Filtry
wszystkich: 690
-
Katalog
- Publikacje 344 wyników po odfiltrowaniu
- Czasopisma 9 wyników po odfiltrowaniu
- Wydawnictwa 2 wyników po odfiltrowaniu
- Osoby 6 wyników po odfiltrowaniu
- Wynalazki 1 wyników po odfiltrowaniu
- Projekty 30 wyników po odfiltrowaniu
- Laboratoria 1 wyników po odfiltrowaniu
- Kursy Online 27 wyników po odfiltrowaniu
- Wydarzenia 1 wyników po odfiltrowaniu
- Dane Badawcze 269 wyników po odfiltrowaniu
Wyniki wyszukiwania dla: sql
-
The AFM micrographs of vanadium oxides thin films obtained at 800°C
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on a silicon substrate and vanadium thin films were obtained by annealing as-prepared films at...
-
The AFM micrographs of vanadium oxides thin films obtained at 1200°C
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
-
The AFM micrographs of vanadium oxides thin films obtained at 400°C
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
-
The AFM micrographs of vanadium oxides thin films obtained at 600°C
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
-
The AFM micrographs of of vanadium oxides thin films obtained at 300°C
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
-
The AFM micrographs of vanadium oxide thin films obtained at 100°C
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
-
The AFM micrographs of vanadium oxides thin films obtained at 150°C
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
-
The AFM micrographs of vanadium oxides thin films obtained at 200°C
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
-
The AFM micrographs of vanadium oxides thin films obtained at 450°C
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
-
Integrity level verification for safety-related functions
PublikacjaThis article describes methods for safety integrity level (SIL) verification of safety-related functions with regard to probabilistic criteria given international standards IEC 61508 and IEC 61511. These functions are to be realized using the electrical, electronic and programmable electronic (E/E/PE) systems or safety instrumented systems (SIS). Some methods are proposed for quantitative probabilistic modelling taking into account...
-
The Righi-Leduc effect: on evidence of two-band electronic structure in Nd1.86Ce0.14CuO4-y.
PublikacjaPrzedstawiono badania temperaturowe zależności oporu elektrycznego, efektu Halla (RH), przewodnictwa cieplnego (k) i współczynnika Righi-Leduc(SRL). Badania wykazały, że współczynnik RL> 0 w szerokim zakresie temperatur RH zmienia znak dwukrotnie w T=50 i 250K. Niezgodność znaków SRL i RH jednoznacznie wskazuje obecność w materiale nośników obu znaków tzn. n- i p- typu. W pracy pokazano, że transport ciepła zdominowany jest przez...
-
Structure evolution of V2O5 thin films deposited on quartz glass substrate - High-Temperature X-ray Diffraction
Dane BadawczeThe DataSet contains the XRD patterns of V2O5 thin films deposited on guartz glass. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on the quartz glass substrate. The structure was measured in-situ during heating between 50-800°C under synthetic...
-
Structure evolution of V2O5 thin films deposited on silicon substrate - High-Temperature X-ray Diffraction
Dane BadawczeThe DataSet contains the XRD patterns of V2O5 thin films deposited on silicon substrates (111). The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on the silicon substrate. The structure was measured in-situ during heating between 50-800°C under...
-
Cache service for maps presentation in distributed information data exchange system
PublikacjaThe paper presents the proposition of caches implementation for map presentation in distributed information data exchange system. The concept of cache service is described in the context of distributed information data exchange system elements which control and present on maps positions and other identification data of vessels and other suspicious objects on the territorial sea, sea-coast and the internal sea-waters. The proposed...
-
Wykorzystanie systemu komputerowego ALEP-PL w planowaniu rozwoju lokalnych systemów energetycznych
PublikacjaZaprezentowano autorski system komputerowy ALEP-PL, który wspomaga proces planowania rozwoju lokalnych systemów energetycznych. Narzędzie zostało przygotowane z uwzględnieniem metodyki planowania zaawansowanego. System składa się z serwisu internetowego, bazy danych i modułów logiki biznesowej. Serwis internetowy został stworzony w technologii ASP.NET z użyciem środowiska Visual Studio 2010 i serwera baz danych MS SQL Server 2008...
-
Determining required safety integrity level
PublikacjaOne of the most important stage of technical system functional safety analysis is defining the safety-related functions as well as determining safety integrity level (SIL) for each defined function. A properly carried out hazard identyfication process is the necessary condition for correct definition of the safety-related functions. Determining the safety integrity level (SIL) is based on risk assessment taking into account risk...
-
Assessment of safety - related systems in industrial hazardous plants
PublikacjaPrzedstawiono problemy związane z określaniem bezpieczeństwa funkcjonalnego systemów przemysłowych, w oparciu o standard IEC 61508. Wykorzystując informacje zawarte w cytowanym standardzie opisujemy metody określenia wymaganych poziomów zabezpieczeń dla instalacji przemysłowej. Wyjaśniamy znaczenie poziomów SIL. Poddano dyskusji procedurę poprawnego określania poziomów bezpieczeństwa systemów składających się z elementów o...
-
Czy projekt akustyczny wnętrza jest opracowaniem nieformalnym?
PublikacjaPrzedstawiono zakres, w jakim prawo budowlane uwzględnia zagadnienia akustycznego projektowania sal. Wskazano na luki w przepisach, pozwalające na projektowanie architektoniczne obiektów o akustyce kwalifikowanej bez udziału specjalisty akustyka.
-
Novel monovalent and multivalent recombinant proteins of Borrelia burgdorferi sensu lato with potential diagnostic value – construction and biotechnological production
PublikacjaThe diverse antigenic structure of Borrelia burgdorferi sensu lato (s.l.) and the low degree of protein sequence conservation between genospecies causes many limitations in serodiagnosis of Lyme disease (LD). Using expression systems based on Escherichia coli, five monovalent B. burgdorferi s.l. recombinant proteins were produced. i.e., BB0108, BB0126, BB0298, BB0323, BB0689 (each in three variants derived from Borrelia afzelii,...
-
Expedited design of microstrip antenna subarrays using surrogate-based optimization
PublikacjaComputationally efficient simulation-driven design of microstrip antenna subarrays is presented. The proposed design approach aims at simultaneous adjustment of all relevant geometry parameters of the subarray, which allows us to take into account the effect of the feeding network on the subarray radiation pattern (in particular, the side lobe level, SLL). In order to handle a large number of variables involved in the design process,...
-
Problems in designing and operating the functional safety solutions of higher integriity levels
PublikacjaThe aim of this article is to identify and discuss some problems that have been encountered in designing and operating the functional safety solutions of higher safety integrity levels (SIL 3 and SIL 4) in the light of analyses outlined in a new version of the international standard IEC 61508:2010. Examples of such solutions are the electric / electronic / programmable electronic systems (E/E/PESs) and the safety instrumented systems...
-
Concept of Multifactor Method and Non-Functional Requirements Solution to Increase Resilience through Functional Safety with Cybersecurity Analysis
PublikacjaIn the process of designing safety systems, an integrated approach in safety and cybersecurity analysis is necessary. The paper describes a new technique of increasing resilience through integrated analysis of functional safety and cybersecurity. It is a modeling methodology based on the combination of the multifactor method utilizing modified risk graphs, used previously for Safety Integrity Level (SIL) assessment, and the Non-Functional...
-
XRD patterns of V2O5 thin films deposited on isotropic etching silicon substrates (111)
Dane BadawczeThe DataSet contains the XRD patterns of V2O5 thin films deposited on isotropic etching silicon substrates (111). The silicon wafers were etched in a mixture of nitric acid, hydrofluoric acid, and acetic acid in the ratio of 40:1:15. The soaking time for the substrates was from 30 to 90 seconds. The thin films were obtained by the sol-gel method. ...
-
Luminescence properties of TeOx thin films annealing under an oxidizing atmosphere
Dane BadawczeThe DataSet contains the emission and excitation spectra of TeOx thin films. The material was obtained by the sol-gel method. The starting solution was prepared by mixing telluric acid (precursor) with thetraetylene glycol, water, and ethanol. The sol was obtained by vigorously stirring precursor solution at 50°C for 2h, then the temperature was raised...
-
Luminescence properties of TeOx-Eu thin films
Dane BadawczeThe DataSet contains the emission and excitation spectra of TeOx-Eu thin films. The material was obtained by the sol-gel method. The starting solution was prepared by mixing telluric acid (precursor) with thetraetylene glycol, water, and ethanol. Next, the 5% mol of europium ions were added, the nitrates were used as a source of rare-earth ions. The...
-
Luminescence properties of TeOx-Tb thin films
Dane BadawczeThe DataSet contains the emission and excitation spectra of TeOx-Tb thin films. The material was obtained by the sol-gel method. The starting solution was prepared by mixing telluric acid (precursor) with thetraetylene glycol, water, and ethanol. Next, the 5% mol of terbium ions were added, the nitrates were used as a source of rare-earth ions. The...
-
Luminescence properties of TeOx-Dy thin films
Dane BadawczeThe DataSet contains the emission and excitation spectra of TeOx-Dy thin films. The material was obtained by the sol-gel method. The starting solution was prepared by mixing telluric acid (precursor) with thetraetylene glycol, water, and ethanol. Next, the 5% mol of dysprosium ions were added, the nitrates were used as a source of rare-earth ions....
-
SEM micrographs of V2O5 thin films deposited on isotropic etching silicon substrates (111)
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of V2O5 thin films deposited on isotropic etching silicon substrates (111). The silicon wafers were etched in a mixture of nitric acid, hydrofluoric acid, and acetic acid in the ratio of 40:1:15. The soaking time for the substrates was from 30 to 90 seconds. The thin films were...
-
Silicon Oxycarbide (SiOC) Ceramic Materials as Anodes for Lithium Ion Batteries
PublikacjaPolymer derived ceramics (PDCs) have attracted attention as alternative anode material for Li-ion batteries. It has been found that ternary SiOC and SiCN ceramics obtained through pyrolysis of various preceramic polymers display high reversible capacities of 500 – 650 mAh/g. In this work we try to correlate the electrochemical performance of polymer derived silicon oxycarbide with its chemical composition and microstructural features....
-
Luminescence properties of TeOx gels
Dane BadawczeThe DataSet contains the emission and excitation spectra of TeOx gels. The material was obtained by the sol-gel method. The starting solution was prepared by mixing telluric acid (precursor) with thetraetylene glycol, water, and ethanol. The sol was obtained by vigorously stirring precursor solution at 50°C for 2h, then the temperature was raised...
-
The AFM micrographs of V2O5 single crystals
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of V2O5 single crystals. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The As-prepared films were deposited on a quartz glass substrate and were annealing at 600°C under synthetic air.
-
Buckling and shape control of prestressable trusses using optimum number of actuators
PublikacjaThis paper describes a method to control the nodal displacement of prestressable truss structures within the desired domains. At the same time, the stress in all members is unleashed to take any value between the allowable tensile stress and critical buckling stress. The shape and stresses are controlled by actuating the most active members. The technique considers the members’ initial crookedness, residual stresses, and slenderness...
-
SEM analysis of the TiO2 layers deposited on a FTO substrates
Dane BadawczeTitanium dioxide layers were deposited on a FTO conducting glass by sol-gel method. For sol gel synthesis butoxy titanium and ethanol were used as a reagents. Samples were sintered in a furnace at temperature of 600 deg. SEM measurements were performed by FEI Quanta FEG250 microscope. SEM images of a cross-section of samples exhibit a porous structures...
-
Luminescence properties of TeOx-Dy thin films annealing under an oxidizing atmosphere
Dane BadawczeThe DataSet contains the emission and excitation spectra of TeOx-Dy thin films. The material was obtained by the sol-gel method. The starting solution was prepared by mixing telluric acid (precursor) with thetraetylene glycol, water, and ethanol. Next, the 5% mol of dysprosium ions were added, the nitrates were used as a source of rare-earth ions....
-
Luminescence properties of TeOx-Tb thin films annealing under an oxidizing atmosphere
Dane BadawczeThe DataSet contains the emission and excitation spectra of TeOx-Tb thin films. The material was obtained by the sol-gel method. The starting solution was prepared by mixing telluric acid (precursor) with thetraetylene glycol, water, and ethanol. Next, the 5% mol of terbium ions were added, the nitrates were used as a source of rare-earth ions. The...
-
Luminescence properties of TeOx-Eu thin films annealing under an oxidizing atmosphere
Dane BadawczeThe DataSet contains the emission and excitation spectra of TeOx-Eu thin films. The material was obtained by the sol-gel method. The starting solution was prepared by mixing telluric acid (precursor) with thetraetylene glycol, water, and ethanol. Next, the 5% mol of europium ions were added, the nitrates were used as a source of rare-earth ions. The...
-
Analiza strukturalna systemu zabezpieczeniowego z uwzględnieniem kryteriów bezpieczeństwa funkcjonalnego.
PublikacjaPrzedstawiono wybrane zagadnienia związane z oceną bezpieczeństwa funkcjonalnego w nawiązaniu do normy międzynarodowej IEC 61508. Zarysowano dobór właściwej struktury systemu zabezpieczeniowego , projektowanego w oparciu o sterowniki PLC dla odpowiedniego poziomu nienaruszalności bwezpieczeństwa SIL, wynikającego z przeprowadzonej wstępnie oceny ryzyka.
-
XPS study of the NH4-VOx powders
Dane BadawczeVanadium pentoxide samples were prepared by sol-gel method. The starting solution was prepared by mixing vanadium (V) oxytripropoxide (Aldrich) in an anhydrous ethanol as solvent and acetylacetone. By drying the sol at 323 K for 48 h, it transforms via gel into a xerogel powder. Next, the precursor powder was pressed into the disk-shaped pellets. Samples...
-
The AFM micrographs of vanadium oxides thin films deposited on quartz glass - the influence of the thickness of the thin film on its morphology
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (1, 2 or 3 AsP layers) were deposited on a quartz glass substrate and were...
-
The AFM micrographs of vanadium oxides thin films deposited on silicon - the influence of the thickness of the film on morphology
Dane BadawczeThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (1, 2 or 3 AsP layers) were deposited on a silicon substrate and were annealing...
-
XRD patterns of vanadium oxide nanostructures on silicon substrate obtained by V2O5 recrystallization
Dane BadawczeThe DataSet contains the XRD patterns of vanadium oxide nanostructures on silicon substrates obtained by recrystallization of V2O5 thin films between 800-1200°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
-
XRD patterns of VO2 and V2O3 thin films obtained at 500°C
Dane BadawczeThe DataSet contains the XRD patterns of VO2 and V2O3 thin films obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (3-9 AsP layers) were deposited on a silicon substrate and were annealing at 500°C under an argon atmosphere.
-
XRD patterns of vanadium oxide nanostructures on quartz glass substrate obtained by V2O5 recrystallization
Dane BadawczeThe DataSet contains the XRD patterns of vanadium oxide nanostructures on quartz glass substrates obtained by recrystallization of V2O5 thin films between 800-1200°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
-
Chemical composition of V2O5 nanorods
Dane BadawczeThe DataSet contains the chemical compositions of the V2O5 nanorods on a silicon substrate. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The As-prepared thin films were annealed at 600C under a synthetic air atmosphere.
-
XRD patterns of VO2 and V2O3 thin films obtained at 700°C
Dane BadawczeThe DataSet contains the XRD patterns of VO2 and V2O3 thin films obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (5-9 AsP layers) were deposited on a silicon substrate and were annealing at 700°C under an argon atmosphere.
-
Analiza ryzyka i zarządzanie bezpieczeństwem funkcjonalnym w instalacjach technicznych
PublikacjaW rozdziale przedstawiono wybrane zagadnienia dotyczące analizy ryzyka i zarządzania bezpieczeństwem funkcjonalnym w cyklu życia w instalacjach technicznych podwyższonego ryzyka w nawiązaniu do odpowiednich norm międzynarodowych i aktualnej literatury przedmiotu. Podkreślono znaczenie definiowania matrycy lub grafu ryzyka w danym systemie technicznym, które odgrywa istotną rolę w określeniu wymaganego poziomu nienaruszalności bezpieczeństwa...
-
The operation mode of E/E/PE system and its influence on determining and verifying the safety integrity level = Rodzaj pracy systemu E/E/PE i jego wpływ na określanie i weryfikację poziomu nienaruszalności bezpieczeństwa
PublikacjaNorma PN-EN 61508 wprowadza kryteria probabilistyczne dla wyróżnionych rodzajów pracy systemów E/E/PE, które związane są z poziomami nienaruszalności bezpieczeństwa SIL. Dla systemów sterowania i zabezpieczeń, pracujących w trybie rzadkiego przywołania do działania, kryterium tym jest przeciętne prawdopodobieństwo niewypełnienia funkcji bezpieczeństwa na żądanie PFDavg. W przypadku systemów realizujących funkcje bezpieczeństwa...
-
Luminescence properties of TeOx-2%Eu1.5%Tb1.5%Dy thin films annealing under an oxidizing atmosphere
Dane BadawczeThe DataSet contains the emission and excitation spectra of TeOx-2%Eu1.5%Tb1.5%Dy thin films. The material was obtained by the sol-gel method. The starting solution was prepared by mixing telluric acid (precursor) with thetraetylene glycol, water, and ethanol. Next, the 5% mol of rare-earth ions were added, the nitrates were used as a source of rare-earth...
-
Luminescence properties of TeOx-2%Eu1.5%Tb1.5%Tm thin films annealing under an oxidizing atmosphere
Dane BadawczeThe DataSet contains the emission and excitation spectra of TeOx-2%Eu1.5%Tb1.5%Tm thin films. The material was obtained by the sol-gel method. The starting solution was prepared by mixing telluric acid (precursor) with thetraetylene glycol, water, and ethanol. Next, the 5% mol of rare-earth ions were added, the nitrates were used as a source of rare-earth...
-
Luminescence properties of TeOx-1%Eu1.5%Tb2.5%Dy thin films annealing under an oxidizing atmosphere
Dane BadawczeThe DataSet contains the emission and excitation spectra of TeOx-1%Eu1.5%Tb2.5%Dy thin films. The material was obtained by the sol-gel method. The starting solution was prepared by mixing telluric acid (precursor) with thetraetylene glycol, water, and ethanol. Next, the 5% mol of rare-earth ions were added, the nitrates were used as a source of rare-earth...