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SEM micrographs of morphology evolution of VO2 and V2O3 thin films obtained at 1000°C
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of VO2 and V2O3 thin films obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films were deposited on a silicon and quartz glass substrate and were annealing at 1000°C under an argon atmosphere.
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SEM micrographs of vanadium oxide nanostructures obtained by V2O5 recrystallization at 1000°C
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of vanadium oxide nanostructures on quartz glass and silicon substrates obtained by recrystallization of V2O5 thin films at 1000°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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SEM micrographs of vanadium oxide nanostructures obtained by V2O5 recrystallization at 800°C
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of vanadium oxide nanostructures on quartz glass and silicon substrates obtained by recrystallization of V2O5 thin films at 800°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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SEM micrographs of morphology evolution of VO2 and V2O3 nanostructures
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of VO2 and V2O3 nanostructures obtained by the sol-gel with different reaction conditions. The information about xerogel powder synthesis is described in the Journal of Nanomaterials. The xerogel powder was annealing under argon atmosphere in the temperature range 400-800C. The...
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SEM micrographs of vanadium oxide nanostructures obtained by V2O5 recrystallization at 1200°C
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of vanadium oxide nanostructures on quartz glass and silicon substrates obtained by recrystallization of V2O5 thin films at 1200°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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SEM micrographs of the topography of Cu-Sn-TiO2 nanocomposite coatings
Dane BadawczeThe dataset contains the scanning electron microscopy (SEM) micrographs of nanocomposite Cu-Sn-TiO2 coatings electrodeposited from oxalic acid bath containing Cu and Sn salts as well as TiO2 nanoparticles under various treatments: mechanical stirring, ultrasonic or none. The details of the electrodeposition process are presented in the readme file attached...
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The scanning tunnelling micrographs of highly oriented pyrolytic graphite
Dane BadawczeThe dataset contains the results imaging of a sample of highly oriented pyrolytic graphite obtained using scanning tunneling microscopy. The above variant of scanning probe microscopy is one of the most convenient research techniques at atomic scales. The file contains images corresponding to increasing magnifications from the 1 um scale to a few nanometers....
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Microstructure of cross-sections of samples after laser treatment for the article entitled "Mechanical and corrosive properties of Ti13Nb13Zr alloy subjected to laser treatment with MWCNTs coatings"
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The morphology of vanadate glasses containing BaTiO3 measured with the use of AFM
Dane BadawczeThe morphology of vanadate glasses doped with BaTiO3 was measured with the use of AFM method. Samples of the composition of x[BaO,TiO2]–(80 − x)V2O5–20Bi2O3 where x = 5, 10 and 15 in mol% were prepared by a conventional melt quenching technique. The melting was performed in alumina crucibles at the temperature of 1273 K–1373 K. The melts were poured...
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SEM micrographs of NH4VO3 crystals - molar concetration factor
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of NH4VO3 nano_crystals obtained by the LPE-IonEx method. The SEM images clearly show that the morphology of the end product can be nicely tuned by changing the molar concentration of ammonium salt in the solvent.
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SEM micrographs of morphology evolution of VO2 and V2O3 thin films obtained at 700°C
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of VO2 and V2O3 thin films obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (3-9 AsP layers) were deposited on a silicon substrate and were annealing at 700°C under an argon...
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SEM micrographs of morphology evolution of VO2 and V2O3 thin films obtained at 1000°C dependent on film thickness
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of VO2 and V2O3 thin films obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (2-3 AsP layers) were deposited on a silicon substrate and were annealing at 1000°C under an argon...
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SEM micrographs of morphology evolution of VO2 and V2O3 thin films obtained at 500°C
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of VO2 and V2O3 thin films obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (3-9 AsP layers) were deposited on a silicon substrate and were annealing at 500°C under an argon...
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SEM micrographs of boron-doped nanocrystalline diamond-carbon nanospikes
Dane BadawczeThis dataset contains the Scanning Electron Microscopy (SEM) micrographs taken for rich boron-doped carbon crystalline nanospikes/nanograss structures, at different magnifications, encoded in the labels of the images. The micrographs were made using Hitachi S-3400N SEM microscope in secondary electron mode under 20 kV accelerating voltage. No additional...
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AFM (atomic force microscopy) images of borophene flakes obtained during ball milling at different operating parameters
Dane BadawczeThis dataset contains atomic force microscopy (AFM) images of representative borophene flakes obtained during ball milling. The operational parameters of the ball-milling process included rotation speed (250, 450, and 650 rpm), time of ball-milling (1, 3, 6, and 12 h), and the mass loading of starting bulk boron (1, 2, 3 g).
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The scanning spreading resistance microscopy (SSRM) studies of heavy boron-doped diamond oxidation under high-temperature
Dane BadawczeThe dataset contains the results of scanning spreading resistance microscopy (SSRM) of heavy boron-doped diamond (BDD) electrodes subjected to high-temperature oxidation in a furnace at 600 Celsius. The micrographs reveal the local change of electric properties at certainly crystallographic orientations of BDD grains and at the grain boundaries due...
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SEM micrographs of morphology evolution of V2O5 thin films on quartz glass
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of V2O5 thin films deposited on a quartz glass substrate. The as-prepared thin films were annealing under an oxidizing atmosphere in the temperature range 200-600C. The results show that the morphology of the films dependent on the annealing temperature.
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SEM micrographs of morphology evolution of V2O3 nanostructures
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of V2O3 nanostructures obtained by the sol-gel with different reaction conditions. The xerogel powder was annealing under a reducing atmosphere (94% Ar, 6% H2) in the temperature range 350-700C. The results show that the morphology dependent on the annealing temperature.
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SEM micrographs of the V2O5 coatings after thermal treatment under reducing atmosphere
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of V2O5 coatings on the silicon substrate after thermal treatment under a reducing atmosphere. Thin films were annealed at 600C and 700C for 10 under a reducing atmosphere (94% Ar, 6% H2).
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SEM micrographs of V2O5 thin film morphology dependent on substrate types
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of V2O5 thin film morphology dependent on substrate types. The as-prepared thin films were deposited on alumina, zirconium, zirconium oxide and metallic vanadium substrate, then was annealing under an oxidizing atmosphere at 600C for 10h. The results show that the morphology of...
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SEM micrographs of morphology evolution of V2O5 thin films on silicon substrate
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of V2O5 thin films deposited on a silicon substrate. The as-prepared thin films were annealing under an oxidizing atmosphere in the temperature range 250-600C. The results show that the morphology of the films dependent on the annealing temperature.
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Microscopy methods in nanotechnology
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Au nanoparticles identifiction with the use of AFM Volta potential mapping
Dane BadawczeThe specific physical, chemical and electrochemical electrical properties of gold nanoparticles have led to their extensive use as high-performance chemical and biochemical sensors. The described properties relate to surface plasmon resonance, fluorescence quenching or enhancement, high electrical conductivity and light scattering. The described nanoparticles...
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SEM micrographs of NH4VO3 crystals
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of NH4VO3 crystals obtained by the LPE-IonEx method. The SEM images clearly show that the morphology of the end product can be nicely tuned by changing the type of ammonium salt and the solvent. It can be concluded that the used solvent affected crystal shapes and their size was...
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The topography of as-quenched and heat treated 58(2Bi2O3-V2O5)-42SrB4O7 glasses measured with confocal microscope
Dane BadawczeThe topography of as-quenched and heat treated 58(2Bi2O3-V2O5)-42SrB4O7 glasses measured with confocal microscope.
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2022 MICROSCOPY IN ENVIRONMENTAL MONITORING -lecture - Nowy
Kursy OnlineThe online repository will be used to teach students by presenting them lectures about variable aspects of microscopy techniques used in environmental monitoring.
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2024 Microscopy in Environmental Monitoring
Kursy OnlineThe online repository will be used to teach students by presenting them lectures about variable aspects of microscopy techniques used in environmental monitoring.
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The morphology of vanadate glass-ceramics containing BaTiO3 measured with the use of AFM
Dane BadawczeThe structure of vanadate glass-ceramics doped with BaTiO3 was measured by AFM technique. Samples of the composition of x[BaO,TiO2]–(80 − x)V2O5–20Bi2O3 where x = 5, 10 and 15 in mol% were prepared by a conventional melt quenching technique. The melting was performed in alumina crucibles at the temperature of 1273 K–1373 K. The melts were poured on...
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The morphology of as-quenched and heat treated 58(2Bi2O3-V2O5)-42SrB4O7 glasses measured with AFM
Dane BadawczeThe morphology of as-quenched and heat treated 58(2Bi2O3-V2O5)-42SrB4O7 glasses was measured with the use of atomic force microscope.
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SEM micrographs of diamond-phase (sp3-C) rich boron-doped carbon nanowalls (sp2-C)
Dane BadawczeThis dataset contains the Scanning Electron Microscopy (SEM) micrographs taken for rich boron-doped carbon nanowalls structures, with different boron addition during the synthesis process and different CVD synthesis duration. The [B]/[C] ratios in the plasma were set to 0k, 1.2k, 2k and 5k ppm. The time of growth was ranging between 4 and 9 hours. This...
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AFM investigation of electrode fabricated by 3D printing
Dane Badawcze3D printing, also known as additive manufacturing, has enjoyed great interest in recent years due to the versatility of this method of producing various shapes and details. Due to the possibility of precise control of the shape and composition of the printed elements, the discussed technique can be widely used in electrochemistry, including electrochemical...
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SEM micrographs of V2O5 thin films deposited on isotropic etching silicon substrates (111)
Dane BadawczeThe DataSet contains the scanning electron microscopy (SEM) micrographs of V2O5 thin films deposited on isotropic etching silicon substrates (111). The silicon wafers were etched in a mixture of nitric acid, hydrofluoric acid, and acetic acid in the ratio of 40:1:15. The soaking time for the substrates was from 30 to 90 seconds. The thin films were...
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Performance of organic coatings upon cyclic mechanical load
PublikacjaA number of engineering structures fail due to the fatigue damage resulting from cyclic mechanical stress. However, as far as organic coatings are concerned this degradation factor remains underestimated. In the paper the authors propose a methodology combining global electrochemical impedance spectroscopy and local atomic force microscopy measurements for evaluation of coating resistance to an impact of repetitive mechanical stress. Typical...
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The AFM micrographs of austenitic stainless steel subjected to sensitization for intergranular corrosion
Dane BadawczeThe dataset contains atomic force microscopy (AFM) maps of topographic images of austenitic steel samples subjected to sensitization to the process of intergranular corrosion. Precipitations of carbides as well as other intermetallic phases can be observed and detected before the fragments of structures sensitized by improper thermal treatment are exposed...
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Improving AFM images with harmonic interference by spectral analysis
PublikacjaPrzedstawiono sposób usunięcia zakłóceń pojawiających się na obrazach uzyskiwanych z mikroskopu sił atomowych (AFM). Przybliżono kilka metod stosowanych do redukcji zakłóceń w obrazach. Następnie opisano zidentyfikowane zakłócenia harmoniczne oraz zaproponowany sposób ich znaczącej redukcji. W pracy zamieszczono szereg obrazów uzyskanych z mikroskopu AFM ilustrujących efekty powodowane zakłóceniami oraz skuteczność zaproponowanej...
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Determination of the refractive index and wavelength‐dependent optical properties of few‐layer CrCl3 within the Fresnel formalism
PublikacjaBased on previous reports on the optical microscopy contrast of mechanically exfoliated few layer CrCl3 transferred on 285 nmand 270 nmSiO2 on Si(100), we focus on the experimental determination of an effective mean complex refractive index via a fitting analysis based on the Fresnel equations formalism. Accordingly, the layer and wavelength-dependent absorbance and reflectance are calculated. Layer and wavelength-dependent optical...
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Polyallylamine as an Adhesion Promoter for SU-8 Photoresist
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Runner bean (Phaseolus coccineus) histological cross section observations of stems, leaves, and roots using light microscope
Dane BadawczeThis data set contains images of root crown, root, stem, and leaf cross-sections of runner bean (Phaseolus coccineus). Runner bean seedlings (3-5 cm) were planted on soil amended with poultry (chicken) manure biochars pyrolized at various temperatures (400, 500, and 600 C degrees). Three different poultry manure biochar materials (450, 500, and 600°C)...
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The topography of as-quenched and heat treated 50(2Bi2O3-V2O5)-50SrB4O7 and 50Bi2VO5.5-50SrB4O7 glasses measured with confocal microscope
Dane BadawczeThe topography of as-quenched and heat treated 50(2Bi2O3-V2O5)-50SrB4O7 and 50Bi2VO5.5-50SrB4O7 glasses measured with confocal microscope.
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TEM, EDS and optical microscope images of pristine and silica-coated bismuth oxide (Bi2O3) and gadolinium oxide (Gd2O3) structures.
Dane BadawczeData consists of raw TEM/EDS and optical microscope images of pristine and silica-coated bismuth oxide (Bi2O3) and gadolinium oxide (Gd2O3) structures. Additional TEM images and optical microscope images of silica shells were included.
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Mechanical lithography in a polymer substrate using AFM in contact mode
Dane BadawczeMechanical lithography in a polymer substrate. Contact mode. NTEGRA Prima (NT-MDT) device. NSG 01 probe.
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Thermal Instability of Gold Thin Films
PublikacjaThe disintegration of a continuous metallic thin film leads to the formation of isolated islands, which can be used for the preparation of plasmonic structures. The transformation mechanism is driven by a thermally accelerated diffusion that leads to the minimalization of surface free energy in the system. In this paper, we report the results of our study on the disintegration of gold thin film and the formation of nanoislands...
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TEM (transmission electron microscopy) images and elemental mapping EDX (energy dispersive X-ray spectroscopy) of bulk boron and borophene obtained during ball milling
Dane BadawczeThese data contain TEM (transmission electron microscopy) images with corresponding elemental mapping EDX of bulk boron and borophene flakes after the ball-milling process (450 rpm, 6 h, 1 g). The data were collected to investigate the structure and morphology of the materials.
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Ferromagnetic nanocrystallites in the SiO2 - PbO - Fe2O3 glass system
PublikacjaThe structure of 50% SiO2 - 35% PbO - 15% Fe2O3, 50% SiO2 - 30% PbO - 20% Fe2O3 and 50% SiO2 - 25% PbO - 25% Fe2O3 (in mol%) glass was investigated by the means of AFM microscopy and X-ray diffraction. Observation by the atomic force microscopy shows that each of prepared iron oxide glass doesn't have homogeneous structure and some nanocrystallites were detected. Next, test with neodymium magnet found out strong magnetic properties...
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Amplitude-distance spectroscopy in semi-contact mode
Dane BadawczeSince it was invented by Binnig et al. in 1986, atomic force microscopy (AFM) plays a key role in science and technology at the nanoscale. AFM is a microscopic technique that visualizes the surface topography using the attractive and repulsive forces of interaction between several atoms (in theory) of a blade attached to the end of the probe lever and...
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Destruction of AFM probes during normal operation
Dane BadawczeThe quality of the images obtained with the use of an atomic force microscope is determined by the state of the blade interacting with the tested material. Image artifacts can be generated by various reasons, such as oxidation, contamination or an error in blade fabrication, but also appear as a result of the repeated scanning process and inevitable...
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Scanning Probe Microscopy in Electrochemistry and Materials Science
Kursy OnlineProwadzący: Prof. Jacek LIPKOWSKI z University of Guelph, Ontario, Canada. Kurs zorganizowany dla doktorantów Wydziału Chemicznego Politechniki Gdańskiej. Dostęp do kursu po kontakcie z administratorem.
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Detection of the acoustic interferences during AFM operation
Dane BadawczeAtomic force microscopy is a particularly complicated surface imaging technique due to the large number of factors that affect the quality of the resulting images. They are obviously difficult and sometimes even impossible to control at the same time. One of such factors may even be the seismological location of the building or the influence of mechanical...
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Imaging of biological samples: crassula arborescens
Dane BadawczeOne of the tasks of modern botany is to describe the relationship between climatic conditions and other environmental factors and the anatomical structure and adaptation of species present in given geographic areas. The work [1] focuses on anatomical and morphological studies of leaves of plants from the coarse family. Species tested belong to leaf...
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Fundamentals of microscopic analysis
Kursy Online