Wyszukiwarka
Wyniki wyszukiwania dla: TEM (transmission electron microscopy) of boron and borophene
-
SEM (scanning electron microscopy) and TEM (transmission electron microscopy) images of PMD and PMH
Dane BadawczeThese data contains SEM (scanning electron microscopy) and TEM (transmission electron microscopy) images of PMD and PMH. TEM was performed on a FEI Tecnai F30 transmission electron microscope operating at an acceleration voltage of 200 kV. SEM was done with a SEM, XL30ESEM-FEG with an acceleration voltage of 20 KV. Sample abbreviations (PMH, PMD) are...
-
TEM (transmission electron microscopy) images and elemental mapping EDX (energy dispersive X-ray spectroscopy) of bulk boron and borophene obtained during ball milling
Dane BadawczeThese data contain TEM (transmission electron microscopy) images with corresponding elemental mapping EDX of bulk boron and borophene flakes after the ball-milling process (450 rpm, 6 h, 1 g). The data were collected to investigate the structure and morphology of the materials.
-
Transmission electron microscope (TEM) and optical microscope images of pristine and silica-coated bismuth oxide and gadolinium oxide particles
Dane BadawczeCollection of raw transmission electron microscope (TEM) micrographs and optical microscope images used in the associated manuscript. All data in accessible *.tif format. Zip package contains:
-
TEM imaging of Ag-Au nanoalloys
Dane BadawczeThe nanostructures of AuAg nanoalloys were prepared by sequential sputtering of metal thin layers (Au/Ag or Ag/Au) followed by annealing under 550 Celsius degree in an argon atmosphere. The basic single layer thickness was usually ca. 3 nm. For investigations two samples wih 50% Au and 50% Ag were selected and samples 1/3 Ag - 2/3 Au and 2/3 Ag - 1/3...
-
XPS analysis of TBBO glass
Dane BadawczeGlasses and glass-ceramics with nominal composition 73 TeO2– 4BaO– 3Bi2O3–18SrF2-2RE2O3 (where RE = Eu, Dy) have been synthesized by conventional melt-quenching technique and subsequent heat treatment at 370 °C for 24 h in air atmosphere. Various Eu3+ to Dy3+ molar ratio have been applied to investigate luminescence properties in both glass and glass-ceramic...
-
Research 1: Heterojunction of (P, S) co-doped g-C3N4 and 2D TiO2 for improved carbamazepine and acetaminophen photocatalytic degradation
Dane BadawczeThe first research article consisted on the synthesis of phosphorus and sulfur co-doped graphitic carbon nitride incorporated in 2D TiO2 structure for solar-driven degradation of emerging pollutants from the group of pharmaceuticals not susceptible to biodegradation. The hybrid photocatalysts with different loadings of (P, S)-doped g-C3N4 were characterized...
-
AFM (atomic force microscopy) images of borophene after sonication of boron
Dane BadawczeThese data include AFM (atomic force microscopy) images of borophene obtained after sonication in aceton of boron, collected in order to estimate lateral size of the nanoflakes.
-
The influence of chitosan hydrogel cross-linking by agarose on coating physico-chemical properties
Dane BadawczeThis dataset contains various physicochemical analyses showing the effect of different concentration of chitosan and the cross-linking agent agarose. Each sample is labeled by C and A representing chitosan and agarose concentrations, respectively, while the exact amounts are depicted in the attached table. Fourier-transform infrared (FT-IR) spectroscopy...
-
Comparison of PM10 concentration in Gdansk and London using electron microscopy
PublikacjaParticulate matter (PM) has been considered as one of the most dangerous elements of air pollution. Multiply analytical methods are employed to identify the composition of particles present in the air. The theoretical part of this work is a description of different research centres all over the world where particulate matter is being analyzed using various techniques. The purpose of this project is to analyze and compare particles...
-
The Progress in Electron Microscopy Studies of Particulate Matters to Be Used as a Standard Monitoring Method for Air Dust Pollution
PublikacjaThe present article reviews studies on air solid particles carried out with the use of electron microscopy. Particle analysis combining scanning and transmission electron microscopy (SEM and TEM) can be used to derive size-resolved information of the composition, mixing state, morphology, and complex refractive index of atmospheric aerosol particles. It seems that electron microscopy is more widely used in atmospheric particulate...
-
The scanning electron microscopy (SEM) studies of heavy boron-doped diamond oxidation under high-temperature
Dane BadawczeThe dataset contains the results of scanning electron microscopy (SEM) images of heavy boron-doped diamond (BDD) electrodes subjected to high-temperature oxidation in a furnace at 600 Celsius. The micrographs reveal the material decomposition of BDD grains due to high temperature.
-
Scanning electron microscopy (SEM) images of the boron-doped carbon nanowalls surfaces
Dane BadawczeThe dataset contains the scanning electron micrographs (SEM), revealing the surface morphology of boron-doped carbon nanowalls electrodes on silicon substrates. The surface is characterized by nano-walled structures. The obtained electrodes were doped with boron at the level of [B]/[C] = 5000ppm in the gas atmosphere during the synthesis.
-
Scanning electron microscopy (SEM) images of the boron-dopied carbon nanowalls surfaces
Dane BadawczeThe dataset contains the scanning electron micrographs (SEM), revealing the surface morphology of boron-doped carbon nanowalls electrodes on silicon substrates. The surface is characterized by nano-walled structures. The obtained electrodes were doped with boron at the level of [B]/[C] = 1200ppm in the gas atmosphere during the synthesis.
-
Scanning electron microscopy (SEM) images of the boron-doped carbon nanowalls surfaces
Dane BadawczeThe dataset contains the scanning electron micrographs (SEM), revealing the surface morphology of boron-doped carbon nanowalls electrodes on silicon substrates. The surface is characterized by nano-walled structures. The obtained electrodes were doped with boron at the level of [B]/[C] = 2000ppm in the gas atmosphere during the synthesis.
-
JOURNAL OF ELECTRON MICROSCOPY
Czasopisma -
Scanning electron microscopy (SEM) images of boron-doped diamond thin films at poly(lactic acid)
Dane BadawczeThe dataset contains the photos obtained by scanning electron microscope(SEM), revealing the surface morphology and cross-section of boron-doped diamond electrodes on commercially available graphene-doped polylactide acid. The boron doping level expressed as the [B]/[C] ratio in the gas phase for these studies was 500 and 10,000 ppm. The top views of...
-
Fourier-transform infrared spectroscopy (FTIR) spectra of bulk boron and borophene flakes
Dane BadawczeThese data contain Fourier-transform infrared spectroscopy (FTIR) spectra of bulk boron and borophene flakes obtained during ball milling (450 rpm, 6 h, 1 g). Spectra were acquired to investigate the chemical bonds and functional groups on the surface of the pristine boron and borophene flakes.
-
Grain type and size of particulate matter from diesel vehicle exhausts analysed in transmission electron microscopy
PublikacjaThe aim of this research was to apply a simple and quick method of size and shape characterization by TEM to diesel exhaust particles from large-capacity, high-performance trucks. Particulate matter (PM) samples were collected while the engines were idling. It was found that PM from vehicle exhaust emissions can be divided into three groups: soot, irregular-shaped particles and circular particles. Irregular-shaped particles and...
-
XRD (X-ray diffraction) spectra of bulk boron and obtained borophene
Dane BadawczeThis dataset includes XRD (X-ray diffraction) spectra of bulk boron and borophene obtained during sonication process, giving the information on the phase composition and crystallinity of materials.
-
AFM (atomic force microscopy) images of borophene flakes obtained during ball milling at different operating parameters
Dane BadawczeThis dataset contains atomic force microscopy (AFM) images of representative borophene flakes obtained during ball milling. The operational parameters of the ball-milling process included rotation speed (250, 450, and 650 rpm), time of ball-milling (1, 3, 6, and 12 h), and the mass loading of starting bulk boron (1, 2, 3 g).
-
Hopping or Tunneling? Tailoring the Electron Transport Mechanisms through Hydrogen Bonding Geometry in the Boron-Doped Diamond Molecular Junctions
PublikacjaMechanisms of charge transport in molecular junctions involving hydrogen bonds are complex and remain mostly unclear. This study is focused on the elucidation of the electron transfer in a molecular device consisting of two boron-doped diamond interfaces bound with an aromatic linker and a hydrogen bonding surrogating molecule. The projected local density of states (PLODS) analysis coupled with transmission spectra and current−voltage...
-
Focused ion beam-based microfabrication of boron-doped diamond single-crystal tip cantilevers for electrical and mechanical scanning probe microscopy
PublikacjaIn this paper, the fabrication process and electromechanical properties of novel atomic force microscopy probes utilising single-crystal boron-doped diamond are presented. The developed probes integrate scanning tips made of chemical vapour deposition-grown, freestanding diamond foil. The fabrication procedure was performed using nanomanipulation techniques combined with scanning electron microscopy and focused ion beam technologies....
-
Bottom up approach of metal assisted electrochemical exfoliation of boron towards borophene
Publikacja -
Self-organized multilayered graphene-boron doped diamond hybrid nanowalls for high performance electron emission devices
PublikacjaCarbon nanomaterials like nanotubes, nanoflakes/nanowalls and graphene have been used as electron sources due to their superior field electron emission (FEE) characteristics. Nevertheless, these materials show poor stability and a short lifetime, preventing them from being used in practical device applications. The intention of this study was to find an innovative nanomaterial, possessing both high robustness and reliable FEE behavior....
-
Boron doped Nanocrystalline Diamond-Carbon Nanospike Hybrid Electron Emission Source
PublikacjaElectron emission signifies an important mechanism facilitating the enlargement of devices that have modernized large parts of science and technology. Today, the search for innovative electron emission devices for imaging, sensing, electronics, and high-energy physics continues. Integrating two materials with dissimilar electronic properties into a hybrid material is an extremely sought-after synergistic approach envisioning a...
-
The Scanning Electron Microscopy images of three arthropods
Dane BadawczeThe dataset contains micrographs of various arthropods made with the Scanning Electron Microscopy (SEM) technique. The images were done during the laboratory with students from the Faculty of Chemistry. Among the studied species, there is a fruit fly (lat.Drosophila melanogaster), a spider (most likely Sibianor aurocinctus), and a weevil insect (Curculionoidea).
-
Stable Field Electron Emission and Plasma Illumination from Boron and Nitrogen Co‐Doped Edge‐Rich Diamond‐Enhanced Carbon Nanowalls
PublikacjaSuperior field electron emission (FEE) characteristics are achieved in edge-rich diamond-enhanced carbon nanowalls (D-ECNWs) grown in a single-step chemical vapor deposition process co-doped with boron and nitrogen. The structure consists of sharp, highly conductive graphene edges supplied by a solid, diamond-rich bottom. The Raman and transmission electron microscopy studies reveal a hybrid nature of sp3-diamond and sp2-graphene...
-
X-ray photoelectron spectroscopy (XPS) results for nickel(II) oxide (NiO) functionalized borophene and boron
Dane BadawczeThis dataset contain X-ray photoelectron spectroscopy (XPS) results for nickel(II) oxide (NiO) functionalized borophene before and after oxygen evolution reacion (OER) nad bulk boron.
-
X-ray Photoelectron Spectroscopy (XPS) results of bulk boron and borophene after the ball-milling process
Dane BadawczeThese data contain X-ray Photoelectron Spectroscopy (XPS) results of boron and borophene nanoflakes induced during ball milling at rotation speed of 450 rpm, 6 h and mass loading of 1g.
-
X-ray diffraction (XRD) patterns of nickel(II) oxide (NiO) functionalized borophene and bulk boron
Dane BadawczeThese data include X-ray diffration (XRD) patterns of nickel(II) oxide (NiO) functionalized borophene before and after oxygen evolution reaction (OER), bulk boron (B), graphiic foil (GF) and nickel(II) oxide nanoparticles (NiO).
-
SEM (Scanning Electron Microscopy) and SEM-EDS (Scanning Electron Microscopy with Energy Dispersive X-ray Spectroscopy) images of nickel (Ni) foam as received, after photocatalysis and after oxidation at 500_C.
Dane BadawczeThis dataset contains SEM (Scanning Electron Microscopy) and SEM-EDS (Scanning Electron Microscopy with Energy Dispersive X-ray Spectroscopy) images of Ni (nickel) foam as received from the supplier, after photocatalytic treatment and after oxidation at 500C. The detailed equipment and measurement data was described in "readme SEM.txt" file
-
X-ray diffraction (XRD) of bulk boron and borophene flakes after the ball-milling process at different operating parameters
Dane BadawczeThese data include X-ray diffraction patterns of bulk boron and borophene obtained during ball milling at different rotation speeds, time and mass loadings. The data were collected to investigate the crystal structure of the studied materials.
-
Multifrequency Nanoscale Impedance Microscopy (m-NIM): A novel approach towards detection of selective and subtle modifications on the surface of polycrystalline boron-doped diamond electrodes
PublikacjaIn this paper, we describe the modification of Nanoscale Impedance Microscopy (NIM), namely, a combination of contact-mode atomic force microscopy with local impedance measurements. The postulated approach is based on the application of multifrequency voltage perturbation instead of standard frequency-by-frequency analysis, which among others offers more time-efficient and accurate determination of the resultant impedance spectra...
-
Electron collisions with boron trichloride (BCl3) molecules
PublikacjaPrzedstawiono wyniki pomiarów absolutnych, całkowitych przekrojów czynnych na rozpraszanie elektronów na drobinach BCl3. Pomiary przeprowadzono w zakresie energii 0.3 - 370eV. Otrzymane wyniki porównano z dostępnymi cząstkowymi przekrojami czynnymi (tj. sprężystym, jonizacyjnym. Przedyskutowano rolę peryferyjnych atomów molekuły, zestawiając wyniki pomiarów całkowitych przekrojów czynnych dla drobin BCl3 i BF3.
-
Scanning electron microscopy (SEM) images of the boron-dopied diamond surfaces
Dane BadawczeThe dataset contains the scanning electron micrographs (SEM), revealing the surface morphology of diamond electrodes on different substrates. The diamond surface is characterized by an aggregation of crystals that do not form a continuous layer.
-
Scanning electron microscopy (SEM) images of the boron-dopied diamond surfaces
Dane BadawczeThe dataset contains the scanning electron micrographs (SEM), revealing the surface morphology of diamond electrodes on silicon substrates. The diamond surface is characterized by ultra-crystalline diamonds obtained by CVD synthesis.
-
Microstructure–Property Relationship of Polyurethane Foams Modified with Baltic Sea Biomass: Microcomputed Tomography vs. Scanning Electron Microscopy
PublikacjaIn this paper, novel rigid polyurethane foams modified with Baltic Sea biomass were compared with traditional petro-based polyurethane foam as reference sample. A special attention was focused on complex studies of microstructure, which was visualized and measured in 3D with high-resolution microcomputed tomography (microCT) and, as commonly applied for this purpose, scanning electron microscopy (SEM). The impact of pore volume,...
-
The scanning electron microscopy (SEM) studies of low voltage copper cables
Dane BadawczeThe dataset contains the scanning electron microscopy (SEM) images of the low voltage copper cables, which were studied in the article discussing the regulatory requirements for checking the electrical resistance of such cables. The cables were cut and studies in cross-section. The full results were published in:
-
Electron-beam irradiation in TEM of hard-segment homopolymers and polyurethanes with different hard-segment content.
PublikacjaZbadano odporność na niszczenie radiacyjne w transmisyjnym mikroskopie elektronowym homopolimeru segmentów sztywnych i poliuretanów z różną zawartością segmentów sztywnych. Dokonano rejestracji morfologii tych polimerów w TEM w trakcie obserwacji w jasnym polu oraz selektywnej dyfrakcji elektronowej. Analizowano tkże te polimery w mikroskopie polaryzacyjnym przed i po obserwacjach w TEM. Potwierdzono doniesienia literatutowe o...
-
Scanning Electron Microscopy images of nanocubes suspension 1 month after synthesis
Dane BadawczeThis dataset contains the SEM images of the gold nanocubes suspension in citrate buffer. The goal of the study was to evaluate the size of the synthesized nanocubes, their stability one month after the synthesis process, and to verify the optimal conditions regarding nanocubes concentration for the SEM analysis. Solutions with two different AuNC concentrations...
-
Scanning Electron Microscopy (SEM ) images of PC-X (porous carbon materials obtained at various temperatures)
Dane BadawczeThese data contain SEM (scanning electron microscopy) images of PC-700 (porous carbon materials obtained at 700°C), PC-800 (porous carbon materials obtained at 800°C) and PC-900 (porous carbon materials obtained at 900°C).
-
The scanning spreading resistance microscopy (SSRM) studies of heavy boron-doped diamond oxidation under high-temperature
Dane BadawczeThe dataset contains the results of scanning spreading resistance microscopy (SSRM) of heavy boron-doped diamond (BDD) electrodes subjected to high-temperature oxidation in a furnace at 600 Celsius. The micrographs reveal the local change of electric properties at certainly crystallographic orientations of BDD grains and at the grain boundaries due...
-
Electron scattering by planar boron-containing molecules BX3(X=F, Cl, CD3)
PublikacjaPraca prezentuje absolutny całkowity przekrój na rozpraszanie elektronów dla drobiny B(CD3)3 w zakresie niskich i średnich energii, otrzymany liniową metodą transmisyjną. Porównanie wyników dla innych płaskich drobin zawierających bor jako atom centralny - BX3(X=F, Cl) ukazuje rolę atomów zewnętrznych w procesie rozpraszania.
-
The topography of various sialoliths by scanning electron microscopy
Dane BadawczeThis dataset contains SEM micrographs taken for salivary gland stones (sialolith) extracted during joint studies between the Medical University of Gdansk and Gdansk University of Technology. Three different types of stones were examined, as discussed in the article: 10.1111/odi.13708
-
Microstructure–Property Relationship of Polyurethane Foams Modified with Baltic Sea Biomass: Microcomputed Tomography vs. Scanning Electron Microscopy
Publikacja -
Comparative study of donor-induced quantum dots in Si nano-channels by single-electron transport characterization and Kelvin probe force microscopy
Publikacja -
Evaluation of the content of zinc compounds in polyethylene films using scanning electron microscopy
Dane BadawczeThe dataset contains the results of in the form of micrographs made using a scanning electron microscope (SEM) S–3400N (Hitachi, Hyogo, Japan) using backscattered electron (BSE) detector. SEM was equipped with tungsten filament. The accelerating voltage was 25 kV. Utilization of BSE detector allowed to increase the contrast of local areas varying in...
-
TEM micrographs of V2O5 nanostructures
Dane BadawczeThe DataSet contains the TEM images of V2O5 nanostructures obtained by the sol-gel method.
-
Scanning electron microscopy studies of the weld decay on SS 304 of water supply pipeline
Dane BadawczeThis dataset contains micrographs made with scanning electron microscope (SEM) Hitachi S-3400N, of the weld decay for water supply system pipelines made of AISI 304 stainless steel. Within the dataset one can see the different corrosion mechanisms. The micrographs were made after the Strauss test (excluding pictures labeled as pits_in_HAZ, done without...
-
Evolution of Ag nanostructures created from thin films: UV–vis absorption and its theoretical predictions
PublikacjaAg-based plasmonic nanostructures were manufactured by thermal annealing of thin metallic films. Structure and morphology were studied using scanning electron microscopy (SEM), transmission electron microscopy (TEM), high-resolution transmission electron microscopy (HR-TEM) and X-ray photoelectron spectroscopy (XPS). SEM images show that the formation of nanostructures is influenced by the initial layer thickness as well as the...