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The study of harmonic imaging by AFM = Badania harmonicznych w obrazowaniu AFM
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Simulation and measurements for the substance identification by AFM
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Morphology of polyurethanes revisited by complementary AFM and TEM
PublicationPrzedmiotem badań mikroskopowych TEM i AFM były lane segmentowe poliuretany o zawartości 30 i 50% segmentu sztywnego. Stwierdzono obecność sferolitów (poziom mikrometrów), fibryl i globul. Ponadto zastosowanie AFM pozwoliło na zbadanie nanomorfologii badanych poliuretanów. Zaobserwowano krótkie, cylindropodobne domeny segmentów sztywnych rozproszone w matrycy segmentów giętkich.
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AFM-assisted investigation of conformal coatings in electronics
PublicationPurpose – This paper aims to presents a new method of investigation of local properties of conformal coatings utilized in microelectronics. Design/methodology/approach – It is based on atomic force microscopy (AFM) technique supplemented with the ability of local electrical measurements, which apart from topography acquisition allows recording of local impedance spectra, impedance imaging and dc current mapping. Potentialities...
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Evaluation of organic coatings condition with AFM-based method
PublicationThe paper presents an atomic force microscopy (AFM)-based approach to evaluation of local protective properties of organic coatings. Apart from topography, it provides local ac and dc characteristics of examined coating. The method consists in application of ac voltage perturbation signal between conductive AFM tip and coated metal substrate. The resulting current is used to determine local impedance characteristics. Both impedance...
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Improving AFM images with harmonic interference by spectral analysis
PublicationPrzedstawiono sposób usunięcia zakłóceń pojawiających się na obrazach uzyskiwanych z mikroskopu sił atomowych (AFM). Przybliżono kilka metod stosowanych do redukcji zakłóceń w obrazach. Następnie opisano zidentyfikowane zakłócenia harmoniczne oraz zaproponowany sposób ich znaczącej redukcji. W pracy zamieszczono szereg obrazów uzyskanych z mikroskopu AFM ilustrujących efekty powodowane zakłóceniami oraz skuteczność zaproponowanej...
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Corrosion process monitoring by AFM higher harmonic imaging
PublicationThe atomic force microscope (AFM) was invented in 1986 as an alternative to the scanning tunnelling microscope, which cannot be used in studies of non-conductive materials. Today the AFM is a powerful, versatile and fundamental tool for visualizing and studying the morphology of material surfaces. Moreover, additional information for some materials can be recovered by analysing the AFM's higher cantilever modes when the cantilever...
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AFM, XRD and HRTEM studies of annealed FePd thin films
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TEM and AFM studies of segmented polyester polyurethanes obtained by quasi-prepolymer method.
PublicationPrzedmiotem badań były poliestrouretany o zawartości 50% segmentów sztywnych i zmiennym stosunku NCO/OH. Wykazano, że poliestrouretany otrzymane metodą quasi-prepolimerową wykazują inną morfologię niż otrzymane za pomocą metody prepolimerowej. W poliuretanach quasi- prepolimerowych obserwowano za pomocą mikroskopu AFM agregację segmentów sztywnych o wymiarze poprzecznym rzędu200nm. Segmenty te tworzyły fazę ciągłą. Kruche...
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Hyperelastic Microcantilever AFM: Efficient Detection Mechanism Based on Principal Parametric Resonance
PublicationThe impetus of writing this paper is to propose an efficient detection mechanism to scan the surface profile of a micro-sample using cantilever-based atomic force microscopy (AFM), operating in non-contact mode. In order to implement this scheme, the principal parametric resonance characteristics of the resonator are employed, benefiting from the bifurcation-based sensing mechanism. It is assumed that the microcantilever is made...
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Performance of zinc-rich coatings evaluated using AFM-based electrical properties imaging
PublicationThe paper presents the results of investigation of polyvinyl zinc-rich coating exposed to 97% relativehumidity atmosphere for 40 days. Condition of the coating and evolution of its protective properties weredetermined with the novel AFM-based approach capable of providing surface profiles, local dc currentmaps as well as local impedance spectra. The proposed technique allowed insight into the local changesof coating topography...
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Localized impedance measurements of AA2024 and AA2024-T3 performed by means of AFM in contact mode
PublicationPurpose: The purpose of this paper is to present the results of an atomic force microscopy (AFM) based approach to local impedance spectroscopy (LIS) measurement performed on AA2024 and AA2024-T3 aluminium alloys. Design/methodology/approach: AFM-LIS measurements were performed ex-situ without the electrolyte environment, so in fact the electrical not electrochemical impedance was obtained. Findings: Relative local impedance values...
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Localized impedance measurements of AA2024 and AA2024‐T3 performed by means of AFM in contact mode
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Assessment of copper surface coverage with corrosion inhibitor using AFM-based local electrical measurements
PublicationThe paper presents a new method of assessment of metal surface coverage with corrosion inhibitor and thus of inhibitor protective performance. It is based on the atomic force microscopy measurement performed in a contact mode. Apart from topography images the proposed approach allows acquisition of local DC maps and local electrical impedance spectra via application of DC bias voltage or AC perturbation signal between the conductive...
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Temporal sequence of the human RBCs' vesiculation observed in nano-scale with application of AFM and complementary techniques
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Investigation of morphological and electrical properties of the PMMA coating upon exposure to UV irradiation based on AFM studies
PublicationCelem badania było określenie wpływu promieniowania ultrafioletowego na morfologię powierzchni powłoki i na jej właściwości elektryczne. Cienka powłoka z polimetakrylanu metylu została nałożona na podłoże stalowe metodą zanurzeniową. Oceny stanu przed ekspozycją UV i w jej trakcie dokonywano przy użyciu mikroskopu sił atomowych. Na obrazach AFM zaobserwowano pojawienie się mikropęknięć. Celem zweryfikowania czy wykryte nieciągłości...
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Evaluation of adhesive forces and the specific surface energy of zirconia stabilized by yttria with alumina additions ceramic by AFM method
PublicationThe adhesive forces and the specific surface energy of ceramic material surfaces are very important for further tribological and biomedical applications of ceramics. Partially stabilized zirconia (zirconium oxide) is popular for manufacturing various medical products. ZrO2 stabilized by Y2O3 with additions of 5 wt% alumina was produced by slip casting method with a subsequent sintering. Structure and chemical composition of ceramic...
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Integration of Fluorescent, NV-Rich Nanodiamond Particles with AFM Cantilevers by Focused Ion Beam for Hybrid Optical and Micromechanical Devices
PublicationIn this paper, a novel fabrication technology of atomic force microscopy (AFM) probes integrating cantilever tips with an NV-rich diamond particle is presented. Nanomanipulation techniques combined with the focused electron beam-induced deposition (FEBID) procedure were applied to position the NV-rich diamond particle on an AFM cantilever tip. Ultrasonic treatment of nanodiamond suspension was applied to reduce the size of diamond...
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Electrical mapping of AISI 304 stainless steel subjected to intergranular corrosion performed by means of AFM-LIS in the contact mode
PublicationThe paper presents results of the AFM-based approach to local impedance spectroscopy (LIS) measurements performed in a 20 20 lm grid within an austenite grain–grain boundary region for sensitized AISI 304 stainless steel (SS). Maps of electrical parameters obtained on the basis of localized impedance spectra were demonstrated, presenting their changes and correlation with the sample topography. Performed research revealed significant...
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Surface characteristics of glass fibres covered with an aluminum layer after a chemical modification process using secondary ion mass spectrometry (SIMS) and atomic force microscopy (AFM)
PublicationPrzedstawiono wyniki z badań powierzchni modyfikowanych włókien szklanych (przed i po procesie chemicznej modyfikacji ich powierzchni), które są kandydatem na przyszły oryginalny bezmatrycowy materiał odniesienia lotnych analitów etenu (C2H4) metodami spektrometrii mas jonów wtórnych oraz mikroskopii sił atomowych. Badania miały na celu obserwację zmian oraz procesów, jakie zaszły na powierzchni włókien szklanych pokrytych...
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Exemplary AFM application in cosmetology
Open Research DataAtomic force microscopy can be used in the diagnosis of the condition of human tissues such as skin, nails and hair. This is obviously related to the use of a variety of cosmetic products and can be understood as an attempt to assess their long-term impact on human appearance and health. An example may be the studies presented in [1] indicating the...
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Colvolutional calibration of AFM probe
Open Research DataAtomic force microscopy is based on the interaction of the examined surface with a probe of a pyramidal shape, tipped with a sharp end with a radius of curvature ranging from single nanometers to hundreds of nanometers. The resolution of the obtained image is of course dependent on the above-mentioned geometric size, and the resulting image is a convolutional...
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The AFM micrographs of V2O5 single crystals
Open Research DataThe DataSet contains the atomic force microscope images of the surface of V2O5 single crystals. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The As-prepared films were deposited on a quartz glass substrate and were annealing at 600°C under synthetic air.
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Examples of AFM applications in liquid environment
Open Research DataImportant advantage of atomic force microscopy (also tunneling microscopy) is the ability to work in different environments (vacuum, controlled atmosphere, liquid environment). The last one, open interesting possibilities, such as imaging of delicate biological materials in their natural state. The use of electrochemical mode allows for the modification...
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Statistics of AFM current-voltage curves
Open Research DataMapping surface electrical conductivity offers enormous cognitive possibilities regarding the structure and properties of modern materials. The technique invented for this purpose (Conductive AFM) by Murrel's team and colleagues allows independent monitoring of the local conductivity of materials in correlation with the topographic profile. The mentioned...
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The AFM micrographs of gold nanoparticles on silicon substrate
Open Research DataThe dataset contains the first approach towards AFM topographic imaging of gold nanoparticles synthesized and immobilized on the silicon surface. Measurements were made in the semi-contact mode on the NTEGRA Prima device, manufactured by NT-MDT. Scans were performed with amplitude detection at an operating value of 60% of the free oscillation amplitude....
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Nanostructures fabrication with use of electrical AFM litography
Open Research DataIn the last 10 years, one of the nanotechnological trends has been observed, consisting in the development of new variants of computer memory systems with high capacity and speed of access, using quantum dots. One of the techniques for creating nanodots and other nanostructures is based on the use of an atomic force microscope acting as a lithographic...
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AFM investigation of electrode fabricated by 3D printing
Open Research Data3D printing, also known as additive manufacturing, has enjoyed great interest in recent years due to the versatility of this method of producing various shapes and details. Due to the possibility of precise control of the shape and composition of the printed elements, the discussed technique can be widely used in electrochemistry, including electrochemical...
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AFM analysis of duplex steel structure and composition
Open Research DataDue to the high content of alloying elements, duplex stainless steels are characterized by a complex structure of phase transitions. Among all types of intermetallic compounds, the sigma phase is of major interest due to its detrimental effect on both mechanical properties and corrosion behavior. It is an intermetallic phase enriched in Cr and Mo and...
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AFM visualization of Mg alloy surface modification
Open Research DataMagnesium alloys with additives improving their mechanical properties are valued as materials with low density and elasticity coefficient. Additionally, their biocompatibility and biodegradability make them interesting in prosthetic applications. However, the last of these features, valuable in medicine, contradicts the industrial needs for the described...
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Detection of the acoustic interferences during AFM operation
Open Research DataAtomic force microscopy is a particularly complicated surface imaging technique due to the large number of factors that affect the quality of the resulting images. They are obviously difficult and sometimes even impossible to control at the same time. One of such factors may even be the seismological location of the building or the influence of mechanical...
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Imaging of the effects of pitting corrosion with the use of AFM
Open Research DataPitting corrosion is a local attack on a metal surface, limited to a point or small area, which appears as a hole. Pitting corrosion is one of the most harmful forms of corrosion due to the fact that it is associated with small, difficult to detect damage, that can even lead to perforation of the structure. A single pit may range in size from micrometers...
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AFM imaging of surface of modern soldering alloy
Open Research DataFollowing the announcement in 2006 of European Union directives aimed at limiting the use of lead in electronic products, there was an urgent need to use lead-free solders in the electronics industry. Due to production requirements, it is necessary to use solders with different melting points. To replace the low-melting eutectic Sn 37 wt. Pb, the most...
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AFM and SSRM investiagtion of carbon nanowalls properties
Open Research DataStructures with limited dimensionality are of great interest in modern nanotechnology. The properties of these objects are used, among others, for the construction of modern displays or as a base for quantum computers. Carbon nanowalls, which are the subject of the imaging results contained in this collection, are also considered interesting building...
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Fingerprint structure studies with semi-contact AFM
Open Research DataThe work [1] presents many, sometimes even surprising examples of the use of atomic force microscopy in modern forensics. Some of them are projectile tests using the characteristic scratch patterns created by the firing pin on the primer. There are more and more suggestions in the literature for the use of atomic force microscopy in dactyloscopy [2]....
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Destruction of AFM probes during normal operation
Open Research DataThe quality of the images obtained with the use of an atomic force microscope is determined by the state of the blade interacting with the tested material. Image artifacts can be generated by various reasons, such as oxidation, contamination or an error in blade fabrication, but also appear as a result of the repeated scanning process and inevitable...
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The AFM micrographs of isotropic etching silicon substrates (111)
Open Research DataThe DataSet contains the atomic force microscope images of isotropic etching silicon substrates (111). The silicon wafers were etched in a mixture of nitric acid, hydrofluoric acid, and acetic acid in the ratio of 40:1:15. The soaking time for the substrates was from 20 to 90 seconds
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Imaging of graphene surface by means of tapping mode AFM
Open Research DataGraphene [1] is a material consisting of carbon planes with a hexagonal structure. One of the facts of interest from a purely scientific point of view is the very high mobility of electrons in the described material, allowing the study of relativistic effects inside a solid sample. Other features, such as bactericidal activity, make graphene an interesting...
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The morphology of vanadate glasses containing BaTiO3 measured with the use of AFM
Open Research DataThe morphology of vanadate glasses doped with BaTiO3 was measured with the use of AFM method. Samples of the composition of x[BaO,TiO2]–(80 − x)V2O5–20Bi2O3 where x = 5, 10 and 15 in mol% were prepared by a conventional melt quenching technique. The melting was performed in alumina crucibles at the temperature of 1273 K–1373 K. The melts were poured...
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The influence of external interference on AFM imaging, the use of a protective helmet
Open Research DataThis collection is of purely practical importance, showing how the presence of external disturbances can adversely affect the quality of imaging with an atomic force microscope. For this reason, it is also advisable to provide a link to a workshop-like study [1] as well as a huge number of commercial solutions available after entering the keyword "AFM...
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Mechanical lithography in a polymer substrate using AFM in contact mode
Open Research DataMechanical lithography in a polymer substrate. Contact mode. NTEGRA Prima (NT-MDT) device. NSG 01 probe.
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Au nanoparticles identifiction with the use of AFM Volta potential mapping
Open Research DataThe specific physical, chemical and electrochemical electrical properties of gold nanoparticles have led to their extensive use as high-performance chemical and biochemical sensors. The described properties relate to surface plasmon resonance, fluorescence quenching or enhancement, high electrical conductivity and light scattering. The described nanoparticles...
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Results of AFM examination of acrylic bone cements incorporating various components
Open Research DataThe database contains the images of the surface topography of modified bone cements observed with the atomic force microscopy (AFM). The following modifications were evaluated: the addition of biodegradable components (including chitosan, cellulose, tricalcium phosphate, polydioxanone or magnesium), the addition of bioactive components (bioglasses)...
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The AFM micrographs of vanadium oxides thin films obtained at 800°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on a silicon substrate and vanadium thin films were obtained by annealing as-prepared films at...
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The AFM micrographs of vanadium oxides thin films obtained at 1200°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films obtained at 400°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films obtained at 600°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of of vanadium oxides thin films obtained at 300°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxide thin films obtained at 100°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...
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The AFM micrographs of vanadium oxides thin films obtained at 150°C
Open Research DataThe DataSet contains the atomic force microscope images of the surface of vanadium oxide thin films. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on quartz glass and silicon substrate and vanadium thin films were obtained by annealing as-prepared...