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Wyniki wyszukiwania dla: ANALOG TO DIGITAL CONVERTERS
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Virtual Models of Analog-Digital Converters in Education of Electrical Measurements and Instrumentation.
PublikacjaPrzedstawiono opracowane przez autorów przyrządy wirtualne do demonstracji działania przetworników analogowo-cyfrowych: integracyjnego, kompensacyjnego, sigma-delta, z pośrednim sygnałem częstotliwościowym. Programy umożliwiają obserwację zmian napięcia w punktach charakterystycznych układów w spowolnionej skali czasowej. Możliwe jest również zadawanie zakłóceń.
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An Ultra-Low-Energy Analog Comparator for A/D Converters in CMOS Image Sensors
PublikacjaThis paper proposes a new solution of an ultra-low-energy analog comparator, dedicated to slope analog-to-digital converters (ADC), particularly suited for CMOS image sensors (CISs) featuring a large number of ADCs. For massively parallel imaging arrays, this number may be as high as tens-hundreds of thousands ADCs. As each ADC includes an analog comparator, the number of these comparators in CIS is always high. Detailed analysis...
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Is Digitalization Improving Governance Quality? Correlating Analog and Digital Benchmarks
PublikacjaThe digitalization of public governance and the resulting concept of electronic governance is a characteristic feature of contemporary information society. Both can be defined as the process and outcome of digital transformation: transformation of the “analog” version of governance into “digital” governance. Measuring both versions of governance against typical performance measures of efficiency, effectiveness, equity, openness...
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On analog comparators for CMOS digital pixel applications. A comparative study
PublikacjaVoltage comparator is the only – apart from the light-to-voltage converter – analog component in the digital CMOS pixel. In this work, the influence of the analog comparator nonidealities on the performance of the digital pixel has been investigated. In particular, two versions of the digital pixel have been designed in 0.35 μm CMOS technology, each using a different type of analog comparator. The properties of both versions have...
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Conditions for measurement, analog-to-digital conversion and frequency analysis of irregularities of profile surface
PublikacjaPrzedstawiono uwarunkowania pomiaru, przetwarzania analogowo-cyfrowego i analizy częstotliwościowej nierówności powierzchni toczonych dla celów rozpoznawania ich głównych składowych. Przedstawiono ograniczenia w pomiarze igłą, która odwzorowuje nierówności poprzeczne. Podano zależności parametrów pomiaru cyfrowego nierówności warunkujące zakresy ich rozpatrywania. Dla wartości przedziału próbkowania, dla którego nie jest spełnione...
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The Influence of Noise Level on the Value of Uncertainty in a Measurement System Containing an Analog-to-Digital Converter
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Experimental Study of the Influence of Noise Level on the Uncertainty Value in a Measurement System Containing an Analog-to-Digital Converter
Dane BadawczeFor newly developed measuring systems it is easy to estimate type B uncertainties based on the technical data of the measuring modules applied. However, it is difficult to estimate A type un-certainties due to the unknown type and level of interferences infiltrating into the measuring sys-tem. This is a particularly important problem for measurements...
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IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing
Czasopisma -
Design of highly linear tunable CMOS OTA for continuous-time filters
PublikacjaW pracy przedstawiono analityczną metodę projektowania wzmacniaczy transkon-duktancyjnych CMOS o bardzo dobrej liniowości. Zaproponowano dwie wersje układu różniące się umiejscowieniem dodatkowej pary różnicowej służącej do kompensacji nieliniowości charakterystyki przejściowej. Praca zawiera wyniki symulacji pełnych wersji obu układów otrzymane przy użyciu symulatora SPICE.
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In-ADC, Rank-Order Filter for Digital Pixel Sensors
PublikacjaThis paper presents a new implementation of the rank-order filter, which is established on a parallel-operated array of single-slope (SS) analog-to-digital converters (ADCs). The SS ADCs use an “on-the-ramp processing” technique, i.e., filtration is performed along with analog-to-digital conversion, so the final states of the converters represent a filtered image. A proof-of-concept 64 × 64 array of SS ADCs, integrated with MOS...
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Self-Testing of Analog Parts Terminated by ADCs Based on Multiple Sampling of Time Responses
PublikacjaA new approach for self-testing of analog parts terminated by analog-to-digital converters in mixed-signal electronic microsystems controlled by microcontrollers is presented. It is based upon a new fault diagnosis method using a transformation of the set of voltage samples of the time response of a tested analog part to a square impulse into localization curves placed in a multidimensional measurement space. The method can be used...
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A Power-Efficient Digital Technique for Gain and Offset Correction in Slope ADCs
PublikacjaIn this brief, a power-efficient digital technique for gain and offset correction in slope analog-to-digital converters (ADCs) has been proposed. The technique is especially useful for imaging arrays with massively parallel image acquisition where simultaneous compensation of dark signal non-uniformity (DSNU) as well as photo-response non-uniformity (PRNU) is critical. The presented approach is based on stopping the ADC clock by...
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Selection of excitation signals for high-impedance spectroscopy
PublikacjaA method of fast impedance spectroscopy of technical objects with high impedance (|Zx| > 1 GOhm) is evaluated in this paper. An object is excited with a signal generated by a digital-to-analog converter (DAC) located on the U2531A DAQ module. Response signals proportional to current flowing through and voltage across the measured object are sampled by analog-to-digital converters (ADC) in the DAQ module. The object impedance spectrum...
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Fixed Pattern Noise Reduction and Linearity Improvement in Time-Mode CMOS Image Sensors
PublikacjaIn the paper, a digital clock stopping technique for gain and offset correction in time-mode analog-to-digital converters (ADCs) has been proposed. The technique is dedicated to imagers with massively parallel image acquisition working in the time mode where compensation of dark signal non-uniformity (DSNU) as well as photo-response non-uniformity (PRNU) is critical. Fixed pattern noise (FPN) reduction has been experimentally validated...
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Zastosowanie sygnałów o projektowanych kształtach do diagnostyki obiektów wysoko-impedancyjnych metodą spektroskopii impedancyjnej
PublikacjaW artykule przedstawiono metodę szybkiej spektroskopii impedancyjnej obiektów o wysokich impedancjach (|Zx| > 1 GOhm) z zastosowaniem sygnałów o projektowanych kształtach. Sygnał pobudzenia wytwarzany jest w module DAQ U2531A i doprowadzany na wejście badanego obiektu za pośrednictwem przetwornika cyfrowo-analogowego (CA). Sygnały odpowiedzi proporcjonalne do napięcia na mierzonej impedancji Zx oraz prądu płynącego przez Zx są...
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Time-domain measurement methods for R, L and C sensors based on aversatile direct sensor-to-microcontroller interface circuit
PublikacjatIn the paper new time-domain measurement methods for determining values of resistive (R), inductive(L) and capacitive (C) sensors based on a versatile direct sensor-to-microcontroller interface for microcon-trollers with internal analog-to-digital converters (ADCs) and analog comparators (ACs) are presented.The interface circuit consists of a reference resistor Rrworking as a voltage divider, a given R, L or C sensorand a microcontroller...
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Dead-Time Effect Compensation Based on Additional Phase Current Measurements
PublikacjaThis paper proposes a new method of dead-time effect compensation. The proposed solution is based on additional phase current measurements realized by analog-to-digital converters. These measurements are carried out at the time instants specified by a pulsewidth-modulation (PWM) strategy. This makes it possible to estimate inverter currents at the commutation instants and, finally, to estimate the voltage error caused by dead time. This...
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The voltage on bus bars of the main switchboard of the car carrier electrical power system during sea trials
Dane BadawczeThe dataset is part of the research results on the quality of supply voltage on bus bars of the main switchboard of the ship's electrical power system in different states of ship exploitation. The attached dataset contains the measurement results conducted onboard the car carrier during sea trials.
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The voltage on bus bars of the main switchboard of the car carrier electrical power system at sea trials during maneuvering
Dane BadawczeThe dataset is part of the research results on the quality of supply voltage on bus bars of the main switchboard of the ship's electrical power system in different states of ship exploitation. The attached dataset contains the measurement results conducted onboard the car carrier at sea trials during maneuvering.
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A measurement method for capacitive sensors based on a versatile direct sensor-to-microcontroller interface circuit
PublikacjaIn the paper, there is presented a new time-domain measurement method for determining the capacitance values of capacitive sensors, dedicated, among others, to capacitive relative humidity sensors. The method is based on a versatile direct sensor-to-microcontroller interface for microcontrollers with internal analog comparators (ACs) and with precision voltage reference sources, e.g. digital-to-analog converters (DACs). The reference...