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Wyniki wyszukiwania dla: xrd
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XRD patterns of VO2 and V2O3 thin films obtained at 700°C
Dane BadawczeThe DataSet contains the XRD patterns of VO2 and V2O3 thin films obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (5-9 AsP layers) were deposited on a silicon substrate and were annealing at 700°C under an argon atmosphere.
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XRD (X-ray diffraction) spectra of bulk boron and obtained borophene
Dane BadawczeThis dataset includes XRD (X-ray diffraction) spectra of bulk boron and borophene obtained during sonication process, giving the information on the phase composition and crystallinity of materials.
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The XRD diffraction patterns of Ce(Gd,Pr)O2-s samples
Dane BadawczeThe dataset includes XRD diffraction patterns of Ce0.8Gd0.2O2-s and Ce0.8Pr0.2O2-s sintered at 600oC under air atmosphere for 4 h. Samples were produced using aqueous soft chemistry methods (Pechini).
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XRD pattern of Mo2Ga2C, Mo2CTx/Mo2GaC and Ni-Mo2CTx/Mo2Ga2C materials
Dane BadawczeIn the dataset are included raw data for the preparation of XRD pattern of Mo2Ga2C, Mo2CTx/Mo2GaC and Ni-Mo2CTx/Mo2Ga2C materials.
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XRD patterns of the V2O5 nanorods after thermal treatment under reducing atmosphere
Dane BadawczeThe DataSet contains the XRD patterns of V2O5 nanorods after thermal treatment under a reducing atmosphere. Samples were annealed at 450C for 2, 20, and 40h under a reducing atmosphere (94% Ar, 6% H2).
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XRD patterns of vanadium oxide nanostructures on silicon substrate obtained by V2O5 recrystallization
Dane BadawczeThe DataSet contains the XRD patterns of vanadium oxide nanostructures on silicon substrates obtained by recrystallization of V2O5 thin films between 800-1200°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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The XRD diffraction patterns of La0.3Sr0.6Ce0.1Ni0.1W0.9O3-s precursor calcined under air atmosphere
Dane BadawczeThe dataset includes XRD patterns of La0.3Sr0.6Ce0.1Ni0.1W0.9O3-s precursor gel prepared using wet chemistry methods, namely modified Pechini route. The powders were calcined at 550oC for 5 h in air.
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The XRD diffraction patterns of La0.3Sr0.6Ce0.1Ni0.1Mo0.9O3-s precursor calcined under air atmosphere
Dane BadawczeThe dataset includes XRD patterns of La0.3Sr0.6Ce0.1Ni0.1Mo0.9O3-s precursor gel prepared using wet chemistry methods, namely modified Pechini route. The powders were calcined at 550oC for 5 h in air.
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The XRD diffraction patterns of La0.3Sr0.6Ce0.1Ni0.1W0.45Mo0.45O3-s precursor calcined under air atmosphere
Dane BadawczeThe dataset includes XRD patterns of La0.3Sr0.6Ce0.1Ni0.1W0.45Mo0.45O3-s precursor gel prepared using wet chemistry methods, namely modified Pechini route. The powders were calcined at 550oC for 5 h in air.
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The XRD diffraction patterns of Ce0.9Gd0.1O2 prepared using modified Pechini/EDTA method
Dane BadawczeThe dataset includes XRD patterns of Ce0.9Gd0.1O2-s nanopowder (nanoparticles) prepared using modified Pechini method consisting of CA (citric acid), PEG (propylene glycol) and EDTA. Exact amount of metal nitrates were dissolved in water followed by addition of gelling agents and heated to 100C. Obtained gel was calcined at 600C for 4h. The powder...
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The XRD diffraction patterns of Ce0.8La0.2O2 and CeO2 prepared using soft template method
Dane BadawczeThe dataset includes XRD patterns of Ce0.8La0.2O2-s and CeO2-s nanopowders (nanoparticles) prepared using soft template method. CTAB was used as a micelle-based templating agent. The powders were precipitated from aqueous nitrate solution using NaOH solution and 250xCMC (critcal micelle concentration) of CTAB. Precipitates were heated up to 90oC, centrifuged...
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The XRD diffraction patterns of Ce0.9Gd0.1O2 prepared using soft template precipitation method
Dane BadawczeThe dataset includes XRD patterns of Ce0.9Gd0.1O2-s nanopowder (nanoparticles) prepared using soft template precipitation method. CTAB was used as a micelle-based templating agent. The powders were precipitated from aqueous nitrate solution using NaOH solution and 25xCMC (critcal micelle concentration) of CTAB. Precipitates were heated up to 90oC,...
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XRD patterns of the V2O5 coatings after thermal treatment under reducing atmosphere
Dane BadawczeThe DataSet contains the XRD patterns of V2O5 coatings on the silicon substrate after thermal treatment under a reducing atmosphere. Thin films were annealed at 500C, 600C, and 700C for 10 under a reducing atmosphere (94% Ar, 6% H2).
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XRD diffraction patterns for strontium ferrite molybdate-based compounds: as-prepared, reduced and reoxidized
Dane BadawczeThe dataset contains the XRD diffractograms collected at room temperature for SFM, LSFM and SFMNb in 3 different oxidation states, namely: as-prepared, reduced and reoxidized.
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XRD patterns of vanadium oxide nanostructures on quartz glass substrate obtained by V2O5 recrystallization
Dane BadawczeThe DataSet contains the XRD patterns of vanadium oxide nanostructures on quartz glass substrates obtained by recrystallization of V2O5 thin films between 800-1200°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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The XRD diffraction pattern of interdiffusion test in the CLO-NiO-YSZ system (30wt.%YSZ)
Dane BadawczeThe dataset includes the XRD pure diffraction pattern of the interdiffusion system consisting of CLO (Ce0.8La0.2O2), NiO and 8YSZ (8mol.% Y2O3 stabilized ZrO2). The mixture contains equal amounts of CLO and NiO as well as 30wt.% 8YSZ. Samples were sintered at 1400 oC. The reaction between CLO and YSZ is visible.
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The XRD diffraction pattern of interdiffusion test in the CLO-NiO-YSZ system (10wt.%YSZ)
Dane BadawczeThe dataset includes the XRD pure diffraction pattern of the interdiffusion system consisting of CLO (Ce0.8La0.2O2), NiO and 8YSZ (8mol.% Y2O3 stabilized ZrO2). The mixture contains equal amounts of CLO and NiO as well as 10wt.% 8YSZ. Samples were sintered at 1400 oC. The reaction between CLO and YSZ is visible.
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The XRD diffraction pattern of interdiffusion test in the CLO-NiO-YSZ system (20wt.%YSZ)
Dane BadawczeThe dataset includes the XRD pure diffraction pattern of the interdiffusion system consisting of CLO (Ce0.8La0.2O2), NiO and 8YSZ (8mol.% Y2O3 stabilized ZrO2). The mixture contains equal amounts of CLO and NiO as well as 20wt.% 8YSZ. Samples were sintered at 1400 oC. The reaction between CLO and YSZ is visible.
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The XRD diffraction patterns of Ce0.9Gd0.1O2 prepared using soft template precipitation method - 50xCMC
Dane BadawczeThe dataset includes XRD patterns of Ce0.9Gd0.1O2-s nanopowder (nanoparticles) prepared using soft template precipitation method. CTAB was used as a micelle-based templating agent. The powders were precipitated from aqueous nitrate solution using NaOH solution and 50xCMC (critcal micelle concentration) of CTAB. Precipitates were heated up to 90oC,...
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The XRD diffraction patterns of Ce0.8La0.2O2/Ni prepared using soft template method and impregnation
Dane BadawczeThe dataset includes XRD patterns of Ce0.8La0.2O2-s nanopowders (nanoparticles,nanocatalyst) prepared using soft template method and further impregnated with 10wt.%Ni using aqueous nitrate solution.
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Physicochemical studies (Raman, XRD) of poly(lactic acid)-carbon black-nanodiamond composites
Dane BadawczeThis dataset contains physico-chemical examination of a new 3D printing-dedicated composites with poly-lactic acid (PLA), carbon black (CB) and nanodiamond fillers. Two types of nanodiamonds were studied: detonation nanodiamonds (DND) and boron-doped carbon nanowalls (BCNW). The investigated techniques include Raman spectroscopy and X-ray diffraction...
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The XRD diffraction patterns of annealed Ce0.9M0.1O2 powders prepared using the reverse microemulsion method
Dane BadawczeThe dataset includes XRD patterns of Ce0.9M0.1O2 (where M=Mn, Fe, Co, Ni, Cu) nanopowders prepared using the reverse microemulsion method. The powders were precipitated from organic-based solution of nitrates using TMAOH. The sediment was cetrifuged and rinsed with alcohol several times. Powders were dried and calcinated at 500 degrees for 2 h, followed...
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XRD patterns of V2O5 thin films deposited on isotropic etching silicon substrates (111)
Dane BadawczeThe DataSet contains the XRD patterns of V2O5 thin films deposited on isotropic etching silicon substrates (111). The silicon wafers were etched in a mixture of nitric acid, hydrofluoric acid, and acetic acid in the ratio of 40:1:15. The soaking time for the substrates was from 30 to 90 seconds. The thin films were obtained by the sol-gel method. ...
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XRD (X-ray Diffraction) patterns of PMH, PMD and simulated MIL-53(Al)
Dane BadawczeThese data contain XRD (X-ray Diffraction) patterns of PMH, PMD and simulated MIL-53(Al). The results were recorded by a Philipsdiffractometer using Cu Ka radiation. Sample abbreviations (PMH, PMD, MIL-53(Al)) are in agreement with the markings used in the linked publication.
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XRD and electrochemical results for MoO3 films deposited using pulsed laser deposition system
Dane BadawczeThe attached data contains XRD and electrochemical results for MoO3 films deposited on fluorine-doped tin oxide glasses. Films were deposited using a pulsed laser deposition system at different conditions. Part of the samples was deposited at room temperature and then annealed at 575°C for given times (samples labeled PLD_RT_575C_xmin, where x stands...
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X-ray diffraction (XRD) of pristine bismuth oxide (Bi2O3) and gadolinium oxide (Gd2O3) structures
Dane BadawczeData contain results from X-ray diffraction (XRD) measurements of pristine Bi2O3 and Gd2O3 structures using Aeris diffractometer (Malvern Panalytical, Malvern, UK) with Cu-Kα radiation (λ = 1.544 Å)
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High temperature XRD diffraction patterns collected during the reoxidation process of SFM-based compounds
Dane BadawczeThis dataset contains three file folders for SFM, LSFM (La-doped) and SFMNb (Nb-doped) respectively. Samples were reduced prior to the XRD measurements. The measurements were performed on Philipps X’Pert Pro diffractometer using a high-temperature Anthon Paar HT-1200 oven adapter. Scans were performed each 50 deg. in air. The data in dataset were already...
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The XRD diffraction patterns of reduced LSCNT prepared using two methods and two sintering temperatures
Dane BadawczeThe dataset includes XRD diffraction patterns of La0.27Sr0.54Ce0.09Ni0.1Ti0.9O3-s produced using two methods, namely organic (citrate assisted) and Pechini sintered at 1000 or 1200oC under air atmosphere and reduced at 900 for 12 h in wet H2.
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The XRD diffraction patterns of as-prepared (La0.3Sr0.6Ce0.1)0.9Me0.1Ti0.9O3-δ (Me= Co, Fe, Ni) materials
Dane BadawczeThe (La0.3Sr0.6Ce0.1)0.9Me0.1Ti0.9O3-δ (Me= Co, Fe, Ni) materials were synthesized via the Pechini method. First, the reagents in the form of nitrates were weighed and dissolved in DI water. In another beaker, a stoichiometric amount of titanium (IV) butoxide (Ti(OBu)4) was mixed together with reagent-grade ethylene glycol (EG), and citric acid (CA)...
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The XRD diffraction patterns of as-prepared (La0.3Sr0.6Ce0.1)0.9Ni0.05Me0.05Ti0.9O3-δ (Me= Co, Fe, Cu) materials
Dane BadawczeThe ((La0.3Sr0.6Ce0.1)0.9Ni0.05Me0.05Ti0.9O3-δ (Me= Co, Fe, Cu) materials were synthesized via the Pechini method. First, the reagents in the form of nitrates were weighed and dissolved in DI water. In another beaker, a stoichiometric amount of titanium (IV) butoxide (Ti(OBu)4) was mixed together with reagent-grade ethylene glycol (EG), and citric acid...
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X-ray diffraction (XRD) of silica-coated bismuth oxide (Bi2O3) and gadolinium oxide (Gd2O3) structures
Dane BadawczeData contain results from X-ray diffraction (XRD) measurements of pristine Bi2O3 and Gd2O3 structures using Aeris diffractometer (Malvern Panalytical, Malvern, UK) with Cu-Kα radiation (λ = 1.544 Å)
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X-ray diffraction (XRD) of silica-coated bismuth oxide/gadolinium oxide (Bi2O3+Gd2O3) structures
Dane BadawczeData contain results from X-ray diffraction (XRD) measurements of pristine Bi2O3 and Gd2O3 structures using Aeris diffractometer (Malvern Panalytical, Malvern, UK) with Cu-Kα radiation (λ = 1.544 Å)
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XRD, DTA and luminescence measurements of B2O3-Bi2O3-AlF3 glasses doped with Eu3+, Tb3+ and Tm3+ ions
Dane BadawczeThe DataSet contains the XRD,DTA and luminescence measurements for the B2O3-Bi2O3-AlF3 glass system. Samples were prepared by the conventional melt quenching technique. Starting materials were melted in porcelain crucibles at 950 oC for 20 min. XRD and DTA data were collected for 50B2O3-50Bi2O3,45B2O3-45Bi2O3+10AlF3 and 40B2O3-40Bi2O3+20AlF3 glasses....
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X-ray diffraction (XRD) patterns of nickel(II) oxide (NiO) functionalized borophene and bulk boron
Dane BadawczeThese data include X-ray diffration (XRD) patterns of nickel(II) oxide (NiO) functionalized borophene before and after oxygen evolution reaction (OER), bulk boron (B), graphiic foil (GF) and nickel(II) oxide nanoparticles (NiO).
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X-ray Diffraction (XRD) patterns of PC-X (porous carbon materials obtained at various temperatures)
Dane BadawczeThese data contain X-ray diffraction patterns (XRD) of PC-700 (porous carbon materials obtained at 700°C), PC-800 (porous carbon materials obtained at 800°C) and PC-900 (porous carbon materials obtained at 900°C).
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Ex-situ XRD (X-ray Diffraction) results for electrodes under different charge/discharge states
Dane BadawczeEx-situ XRD was employed to analyze the energy storage mechanism of CPMD in ZICs system. The ZICs were firstly charged to 1.8 V from the open circuit voltage (at around 1.3 V), then discharge to 1.0 V and 0.2 V, and finally recharged to 1.0 V and 1.8 V. Sample abbreviations (CPMD) are in agreement with the markings used in the linked publication.
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X-ray diffraction (XRD) and particle size distribution (PSD) data of iron oxide (Fe3O4) - magnetite particles
Dane BadawczeDataset presenting X-ray diffractogram and particle size distribution of nanomagnetite (Fe3O4) iron oxide particles purchased from Sigma Aldrich (637106).X-ray diffraction study was performed with a PRO X-ray diffractometer (X’Pert PRO Philips diffractometer, Co. Ka radiation, Almelo, Holland), while PSD was determined using laser diffraction technique...
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The XRD diffraction patterns of as-preapred (La0.3Sr0.6Ce0.1)0.9FexTi(1-x)O3-δ (x=0.1, 0.2 and 0.3) materials
Dane BadawczeThe (La0.3Sr0.6Ce0.1)0.9FexTi(1-x)O3-δ (x=0.1, 0.2 and 0.3) materials were synthesized via the Pechini method. First, the reagents in the form of nitrates were weighed and dissolved in DI water. In another beaker, a stoichiometric amount of titanium (IV) butoxide (Ti(OBu)4) was mixed together with reagent-grade ethylene glycol (EG), and citric acid...
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X-ray diffraction (XRD) of bulk boron and borophene flakes after the ball-milling process at different operating parameters
Dane BadawczeThese data include X-ray diffraction patterns of bulk boron and borophene obtained during ball milling at different rotation speeds, time and mass loadings. The data were collected to investigate the crystal structure of the studied materials.
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The XRD diffraction patterns of as-prepared (La0.3Sr0.6Ce0.1)0.9FexMeyTi(1-x-y)O3-δ materials (Me=Ni,Co)
Dane BadawczeThe (La0.3Sr0.6Ce0.1)0.9FexMeyTi(1-x-y)O3-δ materials (Me=Ni,Co) were synthesized via the Pechini method. First, the reagents in the form of nitrates were weighed and dissolved in DI water. In another beaker, a stoichiometric amount of titanium (IV) butoxide (Ti(OBu)4) was mixed together with reagent-grade ethylene glycol (EG), and citric acid (CA)...
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The XRD diffraction patterns of (La0.3Sr0.6Ce0.1)0.9Me0.1Ti0.9O3-δ (Me= Co, Cu, Fe, Mn, Ni) materials after reduction at 900 deg.C in hydrogen
Dane BadawczeThe (La0.3Sr0.6Ce0.1)0.9Me0.1Ti0.9O3-δ (Me= Co, Cu, Fe, Mn, Ni) materials were synthesized via the solid state reaction method and examined as a potential anode material. First, the mixed oxide reagents were pressed into pellets and calcined at 1200 °C for 12 hours to decompose most of the organic compounds. The resulting calcined pellet was ground...
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The XRD diffraction patterns of (La0.3Sr0.6Ce0.1)0.9Me0.1Ti0.9O3-δ (Me= Co, Cu, Fe, Mn, Ni) materials after reduction at 1000 deg.C in hydrogen
Dane BadawczeThe (La0.3Sr0.6Ce0.1)0.9Me0.1Ti0.9O3-δ (Me= Co, Cu, Fe, Mn, Ni) materials were synthesized via the solid state reaction method and examined as a potential anode material. First, the mixed oxide reagents were pressed into pellets and calcined at 1200 °C for 12 hours to decompose most of the organic compounds. The resulting calcined pellet was ground...
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The XRD diffraction patterns of (La0.3Sr0.6Ce0.1)0.9Me0.1Ti0.9O3-δ (Me= Co, Cu, Fe, Mn, Ni) materials after reduction at 1100 deg.C in hydrogen
Dane BadawczeThe (La0.3Sr0.6Ce0.1)0.9Me0.1Ti0.9O3-δ (Me= Co, Cu, Fe, Mn, Ni) materials were synthesized via the solid state reaction method and examined as a potential anode material. First, the mixed oxide reagents were pressed into pellets and calcined at 1200 °C for 12 hours to decompose most of the organic compounds. The resulting calcined pellet was ground...
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The XRD diffraction patterns of (La0.3Sr0.6Ce0.1)0.9FexTi(1-x)O3-δ (x=0.1, 0.2 and 0.3) materials after reduction at 900 deg.C in hydrogen
Dane BadawczeThe (La0.3Sr0.6Ce0.1)0.9FexTi(1-x)O3-δ (x=0.1, 0.2 and 0.3) materials were synthesized via the Pechini method. First, the reagents in the form of nitrates were weighed and dissolved in DI water. In another beaker, a stoichiometric amount of titanium (IV) butoxide (Ti(OBu)4) was mixed together with reagent-grade ethylene glycol (EG), and citric acid...
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The XRD diffraction patterns of as-prepared (La0.3Sr0.6Ce0.1)0.9Me0.1Ti0.9O3-δ (Me= Co, Cu, Fe, Mn, Ni) materials synthesized via the solid state reaction method
Dane BadawczeThe (La0.3Sr0.6Ce0.1)0.9Me0.1Ti0.9O3-δ (Me= Co, Cu, Fe, Mn, Ni) materials were synthesized via the solid state reaction method and examined as a potential anode material. First, the mixed oxide reagents were pressed into pellets and calcined at 1200 °C for 12 hours to decompose most of the organic compounds. The resulting calcined pellet was ground...
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XRD (X-ray diffraction) patterns of WS2/userGOx (composites of tungsten disulfide and ultrafast self-expanded and reduced graphene oxide), ex-WS2 (exfoliated tungsten disulfide) and GO (graphene oxide)
Dane BadawczeThese data contain XRD (X-ray diffraction) patterns of WS2/userGOx (composites of tungsten disulfide and ultrafast self-expanded and reduced graphene oxide), ex-WS2 (exfoliated tungsten disulfide) and GO (graphene oxide). The data were collected for samples obtained from three ex-WS2:GO dispersions - with 1:1, 1:2, and 2:1 weight ratios.
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XRD data of (Cr,Fe,Mn,Co,Ni)3O4 High-entropy spinel oxide thin films deposited on amorphous SiO2 substrate by spray pyrolysis techniqe, annealed in a range from 400 to 900oC
Dane BadawczeDataset include collected XRD data of (Cr,Fe,Mn,Co,Ni)3O4 high-entropy spinel oxide thin films deposited by spray pyrolysis technique on amorphous SiO2 substrates and annealed from 400 to 900oC. Samples were prepared in the form of a ~ 500 nm thin film utilising a facile spray pyrolysis technique. The structural and electrical properties of the layers...
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X-ray diffractometry results of the Sr1.05Ti0.30Fe0.70O3-d material before and after H2-TPR measurement
Dane BadawczeThis dataset contains results of X-ray diffractometry mesurement (XRD) of the Sr1.05Ti0.30Fe0.70O3-d material. The phase composition of the investigated powders was analyzed by XRD at room temperature. The X-ray diffractometry (XRD) technique was used to determine the phase composition of the fabricated powder and powder after H2-TPR (temperature programmed...
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X-ray diffractometry results of the Sr0.90Ti0.30Fe0.70O3-d material before and after H2-TPR measurement
Dane BadawczeThis dataset contains results of X-ray diffractometry mesurement (XRD) of the Sr0.90Ti0.30Fe0.70O3-d material. The phase composition of the investigated powders was analyzed by XRD at room temperature. The X-ray diffractometry (XRD) technique was used to determine the phase composition of the fabricated powder and powder after H2-TPR (temperature programmed...
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X-ray diffractometry results of the Sr1.00Ti0.30Fe0.70O3-d material before and after H2-TPR measurement
Dane BadawczeThis dataset contains results of X-ray diffractometry mesurement (XRD) of the Sr1.00Ti0.30Fe0.70O3-d material. The phase composition of the investigated powders was analyzed by XRD at room temperature. The X-ray diffractometry (XRD) technique was used to determine the phase composition of the fabricated powder and powder after H2-TPR (temperature programmed...