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  • TEM imaging of metal nanoparticle cross section

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    TEM microscope was used for a imaging of metallic nanostructures. Metallic nanostructures were manufactured by thermal annealing of thin films. Gold and silver nanostructures were chosen for measurements. Samples were annealed for 15 and 60 minutes at 550 deg.

  • Electrical measurements of the dewetting of metal thin films

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    In situ observations of dewetting of thin films is very complicated. One of the method, that helps to observe it, could be electrical measurements. For experiments, thin gold, silver and gold-silver nanoalloy films were deposited by magnetron sputtering method. Films were deposited on a Corning glass substrates. Samples were measured by four point method...

  • Polymers doped by Ca or P. Chemical composition investigations

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    The calcium and phosphorus doped polyurethane polymers (PU) were analyzed by XPS method. A series of samples with various content of Ca and P dopand - from 0% up to 21%) were selected for measutements. The chemical composition and valence state of elements were measurements using OmicronNatechnology UHV system wih  Argus hemispherical photoelectron...

  • XPS study of the NH4-VOx powders

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    Vanadium pentoxide samples were prepared by sol-gel method. The starting solution was prepared by mixing vanadium (V) oxytripropoxide (Aldrich) in an anhydrous ethanol as solvent and acetylacetone. By drying the sol at 323 K for 48 h, it transforms via gel into a xerogel powder. Next, the precursor powder was pressed into the disk-shaped pellets. Samples...

  • Optical measurements of LTO:Cu sol-gel derived thin films

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    Lithium titanate doped by copper thin films were manufactured by chemical, sol-gel method. Flms were deposited on a Corning glass substrated by spin coater. To calculated optical band gap and other optcal parameters, UV-VIS spectroscopy measurements were performed. For measurements selected samples with various content of Cu.

  • Depth chemical profile in a CeIr3 sample

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    The polycrystalline sample of CeIr3 used in the present studies was synthesized by arc-melting cerium (4N) and iridium (3N5) in an arc furnace on a water-cooled copper hearth using a tungsten electrode under a high purity argon atmosphere. A piece of zirconium was used as an oxygen getter. First, a button of Ir was prepared by arc-melting the iridium...

  • Analysis of the electrical parameters of the LTO thin films

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    Lithium titanate thin films were derived by sol-gel technique. Films with thickness ca. 800 nm were annealed for various time, in a range of 10h-80h at 550 deg. Electrical conductivity in a wide range of temperature was measured.

  • Ultra-thin film of aluminum oxide influence on the plasmon resonance in gold nanostructures

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    Ultra-thin film of aluminum oxide influence on the plasmon resonance in gold nanostructures was measured by UV-VIS spectroscopy. Ultra thin film of Al2O3 was deposited on a gold nanostructures. Thickness of film was 2nm - 8nm. Shift of plasmon resonance was observed, as a result of various dielectric constant of layer.

  • Optical transmission of the Niobium thin films

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    Niobium thin films with a thickness of 200nm were deposited n a Corning glass substrate by magnetron sputtering method. The optical transmission spectra in a visible light range were.recorded. Investigations showed a good optical transmission thru the layers for each samples, annealed at various temperatures. For measurements samples annealed at 500,...

  • Chemical composition of La-Sr-Ce-Ni-Ti ceramics material measured by XPS method

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    La-Sr-Ce-Ni-Ti (LSCNT) based ceramics sample was manufactured by standard solid state reaction.Prepared powder was pressed into pilled and sintered in a furnace in air atmosphere for 10h. Annealing temperature was 1200 Celsius degree. To calculate chemical composition and determine valence states of the elements, X-Ray photoemission spectroscopy (XPS)...

  • Luminescence of TeO2:Eu thin films

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    Tellurium dioxide doped by europium thin films were deposited by magnetron sputtering method and simultaneously heated at 200 oC. Presence of Eu ions and their valence states was confirmed by X-ray photoemission spectroscopy measurements. The structure of the films as well as the influence of europium dopant on crystalline structure of the films was...

  • Chemical composition analysis of the LSNO ceramics

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    The chemical composition of a series of La-Sb-Nb-O ceramics manufactured by the solid-phase reaction method was analyzed. The samples with a various antimony content were measured by XPS method (OmicronNanotechnology UHV system). Analysis confirmed presence of elements: La, Sb, Nb.

  • X-Ray diffraction of the metallic nanostructures

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    Metallic nanostructures (gold and silver) were manufactured as a thermal annealing of gold or silver thin film. Gold films with thickness of 2.8 nm were deposited on a silicon substrates using a table-top dc magnetron sputtering coater (EM SCD 500, Leica), equipped with quartz microbalance for in-situ thickness measurements. Films were deposited from...

  • Structural investigations of the Al2O3 ultra thin films

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    Ultra-thin layers of Al2O3 were deposited by atomic layer deposition (ALD) (Beneq TFS 200 ALD system). This method provides precise thickness control down to a single atomic layer. The precursors used were trimethylaluminum (Sigma-Aldrich) and purified water. The deposition of the atomic layer was carried out at 200 °C. Samples with a thickness of 2...

  • XRD analysis of the tellurium dioxide thin films

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    Tellurium dioxide thin films were deposited by magnetron sputtering method. The XRD analysis of the films annealed at 200, 500, 650 and 700 celsius degree showed appearing of crystalline phase in a higher temeratures.

  • Influence of the annealing condictions on the chemical structure of LaBaGdCo ceramics

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    Ceramic samples based on Barium, Lanthanum, Gadolinium and Cobaltium were produced by solid state reaction.  After sintring in a furnance, samples were annealed at 300 Celsius degree in wet and dry atmosphere. Annealing takes 72h or 2h. Results of annealing were observed by X-Ray photoemission spectroscopy (XPS), OmicronNanotechnology.  XPS analysis...

  • Impedance spectroscopy of the lithium titanate doped by copper thin films

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    Lithium titanate doped by copper thin films were derived by sol-gel method. Prepared gel was deposited by spin-coating technique. Samples with various content of Cu were measured by impedance spectroscopy method in a wide range of temperature, from -120 up to 150 deg.

  • Study of the chemical state of Gd in a Ba-La-Gd-Co based ceramic

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    Barium, Lanthanum, Gadolinium and Cobaltium precursors were used for production of ceramic materials. Samples were produced by standard solid state reaction.  Samples were annealed at 300 Celsius degree in wet and dry atmosphere. Annealing takes 72h or 2h. Results of annealing on a Gadolinum were observed by X-Ray photoemission spectroscopy (XPS), OmicronNanotechnology....

  • X-Ray photoemission spectroscopy measurements of the Nb-V-Sr-O ceramics

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    Niobium doped strontium vanadate based perovskite SrV1-xNbxO3-δ materials were prepared via conventional solid state reaction (SSR) method. For comparison, different samples with a various amount of niobium dopant in the structure were synthesized; x = 0; 0,2; 0,5; 0,8 and 1. Samples were sintered by two-steps: first under a pure hydrogen (purity >99.999%)...

  • Chemical properties of bismuth telluride – carbon composites.

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    Carbon nanotubes and amorphous carbon have been introduced into bismuth telluride matrix (in 0.15 and 0.30 wt % ratio) in order to investigate influence of carbon on composite’s thermoelectric properties. Composites with well-dispersed additives have been obtained by sonication and ball-milling. Chemical composition of materials was confirmed by XPS...

  • Lanthanum investigations in ceramics annealed in a dry and wet atmosphere

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    Ceramics based on Barium, Lanthanum, Gadolinium and Cobaltium were produced by standard solid state reaction from oxides and carbonate powders. After sintring, samples were annealed for 2 hours or 72 hours at 300 Celsius degree in a both: wet and dry atmosphere. Results of annealing on a chemical composition and valence state of lanthanum were observed...

  • Formation of gold nanostructures detected by XPS method

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    Gold nanostructers were manufactured by thermal dewetting of thin film. Film with thickness of 2.8 nm was deposited by magnetron sputtering method. As a result of annealing at 550 deg, nanostructures appear. Bulk gold, as-deposited gold film and metallic nanostructures were measured by XPS method. 

  • Morphology of the sol-gel derived LTO:Cu films

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    Morphology of the lithium titanate doped by Cu thin films were investigated by SEM microscope. Films were deposited by spin-coater from sol-gel derived sol. SEM images showed a high porous structure, tipaciall for sol-gel based films. For measurements samples with a various content of Cu were selected.

  • Depth XPS profile of Fe-S layers on a titanium substrate

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    Depth XPS profile of Fe-S layers on a titanium substrate was measured. Material was etched by Argon ion gun and measured by XPS method. For each sample, three times per 10 minutes each was sputtered.

  • Tellurite based glass doped by Eu3+ ions - XPS measurements

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    Eu3+ doped tellurite glass ceramics containing SrF2 nanocrystals were prepared using melt quenching technique and subsequent heat treatment of glass in 370 °C for different time periods. Thermal properties of glass matrix have been determined based on DSC measurements. XRD and XPS results confirmed formation of SrF2 nanocrystals in glass matrices after...

  • XPS analysis of TBBO glass

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    Glasses and glass-ceramics with nominal composition 73 TeO2– 4BaO– 3Bi2O3–18SrF2-2RE2O3 (where RE = Eu, Dy) have been synthesized by conventional melt-quenching technique and subsequent heat treatment at 370 °C for 24 h in air atmosphere. Various Eu3+ to Dy3+ molar ratio have been applied to investigate luminescence properties in both glass and glass-ceramic...

  • Dewetting of silver films detected by XPS method

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    Dewetting of silver thin films was detected by XPS method. Thin metallic films were deposited by magnetron sputtering method. Formation of nanostructures , as a result of thermal annealing, was confirmed by SEM microscope. For comparision three samples were measured. Bulg gold, as-deposited silver film with thickness of 3 nm and nanostructures.

  • Hydrogenation process ofTiO2/BiVO4/PEDOT:PSS observed by XPS method

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    Titania nanotubes synthesis was based on a two-stage anodization process at water/ethylene glycol (5%/95%) electrolyte containing 0.27 M NH4F and 1 M H3PO4 described previously. Anodization process was performed in two-electrode cell compartment using platinum mesh as a cathode. The distance between electrodes was about 2 cm. The anodization voltage...

  • XPS study of the YST ceramics

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    Yttrium-doped strontium titanate  was prepared via conventional solid-state reaction method from Y2O3 (Sigma Aldrich, 99,9%), TiO2 (Sigma Aldrich, 99%) and SrCO3 (Sigma Aldrich,98%). For comparision, two other techniques were used for synthesis: Pechini and wet methods. Both kind of samples were measured, after and before reduction process (in a hydrogen)....

  • Analysis of the properties of the YSTF ceramics materials before and after reduction

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    The valence of titanium in reduced YSTF ceramics materials was investigated. Ceramics were reduced by annealing in a hydrogen atmosphere. For comparison unreduced sample was also measured. Valance state was measured by XPS method.

  • Detection of the Ag nanoparticles in Te-Bi-Ba-Oa glass

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    The influence of the manufacturing parameters of tellurium-bismuth-barium glasses on the presence of silver nanoparticles was investigated. Glasses were annealed at 330, 335, 340, 345 and 350 degrees Celsius for 24 and 48 hours. Presence of the Ag nanoparticles was measured by XPS method. The growth of nanoparticles was observed along with the extension...

  • XRD investigations of the lithium titanate thin films

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    Nanocrystalline thin films with 800 nm thickness were prepared by sol–gel method. To examine the influence of the annealing temperature on as-prepared films crystallization, the coatings were heated at temperature from 500 °C up to 600 °C  for 20h. Structure of manufactured thin films was investigated using X-ray diffraction (XRD). The most visible...

  • Investigations of the valence state of Co in a MnCoO ceramics

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    McCoO ceramics materials were produced by solid state reaction and sintred in a furnance in air atmosphere for 20h. Annealing temperature was 600 Celsius degree. For investigations a series of samples, with a various composition was chosen: MnCoO, Mn, Co2O and Mn2CoO. Chemical behaviour of the Cobaltium was measured by XPS method.  The analyses were...

  • XPS measurement of the Fe-Ti based materials

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    The mono‐ and bimetal‐modified (Pd, Cu) titanium(IV) oxide and iron oxide (III) photocatalysts were prepared by chemical reduction method and characterized using XPS method. The composition of elements incorporated in the surface layer of mono- and bimetallic photocatalysts was determined by XPS analysis, as well as the valence state of elements. Measurements...

  • SPTNO ceramics measured by XPS method

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    SPTNO (Sr-Pr-Ti-Ni-O) ceramic were manufactured by solid state reaction, from oxides compounds. Synthesis conducted in air atmosphere at temperature in a range of 800-900 deg. Chemical composition of prepared materials were measured by XPS (X-Ray photoemision spectroscopy) method. UHV OmicronNanotechnology system with 128 channel Argus hemispherical...

  • SEM images of dewetted gold films

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    Gold nanostructures were prepared on silicon - Si(111) as a substrate. as a result of dewetting process. Thin golds films were deposited using a table-top dc magnetron sputtering coater under pure Ar plasma conditions . The Au target had 99.99% purity, the rate of Au layer deposition was about 0.4 nm·s−1 and the incident power was 32 W. The thickness...

  • XPS study of the lithium titanate doped by copper

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    Lithium titanate doped by copper was measured by X-ray photoemission spectroscopy. For sol-gel synthesis lithium acetate dehydrate from Alfa Aesar GmbH &Co and titanium (IV) butoxide 97% from Aldrich were used as reagents. Copper (II) nitrate from Alfa Aesar was used as a source of Cu dopant. It was added in the proper weight to get an x index equal...

  • Substrate characterization in a electrochemically derived Manganium-Cobaltium thin films

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    Manganium-Cobaltium thin films were electrochemically deposited on a Ni foams subsrates in a one-step process at −1.1 V vs. Ag/AgCl in an aqueous solution of differently concentrated Mn(NO3)2·4H2O and Co(NO3)2·6H2O with the deposition time limited by charges of 60, 120, and 200 mC at 25 °C. The concentration ratios of Mn(NO3)2·4H2O to Co(NO3)2·6H2O...

  • Formation of gold anostructures detected by SEM microscope

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    Gold nanostructures were prepared on silicon - Si(111) as a substrate. The substrates (1 × 1 cm2  of area) were cleaned with acetylacetone and then rinsed in ethanol. Thin Au films (with thicknesses in a range of 1.7–5.0 nm) were deposited using a table-top dc magnetron sputtering coater (EM SCD 500, Leica) under pure Ar plasma conditions (Argon, Air...

  • Investigation of the uniformity of TeO2:Eu layer

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    TeO2 doped by Eu thin films manufactured by magnetron sputtering method were measured by XPS method.  Te-Eu mosaic target with diameter of 50.8 mm was sputtered for about 45 min in argon-oxygen atmosphere what resulted in 300 nm film thickness deposition. The pressure in the deposition chamber was below 0.2 Pa and substrate was heated  at 200 oC during...

  • SEM images of tge gold nanostructures on silicon

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    Au nanostructures were prepared on Si(111) as a substrate. The substrates (1 × 1 cm2  of area) were cleaned with acetylacetone and then rinsed in ethanol. Thin Au films (with thicknesses in a range of 1.7–5.0 nm) were deposited using a table-top dc magnetron sputtering coater (EM SCD 500, Leica) under pure Ar plasma conditions (Argon, Air Products 99.999%)....

  • Chemical investigation of the Al2O3 ultra-thin films

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    Ultra-thin layers of oluminum oxide (Al2O3) were deposited by ALD method.  Atomic layer deposition provides precise thickness control down to a single atomic layer. The precursors used were trimethylaluminum (Sigma-Aldrich) and purified water. The deposition of the atomic layer was carried out at 200 °C. Samples with a thickness of 2 and 8 nm of alumina...

  • XPS analysis of the GO based materials

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    Graphene oxides samples were measured by XPS method. The X-ray photoemission spectroscopy measurements were carried out with Omicron NanoTechnology UHV equipment. The hemispherical spectrophotometer was equipped with a 128-channel collector. The XPS measurements were performed at room temperature at a pressure below 1.1 × 10−8 mBar. The photoelectrons...

  • Oxidation of silver nanostructures

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    Silver nanostructures were prepared on  Si substrate. Thin Ag films (2 and 6 nm thickness) were deposited using a tabletop dc magnetron sputtering coater (EM SCD 500, Leica) in pure Ar plasma. The Ag target was of 99.99% purity, the rate of layer deposition was about 0.4 nm·s−1 , and the incident power was in the range of 30–40 W. The layer thickness...

  • Graphene oxide thin films deposited on a PCB board - chemical analysis

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    Graphene oxides based films were measured by  X-ray photoemission spectroscopy (XPS) method. TheXPS measurements were carried out with the Omicron NanoTechnology UHV equipment. The hemispherical spectrophotometer was equipped with a 128-channel collector. The XPS measurements were performed at room temperature at a pressure below 1.1 × 10−8 mBar. The...

  • Mn-Co nanofilms on nickel foam measured by XPS mehod

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    Manganium-Cobaltium based thin films were electrochemically deposited on a Ni based subsrates in a one-step process at −1.1 V vs. Ag/AgCl in an aqueous solution of differently concentrated Mn(NO3)2·4H2O and Co(NO3)2·6H2O with the deposition time limited by charges of 60, 120, and 200 mC at 25 °C. The concentration ratios of Mn(NO3)2·4H2O to Co(NO3)2·6H2O...

  • Surface modifcation of PMMA polymer detected by XPS

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    In order to obtain the experimental specimens, four PMMA/PC61BM samples with the following  mass proportions were prepared: 10%, 20%, 30%, and 40%. In addition, as a reference, a PMMA sample without  PC61BM was prepared as well. For the fabrication process, PC61BM 99.5% (Solenne BV), chloroform HPLC  (Sigma Aldrich), and PMMA (commercially available...

  • Chemical analysis of the Au-Ag nanoaloys

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    The nanostructures of AuAg nanoalloys were prepared by sequential sputtering of gold and silver thin films.  Single layer thickness was usually 2.8 nm were deosted by magnetron sputtering method in a Ar plasma. As deposited layers were annealed in Ar atmosphere at 550 degress for 15 minutes. For XPS measurements five samples were selected: pure gold...

  • Depth profile of the composition of 8 nm Al2O3 thin film

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    8 nm layer of aluminum oxide (Al2O3) was deposited by ALD method on a s.  Atomic layer deposition provides precise thickness control down to a single atomic layer. The precursors used were trimethylaluminum (Sigma-Aldrich) and purified water. The deposition of the atomic layer was carried out at 200 °C. To investigate the profile of concenration of...

  • Measurements of the chemical composition of LTO:Cu powders

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    Lithium titanate doped by copper was measured by X-ray photoemission spectroscopy (XPS). For sol-gel synthesis lithium acetate dehydrate and titanium (IV) butoxide 97% and copper (II) nitrate from Alfa Aesar were used as a reagents. Cu precursor was added in the proper weight to get an x index equal 0, 0.1 and 0.2. In the first step lithium acetate...