and discharged to 10 mV by constant current 420 mA. Sample 103. Pictures were taken with period of 0,5 sec (2 Hz) in order to examine the fast fluctuations of sample temperature during charging...
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Thermographic imaging of electrochemical double layer capacitors during cycling charging - discharging 0 - 3,6 V at 420 mA. Sample 103, run #3. Image period: 1 sec.
Dane BadawczeDataset contains thermal images of prototype electrochemical double layer capacitor taken during cyclic charging - discharging. The sample was charged to 3,6 V and discharged to 10 mV by constant current 420 mA. Sample 103. Pictures were taken with period of 1 sec (1 Hz) in order to examine the fast fluctuations of sample temperature during charging...
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Ocean mixed layer dynamics: high-resolution simulations of wind, wave and convective effects
Dane BadawczeThis dataset contains results of high-resolution numerical simulations of the ocean mixed layer (OML) forced by wind, waves and cooling from the atmosphere, i.e., under strongly turbulent, convective conditions. The goal is to provide detailed, three-dimensional information about OML circulation, turbulent kinetic energy, and temperature and salinity...
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Validation of polyurethane-wood composites properties
Dane BadawczeThis study focuses on the development of the PU-WC manufacturing method, the determination of properties of this type of composite, and the indication of its potential application. The mechanical properties of PU-WC were characterized by flexural tests. To determine the thermal properties, dynamic mechanical analysis (DMA) and thermogravimetric analysis...
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The effect of cobalt addition on the corrosion behavior of near equiatomic NiTi shape memory alloy in normal saline solution, impedance and microscopic studies
Dane BadawczeThe electrochemical and corrosion (uniform and localized) behavior of a binary Ni52Ti48 shape memory alloy (SMA) and two ternary Ni52Ti48-xCox (x = 1.5 and 4.0 wt.%) SMAs were studied. Measurements were conducted in 0.9% NaCl solution at 37 oC. This dataset contains the results of electrochemical impedance spectroscopy (EIS) studies done on daily basis...
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Mechanical studies of poly(lactic acid)-carbon black-nanodiamond composites
Dane BadawczeThis dataset contains mechanical tests carried out on new 3D printing-dedicated composites with poly-lactic acid (PLA), carbon black (CB) and nanodiamond fillers. Two types of nanodiamonds were studied: detonation nanodiamonds (DND) and boron-doped carbon nanowalls (BCNW). The investigated techniques was dynamic mechanical analysis (DMA). The measurements...
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Temperature measurement of supercapacitor with the use of ZnO coated microsphere-based fiber-optic sensor - 75 Celsius degrees
Dane BadawczeApplication of a microsphere-based fiber-optic sensor with 200 nm zinc oxide (ZnO) coating, deposited by Atomic Layer Deposition (ALD) method, for temperature measurements of supercapasitor, is presented. Internal temperature of the supercapacitor is investigated in the range between 30°C and 90°C. The supercapacitor temperature was investigated using...
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Temperature measurement of supercapacitor with the use of ZnO coated microsphere-based fiber-optic sensor - 65 Celsius degrees
Dane BadawczeApplication of a microsphere-based fiber-optic sensor with 200 nm zinc oxide (ZnO) coating, deposited by Atomic Layer Deposition (ALD) method, for temperature measurements of supercapasitor, is presented. Internal temperature of the supercapacitor is investigated in the range between 30°C and 90°C. The supercapacitor temperature was investigated using...
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Temperature measurement of supercapacitor with the use of ZnO coated microsphere-based fiber-optic sensor - 90 Celsius degrees
Dane BadawczeApplication of a microsphere-based fiber-optic sensor with 200 nm zinc oxide (ZnO) coating, deposited by Atomic Layer Deposition (ALD) method, for temperature measurements of supercapasitor, is presented. Internal temperature of the supercapacitor is investigated in the range between 30°C and 90°C. The supercapacitor temperature was investigated using...
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Temperature measurement of supercapacitor with the use of ZnO coated microsphere-based fiber-optic sensor - 80 Celsius degrees
Dane BadawczeApplication of a microsphere-based fiber-optic sensor with 200 nm zinc oxide (ZnO) coating, deposited by Atomic Layer Deposition (ALD) method, for temperature measurements of supercapasitor, is presented. Internal temperature of the supercapacitor is investigated in the range between 30°C and 90°C. The supercapacitor temperature was investigated using...
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Temperature measurement of supercapacitor with the use of ZnO coated microsphere-based fiber-optic sensor - 45 Celsius degrees
Dane BadawczeApplication of a microsphere-based fiber-optic sensor with 200 nm zinc oxide (ZnO) coating, deposited by Atomic Layer Deposition (ALD) method, for temperature measurements of supercapasitor, is presented. Internal temperature of the supercapacitor is investigated in the range between 30°C and 90°C. The supercapacitor temperature was investigated using...
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Temperature measurement of supercapacitor with the use of ZnO coated microsphere-based fiber-optic sensor - 35 Celsius degrees
Dane BadawczeApplication of a microsphere-based fiber-optic sensor with 200 nm zinc oxide (ZnO) coating, deposited by Atomic Layer Deposition (ALD) method, for temperature measurements of supercapasitor, is presented. Internal temperature of the supercapacitor is investigated in the range between 30°C and 90°C. The supercapacitor temperature was investigated using...
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Temperature measurement of supercapacitor with the use of ZnO coated microsphere-based fiber-optic sensor - 50 Celsius degrees
Dane BadawczeApplication of a microsphere-based fiber-optic sensor with 200 nm zinc oxide (ZnO) coating, deposited by Atomic Layer Deposition (ALD) method, for temperature measurements of supercapasitor, is presented. Internal temperature of the supercapacitor is investigated in the range between 30°C and 90°C. The supercapacitor temperature was investigated using...
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Temperature measurement of supercapacitor with the use of ZnO coated microsphere-based fiber-optic sensor - 70 Celsius degrees
Dane BadawczeApplication of a microsphere-based fiber-optic sensor with 200 nm zinc oxide (ZnO) coating, deposited by Atomic Layer Deposition (ALD) method, for temperature measurements of supercapasitor, is presented. Internal temperature of the supercapacitor is investigated in the range between 30°C and 90°C. The supercapacitor temperature was investigated using...
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Temperature measurement of supercapasitor with the use of ZnO coated microsphere-based fiber-optic sensor - 30 Celsius degrees
Dane BadawczeApplication of a microsphere-based fiber-optic sensor with 200 nm zinc oxide (ZnO) coating, deposited by Atomic Layer Deposition (ALD) method, for temperature measurements of supercapasitor, is presented. Internal temperature of the supercapacitor is investigated in the range between 30°C and 90°C. The supercapacitor temperature was investigated using...
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Temperature measurement of supercapacitor with the use of ZnO coated microsphere-based fiber-optic sensor - 60 Celsius degrees
Dane BadawczeApplication of a microsphere-based fiber-optic sensor with 200 nm zinc oxide (ZnO) coating, deposited by Atomic Layer Deposition (ALD) method, for temperature measurements of supercapasitor, is presented. Internal temperature of the supercapacitor is investigated in the range between 30°C and 90°C. The supercapacitor temperature was investigated using...
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Temperature measurement of supercapacitor with the use of ZnO coated microsphere-based fiber-optic sensor - 40 Celsius degrees
Dane BadawczeApplication of a microsphere-based fiber-optic sensor with 200 nm zinc oxide (ZnO) coating, deposited by Atomic Layer Deposition (ALD) method, for temperature measurements of supercapasitor, is presented. Internal temperature of the supercapacitor is investigated in the range between 30°C and 90°C. The supercapacitor temperature was investigated using...
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Temperature measurement of supercapacitor with the use of ZnO coated microsphere-based fiber-optic sensor - 85 Celsius degrees
Dane BadawczeApplication of a microsphere-based fiber-optic sensor with 200 nm zinc oxide (ZnO) coating, deposited by Atomic Layer Deposition (ALD) method, for temperature measurements of supercapasitor, is presented. Internal temperature of the supercapacitor is investigated in the range between 30°C and 90°C. The supercapacitor temperature was investigated using...
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Temperature measurement of supercapacitor with the use of ZnO coated microsphere-based fiber-optic sensor - 55 Celsius degrees
Dane BadawczeApplication of a microsphere-based fiber-optic sensor with 200 nm zinc oxide (ZnO) coating, deposited by Atomic Layer Deposition (ALD) method, for temperature measurements of supercapasitor, is presented. Internal temperature of the supercapacitor is investigated in the range between 30°C and 90°C. The supercapacitor temperature was investigated using...
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SEM micrographs of V2O5 nanorods as cathode material in Li-ion batteries
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of V2O5 nanorods as cathode materials before and after the galvanostatic charge/discharge curves.
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SEM micrographs of the V2O5 nanorods after thermal treatment under reducing atmosphere
Dane BadawczeThe DataSet contains the SEM micrographs of V2O5 nanorods after thermal treatment under a reducing atmosphere. Samples were annealed at 450C for 2, 20, and 40h under a reducing atmosphere (94% Ar, 6% H2).
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SEM micrographs of V2O5 nanocrystals as cathode material in Li-ion batteries
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of V2O5 nanocrystals as cathode materials before and after the galvanostatic charge/discharge curves.
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Morphology and structure of ammonium vanadates synthesis by hydrothermal method
Dane BadawczeThe DataSet contains the XRD patterns, FTIR spectra, and scanning electron microscopy (SEM) micrographs of ammonium vanadates synthesis by hydrothermal method from different NH4VO3 precursors. The results reveal that a mixture of (NH4)V4O10xH2O and(NH4)0.76V4O10 was obtained for both precursors, however the contribution of each phase was different for...
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SEM micrographs of VO2 and V6O13 nanostructures
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of VO2 and V6O13 thin films deposited on a silicon substrate. The as-prepared thin films were annealing under a reducing atmosphere (94% Ar, 6% H2) at 600 and 700C for 10h.
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SEM micrographs of NH4VO3 crystals - molar concetration factor after annealing
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of NH4VO3 nano_crystals obtained by the LPE-IonEx method with different morphology after annealing at 400C under argon atmosphere (with a heating rate of 10 C/min).
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SEM micrographs of ammonium vanadate nanocrystals
Dane BadawczeThe DataSet contains the electron microscopy (SEM) micrographs of ammonium vanadate nanobelts obtained by the hydrothermal method with different conditions. The results show that the morphology of samples dependent on reaction conditions.
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SEM micrographs of morphology evolution of VO2 and V2O3 thin films obtained at 1000°C
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of VO2 and V2O3 thin films obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films were deposited on a silicon and quartz glass substrate and were annealing at 1000°C under an argon atmosphere.
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SEM micrographs of vanadium oxide nanostructures obtained by V2O5 recrystallization at 1000°C
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of vanadium oxide nanostructures on quartz glass and silicon substrates obtained by recrystallization of V2O5 thin films at 1000°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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SEM micrographs of vanadium oxide nanostructures obtained by V2O5 recrystallization at 800°C
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of vanadium oxide nanostructures on quartz glass and silicon substrates obtained by recrystallization of V2O5 thin films at 800°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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SEM micrographs of morphology evolution of VO2 and V2O3 nanostructures
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of VO2 and V2O3 nanostructures obtained by the sol-gel with different reaction conditions. The information about xerogel powder synthesis is described in the Journal of Nanomaterials. The xerogel powder was annealing under argon atmosphere in the temperature range 400-800C. The...
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SEM micrographs of vanadium oxide nanostructures obtained by V2O5 recrystallization at 1200°C
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of vanadium oxide nanostructures on quartz glass and silicon substrates obtained by recrystallization of V2O5 thin films at 1200°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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SEM micrographs of NH4VO3 crystals - molar concetration factor
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of NH4VO3 nano_crystals obtained by the LPE-IonEx method. The SEM images clearly show that the morphology of the end product can be nicely tuned by changing the molar concentration of ammonium salt in the solvent.
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SEM micrographs of morphology evolution of VO2 and V2O3 thin films obtained at 700°C
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of VO2 and V2O3 thin films obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (3-9 AsP layers) were deposited on a silicon substrate and were annealing at 700°C under an argon...
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SEM micrographs of morphology evolution of VO2 and V2O3 thin films obtained at 1000°C dependent on film thickness
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of VO2 and V2O3 thin films obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (2-3 AsP layers) were deposited on a silicon substrate and were annealing at 1000°C under an argon...
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SEM micrographs of morphology evolution of VO2 and V2O3 thin films obtained at 500°C
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of VO2 and V2O3 thin films obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (3-9 AsP layers) were deposited on a silicon substrate and were annealing at 500°C under an argon...
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SEM micrographs of morphology evolution of V2O5 thin films on quartz glass
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of V2O5 thin films deposited on a quartz glass substrate. The as-prepared thin films were annealing under an oxidizing atmosphere in the temperature range 200-600C. The results show that the morphology of the films dependent on the annealing temperature.
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SEM micrographs of morphology evolution of V2O3 nanostructures
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of V2O3 nanostructures obtained by the sol-gel with different reaction conditions. The xerogel powder was annealing under a reducing atmosphere (94% Ar, 6% H2) in the temperature range 350-700C. The results show that the morphology dependent on the annealing temperature.
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XRD patterns of the V2O5 coatings after thermal treatment under reducing atmosphere
Dane BadawczeThe DataSet contains the XRD patterns of V2O5 coatings on the silicon substrate after thermal treatment under a reducing atmosphere. Thin films were annealed at 500C, 600C, and 700C for 10 under a reducing atmosphere (94% Ar, 6% H2).
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SEM micrographs of the V2O5 coatings after thermal treatment under reducing atmosphere
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of V2O5 coatings on the silicon substrate after thermal treatment under a reducing atmosphere. Thin films were annealed at 600C and 700C for 10 under a reducing atmosphere (94% Ar, 6% H2).
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SEM micrographs of V2O5 thin film morphology dependent on substrate types
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of V2O5 thin film morphology dependent on substrate types. The as-prepared thin films were deposited on alumina, zirconium, zirconium oxide and metallic vanadium substrate, then was annealing under an oxidizing atmosphere at 600C for 10h. The results show that the morphology of...
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SEM micrographs of morphology evolution of V2O5 thin films on silicon substrate
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of V2O5 thin films deposited on a silicon substrate. The as-prepared thin films were annealing under an oxidizing atmosphere in the temperature range 250-600C. The results show that the morphology of the films dependent on the annealing temperature.
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SEM micrographs of NH4VO3 crystals
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of NH4VO3 crystals obtained by the LPE-IonEx method. The SEM images clearly show that the morphology of the end product can be nicely tuned by changing the type of ammonium salt and the solvent. It can be concluded that the used solvent affected crystal shapes and their size was...
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FTIR spectra of V2O5 nanostructures
Dane BadawczeThe DataSet contains FTIR spectra of vanadium pentaoxide nanostructures obtained by the sol-gel with different annealing temperatures under synthetic air.
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X-ray diffraction spectra of nitrogen-doped carbon in hybrid materials containing praseodymium oxide
Dane BadawczeX-ray powder diffraction patterns of samples were carried out by Philips X’Pert diffractometer, which was radiated by graphite monochromatized Cu Kα (l equal 1.540598). The operating voltage was maintained at 40 kV, the current was maintained at 30 mA and analyzed in the range from 20° to 90°. The data presented confirmed the presence of the PrBSCF...
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SWM for porous hierarchical nanocarbons composites
Dane BadawczeRaw Raman spectra and XRD diffractograms (background subtracted) of 13 among which carbon-derived secondary waste and reference materials.
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X-ray diffraction spectra of the NiCo2O4 modified by carbon
Dane BadawczeThis dataset comprises XRD results for NiCo2O4 modified with carbon, varying according to the amount of carbon. In this context, the XRD data provide insights into the crystalline structure and phase composition of the NiCo2O4 material as it is modified with varying quantities of carbon. This investigation is valuable for understanding how the presence...
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FTIR spectra of VO2 and V2O3 nanostructures
Dane BadawczeThe DataSet contains the FTIR spectra of VO2 and V2O3 nanostructures obtained by the sol-gel with different reaction conditions. The information about xerogel powder synthesis is described in the Journal of Nanomaterials. The xerogel powder was annealing under argon atmosphere in the temperature range 400-1000C. The results show that the morphology...
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Morphology and structure of V2O5 nanorods deposited on the silicon substrate after reduction
Dane BadawczeThe DataSet contains the XRD patterns and SEM micrographs of V2O5 nanorods on the silicon substrate after thermal treatment under a reducing atmosphere. Thin films were annealed at 500C for 40 under a reducing atmosphere (94% Ar, 6% H2).
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SEM micrographs of V2O5 thin films deposited on isotropic etching silicon substrates (111)
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of V2O5 thin films deposited on isotropic etching silicon substrates (111). The silicon wafers were etched in a mixture of nitric acid, hydrofluoric acid, and acetic acid in the ratio of 40:1:15. The soaking time for the substrates was from 30 to 90 seconds. The thin films were...
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Structure of ammonium vanadate synthesis by LPE-IonEx method
Dane BadawczeThe DataSet contains the XRD patterns, FTIR spectra of NH4VO3 crystals with different morphology obtained by the LPE-IonEx method.